| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 02/24/2004 | CA2350877C Timing ruler or timing disk |
| 02/19/2004 | WO2004015893A2 System and method for automatically calibrating an alignment reference source |
| 02/19/2004 | WO2004015831A1 Method for detecting projecting adherend and method for producing super plug using that method |
| 02/19/2004 | WO2004015727A2 Method for controlling a recess etch process |
| 02/19/2004 | WO2004015455A2 Improved method and system for scanning apertureless fluorescence microscope |
| 02/19/2004 | WO2004015368A1 A monitoring apparatus |
| 02/19/2004 | WO2004015367A1 Determining topography and composition of a sample by using an interferometer |
| 02/19/2004 | WO2004015366A1 Surface shape determining method and its device |
| 02/19/2004 | WO2004015365A1 Process endpoint detection method using broadband reflectometry |
| 02/19/2004 | WO2004015364A1 Method for in-situ monitoring of patterned substrate processing using reflectometry |
| 02/19/2004 | WO2004001332B1 System and method for determining 3-d coordinates of a surface using a coded array |
| 02/19/2004 | US20040033426 Alignment system uses a self-referencing interferometer that produces two overlapping and relatively rotated images of an alignment markers. |
| 02/19/2004 | US20040032974 Methods and apparatus for the dimensional measurement of livestock using a single camera |
| 02/19/2004 | US20040032803 Position control for plunge mechanism |
| 02/19/2004 | US20040032802 Position control for plunge mechanism |
| 02/19/2004 | US20040032597 Method for detecting and identifying defects in a laser beam weld seam |
| 02/19/2004 | US20040032596 Apparatus for determining relative positioning of objects and related methods |
| 02/19/2004 | US20040032595 Arrangement and method for producing photogrammetric image records |
| 02/19/2004 | US20040032594 Surface mapping and generating devices and methods for surface mapping and surface generation |
| 02/19/2004 | US20040032593 Process endpoint detection method using broadband reflectometry |
| 02/19/2004 | US20040032592 Method for in-situ monitoring of patterned substrate processing using reflectometry |
| 02/19/2004 | US20040032591 Wavelength determining apparatus, method and program for thin film thickness monitoring light |
| 02/19/2004 | US20040032587 Optical alignment system for power tool |
| 02/19/2004 | US20040032280 Integrated visual imaging and electronic sensing inspection systems |
| 02/19/2004 | US20040031924 Infrared sensor assembly and refrigerator having the infrared sensor |
| 02/19/2004 | US20040031913 Method for measuring position and position measuring device for carrrying out said method |
| 02/19/2004 | US20040031335 Bulk materials management apparatus and method |
| 02/19/2004 | US20040031274 Infrared sensor assembly and refrigerator having the infrared sensor |
| 02/19/2004 | DE19818190B4 Verfahren und Vorrichtung zur berührungslosen Messung der Wanddicke Method and device for contactless measurement of the wall thickness |
| 02/19/2004 | DE10254104A1 Fuel injector diameter measurement method in which a pressurized liquid is forced through the injector bore hole and the diameter of the resultant liquid jet on the output side is measured and related to the injector bore diameter |
| 02/19/2004 | DE10236769A1 Physiological data measurement device for use in estimating a person's age so that vehicle safety restraining mechanisms can be adjusted to take their age into consideration |
| 02/19/2004 | DE10236756A1 Device for measuring the wall thickness of a pipe in a rolling mill has lamp emitting a bundled light and fixed to different sites on a measuring head |
| 02/19/2004 | DE10236692A1 Optical topometer for simultaneous determination of surface topometry and material properties, in which surface height is determined on a point by point basis in addition to the ellipsometric angle |
| 02/19/2004 | DE10208781B4 Verfahren zum Bestimmen der Intensitätsverteilung beim Auftreffen eines Laserstrahls auf eine Objektoberfläche A method for determining the intensity distribution of a laser beam when impinging on an object surface |
| 02/19/2004 | DE10157850B4 Verfahren und Vorrichtung zur hochpräzisen Bestimmung der Topographie einer Oberfläche Method and apparatus for high-precision measurement of the topography of a surface |
| 02/18/2004 | EP1389441A1 Diagnostic tomographic laser imaging apparatus |
| 02/18/2004 | EP1084462B1 Method for high precision optical distance measurement using an adjustable point light source and multi-channel ccd sensor arrays based on optical triangulation and point by point scanning, especially contactless measurement of three dimensional objects |
| 02/18/2004 | CN2603938Y Three-dimensional digital display big spacing CTOD reading instrument |
| 02/18/2004 | CN1476506A Device for measuring rail segment for magnetic levitation railway |
| 02/18/2004 | CN1475795A Glass Bottle and can detecting method and detecting device |
| 02/18/2004 | CN1475774A Infra red sensor component part and refrigerator having said infra red sensor |
| 02/18/2004 | CN1475770A Position detecting device |
| 02/18/2004 | CN1475764A Infra red sensor component part and refrigerator having said infra red sensor |
| 02/18/2004 | CN1138970C Method for measuring diameter of elongated article of circular cross section |
| 02/18/2004 | CN1138969C High-frequency light intensity modulated green laser weak signal distance and thickness measuring system |
| 02/17/2004 | US6693716 Method and apparatus for optical measurement of a surface profile of a specimen |
| 02/17/2004 | US6693715 Fringe analysis method using fourier transform |
| 02/17/2004 | US6693712 High rate optical correlator implemented on a substrate |
| 02/17/2004 | US6693705 Apparatus for measuring slant angle of solid immersion lens |
| 02/17/2004 | US6693293 Surface inspection apparatus using radiation or light |
