Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
10/2003
10/02/2003WO2003006918A3 Method and apparatus for increasing signal to noise ratio in a photoacoustic film thickness measurement system
10/02/2003US20030187610 Color vision vehicle wheel alignment system
10/02/2003US20030186136 Separated beam multiple degree of freedom interferometer
10/02/2003US20030186134 Interferometrically measuring first and second optical path lengths to a measurement object along respective first and second paths; compensating the first measured optical path length for time-varying optical properties of gas
10/02/2003US20030186132 Optical alignment test structure patterns on photomasks used to determine field-to-field alignment of a stepper in lithography
10/02/2003US20030185664 Alignment apparatus for substrates
10/02/2003US20030185435 Data processing method, data processing program and recording medium
10/02/2003US20030185433 Side lit, 3D edge location method
10/02/2003US20030185429 Method and apparatus for quantitatively evaluating scintillation, antiglare film and method of producing the same
10/02/2003US20030185425 Finger movement detection method and apparatus
10/02/2003US20030185349 Device for a non-contact measurement of distance at a radiotherapy of the human body
10/02/2003US20030184769 Patterned implant metrology
10/02/2003US20030184768 Accuracy analyzing apparatus for machine tool
10/02/2003US20030184767 Method and apparatus for optical measurement of the leading edge position of an airfoil
10/02/2003US20030184766 Moire grating noise eliminating method
10/02/2003US20030184765 Apparatus for measuring a measurement object
10/02/2003US20030184764 Method and system for high speed measuring of microscopic targets
10/02/2003US20030184763 Spherical form measuring and analyzing method
10/02/2003US20030184762 Apparatus for and method of measurement of aspheric surfaces using hologram and concave surface
10/02/2003US20030184761 System and method for surface profiling
10/02/2003US20030184752 Method and apparatus for precision alignment and assembly of opto-electronic components for fiber-optic networks
10/02/2003US20030184744 Surface inspection method and surface inspection system
10/02/2003US20030184743 Edge flaw inspection device
10/02/2003US20030184742 Wafer metrology apparatus and method
10/02/2003US20030184732 System and method of broad band optical end point detection for film change indication
10/02/2003US20030184719 Exposure apparatus
10/02/2003US20030184439 Passenger detecting apparatus
10/02/2003US20030182810 Steering angle detector
10/01/2003EP1349106A1 Finger movement detection method and apparatus
10/01/2003EP1348986A2 Illuminating apparatus for image processing in measuring machines
10/01/2003EP1348947A1 Apparatus for semiconductor wafer edge inspection
10/01/2003EP1348945A1 Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminescence device
10/01/2003EP1348934A2 Accuracy analyzing apparatus for machine tool
10/01/2003EP1348932A2 Method and apparatus for monitoring wall thickness of blow-molded plastic containers
10/01/2003EP1348931A2 Rolling and lathing parameter measuring device by artificial viewing for railway vehicles wheels
10/01/2003EP1348376A2 Device for non-contact measurement of a distance whilst irradiating a human body
10/01/2003EP1348150A1 Method of measuring overlay
10/01/2003EP1042643B1 Device for determining the wheel and/or axle geometry of motor vehicles
10/01/2003CN2577239Y Potable laser collimator
10/01/2003CN2577238Y Measuring device for interference of flat-plate surface appearance
10/01/2003CN2577237Y Static-displacement real-time interference measuring device
10/01/2003CN1445612A Method for manufacturing photoetching equipment and device
10/01/2003CN1122856C Method for measuring guide track
10/01/2003CN1122821C Confocal scan method for detecting surface shape of material
10/01/2003CN1122820C Method and device for measuring and calculating curvature radius of quenched bent rib
09/2003
09/30/2003US6628410 Endpoint detector and method for measuring a change in wafer thickness in chemical-mechanical polishing of semiconductor wafers and other microelectronic substrates
09/30/2003US6628406 Self referencing mark independent alignment sensor
09/30/2003US6628405 Optical angle finder and coaxial alignment device
09/30/2003US6628402 Phase interference detecting method and system in interferometer, and light detector therefor
09/30/2003US6628399 Method and device real time non-destructive determination of residual stresses in objects by the optical holographic interferometry technique
09/30/2003US6628397 Apparatus and methods for performing self-clearing optical measurements
