Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
08/2010
08/17/2010US7778727 Electronic component inspection apparatus
08/12/2010WO2010091147A1 Electrical interconnect and method for electrically coupling a plurality of devices
08/12/2010US20100201387 Safety-Enhanced Component and Circuit Tester
08/12/2010US20100201349 Method for measuring i-v characteristics of solar cell, and solar cell
08/12/2010DE10240489B4 Pinzette mit Meßeinrichtung Tweezers with measuring device
08/11/2010EP2216656A1 Probe device
08/11/2010EP2216655A1 Probe card
08/11/2010EP2215484A1 Probe with highly precise direct current measurement
08/11/2010CN201549611U Grounding device
08/11/2010CN201549181U Probe frame for detecting TFT-LCD array circuit
08/11/2010CN201548673U Tester for LED indicator lights of automobile instrument penal
08/11/2010CN201548670U DC power comprehensive test instrument
08/11/2010CN201548668U Retest-free high-efficiency voltage/internal resistance testing system of battery
08/11/2010CN201548656U Anti-jamming device for testing chips simultaneously
08/11/2010CN201548628U Super-wide frequency-band durable microwave testing device
08/11/2010CN201548623U Test device of display panel driving chip
08/11/2010CN201548580U Voltage aging load circuit
08/11/2010CN201548579U Delayed-response transducer for withstand voltage test of transformer
08/11/2010CN201548578U Three-phase change-over switch used for GIS product test butt joint
08/11/2010CN201548577U Probe support
08/11/2010CN201548576U Automatic elevating component and nanometer detecting probe production component
08/11/2010CN201548575U 改良的测试夹具 Improved test fixture
08/11/2010CN201548574U High-voltage signals measuring fixture
08/11/2010CN201548573U Terminal product load application universal clamping apparatus
08/11/2010CN201548572U Insulating rod test stand
08/11/2010CN201548571U Chip testing fixture
08/11/2010CN201548570U Voltage sampling termination
08/11/2010CN201548569U Aging test bench of constant-temperature crystal oscillator
08/11/2010CN201548568U Primary current testing clamp for calibration of straight plate current transformer on site
08/11/2010CN201548567U Field calibration disposable test clamp of current transformer
08/11/2010CN201548566U Counter protection disc
08/11/2010CN201548565U Probe card with strengthening ribs
08/11/2010CN201548564U Current measurement device
08/11/2010CN201548563U Stitch connector and a chip maintenance jig with the stitch connector
08/11/2010CN201548562U Monitor station for constant temperature crystal oscillator
08/11/2010CN201548561U Withstand adapter of gas-insulated switch gear
08/11/2010CN201548560U Interface board of semiconductor tester test head
08/11/2010CN101800015A Blade type probe module
08/11/2010CN101799516A Circuit board detection device
08/11/2010CN101799509A System and method for detecting armature winding of motor
08/11/2010CN101799486A Method for manufacturing probe and probe array thereof
08/11/2010CN101799485A Core holder and zeta electric potential measuring system and method using same
08/11/2010CN101799484A Lithium battery detection and separation tray
08/11/2010CN101799483A Containing device of tester
08/11/2010CN101105504B Probe card device
08/11/2010CN101063625B BGA packaging retainer apparatus and method for testing BGA packaging
08/10/2010US7774148 Torque estimator for IPM motors
08/10/2010US7772864 Contact probe with reduced voltage drop and heat generation
08/05/2010US20100197152 Socket for connecting ball-grid-array integrated circuit device to test circuit
08/05/2010US20100194419 Multi-contact probe assembly
08/05/2010US20100194383 Apparatus for determining and/or monitoring a process variable
08/05/2010US20100194382 Method for determining electrical power signal levels in a transmission system
08/05/2010US20100194375 Electronic transformer measuring device having surface mounting assembly
