Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
11/2010
11/10/2010CN101882720A Anisotropc conductive connector device and production method therefor and circuit device inspection device
11/10/2010CN101881788A Test turntable for transverse electromagnetic wave transmission cell and test method thereof
11/10/2010CN101881787A Multi-chip test probe device
11/10/2010CN101515017B Detection device of chip diode
11/10/2010CN101160532B Conductive contact holder and conductive contact unit
11/09/2010US7830135 Digital multimeter having housing sealing arrangement
11/09/2010US7830134 Power meter with means to eliminate the need to zero and calibrating
11/09/2010US7828981 Semiconductor probe with high resolution resistive tip and method of fabricating the same
11/04/2010WO2010124752A1 Measuring machine and measuring method for measuring differential signals
11/04/2010US20100277198 System and method for testing a characteristic impedance of an electronic component
11/04/2010US20100277196 Semiconductor test system and method
11/04/2010US20100277193 Probe
11/04/2010US20100277192 Manufactoring method of semiconductor integrated circuit device
11/04/2010US20100277191 Spring contact pin for an ic test socket and the like
11/04/2010US20100277190 Probe with high-precision dc-voltage measurement
11/04/2010DE10320381B4 Platinentestvorrichtung mit schrägstehend angetriebenen Kontaktiernadeln Board test device with obliquely driven contacting needles
11/04/2010DE102007005719B4 Befestigungsanordnung zur Fixierung eines elektrischen Sensors in einer Nut Mounting arrangement for fixing an electrical sensor in a groove
11/03/2010CN201622313U Thermal resistance full-automatic test grading device
11/03/2010CN201622289U Series-resonant automatic voltage stabilizer
11/03/2010CN201622288U Clamp for radio-frequency testing of semiconductor chip
11/03/2010CN201622287U Liquid crystal panel testing clamp
11/03/2010CN201622286U Solar battery attenuation test-dedicated pressing frame
11/03/2010CN201622285U Solar battery attenuation test insolation frame
11/03/2010CN201622284U Insulation testing track for automatic high-voltage tester
11/03/2010CN201622283U Device for overturning and crimping auxiliary terminal of electricity use information-collecting terminal for power consumers
11/03/2010CN101878431A Probe
11/03/2010CN101877263A Actively shielded high-value Hamon resistor
11/03/2010CN101876679A Testing device of a flat-plate shaped body to be tested
11/03/2010CN101876668A Rotating mechanism of bearing platform for detection
11/03/2010CN101441625B Method for counting use amount of probe card by using probe card tester
11/03/2010CN101315405B Semiconductor component test station with detachable electric property detecting system
11/02/2010CA2555744C Test fixture for assembled wireless devices
10/2010
10/28/2010US20100271060 Membrane probing method using improved contact
10/28/2010US20100271059 method of determining an electrical property of a test sample
10/28/2010US20100271058 System and method for probing work pieces
10/28/2010US20100271038 Differential-mode current sensor method
10/28/2010US20100271006 Start test electronic device and system and method of use thereof
10/27/2010CN201615933U 一种电力测量仪表 An electrical measuring instruments
10/27/2010CN201615914U 一种新型圆柱电池探针 A new cylindrical battery probe
10/27/2010CN201615913U 示波器探头存放盒 Oscilloscope Probes storage box
10/27/2010CN201615912U 一种调整飞机模型姿态试验的绝缘支架 A method for adjusting the attitude test aircraft model insulating bracket
10/27/2010CN201615911U 一种线缆测试仪转接箱 One kind of cable tester adapter box
10/27/2010CN101871957A Electromagnetic test fixture
10/27/2010CN101871956A Test clamp
10/27/2010CN101871955A Circuit breaker electrifying information detection and display device
10/27/2010CN101871954A Instrumentation general system on chip (SOC)
10/27/2010CN101871953A Hydraulic-type constant-pressure track branch testing clamp
10/27/2010CN101351080B Printed circuit board
