Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
08/2003
08/14/2003US20030151750 Compensating for effects of variations in gas refractivity in interferometers
08/14/2003US20030151749 Interferometric optical surface comparison apparatus and method thereof
08/14/2003US20030151720 Apparatus and method for determining relative positional and rotational offsets between a first and second imaging device
08/14/2003US20030150272 Surface photo-acoustic film measurement device and technique
08/14/2003DE10203797C1 Three-dimensional interferometric measuring method allows evaluation of depth information for interesting area of camera image selected via defined criteria
08/14/2003CA2475295A1 Method for dynamic measuring the position and the orientation of a wheel
08/14/2003CA2474893A1 Head position sensor
08/13/2003EP1335581A1 Method and apparatus for a color sequential scannerless range imaging system
08/13/2003EP1335235A2 A vision system using projection of figures of light
08/13/2003EP1335233A1 Control apparatus and control method of optical signal exchanger
08/13/2003EP1335182A2 Vehicle wheel alignment system
08/13/2003EP1335181A1 Device for measuring the characteristic attitude parameters of a vehicle
08/13/2003EP1334464A1 Optical input device for measuring finger movement
08/13/2003EP1334463A1 Method of measuring the movement of an input device.
08/13/2003EP1334407A2 A method for monitoring line width of electronic circuit patterns
08/13/2003EP1334332A1 Method for measuring position and position measuring device for carrying out said method
08/13/2003EP1285221A4 In-situ mirror characterization
08/13/2003EP1254431B1 Method and system for detecting defects on a printed circuit board
08/13/2003EP1254389B1 Optical element
08/13/2003CN2566221Y Space filter dynamic coaxial on-line adjusting device
08/13/2003CN1435676A Method and system for inspection of body surface
08/13/2003CN1117964C Special microscopic device for measuring size of fibre
08/13/2003CN1117895C Transmitting cloth offset detecting device
08/12/2003US6606403 Repetitive inspection system with intelligent tools
08/12/2003US6606401 Inspection of edge periods of two-dimensional periodic structures
08/12/2003US6606394 Surface inspecting apparatus and method therefor
08/12/2003US6606160 Nondestructive testing of diffusely reflective objects
08/12/2003US6606149 Optical system adjusting method for energy beam apparatus
08/12/2003US6606147 Measuring method using photoelastic analysis for finding touching point between ball and track profile
08/12/2003US6605828 Optoelectronic component with a space kept free from underfiller
08/12/2003CA2294696C Apparatus and method for aligning a horizontal metal extrusion press
08/07/2003WO2003065007A2 Sample level detection system
08/07/2003WO2003064977A2 Multiple degree of freedom interferometer
08/07/2003WO2003064973A1 Three-dimensional measuring instrument, filter striped plate, and illuminating means
08/07/2003WO2003064972A1 A method and a device for measuring the three dimension surface shape by projecting moire interference fringe
08/07/2003WO2003064971A1 Method and system for measuring profile of large-area using point diffraction light source based on multilateration
08/07/2003WO2003064969A2 Spray can targeting and positioning system
08/07/2003WO2003064966A1 Interference measuring method, interference measuring device, production method for projection optical system, projection optical system, and projection aligner
08/07/2003WO2003064962A2 Multi-axis interferometer
08/07/2003WO2003064738A2 Multi-measurement / sensor coating consolidation detection method and system
08/07/2003WO2003064116A2 Method and apparatus for single camera 3d vision guided robotics
08/07/2003WO2002099373A3 Determining large deformations and stresses of layered and graded structures to include effects of body forces
08/07/2003US20030149426 Method and apparatus for determining characteristics of a laser beam spot
08/07/2003US20030147254 Light radiation device, light source device, light radiation unit, and light connection mechanism
08/07/2003US20030147128 Broad band deep ultraviolet/vacuum ultraviolet catadioptric imaging system
08/07/2003US20030147086 Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements
08/07/2003US20030147085 Method for the determination of layer thicknesses
08/07/2003US20030147084 Apparatus for devices for determining properties of applied layers
08/07/2003US20030147068 Device for measuring the characteristic attitude parameters of a vehicle
08/07/2003US20030147064 Laser based method and system for measuring separation distance between platforms
08/07/2003US20030147002 Method and apparatus for a color sequential scannerless range imaging system