08/05/2010US20100193121 Laser welding of resin members using a ridge for enhancing weld strength
08/05/2010DE10297654B4 Halteeinsatz und Handhabungsvorrichtung mit einem solchen Halteeinsatz für elektronische Bauelemente Holding insert and handling device with such a retaining insert for electronic components
08/04/2010EP2214269A2 Interface device
08/04/2010CN201540361U 40 V power module calibration stand
08/04/2010CN201540355U Relay protection checking table
08/04/2010CN201540353U Circuit board detecting device
08/04/2010CN201540312U Simulating circuit in discharging process of pulse xenon lamp
08/04/2010CN201540311U Battery internal resistance measuring fixture
08/04/2010CN201540310U Loading frame of circuit board testing machine
08/04/2010CN201540309U IC chip testing socket
08/04/2010CN201540308U Transformer test device
08/04/2010CN201540307U Semiconductor testing device
08/04/2010CN201540306U Cable-jamming mechanism for fault indicator
08/04/2010CN1762050B Probe and method of making same
08/04/2010CN101793945A Solar cell testing device
08/04/2010CN101793926A Aging test bench
08/04/2010CN101793914A Contact type probe using flexible wire
08/04/2010CN101793913A Processing technology of protective plate of PCB (Printed Circuit Board) testing device
08/04/2010CN101793912A Tube-to-disc conversion device
08/03/2010US7768284 Test apparatus for testing a semiconductor device, and method for testing the semiconductor device
07/2010
07/30/2010CA2691270A1 Method and apparatus for measuring current output of low-voltage pad-mount distribution power transformers
07/29/2010WO2010084405A1 Elastic contact device for electronic components with buckling columns
07/29/2010WO2010053288A3 Constant-pressure non-destructive contact probe device
07/29/2010US20100190361 Electrical connecting apparatus
07/29/2010US20100190278 Testing for correct undercutting of an electrode during an etching step
07/29/2010US20100188113 Cantilever probe and applications of the same
07/29/2010US20100188073 Methods and apparatus for measuring analytes using large scale fet arrays
07/29/2010DE102004027887B4 Prüfeinrichtung zur elektrischen Prüfung eines Prüflings Test equipment for electrical testing a device under test
07/28/2010EP2211188A2 Test probe with retractable insulative sleeve
07/28/2010EP2210115A2 Full raster cartridge for a parallel tester for testing an unpopulated printed circuit board, spring contact pin for such a full raster cartridge and adapter for testing an unpopulated printed circuit board
07/28/2010EP1810041B1 Battery sensor device
07/28/2010EP1729174B1 Photolithographically-patterned out-of-plane coil structures and method of making
07/28/2010CN201535808U Storage card connector function testing machine
07/28/2010CN201535790U Automobile circuit check pen
07/28/2010CN201535789U 探针单元及检查装置 The probe unit and inspection equipment
07/28/2010CN201535788U Test frame for a solar simulator
07/28/2010CN201535787U 10kV配电变压器低压综合计量装置箱 10kV distribution transformer low-voltage integrated metering device box
07/28/2010CN201535786U 氧传感器功能测试夹具 Oxygen sensor function test fixture
07/28/2010CN201535785U Winding lenticular wire adhesion closed loop cutting test device
07/28/2010CN201535784U 一种老化测试基板 A burn test substrate
07/28/2010CN201535783U 一种晶体硅太阳能电池组件测试连接器 A crystalline silicon solar cell component test connector
07/28/2010CN101789293A Sampling resistor in pulse-width modulation (PWM) controller
07/28/2010CN101788628A Detection mechanism of circuit breaking and short circuit of wires and cables
07/28/2010CN101788624A Device for testing electrical-connection topological structure
07/28/2010CN101788620A Line impedance stabilization network for medium-frequency power supply and design method thereof
07/28/2010CN101788576A Electrical testing device and electrical testing method for electronic device
07/28/2010CN101788575A Probe seat with micro-electroforming probes
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