Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/2003
08/28/2003CA2475046A1 Tracking assisted optical coherence tomography
08/27/2003EP1338862A1 Optical method and device for performing geometrical measurements
08/27/2003EP1337880A1 Non-contact measurement device for accurately determining angular measurements in relation to plumb and level
08/27/2003EP1337873A2 System and method for optically sensing motion of objects
08/27/2003EP1337804A1 Method and device for non-destructive real-time measurements of residual stresses in planar and non-planar objects
08/27/2003EP1337803A1 Interferometric measuring device
08/27/2003EP1234158B1 Distortion detector
08/27/2003EP0894240B1 Electro-optical measuring device for determining the relative position of two bodies, or of two surface areas of bodies, in relation to each other
08/27/2003EP0823037B1 Method and system for triangulation-based 3-d imaging utilizing an angled scanning beam of radiant energy
08/27/2003CN1439096A Lighting arrangement for automated optical inspection system
08/27/2003CN1439091A Method and apparatus for measuring vehicle wheel scrub radius
08/27/2003CN1439090A Method and system for conducting wheel alignment
08/27/2003CN1438836A Method for positioning on base and placing view-point characteristic of semiconductor piece
08/27/2003CN1438469A Wire-width measuring method and apparatus thereof
08/27/2003CN1119647C Apparatus and method for generating image of surface to pography enhancement of object
08/27/2003CN1119646C Langqi raster schlieren instrument for measuring surficial shape of object
08/27/2003CN1119623C Determination method of spherical tank volume
08/27/2003CN1119622C Measuring method for three dimension surface contour of optic lens with free cured surface
08/27/2003CN1119241C Method of gauging engraved cups
08/27/2003CN1119235C Method and device for checking material band width
08/26/2003US6611791 Method for combining partially measured data
08/26/2003US6611787 Object measuring and weighing apparatus
08/26/2003US6611617 Scanning apparatus and method
08/26/2003US6611345 Method and device for determining the position of an object having faces and edges, and a positioning system
08/26/2003US6611344 Apparatus and method to measure three dimensional data
08/26/2003US6611343 Method and device for 3D measurement
08/26/2003US6611338 Method and apparatus for the interferometric examination of scattering objects
08/26/2003US6611331 Method of measuring surface form of semiconductor thin film
08/26/2003US6611330 System for measuring polarimetric spectrum and other properties of a sample
08/26/2003US6611141 Hybrid 3-D probe tracked by multiple sensors
08/26/2003US6610992 Rotating beam method and system for measuring part edges and openings
08/26/2003US6610991 Electronics assembly apparatus with stereo vision linescan sensor
08/26/2003US6609305 Process and device for determining the axial position of two machine spindles
08/21/2003WO2003069667A1 Polarization analyzing method
08/21/2003WO2003069392A2 Optical rotating transmitter having a free inside diameter
08/21/2003WO2003069384A1 Fiber optical plate and irregular pattern detection device
08/21/2003WO2003069286A2 Method and apparatus to measure fiber optic pickup errors in interferometry systems
08/21/2003WO2003069278A1 Optical displacement sensor
08/21/2003WO2003069277A1 Portable coordinate measurement machine with integrated line laser scanner
08/21/2003WO2003069276A1 Position measuring method, exposure method, and device producing method
08/21/2003WO2003069273A2 Separated beam multiple degree of freedom interferometer
08/21/2003WO2003069267A1 Portable coordinate measurement machine with articulated arm
08/21/2003WO2003069266A2 An articulated arm for a portable coordinate measurement machine
08/21/2003WO2003069264A2 Characterization and compensation of non-cyclic errors in interferometry systems
08/21/2003WO2003069263A2 System for detecting anomalies and/or features of a surface
08/21/2003WO2003068889A1 Profile refinement for integrated circuit metrology
08/21/2003WO2003068058A1 Determining relative positional and rotational offsets
08/21/2003WO2002013140A3 Camera calibration for three-dimensional reconstruction of objects
08/21/2003US20030156737 Vehicle area detecting apparatus and vehicle area determining method
