Patents
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
10/2010
10/07/2010US20100251545 Wafer probe
10/07/2010DE102009019158A1 Temporarily used mobile measurement system controlling arrangement for passenger car, has current limiting elements designed such that amount of residual current remains below preset exposure limit during breakdown of measuring lines
10/07/2010DE102008016388B4 Vorrichtung zum Testen einer Schutz-, Mess- oder Zähleinrichtung als Bestandteil einer Mittel- oder Hochspannungsanlage Apparatus for testing a protection, measuring or counting as part of a medium- or high-voltage system
10/06/2010EP2237052A1 Automated multi-point probe manipulation
10/06/2010EP2235546A1 Improved probe card for testing integrated circuits
10/06/2010CN201601275U 测试电连接器及其电子装置 Test electrical connector and electronic devices
10/06/2010CN201600393U 一种耐电压辅助测试架 One kind of auxiliary voltage resistance test stand
10/06/2010CN201600392U 多笔芯组合电装测试笔 Multi-combination Denso test pen refills
10/06/2010CN201600391U 一种测量仪表的扩展式模块 An instrument to measure the expansion modules
10/06/2010CN201600390U 一种高压电器末屏测量端子 At the end of a high-voltage electrical panel measuring terminals
10/06/2010CN201600389U 一种传感器支架 A sensor bracket
10/06/2010CN201600388U 印刷电路板测试治具的间隔连接柱 Interval column printed circuit board connection test fixture
10/06/2010CN1953276B Zero insertion force printed circuit assembly connector system and method
10/06/2010CN1945349B Flexible generating device for embedded AC motor complex fault
10/06/2010CN1900725B Lithographic contact elements
10/06/2010CN1877343B Voltage supply system for uninterrupted-power-supply detection of electronic product performance used in production line
10/06/2010CN1660559B Laser welding of resin members using a ridge for enhancing weld strength
10/06/2010CN101855559A Stiffener assembly for use with testing devices
10/06/2010CN101852838A Voltage withstand detection device for external conical equipment casing of high-voltage switch cabinet
10/06/2010CN101852834A Short circuit inspection device of low-efficiency solar battery
10/06/2010CN101852820A Digital installation meter
10/06/2010CN101852819A Automatic heat engine device of circuit board
10/06/2010CN101363884B Method for testing circuit board
10/06/2010CN101210938B PCB Connection method for implementing common use of four-density grid and eight-density grid in PCB test
10/06/2010CN101169455B Probe
10/06/2010CN101165494B Probe
10/05/2010US7809518 Method of calibrating an instrument, a self-calibrating instrument and a system including the instrument
10/05/2010US7808258 Test interposer having active circuit component and method therefor
09/2010
09/30/2010WO2010109705A1 Probe, and probe manufacturing method
09/30/2010US20100244875 Scrub inducing compliant electrical contact
09/30/2010DE102006047069B4 Verfahren zur Herstellung einer stabförmigen Messelektrode und stabförmige Messelektrode A method for preparing a rod-shaped measuring electrode and rod-shaped measuring electrode
09/30/2010CA2683871A1 Synchronizer for a data acquisition system
09/29/2010EP2233933A2 Wireless Clamp-On Current Probe
09/29/2010CN201594108U Wide-range transformer iron core grounding current on-line monitoring sensing device
09/29/2010CN201594097U Combined shell of measuring displaying meter
09/29/2010CN201594096U High-altitude testing pincer
09/29/2010CN1930737B Cable terminal with air-enhanced contact pins
09/29/2010CN1649120B Silicon-on-insulator channel architecture for automatic test equipment
09/29/2010CN101849188A Full raster cartridge for a parallel tester for testing an unpopulated printed circuit board, spring contact pin for such a full raster cartridge and adapter for testing an unpopulated printed circuit board
09/29/2010CN101846696A Probe and manufacturing method thereof
09/29/2010CN101846695A Test probe and probe base
09/29/2010CN101846694A Cantilever-type probe head
09/29/2010CN101431201B Clamping device