09/30/2003US6628392 Optical and electro-optical apparatus comprising nanostructure apertures, in layouts for controlling intensity from light sources, used as switches or shutters
09/30/2003US6628390 Wafer alignment sensor using a phase-shifted microlens array
09/30/2003US6628389 Method and apparatus for measuring cell gap of VA liquid crystal panel
09/30/2003US6628384 Calibration and determination of electrode spacings by coupling direct current voltage having spectral emitter gases comprising hydrogen or helium in the spacings, then evaluating wavelengths using spectrometers
09/30/2003US6628378 Methods and apparatus for aligning rolls
09/30/2003US6628322 Device and method for positioning a measuring head on a noncontact three-dimensional measuring machine
09/30/2003US6627863 System and methods to determine the settings of multiple light sources in a vision system
09/30/2003CA2152887C Non destructive examination process for surface finish
09/26/2003CA2421444A1 Method and apparatus for monitoring wall thickness of blow-molded plastic containers
09/25/2003WO2003079292A1 Defect inspection method
09/25/2003WO2003078987A1 Mutli-detector defect detection system and a method for detecting defects
09/25/2003WO2003078928A1 Determining object orientation and defects with a camera for a rotator (aligned lables of beverages cans)
09/25/2003WO2003078927A1 Device for contactless inspection of linear dimensions of three-dimensional objects
09/25/2003WO2003078926A1 Device for contactless inspection of linear dimensions of three-dimensional objects
09/25/2003WO2003078925A2 Surface profiling apparatus
09/25/2003WO2003078920A2 Method and device for determining the absolute coordinates of an object
09/25/2003WO2003077815A1 Apparatus and method for making and inspecting pre-fastened articles
09/25/2003WO2003077814A1 Infrared detection of composite article components
09/25/2003WO2003077813A1 Process for detection of marked components of a composite article using infrared blockers
09/25/2003WO2003033994B1 Measurement of complex surface shapes using a spherical wavefront
09/25/2003US20030180637 X/Y alignment vernier and method of fabricating same
09/25/2003US20030179921 Pattern inspection method and its apparatus
09/25/2003US20030179920 Inspection system for determining object orientation and defects
09/25/2003US20030179387 Displacement sensor
09/25/2003US20030179385 Surface shape measuring system
09/25/2003US20030179382 Use of electronic speckle interferometry for defect detection in fabricated devices
09/25/2003US20030179369 Wafer defect detection system with traveling lens multi-beam scanner
09/25/2003US20030179366 Deflection angle measuring device, optical signal switching system, information recording and replaying system, deflection angle measuring method, and optical signal switching method
09/25/2003US20030179362 Method of measuring length and coordinates using laser tracking interferometric length measuring instruments
09/25/2003US20030179357 Lithographic apparatus and device manufacturing method
09/25/2003US20030179353 Alignment device
09/25/2003US20030178587 Chemical-mechanical polishing apparatus and method for controlling the same
09/25/2003US20030178584 Imaging apparatus and method
09/25/2003US20030178556 Optical tactile sensor
09/25/2003US20030178549 Scannerless range imaging system having high dynamic range
09/25/2003US20030178283 Nethod for measuring the surface height of a material bed conducted on a conveyor belt to thermal treatment
09/24/2003EP1347636A2 A scannerless range imaging system having high dynamic range
09/24/2003EP1347501A1 Wavefront aberration measuring instrument, wavefront aberration measuring method, exposure apparatus, and method for manufacturing microdevice
09/24/2003EP1347417A2 Face detection computer program product for redeye correction
09/24/2003EP1347266A2 Device for measuring an object
09/24/2003EP1346310A2 Repetitive inspection system with intelligent tools
09/24/2003EP1346201A1 Device for ellipsometric two-dimensional display of a sample, display method and ellipsometric measurement method with spatial resolution
09/24/2003EP1346191A1 Device and method for measuring an object
09/24/2003EP1346190A1 Fibre-optical strain gauge and method for the production of said strain gauge
09/24/2003EP1345796A2 Method and device for detecting an object in a vehicle in particular for occupant protection systems
09/24/2003EP0998656B1 Interferometric calibration of laser ablation
09/24/2003CN2575604Y Outdoor metering display box
09/24/2003CN2575603Y Counter point device for mounting instrument
09/24/2003CN1444721A Two piece alignment head
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