Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
12/2003
12/02/2003US6658150 Image recognition system
12/02/2003US6658137 Road sensor system
12/02/2003US6657762 Optical barrier device
12/02/2003US6657737 Method and apparatus for measuring film thickness
12/02/2003US6657733 Method and apparatus for detecting ultrasonic surface displacements using post-collection optical amplification
12/02/2003US6657727 Interferometers for optical coherence domain reflectometry and optical coherence tomography using nonreciprocal optical elements
12/02/2003US6657726 In situ measurement of slurry distribution
12/02/2003US6657711 Vehicle wheel alignment measuring apparatus
12/02/2003US6657708 Apparatus for optically characterising thin layered material
12/02/2003US6657703 Exposure apparatus, maintenance method therefor, semiconductor device manufacturing method, and semiconductor manufacturing factory
12/02/2003US6657219 Optical detection and measurement system
12/02/2003US6657218 Method and apparatus for measuring gap, method and apparatus for measuring shape and method for manufacturing liquid crystal device
12/02/2003US6657216 Dual spot confocal displacement sensor
12/02/2003US6657185 Pattern detector for capturing images with reduced distortion
12/02/2003US6657181 Optical element used in compact interference measuring apparatus detecting plurality of phase difference signals
12/02/2003US6657156 Laser welding method and laser welding apparatus
12/02/2003US6656678 Impinging with a biocomponent (cells, antibodies, microorganisms) contained in a nutrient/osmotic protective medium; determining chemical or topographic characteristics by evaluating changes in color, shape, size or arrangement
12/02/2003US6656648 Pattern inspection apparatus, pattern inspection method and mask manufacturing method
12/02/2003US6655802 Method for producing eyeglasses
12/02/2003CA2284085C Topological and motion measuring tool
11/2003
11/27/2003WO2003098527A2 Apparatus comprising an optical input device and at least one further optical device having a common radiation source
11/27/2003WO2003098397A2 Method and apparatus for determining layer thickness and composition using ellipsometric evaluation
11/27/2003WO2003098333A1 Method of characterization of liquid crystal cell
11/27/2003WO2003098201A1 Surface defect judging method
11/27/2003WO2003098194A1 Point diffraction interferometer using inclined-section optical fiber light source and its measuring method
11/27/2003WO2003098148A1 A device for measuring in three dimensions a topographical shape of an object
11/27/2003WO2003097908A1 Device and method for spinning and depositing a tow
11/27/2003WO2003097430A1 Method of adjusting straight ahead traveling capability of vehicle
11/27/2003WO2003069263A3 System for detecting anomalies and/or features of a surface
11/27/2003WO2003066386A3 Head position sensor
11/27/2003WO2003058568A3 Obscuration detector
11/27/2003WO2003014659A3 Method and system for measuring the topography of a sample
11/27/2003WO2003008905B1 Method for measuring surface properties and co-ordinate measuring device
11/27/2003US20030219191 Actuator and sensor system for composite structures
11/27/2003US20030218758 Thickness measurement method and apparatus
11/27/2003US20030218757 Multi-axis interferometer
11/27/2003US20030218754 Apparatus and method for depositing optical thin film
11/27/2003US20030218743 Method and apparatus for detecting defects in a continuously moving strip of transparent material
11/27/2003US20030218742 Methods and systems for substrate surface evaluation
11/27/2003US20030218688 Method and apparatus for automatically optimizing optical contrast in automated equipment
11/27/2003US20030218607 Three-dimensional computer modelling
11/27/2003US20030218125 Sensor using roof mirror/roof prism array scale, and apparatus equipped with the sensor
11/27/2003US20030218122 Method for detecting objects and light barrier grid
11/27/2003DE10106699C2 Berührungssensor und Vorrichtung zum Schutz eines hervorstehenden Bauteils Touch sensor and device for protecting a protruding member
11/26/2003EP1365214A1 Sensor using roof mirror/roof prism array scale, and apparatus equipped with the sensor
11/26/2003EP1365209A1 Method for measuring gap of liquid crystal cell
11/26/2003EP1364239A2 Optical delay line
11/26/2003EP1287311B1 Device for acquiring a three-dimensional shape by optoelectronic process
11/26/2003CN2588322Y Optics diameter measurer for gallium arsenide monocrystal growth
11/26/2003CN1458543A Circular lighting device
11/26/2003CN1458540A Centre regulating method and its device for optical element
11/26/2003CN1458006A Method for detecting fatigue driving based on multiple characteristic fusion
11/26/2003CN1128982C 多功能三维测量机 Multifunctional three-dimensional measuring machine