09/29/2010CN101424705B Probe column, wafer testing seat and wafer testing system
09/29/2010CN101261284B Wafer adsorption and unloading device capable of longitudinally elevating and horizontally rotating
09/29/2010CN101206249B Electronic load device
09/29/2010CN101082633B IC detecting machine capable of simultaneously multiple parallel built-in testing
09/29/2010CN101025426B Probe assembly
09/28/2010US7804312 Silicon wafer for probe bonding and probe bonding method using thereof
09/23/2010WO2010108089A2 Display device for measurement tool
09/23/2010WO2010105736A1 Test prods
09/23/2010CA2755915A1 Test prod for high-frequency measurement
09/22/2010EP2230527A2 Mechanism for fixing probe card
09/22/2010CN201590582U Test interface adapter
09/22/2010CN201589849U Printed circuit substrate testing mechanism integrating flying probe testing
09/22/2010CN201589841U Integral pressure resistance test device
09/22/2010CN201589823U Data acquisition unit of resistance card ageing test for lightning arrester
09/22/2010CN201589822U GPS board card testing device before assembly
09/22/2010CN201589821U Bridge rectifier DF - M testing machine
09/22/2010CN201589797U Three-phase alternating current load box
09/22/2010CN201589796U Electromagnetic wave darkroom
09/22/2010CN201589795U Detection probe structure
09/22/2010CN201589794U Liquid crystal screen testing clip
09/22/2010CN201589793U Motor testing auxiliary device
09/22/2010CN201589792U Picker
09/22/2010CN201589791U Heat dissipating device in POE function test of Ethernet switch
09/22/2010CN201589790U Table model measuring equipment with LCD screen
09/22/2010CN201589789U Lead wire clamping device for electric test
09/22/2010CN1812070B Probe card, method of manufacturing the probe card and alignment method
09/22/2010CN101839961A Test system and method
09/22/2010CN101839925A Signal source device
09/22/2010CN101329365B Probe clip and combined assembly method
09/21/2010US7798822 Microelectronic contact structures
09/16/2010WO2010105131A1 Probe head structure for probe test cards
09/16/2010WO2010104990A2 Pin electronics liquid cooled multi-module for high performance, low cost automated test equipment
09/16/2010WO2010104337A2 Probe card for testing film package
09/16/2010WO2010104303A2 Probe unit for testing panel
09/16/2010WO2010104289A2 Probe unit for testing panel
09/16/2010WO2010103892A1 Probe card
09/16/2010WO2010102801A1 Measuring device for electrically measuring a flat measurement structure that can be contacted on one side
09/16/2010US20100231249 Probe Head Structure For Probe Test Cards
09/16/2010US20100231200 Electrical Coil and Manufacruring Process Therefor
09/16/2010US20100231199 Oscilloscope Probe
09/15/2010CN201584754U High-voltage testing power supply quickly cutting device
09/15/2010CN201583629U Electron and circuit board testing device
09/15/2010CN201583568U Phase reversal device of test system of integrated circuit
09/15/2010CN201583567U Pneumatic clamping device of miniature breaker
09/15/2010CN201583566U Manual clamping device of miniature breaker
09/15/2010CN201583565U Pneumatic switching clamp device of plastic-shell circuit breaker
09/15/2010CN201583564U Fixture for detecting electric property of wire holder
09/15/2010CN201583563U Front-end processor cabinet for online monitoring of power equipment under large-temperature difference environment
09/15/2010CN201583562U Measuring clamp for bottom surface base pin LED
09/15/2010CN201583561U Measuring clamp of side surface pin LED
09/15/2010CN201583560U Testing jig of information module
09/15/2010CN201583559U Testing claw module interchange unit for QFN integrated circuit testing sorter
09/15/2010CN201583558U Motor locked-rotor mechanism
09/15/2010CN201583557U Detection device of automatic detection classifier
09/15/2010CN201583556U Closed constant flow water supply circulating cooling system with adjustable flow
09/15/2010CN201583555U Pressing device
09/15/2010CN201583554U Safety device of high-voltage movable testing room