Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
10/2003
10/21/2003US6634109 Method and system for determining symmetry and Ackermann geometry status of the steering system of a vehicle
10/16/2003WO2003085356A1 Mark provided in an environment to be measured and measuring system comprising same
10/16/2003WO2003085354A1 Contactless system for measuring centricity and diameter
10/16/2003WO2003062799A3 Spectroscopic diagnostic methods and system
10/16/2003WO2003062129A3 Method and apparatus for detecting a liquid spray pattern
10/16/2003WO2003054775A3 Centreline identification in a docking guidance system
10/16/2003WO2003046551A3 Measuring method for measuring the surfaces of biological and/or chemical samples
10/16/2003WO2003014866A3 Method and system for dynamic learning through a regression-based library generation process
10/16/2003WO2003006952A3 Method and apparatus for manipulating a sample
10/16/2003WO2002063368A8 Scanning near-field optical microscope
10/16/2003US20030195623 Prosthesis and method of making
10/16/2003US20030194481 Method and device for applying fluids to substrates
10/16/2003US20030194251 Recording-material type determination apparatus and method and image forming apparatus
10/16/2003US20030193817 Lighting unit
10/16/2003US20030193672 Film thickness measuring method and measuring apparatus for organic thin film for use in organic electroluminesce device
10/16/2003US20030193659 Range finder device and camera
10/16/2003US20030193658 Ranger finder device and camera
10/16/2003US20030193657 Range finder device and camera
10/16/2003US20030193560 Precise position control apparatus and precise position control method using the same
10/16/2003US20030192866 Chip scale marker and making method
10/15/2003EP1353294A1 Mage processor, image processing method, recording medium and program
10/15/2003EP1353237A2 Recording-material type determination apparatus and method and image forming apparatus
10/15/2003EP1353196A1 Object detection and light curtain
10/15/2003EP1353165A2 Automated photomask inspection apparatus and method
10/15/2003EP1353143A1 Lens measuring device
10/15/2003EP1353142A1 Device for measuring the length of stacked objects
10/15/2003EP1353141A2 Laser system for measuring pieces for a machine tool
10/15/2003EP1353139A1 Detecting damage to a structural member
10/15/2003EP1353104A1 Method and device for applying liquids to a substrate
10/15/2003EP1352415A2 Monitoring substrate processing using reflected radiation
10/15/2003EP1352226A1 System for determining the dynamic orientation of a vehicle wheel plane
10/15/2003EP1352213A1 Position and orientation detection system
10/15/2003EP1352212A1 Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
10/15/2003EP1352209A2 Wheel alignment measuring method and apparatus
10/15/2003EP1071924B1 Laser measuring method for determining the azimuth and elevation of two tool spindles relative to a reference plane
10/15/2003EP1017962B1 Three dimensional inspection of electronic leads with optical element attached to the top surface of a transparent reticle
10/15/2003CN1449487A Nethod for measuring the surface height of a material bed conducted on a conveyor belt to thermal treatment
10/15/2003CN1448886A Apparatus and method for measuring vehicle queue length
10/15/2003CN1448797A 曝光装置 Exposure device
10/15/2003CN1448693A Side lit, 3d edge location method
10/15/2003CN1448692A Displacement transducer
10/15/2003CN1448691A Image measuring device, lighting system for the same, lighting system control method and program
10/14/2003US6633730 Rangefinder device and camera incorporating the same
10/14/2003US6633390 Focus measurement in projection exposure apparatus
10/14/2003US6633389 Profiling method
10/14/2003US6633387 Method and apparatus for measuring opposite surfaces
10/14/2003US6633384 Method and apparatus for ultrasonic laser testing
10/14/2003US6633375 Method and device for optically examining structured surfaces of objects
10/14/2003US6633326 Device for capturing images three-dimensionally
10/14/2003US6633146 Braking device for electrical tool
10/14/2003US6633051 Surface sensing device with optical sensor
10/14/2003US6633046 Method and apparatus for detecting that two moveable members are correctly positioned relatively to one another