11/25/2003US6654399 Semiconductor light projection apparatus and distance measurement apparatus
11/25/2003US6654132 Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
11/25/2003US6654131 Critical dimension analysis with simultaneous multiple angle of incidence measurements
11/25/2003US6654129 Film thickness testing apparatus and method
11/25/2003US6654127 Optical delay line
11/25/2003US6654113 Surface inspection apparatus
11/25/2003US6654111 Surface inspection apparatus and method
11/25/2003US6654107 Stepper lens aberration measurement pattern and stepper lens aberration characteristics evaluating method
11/25/2003US6654046 Method and apparatus for recording a three dimensional figure on a two dimensional surface allowing clothing patterns to be produced
11/25/2003US6654007 Coordinate input and detection device and information display and input apparatus
11/25/2003US6653650 Streamlined method and apparatus for aligning a sensor to an aircraft
11/25/2003US6653634 Method of measuring length with scanning type electron microscope
11/25/2003US6652355 Method and apparatus for detecting an end-point in chemical mechanical polishing of metal layers
11/25/2003US6651351 Coordinate measuring instrument with feeler element and optic sensor for measuring the position of the feeler
11/25/2003CA2272357C A system for determining the spatial position of a target
11/25/2003CA2222720C Method and apparatus for measuring outside dimensions and the center of gravity of a package
11/20/2003WO2003096391A2 System and method for controlling wafer temperature
11/20/2003WO2003096228A1 Video microscopy system and multi-view virtual slide viewer capable of simultaneously acquiring and displaying various digital views of an area of interest located on a microscopic slide
11/20/2003WO2003095942A2 System and method for control of paint thickness by using an optoacoustic technique
11/20/2003WO2003095941A2 System and method for controlling tube thickness with ultrasound
11/20/2003WO2003095940A2 Compensation for geometric effects of beam misalignments in plane mirror interferometers
11/20/2003WO2003095937A1 Device to determine the thickness of a conductive layer
11/20/2003WO2003095744A1 System and method for online control of paper elasticity and thickness
11/20/2003WO2003069286A3 Method and apparatus to measure fiber optic pickup errors in interferometry systems
11/20/2003WO2003064977A3 Multiple degree of freedom interferometer
11/20/2003WO2003054529A3 Method for mobile on- and off-line monitoring of coloured and high-gloss automobile component surfaces
11/20/2003WO2003014774A3 Amplified tree structure technology for fiber optic sensor arrays
11/20/2003WO2003014658A3 Method and apparatus for process control in the semiconductor manufacturing
11/20/2003WO2003010489A3 Method and apparatus for surface roughness measurement
11/20/2003WO2003001237A3 Optical 3d position measuring system for simultaneously detecting six degrees of freedom
11/20/2003WO2002090876A3 Method and apparatus for determining the coordinates of an object
11/20/2003US20030216012 Method and apparatus for crystallizing semiconductor with laser beams
11/20/2003US20030215965 Method and apparatus for position measurement of a pattern formed by a lithographic exposure tool
11/20/2003US20030215724 Monitoring method, exposure method, a manufacturing method for a semiconductor device, including an etching method and exposure processing unit
11/20/2003US20030215053 Interferometer system and method of manufacturing projection optical system using same
11/20/2003US20030214654 Spatial averaging technique for ellipsometry and reflectometry
11/20/2003US20030214647 Systems and methods for wavefront measurement
11/20/2003US20030213924 Optical distance measuring device and printing apparatus using the same
11/20/2003DE20312862U1 Steering alignment measuring device for bicycle, uses e.g. laser pointer attached to pedal axle to create theoretical reference plane perpendicular to pedal axle
11/20/2003CA2485414A1 Video microscopy system and multi-view virtual slide viewer capable of simultaneously acquiring and displaying various digital views of an area of interest located on a microscopic slide
11/19/2003EP1363153A1 Ring illuminator
11/19/2003EP1362234A1 Web inspection method and device
11/19/2003EP1362218A1 (dental) surface mapping and generation
11/19/2003EP1362217A1 A local track pitch measuring apparatus and method
11/19/2003EP1362216A1 Co-ordinate measuring device having a probehead for probing a workplace
11/19/2003EP1009984B1 Method and device for determining the phase- and/or amplitude data of an electromagnetic wave
11/19/2003CN1457427A Light scattering measuring probe
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