Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
05/2003
05/20/2003CA2234294C Inspection bench with pivoting arm
05/15/2003WO2003040771A2 Method and system for measuring thin films
05/15/2003WO2003040650A1 Zone plate, measuring method using it, and production method for projection optical system
05/15/2003WO2003040649A1 Method and device for measuring the physical characteristics of thin, optically transparent layers
05/15/2003WO2003040648A1 Interferometric cyclic error compensation
05/15/2003WO2003001143A3 Apparatus and method for measuring aspherical optical surfaces and wavefronts
05/15/2003US20030091730 Via shielding for power/ground layers on printed circuit board
05/15/2003US20030091351 Imaging system having media stack component measuring system
05/15/2003US20030091281 System and method for optical multiplexing and/or demultiplexing
05/15/2003US20030091228 Image recognition apparatus
05/15/2003US20030090682 Positioning in computer aided manufacturing by measuring both parts (cameras, retro reflectors)
05/15/2003US20030090681 Systems and methods for reducing position errors in image correlation systems during intra-reference-image displacements
05/15/2003US20030090680 Process and apparatus for determining surface information using a projected structure with a periodically changing brightness curve
05/15/2003US20030090678 Rapid in situ mastering of an aspheric fizeau with residual error compensation
05/15/2003US20030090677 Methods and apparatus for interferometric dimensional metrology
05/15/2003US20030090676 In-situ film thickness measurement using spectral interference at grazing incidence
05/15/2003US20030090675 Interferometric methods and apparatus for determining object position while taking into account rotational displacements and warping of interferometer mirrors on the object
05/15/2003US20030090674 System and method for performing selected optical measurements
05/15/2003US20030090671 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them
05/15/2003US20030090669 Thin-film inspection method and device
05/15/2003US20030090662 Alignment method, alignment apparatus, exposure apparatus using the same, and device manufactured by using the same
05/15/2003US20030090661 Focusing method, position-measuring method, exposure method, method for producing device, and exposure apparatus
05/15/2003US20030090651 Three-dimensional micropattern profile measuring system and method
05/15/2003US20030090640 Exposure method and apparatus
05/15/2003US20030090266 Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors
05/15/2003US20030089844 Linear scale measuring device and position detection method using the same
05/15/2003US20030089206 Method of aligning a workpiece in a cutting machine
05/15/2003US20030089050 Apparatus and method for improving quality of elevated concrete floors
05/14/2003EP1309987A2 Shape accuracy improvement using a novel calibration approach
05/14/2003EP1309897A2 Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography
05/14/2003EP1309849A2 Database interpolation method for optical measurement of diffractive microstructures
05/14/2003EP1309832A1 Self-calibrating 3D machine measuring system useful in motor vehicle wheel alignment
05/14/2003EP1141662B1 Three-dimensional measuring module
05/14/2003EP0956496B1 Method and apparatus for detecting an object
05/14/2003EP0920696B1 Phase-controlled evanescent field systems and methods
05/14/2003EP0857336B1 Method and apparatus for identifying characters on a plurality of silicon wafers
05/14/2003EP0745211B1 Grating-grating interferometric alignment system
05/14/2003CN2550720Y Vernier derivometer
05/14/2003CN2550719Y Optical fiber and grating sheet type package strainometer
05/14/2003CN2550718Y Thickness measurer
05/14/2003CN1417737A Free hand-written number string mold separator and separation method
05/14/2003CN1417567A Optical fiber test method and device
05/14/2003CN1417556A Transverse double-frequency zeeman laser linearity/coaxality measuring mechanism
05/14/2003CN1417008A Workpiece regulating method for cutting machine
05/14/2003CN1108636C Method and device for checking IC device shell pin
05/13/2003US6564166 Projection moiré method and apparatus for dynamic measuring of thermal induced warpage
05/13/2003US6564087 Fiber optic needle probes for optical coherence tomography imaging
05/13/2003US6564086 Prosthesis and method of making