| 02/17/2004 | US6693286 Method for evaluating the quality of a semiconductor substrate |
| 02/17/2004 | US6693275 Method and apparatus for inspecting blow molded containers |
| 02/17/2004 | US6691565 Steering angle sensor, system, method, and incremental track thereof |
| 02/12/2004 | WO2004013723A2 Model and parameter selection for optical metrology |
| 02/12/2004 | WO2004013572A1 Curved shape inspection method and device |
| 02/12/2004 | WO2004013571A1 A multipoint position sensor for providing information regarding the position of a light point projected onto a screen |
| 02/12/2004 | WO2004013566A2 System and method for imaging of coated substrates |
| 02/12/2004 | WO2004013565A2 Fringe pattern discriminator for grazing incidence interferometer |
| 02/12/2004 | WO2004012999A2 Ultraviolet bottle coating thickness measurement |
| 02/12/2004 | WO2003095940A3 Compensation for geometric effects of beam misalignments in plane mirror interferometers |
| 02/12/2004 | WO2003052800B1 Semiconductor wafer carrier mapping sensor |
| 02/12/2004 | WO2003046476A3 Method and system for determining symmetry of the steering system of a vehicle |
| 02/12/2004 | US20040030529 Position measuring device |
| 02/12/2004 | US20040030519 System and method for automatically calibrating an alignment reference source |
| 02/12/2004 | US20040029028 Window between pattern layout; projecting laser beams; determination, calibration reflection |
| 02/12/2004 | US20040028311 Multiplexable fiber-optic strain sensor system with temperature compensation capability |
| 02/12/2004 | US20040028310 Multiplexable fiber-optic strain sensor system with temperature compensation capability |
| 02/12/2004 | US20040027589 Method for identifying measuring points in an optical measuring system |
| 02/12/2004 | US20040027588 Optical position transducer |
| 02/12/2004 | US20040027586 Processing apparatus, processing method and position detecting device |
| 02/12/2004 | US20040027585 Phase gap analysis for scanning interferometry |
| 02/12/2004 | US20040027584 Advanced signal processing technique for translating fringe line disturbances into sample height at a particular position above an interferometer's sample stage |
| 02/12/2004 | US20040027583 Pre-established reference scale for interferometric topological metrology |
| 02/12/2004 | US20040027582 Method and apparatus for determining sample composition with an interferometer |
| 02/12/2004 | US20040027581 Interferometric topological metrology with pre-established reference scale |
| 02/12/2004 | US20040027580 Method for automatic determination of optical parameters of a layer stack and computer program |
| 02/12/2004 | US20040027579 Fringe pattern discriminator for grazing incidence interferometer |
| 02/12/2004 | US20040027578 Method and apparatus for ultrasonic laser testing |
| 02/12/2004 | US20040027576 Interferometric optical systems having simultaneously scanned optical path length and focus |
| 02/12/2004 | US20040027561 Deflection angle detecting device |
| 02/12/2004 | US20040026635 Method and apparatus for discriminating latent fingerprint optical fingerprint input apparatus |
| 02/12/2004 | US20040026622 System and method for imaging of coated substrates |
| 02/12/2004 | US20040026618 Submerged sample observation apparatus and method |
| 02/12/2004 | US20040026373 Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs |
| 02/12/2004 | US20040025579 Submerged sample observation apparatus and method |
| 02/12/2004 | DE19741855B4 Optoelektronische Sensoreinrichtung Optoelectronic sensor device |
| 02/12/2004 | DE19517029B4 Verfahren zur Bestimmung der Höhe eines Fahrzeuges mit Hilfe einer das Fahrzeug aufnehmenden Videokamera und Vorrichtung zur Durchführung des Verfahrens A method for determining the height of a vehicle by means of a video camera receiving the vehicle and a device for carrying out the method |
| 02/12/2004 | DE10320991A1 Optical position measurement device has a mirror based beam deflection unit for controlling the position of a sampling light beam that can be independently adjusted and aligned |
| 02/12/2004 | DE10247319B3 Determining movement or angle of rotation from indicator tracks on cylinder, takes into account angular error in phase sensor mounting and corrects it |
| 02/12/2004 | DE10244552B3 Interferometric measuring device for determining the shape, roughness or distance of the surface of a measurement object comprises a measurement probe coupled to an interferometer via an optical fiber arrangement |
| 02/12/2004 | DE10235669A1 Laser-based position measurement instrument of the interferometer or diffraction grating type is configured so that a single mode laser source interacts with feedback means to cause excitation of multimode operation |
| 02/12/2004 | DE10233372A1 3D object measurement method and metrology system, whereby at least 3D and 2D object measurement devices are used and the first measurement set is used to create correction values for the second measurement process |
| 02/12/2004 | DE10232690A1 Verfahren und Vorrichtung zur dreidimensionalen Erfassung von Objekten sowie Verwendung der Vorrichtung und des Verfahrens Method and apparatus for three-dimensional detection of objects as well as using the apparatus and method |
| 02/12/2004 | DE10230614B3 Opto-electronic equipment making reference marks on measurement grid plate, has reference mark modules in specified disposition with sensor configurations |
| 02/12/2004 | DE10110969B4 Verfahren zur Erfassung von out-of-plane-Oberflächenverformungen A method for detecting out-of-plane surface deformations |
| 02/12/2004 | CA2494884A1 System and method for imaging of coated substrates |
| 02/11/2004 | EP1387998A1 Sensor system and method incorporating fibre bragg gratings |
| 02/11/2004 | EP1387996A2 Method for measuring and/or machining a workpiece |
| 02/11/2004 | EP0981733B1 Grating based phase control optical delay line |
| 02/11/2004 | EP0786071B1 On-axis mask and wafer alignment system |