10/27/2010CN101339204B Disc conveyer device
10/26/2010US7821255 Test system with wireless communications
10/26/2010US7819672 Electrical connecting apparatus with inclined probe recess surfaces
10/21/2010US20100267290 Spring connector and terminal device
10/21/2010US20100264949 Flexure band and use thereof in a probe card assembly
10/21/2010US20100264947 Closed-grid bus architecture for wafer interconnect structure
10/21/2010US20100264946 Test and measurement instrument and method of configuring using a sensed impedance
10/21/2010US20100264905 Arrangement for the potential-free measurement of currents
10/21/2010US20100263432 Methods for planarizing a semiconductor contactor
10/21/2010DE202010007229U1 Hochfrequenz-Prüfstift und Hochfrequenz-Prüfanordnung High-frequency and high-frequency test pin test set-
10/21/2010DE202010007227U1 Hochfrequenz-Prüfstift und Hochfrequenz-Prüfanordnung High-frequency and high-frequency test pin test set-
10/20/2010CN201611720U 连接器 Connector
10/20/2010CN201611352U 一种mosfet的测试电路 One kind of a test circuit mosfet
10/20/2010CN201611351U 多用户集中式电能表外壳 Multi-user centralized meter housing
10/20/2010CN101867111A Spring connector and terminal device
10/20/2010CN101865972A Detector
10/20/2010CN101865939A Generation device for very fast transient overvoltage
10/20/2010CN101865938A Probe card assembly and probe base therein
10/20/2010CN101865937A Multilayer probe set and manufacturing method thereof
10/19/2010US7815438 Needle-like member, conductive contact, and conductive contact unit
10/14/2010WO2010117521A1 Non-intrusive electric alternating current sensor
10/14/2010WO2010117080A1 Probe holder and probe unit
10/14/2010WO2010117058A1 Contact probe and probe unit
10/14/2010WO2010117034A1 Probe card
10/14/2010WO2010115771A1 Automated multi-point probe manipulation
10/14/2010US20100259290 Cantilever type probe head
10/13/2010EP2239587A1 Probe unit
10/13/2010EP2238466A1 Method and device for transporting electronic modules
10/13/2010EP2238461A1 Module for a parallel tester for testing of circuit boards
10/13/2010EP2238429A1 Degradation sensor
10/13/2010CN201608279U 一种测试接线单元及具有该测试接线单元的接线排 A test line unit and have the test terminal block wiring unit
10/13/2010CN201607516U 电源滤波器电流型加载试验装置 Power filter current-loading test apparatus
10/13/2010CN201607505U 用于测试网络信号变压器参数的测试套件 Transformer parameters for testing network signal test suite
10/13/2010CN201607496U 按键式模拟测试装置 Touchtone simulation test device
10/13/2010CN201607474U 密封保护式电力测量显示仪表 Seal protection type power meter measurements show
10/13/2010CN201607461U 电力计量箱进出表配线装置 Electricity metering box out table Wiring Devices
10/13/2010CN201607460U 一种gis设备耐压试验接地装置 One kind of pressure test equipment grounding device gis
10/13/2010CN201607459U 高压开关测试用夹具 High pressure switch test jig
10/13/2010CN201607458U 一种大电流夹具 One kind of high current clamp
10/13/2010CN201607457U 自动测试机喷头装置 Automatic testing machine nozzle device
10/13/2010CN1745310B Wrist joint for positioning a test head
10/13/2010CN101861524A Method and apparatus for identifying broken pins in a test socket
10/13/2010CN101858957A Ageing test box
10/13/2010CN101858954A Circuit board testing device
10/13/2010CN101858934A Method and system for implementing program controlled alternating current source
10/13/2010CN101858933A Three-phase heavy current generator for detecting current transformer on power line
10/13/2010CN101231307B Test arrangement capable of preventing electromagnetic interference and test approach thereof
10/13/2010CN101082631B IC detecting machine capable of simultaneously multiple parallel built-in testing
10/07/2010WO2010114164A1 Spring wire, contact probe, and probe unit
10/07/2010WO2010112584A1 Contact-connection unit for a test apparatus for testing printed circuit boards
10/07/2010US20100253377 Active wafer probe
10/07/2010US20100253157 Multiplexed voltage and current signaling
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