Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
09/2010
09/15/2010CN101836121A Method of manufacturing an inspection apparatus for inspecting an electronic device
09/15/2010CN101833064A Experimental system for simulating single event effect (SEE) of pulse laser based on optical fiber probe
09/15/2010CN101833020A 测试装置 Testing device
09/15/2010CN101308819B Manufacturing method of semiconductor integrated circuit device and probe card
09/14/2010US7795593 Surface contamination analyzer for semiconductor wafers
09/09/2010US20100225306 Printed circuit board with an adaptable connector module
09/09/2010US20100225305 Meter socket connection methods and systems for local generators or monitoring connections
09/09/2010US20100225304 Voltage-measuring circuit and method
09/08/2010CN201576871U Electric connector
09/08/2010CN201576870U Electric connector
09/08/2010CN201576862U Short circuit seal used for plugging in current test terminal
09/08/2010CN201576066U Electrical insulation testing device
09/08/2010CN201576016U Alternating current measuring device under ultravoltage environment
09/08/2010CN201576015U PCB for electric energy meter
09/08/2010CN201576014U Electricity meter box
09/08/2010CN201576013U Flexible jack test board
09/08/2010CN201576012U Movable triangular chassis
09/08/2010CN201576011U Alternating current-direct current comprehensive load box
09/08/2010CN201576010U Communication equipment load box
09/08/2010CN201576009U Alternating-current/direct-current load box
09/08/2010CN201576008U Cable device used for testing switching property of trolley
09/08/2010CN201576007U Pen-shape meter suitable for simultaneously testing parameters of various electronic components on circuit board
09/08/2010CN1797003B Apparatus for testing un-moulded IC devices using air flow system and the method of testing the same
09/08/2010CN101825681A Method for measuring current amplification factor of bipolar transistor
09/08/2010CN101825669A Display module testing device and method
09/08/2010CN101825651A Probe card, semiconductor testing device including the same, and fuse checking method for probe card
09/08/2010CN101825650A Joint detecting structure and joint structure
09/08/2010CN101825649A Superpower remote control electric discharge device
09/08/2010CN101241143B Integrated circuit test seat and its test interface
09/08/2010CN101105505B Carrier module and test tray installed with the carrier module
09/08/2010CN101065681B Interface apparatus for semiconductor device tester
09/02/2010WO2010099245A1 Space transformer connector printed circuit board assembly
09/02/2010WO2010098315A1 Probe card substrate, probe card laminated body, and probe card equipped with said probe card laminated body and probe
09/02/2010US20100219806 Electric field detection probe, method thereof, and manufacturing method of circuit board
09/01/2010EP1938116B1 Device for measuring the loss factor
09/01/2010CN201569677U Port protector of vector network analyzer
09/01/2010CN201569676U Make-and-break device of AC power supply
09/01/2010CN201569675U Local discharge testing power supply device for ultra-high-voltage transformer
09/01/2010CN201569674U Dummy load of electronic ballast for gas discharge lamp
09/01/2010CN201569673U Switching device for testing electric relay
09/01/2010CN201569672U Auxiliary jig for testing wire rods
09/01/2010CN1847859B Burn-in board, burn-in test method
09/01/2010CN1806368B Anisotropic conductive connector device and production method therefor and circuit device inspection device
09/01/2010CN1747071B Method of fabricating semiconductor probe with resistive tip
09/01/2010CN101821634A Multi-site probe
09/01/2010CN101819221A Reverse testing jig and testing method thereof
09/01/2010CN101819220A Suction nozzle structure with light source
09/01/2010CN101819099A Push rod of key testing machine
09/01/2010CN101266262B High speed test card
08/2010
08/31/2010US7786743 Probe tile for probing semiconductor wafer
08/31/2010US7786741 Measuring tip for high-frequency measurement
08/26/2010WO2010096171A2 Test access component for automatic testing of circuit assemblies
08/26/2010WO2010095521A1 Probe guard
08/26/2010WO2010095520A1 Contact probe and probe unit
08/26/2010US20100213926 Apparatus and method for voltage sensing in electrical metering systems
08/25/2010EP2220510A2 Method for producing a magnetic field sensor and sensor produced according to said method
08/25/2010CN201562035U Device for taking electric measurement of chips
08/25/2010CN201561993U Test switch
08/25/2010CN201561992U Undervoltage detecting circuit
08/25/2010CN201561991U Adjustable probe bracket for solar battery detection
08/25/2010CN201561990U Measuring head
08/25/2010CN201561989U Built-in device of local discharge sensor
08/25/2010CN1979193B Ageing test apparatus and ageing test drive plate and control method of the ageing test apparatus and drive plate
08/25/2010CN101813715A Square wave injecting device
08/25/2010CN101813714A Probe device
08/25/2010CN101813713A Probe unit for testing planar display panel
08/25/2010CN101813712A Connecting needle for wired fixture
08/25/2010CN101813711A Test probe and probe bed
08/25/2010CN101271128B Digital display signal measurement amplifying circuit
08/25/2010CN101093231B 探针卡 Probe Card
08/24/2010US7782044 Cover
08/24/2010US7781921 Voltage regulator and method for generating indicator signal in voltage regulator
08/19/2010US20100210122 Electrical connecting apparatus
08/19/2010US20100207654 MEMS Interconnection Pins Fabrication on a Reusable Substrate for Probe Card Application
08/19/2010US20100207641 System and Method for Evaluating the Electromagnetic Compatibility of Integrated Circuits in an In-Situ Environment
08/19/2010DE19931278B4 Prüfkarte und IC-Prüfgerät Probe card and IC tester
08/19/2010DE10297763B4 Electronic device test system includes springs which provide resilient force to pusher block fixed removably to load base, in order to press integrated circuit under test
08/18/2010CN201555940U Automatic testing machine of SAW filter
08/18/2010CN201555868U Portable resistance type current phase shifter
08/18/2010CN201555867U Shielding device of primary terminal during radio interference voltage measurement
08/18/2010CN201555866U Circuit board detection aging oven
08/18/2010CN201555865U Safety shield of phoenix connectible terminal
08/18/2010CN201555864U SAW filter test fixture
08/18/2010CN201555863U Three-phase energy-regenerating alternating current and direct current universal electronic load simulator
08/18/2010CN201555862U Connecting piece used for discharge test of transformer
08/18/2010CN1628251B Electrical feedback detection system for multi-point probes
08/18/2010CN101809176A Iridium alloy excellent in hardness, processability and stain proofness
08/18/2010CN101806856A Full-automatic circuit board testing machine
08/18/2010CN101806818A Isolated array type voltage signal source circuit
08/18/2010CN101806817A Test head positioning system and method
08/18/2010CN101806816A Clamper of low voltage breaker test sample
08/18/2010CN101806815A Fixture for SiC MESFET DC tests
08/18/2010CN101806814A Exposing frame for use in attenuation test of solar battery
08/18/2010CN101806813A Compression clamp for solar battery attenuation test
08/18/2010CN101261283B Test bench wafer suction disc device
08/18/2010CN101226207B Active variable impedance synthesizer
08/18/2010CN101191799B AC load
08/18/2010CN101067636B Flexible test cable
08/17/2010USRE41516 Socketless/boardless test interposer card
08/17/2010USRE41515 Contactor and production method for contactor
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