| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/08/2004 | WO2003029752A3 Co-ordinate measuring device |
| 01/08/2004 | WO2003025496A3 Optical method measuring thin film growth |
| 01/08/2004 | WO2002097534A3 Apparatus and method for aligning an article with a reference object |
| 01/08/2004 | WO2002054132A3 System for automatically adjusting a lens power through gaze tracking |
| 01/08/2004 | US20040005727 Device and method for automatically determining the surface quality of a bonding interface between two wafers |
| 01/08/2004 | US20040005403 Part including a part support, a sprayer, a part measurer including a digital camera and a display device, all of which are positioned adjacent to the part support. The sprayer applies a coating to a section of the part while the part |
| 01/08/2004 | US20040005402 Method for simultaneously coating and measuring parts |
| 01/08/2004 | US20040005092 Coded-array technique for obtaining depth and other position information of an observed object |
| 01/08/2004 | US20040005091 Topographic measurement using stereoscopic picture frames |
| 01/08/2004 | US20040005088 Method and system for monitoring breathing activity of an infant |
| 01/08/2004 | US20040004762 Method of calibrating a stereomicroscope and a stereomicroscope capable of being calibrated |
| 01/08/2004 | US20040004730 Method for improved dielectric layer metrology calibration |
| 01/08/2004 | US20040004729 Inspection device of a tape reel |
| 01/08/2004 | US20040004727 Three-dimensional shape measuring method, and three-dimensional shape measuring apparatus |
| 01/08/2004 | US20040004726 Overlay targets with isolated, critical-dimension features and apparatus to measure overplay |
| 01/08/2004 | US20040004725 Measurement system for electromagnetic radiation structure |
| 01/08/2004 | US20040004724 Spin etcher with thickness measuring system |
| 01/08/2004 | US20040004723 Position measuring system |
| 01/08/2004 | US20040004715 Method for Raman imaging of semiconductor materials |
| 01/08/2004 | US20040004713 Method of and apparatus for detecting a defect at the outer peripheral edge of a wafer, and cleaning equipment comprising the apparatus |
| 01/08/2004 | US20040004712 Apparatus and method for normalization of a drilling tool to a work surface |
| 01/08/2004 | US20040003776 Apparatus for simultaneously coating and measuring parts |
| 01/08/2004 | US20040003739 Radiometric measuring of thin fluid films |
| 01/08/2004 | DE10226801A1 Oberflächenmessvorrichtung und Verfahren zur mechanischen sowie berührungslosen-optischen Untersuchung von Objektoberflächen Surface measuring apparatus and methods for mechanical and non-contact optical investigation of object surfaces |
| 01/08/2004 | DE10225418A1 Meßvorrichtung zum Messen von Positionen oder Bewegungen A measuring device for measuring positions or movements |
| 01/08/2004 | DE10225193A1 Verfahren zur Kalibrierung eines Stereomikroskops sowie kalibrierbares Stereomikroskop A method for calibrating a stereo microscope and stereomicroscope calibratable |
| 01/08/2004 | DE10033817B4 Waferauflageplatte Wafer platen |
| 01/08/2004 | CA2490087A1 Delivery of metered amounts of liquid materials |
| 01/07/2004 | EP1378900A2 Optical information recording medium and method of manufacturing same |
| 01/07/2004 | EP1378790A2 Method and device for correcting lens aberrations in a stereo camera system with zoom |
| 01/07/2004 | EP1377793A1 Long-base, stretched fibre-optic, bragg network extensometer and production method for same |
| 01/07/2004 | EP1060139B1 Automatic melt stream positioning device |
| 01/07/2004 | CN2597944Y Apparatus for measuring workpiece parallel degree |
| 01/07/2004 | CN2597943Y Standard measuring tool using laser space position to display radioactive ray working point |
| 01/07/2004 | CN1466673A Method for measuring the geometry of an object by means of a co-ordination measuring device |
| 01/07/2004 | CN1466439A Method and device for determining a load axis of an extremity |
| 01/07/2004 | CN1465988A Laser position detector and method |
| 01/07/2004 | CN1133952C Apparatus and method for detecting image exist, optical assembly and accessing optical mode |
| 01/07/2004 | CN1133876C Apparatus and method for characterizing fiber crimps |
| 01/07/2004 | CN1133402C Method for measuring sizes of human body |
| 01/06/2004 | US6674893 Three-dimensional shape measuring apparatus |
| 01/06/2004 | US6674891 Cylindrical-shaped workpiece evaluation method and evaluation apparatus |
| 01/06/2004 | US6674890 Defect inspection method and apparatus therefor |
| 01/06/2004 | US6674572 Confocal microscopic device |
| 01/06/2004 | US6674534 Measuring system with improved method of reading image data of an object |
| 01/06/2004 | US6674531 Method and apparatus for testing objects |
| 01/06/2004 | US6674521 Optical method and system for rapidly measuring relative angular alignment of flat surfaces |
| 01/06/2004 | US6674517 Optical motion detector, transport system and transport processing system |