08/07/2003US20030145663 Device for measuring the angle and/or the angular velocity of a rotatable body and/or the torque acting upon said body
08/07/2003US20030145658 Method and apparatus for surveying the geometry of tunnels
08/07/2003DE19880793C1 Oberflächenprüfgerät und Oberflächenprüfverfahren A surface and surface test methods
08/06/2003EP1333305A2 Stereoscopic examination system, stereoscopic image processing apparatus and operating method
08/06/2003EP1333275A2 Method and apparatus for inspecting the surface of substrates
08/06/2003EP1333246A1 Position detection method, position detection device, exposure method, exposure system, control program, and device production method
08/06/2003EP1333245A1 Fine displacement detection device by sound or the like
08/06/2003EP1332354A2 Methods and devices for analyzing agricultural products
08/06/2003EP1332334A1 Measuring device for contactless measurement of tyres
08/06/2003EP1332333A1 Device for optical yarn measurement
08/06/2003EP1332332A2 Height scanning interferometry method and apparatus including phase gap analysis
08/06/2003EP1332101A1 Device for continuously unwinding objects with rotational symmetry, use for visual inspection and control
08/06/2003EP1222055B1 Method and device for testing the cutting edge geometry of a rotary-driven tool
08/06/2003EP1149332B1 Light detection apparatus
08/06/2003EP1071921B1 Method and arrangement for measuring the structures of an object
08/06/2003EP1034432B1 Process and device for detecting microparticle movement
08/06/2003EP0943088B1 Wafer inspection system for distinguishing pits and particles
08/06/2003EP0832417B1 Method for simultaneous detection of multiple fluorophores for in situ hybridization and chromosome painting
08/06/2003CN1434932A Nonlinear image distortion correction in printed circuit board manufacturing
08/06/2003CN1434919A 光学系统 Optical system
08/06/2003CN1434289A Method for detecting surface defect and device thereof
08/06/2003CN1433854A Method for detecting rolling products shape detect and reative device
08/06/2003CN1117264C In-line real-time collinating measurer with computer visulization technique and its calibration method
08/06/2003CN1116833C Cigarette making system and method, and system and method for making optical detection to web material containing band
08/05/2003US6603875 Pattern inspection with a simple mechanical apparatus following a simple procedure are provided. A recording medium which records a pattern inspection program for carrying out the pattern inspection is also provided.
08/05/2003US6603867 Three-dimensional object identifying system
08/05/2003US6603865 System for optically performing position detection and data communication
08/05/2003US6603563 Apparatus for determining measurements of an object utilizing negative imaging
08/05/2003US6603561 Chromatic diffraction range finder
08/05/2003US6603539 Method for detecting the spatial position of a tracking mirror and a mirror arrangement for carrying out said method
08/05/2003US6603532 Illuminance measurement apparatus, exposure apparatus, and exposure method
08/05/2003US6603115 Measurement scale and system incorporating a measurement scale for determining absolute position
08/05/2003US6603114 Scanning head comprising a semiconductor substrate with a blind hole containing a light source
08/05/2003US6603105 Smart optical microphone/sensor
08/05/2003US6603103 Circuit for machine-vision system
08/05/2003US6601956 Method and apparatus for the simultaneous determination of surface topometry and biometry of the eye
08/05/2003US6601365 Component handling apparatus and method of handling the same
07/2003
07/31/2003WO2003063053A1 Generating a library of simulated-diffraction signals and hypothetical profiles of periodic gratings
07/31/2003WO2003062799A2 Spectroscopic diagnostic methods and system
07/31/2003WO2003062747A1 Aligning optical components of an optical measuring system
07/31/2003WO2003062746A1 Method for optical measurement of the shape of a three-dimensional object
07/31/2003WO2003062745A1 Method and device for the detection of information on a tool
07/31/2003WO2003062744A1 Laser-based coordinate measuring device and laser-based method for measuring coordinates
07/31/2003WO2003062739A2 Method and apparatus for compensation of time-varying optical properties of gas in interferometry
07/31/2003WO2003062129A2 Method and apparatus for detecting a liquid spray pattern
07/31/2003WO2003028360A3 Three dimensional scanning camera
07/31/2003US20030144813 Position and orientation determination method and apparatus and storage medium
07/31/2003US20030144807 System and method for heterodyne interferometer high velocity type non-linearity compensation
07/31/2003US20030143761 Method of manufacturing a semiconductor device
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