08/21/2003US20030156297 Calibration methods for placement machines incorporating on-head linescan sensing
08/21/2003US20030156289 Laser alignment target and method
08/21/2003US20030156279 Low force optical fiber auto-alignment system
08/21/2003US20030156276 Aberration mark and method for estimating overlay error and optical aberrations
08/21/2003US20030154613 Differential bending and/or subsidence detector and method for monitoring a structure
08/21/2003US20030154609 Chassis alignment system
08/21/2003CA2513203A1 Optical displacement sensor
08/20/2003EP1336899A1 Lithographic apparatus, alignment method and device manufacturing method
08/20/2003EP1336819A2 Advanced applications for 3-D autoscanning lidar system
08/20/2003EP1336817A2 Apparatus and method for determining the relative attitude of two bodies
08/20/2003EP1336095A2 Measurement of surface defects
08/20/2003EP1336094A2 Measurement of surface defects
08/20/2003EP1336076A1 Method and device for analysing the surface of a substrate
08/20/2003EP1335840A2 Height control system and sensor therefor
08/20/2003EP1335833A1 Radiometric measuring of thin fluid films
08/20/2003EP1221076B1 Micropositioning system
08/20/2003CN2567585Y Hand circuit substrate testing machine
08/20/2003CN2567544Y Optical detection device with high-intensity lighting device
08/20/2003CN1437063A Method and apparatus for generating range subject distance image
08/20/2003CN1437015A Fluorophor detecting method and fluorophor detecting apparatus
08/20/2003CN1437000A Projecting grating method and device for measuring 3D surface shape of object
08/20/2003CN1118718C Scanner
08/20/2003CN1118680C Laser self-collimation collimator
08/19/2003US6609086 Profile refinement for integrated circuit metrology
08/19/2003US6608921 Inspection of solder bump lighted with rays of light intersecting at predetermined angle
08/19/2003US6608689 Combination thin-film stress and thickness measurement device
08/19/2003US6608688 Wireless optical instrument for position measurement and method of use therefor
08/19/2003US6608687 On line measuring of golf ball centers
08/19/2003US6608686 Measurement of metal electroplating and seed layer thickness and profile
08/19/2003US6608676 System for detecting anomalies and/or features of a surface
08/19/2003US6608673 Method and apparatus for obtaining optical center lens, attaching lens to a lens holder, and producing lens
08/19/2003US6608666 Reference plate, exposure apparatus, device manufacturing system, device manufacturing method, semiconductor manufacturing factory, and exposure apparatus maintenance method
08/19/2003US6608495 Eddy-optic sensor for object inspection
08/19/2003US6608320 Electronics assembly apparatus with height sensing sensor
08/14/2003WO2003067546A2 Method for dynamic measuring the position and the orientation of a wheel
08/14/2003WO2003067509A1 Arrangement and method for measurement on a resonant oscillator, control thereof and setting of a pixel width
08/14/2003WO2003067351A2 Stabilisation and control of aircraft and other objects
08/14/2003WO2003067246A2 Use of electronic speckle interferometry for defect detection in fabricated devices
08/14/2003WO2003067233A1 Surface contour recognition device
08/14/2003WO2003067197A1 Optical torque and angle sensor
08/14/2003WO2003067196A1 Optical angle and torque sensor
08/14/2003WO2003067188A1 Method and device for optically measuring the surface shape and for the optical surface inspection of moving strips in rolling and processing installations
08/14/2003WO2003067187A1 Device and procedure for aligning of components
08/14/2003WO2003067186A1 Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements
08/14/2003WO2003067185A1 A sensing device for measuring the three dimension shape and its measuring method
08/14/2003WO2003067184A1 Optical method and device for performing geometrical measurements
08/14/2003WO2003067183A2 Wireless substrate-like sensor
08/14/2003WO2003066386A2 Head position sensor
08/14/2003US20030154050 Method and apparatus for determining ride height of a vehicle
08/14/2003US20030152290 Range adaptable system for determining the angular position and distance of a radiating point source and method of employing
08/14/2003US20030151751 Measurement of metal electroplating and seed layer thickness and profile