| 01/06/2004 | US6674512 Uses the known relative movement between interferometer support blocks and a reference member |
| 01/06/2004 | US6674511 Evaluation mask, focus measuring method and aberration measuring method |
| 01/06/2004 | US6674510 Off-axis levelling in lithographic projection apparatus |
| 01/06/2004 | US6674092 Thin film CMOS calibration standard having protective cover layer |
| 01/06/2004 | CA2259659C Automatic semiconductor wafer sorter/prober with extended optical inspection |
| 01/03/2004 | CA2434011A1 Method and apparatus for aligning diffraction grating |
| 01/02/2004 | EP1376464A1 Image processing device and method therefor and program codes, storing medium |
| 01/02/2004 | EP1376103A2 Method for determining local structures in optical crystals |
| 01/02/2004 | EP1376080A1 Stabilized Fabry-Perot interferometer with oblique reference beams |
| 01/02/2004 | EP1376065A2 Opto-electronic angle measuring device and method for manufacturing the same |
| 01/02/2004 | EP1376055A1 Construction laser apparatus |
| 01/02/2004 | EP1376052A2 System and method for automated focus measuring of a lithography tool |
| 01/02/2004 | EP1376051A1 Calibration of an image sensing system with a vehicle with a calibration object and a relative position sensor |
| 01/02/2004 | EP1375443A1 Method and apparatus for positioning a glass sheet prior to bending |
| 01/02/2004 | EP1374002A1 Image analysis apparatus |
| 01/02/2004 | EP1373959A2 Multiple-source arrays with optical transmission enhanced by resonant cavities |
| 01/02/2004 | EP1373867A1 Method and device for surface evaluation |
| 01/02/2004 | EP1373836A1 An improved displacement and torque sensor |
| 01/02/2004 | EP1373830A1 Surface profile measurement |
| 01/02/2004 | EP1373828A1 Method to measure features with asymmetrical profile |
| 01/02/2004 | EP1373827A1 Illumination device and method for illuminating an object |
| 01/02/2004 | EP1373826A1 Contact wire inspection with separate position determination |
| 01/02/2004 | EP1151260B1 Device for determining the bending stress of components |
| 01/01/2004 | US20040002172 Methods and apparatus for aligning a wafer in which multiple light beams are used to scan alignment marks |
| 01/01/2004 | US20040002164 By use of a pin like an optical fiber; sample of the liquid material is placed on the tip of the pin for delivery to a target area, such as a specific location on a microarray, in a contactless manner; light transmitted through pin is detected |
| 01/01/2004 | US20040002011 Photolithography; measuring adjustment mask; forming grid pattern; calibration |
| 01/01/2004 | US20040001206 Z-axis monitoring apparatus for robot blade |
| 01/01/2004 | US20040001205 Sample inclination measuring method |
| 01/01/2004 | US20040001197 Position measurement apparatus and method using laser |
| 01/01/2004 | US20040001195 Method of extracting circular region from fringe image |
| 01/01/2004 | US20040001192 System and method for automated focus measuring of a lithography tool |
| 01/01/2004 | US20040000627 Method for focus detection and an imaging system with a focus-detection system |
| 12/31/2003 | WO2004001427A2 Common-path frequency-scanning interferometer |
| 12/31/2003 | WO2004001354A1 Image sensing device and method of |
| 12/31/2003 | WO2004001332A1 System and method for determining 3-d coordinates of a surface using a coded array |
| 12/31/2003 | WO2004001330A2 Multi-stage data processing for frequency-scanning interferometer |
| 12/31/2003 | WO2003081190A3 Spectrally tunable detector |
| 12/31/2003 | WO2003071229B1 Rapid high resolution position sensor for auto steering |
| 12/31/2003 | WO2003046472A3 Method and device for detecting the shape of a three-dimensional object |
| 12/31/2003 | WO2002063236A3 Method and device for determining the contour of a recess in a piece of material |
| 12/31/2003 | WO2002061684A3 System and method for the measurement of the relative position of an object with respect to a point of reference |
| 12/31/2003 | CN2596322Y Absolute photoelectric encoding rule |
| 12/31/2003 | CN2596321Y Large size calibrating device with straightness analysis |
| 12/31/2003 | CN1464970A Self-calibrating, multi-camera machine vision measuring system |
| 12/31/2003 | CN1464969A Coordinate detector |
| 12/30/2003 | US6671574 Position detecting apparatus and library apparatus |
| 12/30/2003 | US6671423 Method of suppressing geometric distortion of an image space |
| 12/30/2003 | US6671092 Reflective measuring scale graduation and method for its manufacture |
| 12/30/2003 | US6671051 Apparatus and methods for detecting killer particles during chemical mechanical polishing |
| 12/30/2003 | US6671042 Multiple beam scanner for an inspection system |
| 12/30/2003 | US6670200 Layer-thickness detection methods and apparatus for wafers and the like, and polishing apparatus comprising same |
| 12/30/2003 | US6668661 Pressure distribution image analysis process |