05/13/2003US6563967 Fiber optic displacement sensor
05/13/2003US6563594 Mark position detecting system and method for detecting mark position
05/13/2003US6563593 Dynamic angle measuring interferometer
05/13/2003US6563592 Interferometric alignment device
05/13/2003US6563586 Wafer metrology apparatus and method
05/13/2003US6563578 In-situ thickness measurement for use in semiconductor processing
05/13/2003US6563574 Surveying apparatus
05/13/2003US6563570 Apparatus for evaluating a sample including a self-supporting thin film
05/13/2003US6563569 Laser tracking interferometric length measuring instrument and method of measuring length and coordinates using the same
05/13/2003US6563308 Eddy current loss measuring sensor, thickness measuring system, thickness measuring method, and recorded medium
05/13/2003US6563129 Method and device for the contactless measurement of the deformation of a specimen to be measured
05/13/2003US6563107 Topological and motion measuring tool
05/13/2003US6563098 High-precision displacement measurement device and method using unit displacement sensor based on confocal theory
05/13/2003US6562633 Assembling arrays of small particles using an atomic force microscope to define ferroelectric domains
05/13/2003US6561917 System and method for measuring a golfer's ball striking parameters
05/13/2003US6560883 Method and system for conducting wheel alignment
05/08/2003WO2003038493A1 Dual-parameter optical waveguide grating sensing device and sensor
05/08/2003WO2003038373A2 Characterization of optical preforms
05/08/2003WO2003038371A1 Displacement sensor
05/08/2003WO2003005793A3 Choice of reference markings for enabling fast estimating of the position of an imaging device
05/08/2003US20030088337 Position detecting device and takeout apparatus with position detecting device
05/08/2003US20030086097 Method and system for thin film characterization
05/08/2003US20030086096 Telemetry equipment for the two-dimensional or three-dimensional mapping of a volume
05/08/2003US20030086095 Apparatus and method for measuring a workpiece
05/08/2003US20030086094 Microforce measurement method and apparatus
05/08/2003US20030086093 All fiber autocorrelator
05/08/2003US20030086080 Apparatus and methods for reducing thin film color variation in optical inspection of semiconductor devices and other surfaces
05/08/2003US20030085890 Image processing apparatus
05/08/2003US20030085344 Dual-parameter optical waveguide grating sensing device and sensor
05/08/2003DE20120792U1 Measurement of width of continuous flat material, e.g. textile fabric, involves traversing edge sensor linked to computer
05/07/2003EP1308894A2 Image processing system for estimating the energy transfer of an occupant into an airbag
05/07/2003EP1307704A1 Measuring device and measuring method for determining distance and/or position
05/07/2003EP1307702A1 Frequency transform phase shifting interferometry
05/07/2003EP1307701A2 Two piece alignment head
05/07/2003EP1192291B1 Device for monitoring intended or unavoidable layer deposits and corresponding method
05/07/2003EP1189732B1 Method and device for calibrating robot measuring stations, manipulators and associated optical measuring devices
05/07/2003CN2549430Y Optical fiber raster capillary packed strain gauge
05/07/2003CN2549429Y Optical measuring devices
05/07/2003CN2549428Y Optical measuring devices
05/07/2003CN2549427Y Optical measuring devices
05/07/2003CN2549426Y Multifunctional special checking device for measuring implements
05/07/2003CN1416554A Optical input device for measuring finger movement
05/07/2003CN1416394A Ink and dampening solution determination in affset printing
05/07/2003CN1416019A 曝光方法和曝光装置 Exposure method and exposure apparatus
05/07/2003CN1415935A Fiberoptic grating with prestrain and relev sensor
05/07/2003CN1415780A Method for preparing nano membrane device
05/06/2003US6559955 Straightness measuring apparatus for moving stage
05/06/2003US6559954 Method and device for measuring the shape of a three dimensional object
05/06/2003US6559953 Point diffraction interferometric mask inspection tool and method
05/06/2003US6559948 Method for locating a structure using holograms
05/06/2003US6559937 Inspection apparatus and method
05/06/2003US6559936 Measuring angles of wheels using transition points of reflected laser lines
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