10/14/2003US6631547 Manufacturing method for thin film magnetic heads
10/12/2003CA2425081A1 Method and device for applying fluids to substrates
10/09/2003WO2003083560A2 Uv compatible programmable spatial filter
10/09/2003WO2003083522A2 System and method of broad band optical end point detection for film change indication
10/09/2003WO2003083450A1 Dark field detection apparatus with traveling lens multi-beam scanner and a method thereof
10/09/2003WO2003083449A1 Wafer defect detection system with traveling lens multi-beam scanner
10/09/2003WO2003083412A1 Measuring method and corresponding measuring device
10/09/2003WO2003083411A1 Multiple emitter boresight reference source
10/09/2003WO2003083410A1 Distributed control network for a shape of a flexible electromagnetic radiation structure (mirror, adaptive optics)
10/09/2003WO2003083409A1 Measuring shape of a flexible electromagnetic radiation structure (mirror, adaptive optics)
10/09/2003WO2003032252A3 Device for imaging a three-dimensional object
10/09/2003WO2003016944A3 Method and device for recording a three-dimensional distance-measuring image
10/09/2003US20030191603 Portable coordinate measurement machine with integrated line laser scanner
10/09/2003US20030190867 Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
10/09/2003US20030190073 Image processing device for stereo image processing
10/09/2003US20030190058 Apparatus and method for measuring queue length of vehicles
10/09/2003US20030189713 Tubular ovality testing
10/09/2003US20030189705 Flip-chip alignment method
10/09/2003US20030189500 System for determining kind of vehicle and method therefor
10/09/2003US20030189166 Apparatus and method for sensing rotation
10/08/2003EP1351034A2 Method and apparatus for optical measurement of the leading edge position of an airfoil
10/08/2003EP1351033A2 Side lit, 3D edge location method
10/08/2003EP1350709A1 Steering angle detector
10/08/2003EP1350084A2 Method and apparatus for crack and fracture detection utilizing bragg gratings
10/08/2003EP1350081A1 Fiber optic displacement sensor
10/08/2003EP1350075A1 Topological and motion measuring tool
10/08/2003EP1040366B1 Method and device for recording three-dimensional distance-measuring images
10/08/2003CN2578785Y Automatic road surface damage collector
10/08/2003CN1447903A Self-calibrating 3D machine measuring system useful in motor vehicle wheel alignement
10/08/2003CN1447411A Surface checking method and surface checker
10/08/2003CN1447396A Chemical mechanical polishing appts. and its control method
10/08/2003CN1447282A Finger mobile detection method and appts. thereof
10/08/2003CN1447194A Monitoring, exposure, etching method, mfg. method of semiconductor device and exposure machine
10/08/2003CN1447108A Pick-up system for block-shape deposited particles
10/08/2003CN1123783C Electro-optical measuring device for absolute distances
10/07/2003US6631005 Optical displacement sensor having a semiconductor laser light source using an optical element which can control beam angle and a beam shape
10/07/2003US6631004 Single-pass and multi-pass interferometry systems having a dynamic beam-steering assembly for measuring distance, angle, and dispersion
10/07/2003US6631001 Spectral image input device
10/07/2003US6631000 Device and procedure for the quality control of in particular finished surfaces
10/07/2003US6630993 Method and optical receiver with easy setup means for use in position measurement systems
10/07/2003US6630364 System for automatic control of the wall bombardment to control wall deposition
10/07/2003CA2223606C Diagnostic tomographic laser imaging apparatus
10/02/2003WO2003081715A2 Wave interrogated near field array system and method for detection of subwavelength scale anomalies
10/02/2003WO2003081662A1 Method and structure for calibrating scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device
10/02/2003WO2003081531A1 A morphological inspection method based on skeletonization
10/02/2003WO2003081293A2 Improved semiconductor etching process control
10/02/2003WO2003081190A2 Spectrally tunable detector
10/02/2003WO2003081168A2 Method for determining and correcting guiding errors in a coordinate measuring device
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