Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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07/31/2003 | US20030143317 Multi-measurement/sensor coating consolidation detection method and system |
07/31/2003 | US20030142863 Method and arrangement for detecting the spatial form of an object |
07/31/2003 | US20030142862 Stereoscopic three-dimensional metrology system and method |
07/31/2003 | US20030142324 Optoelectronic measuring method and distance measuring device for carrying out the method |
07/31/2003 | US20030142321 Positioning stage device |
07/31/2003 | US20030142318 Spectral image input device |
07/31/2003 | US20030142313 Position detection apparatus and exposure apparatus |
07/31/2003 | US20030142298 Inspection method and inspection system of surface of article |
07/31/2003 | US20030142294 Method and system for measuring caster trail |
07/31/2003 | US20030142290 Optical motion detector, transport system and transport processing system |
07/31/2003 | US20030141762 Device for detecting the presence of objects |
07/31/2003 | US20030141465 Semiconductor wafer carrier mapping sensor |
07/31/2003 | US20030141456 Sample level detection system |
07/31/2003 | US20030141444 Near-field optical probe |
07/31/2003 | US20030141440 Multi-type fiber bragg grating sensor system |
07/31/2003 | US20030141376 Spray can targeting and positioning system |
07/31/2003 | US20030140509 Apparatus for monitoring the rails of a railway or tramway line |
07/31/2003 | DE10221945C1 Process for determining defects in continuously moved sheet of transparent material, especially wide thin window glass sheet, involves coupling monochromatic light beam in the sheet via transparent liquid between light source and sheet |
07/30/2003 | EP1331840A2 Method of locating and placing eye point features of a semiconductor die on a substrate |
07/30/2003 | EP1331603A1 Imaging method and imaging device, object to be imaged, printing method |
07/30/2003 | EP1330790A2 Accurately aligning images in digital imaging systems by matching points in the images |
07/30/2003 | EP1330661A1 A device and a method for producing information about the properties of an environment |
07/30/2003 | EP1330631A1 Position measuring device |
07/30/2003 | EP1330628A1 Method for correcting physical errors in measuring microscopic objects |
07/30/2003 | EP1196738B1 Dust removal and anti-shock protection device for optical gauges |
07/30/2003 | EP1116169B1 Improvements relating to pattern recognition |
07/30/2003 | EP1073877B1 Endpoint detection in chemical mechanical polishing (cmp) by substrate holder elevation detection |
07/30/2003 | CN2563551Y Coordinate detection plate |
07/30/2003 | CN1433376A Boom positioning device for high-position working |
07/30/2003 | CN1432790A Long-range profile instrument |
07/29/2003 | US6600808 Part program generating apparatus and program for image measuring apparatus |
07/29/2003 | US6600568 System and method of measuring image sensor chip shift |
07/29/2003 | US6600567 Method and apparatus for inspecting appearance and shape of subject body |
07/29/2003 | US6600561 Overlappingly formed on semiconductor; alignment reference mark |
07/29/2003 | US6600560 Optical measurement arrangement having an ellipsometer |
07/29/2003 | US6600555 Apparatus and method for target identification in a vehicle wheel alignment system |
07/29/2003 | US6600509 Detection system |
07/29/2003 | US6599042 Device for controlling a transport of printing products by a print-related machine |
07/29/2003 | US6598994 Multi-angle inspection of manufactured products |
07/29/2003 | CA2416854A1 Method of locating and placing eye point features of a semiconductor die on a substrate |
07/24/2003 | WO2003061084A1 Method and device for measuring distance |
07/24/2003 | WO2003060810A2 Laser scanner with parabolic collector |
07/24/2003 | WO2003060594A1 Machine and method for inspecting ferrule of optical connector |
07/24/2003 | WO2003060426A2 Imaging device for recording depth |
07/24/2003 | WO2003060425A1 Optical apparatus for measuring the two and three-dimensional shape of an object |
07/24/2003 | WO2003060424A1 A machine vision system |
07/24/2003 | WO2003059656A1 Method and systems for measuring wear in relation to tyre casing |
07/24/2003 | US20030139897 Method for generating coating film build usage and cost impact from Cpk's |
07/24/2003 | US20030139658 Method for the reconstruction of the geometry of the inner surface of a cavity |
07/24/2003 | US20030137674 Measuring system with improved method of reading image data of an object |
07/24/2003 | US20030137673 Systems, and methods of use, employing distorted patterns to ascertain the shape of a surface, for road or runway profiling, or as input to control pro-active suspension systems |
07/24/2003 | US20030137669 Aspects of basic OCT engine technologies for high speed optical coherence tomography and light source and other improvements in optical coherence tomography |
07/24/2003 | US20030137668 Apparatus for evaluating metalized layers on semiconductors |
07/24/2003 | US20030137665 Pattern test device |
07/24/2003 | US20030137510 Method and assembly for the photogrammetric detection of the 3-d shape of an object |
07/24/2003 | US20030136925 Method to detect defects in the shape of a rolled product and relative device |
07/24/2003 | US20030136190 Micro-distance toss-up type absolute gravimeter |
07/24/2003 | DE20306033U1 Device for contact free measurement of the edges of partially reflecting and or transparent plate using a camera linked to a computer, with the computer able to determine a reference edge for a plate of unknown shape |
07/24/2003 | DE10145167C2 Optischer Abstandsschalter und Bestückkopf, Bestückautomat und Verfahren zum Bestücken von Substraten mit Bauelementen unter Verwendung des optischen Abstandsschalters Optical distance switch and placement, placement machine and method for placing components on substrates by using the optical distance switch |
07/23/2003 | EP1329710A2 Pattern test device |
07/23/2003 | EP1329709A1 Method to detect defects in the shape of a rolled product and relative device |
07/23/2003 | EP1329689A1 Method and apparatus for surveying the geometry of tunnels |
07/23/2003 | EP1329688A2 Accuracy analyzing apparatus for machine tool |
07/23/2003 | EP1329686A2 Integrated measuring instrument |
07/23/2003 | EP1328774A1 Improved overlay alignment measurement mark |
07/23/2003 | EP1328773A1 Detecting and correcting plural laser misalignment |
07/23/2003 | EP1328772A1 Optical coherence interferometry and coherence tomography with spatially partially coherent light sources |
07/23/2003 | EP1328195A1 Frameless radiosurgery treatment system and method |
07/23/2003 | EP1029219B1 Optoelectronic apparatus for the dimension and/or shape checking of pieces with complex tridimensional shape |
07/23/2003 | CN2562167Y Optical element carrier |
07/23/2003 | CN1432126A Method for imaging measurement, imaging measuring device and use of measured information in process control |
07/23/2003 | CN1431482A Surface state checking method and circuit board checker |
07/23/2003 | CN1431464A Polarization analyzing method of beam splitting polarized light for measuring angular displacement of object |
07/23/2003 | CN1431463A High power holographic phase difference amplifying device |
07/23/2003 | CN1431462A Frequency shift without chromatic aberration of wideband light source and device generation interferential heterodgne signal |
07/23/2003 | CN1431461A Two dimensions length measurement unit |
07/23/2003 | CN1431460A Multi-function laser diffraction measuring apparatus and its measuring method |
07/23/2003 | CN1431459A Dual frequency laser synthesized wavelength interferometer |
07/23/2003 | CN1431458A Grid type displacement transducer |
07/23/2003 | CN1115556C Method and appts. for following and inspecting edge or border |
07/23/2003 | CN1115555C Flaw investigating method and device using light thereof |
07/23/2003 | CN1115546C Surface 3-D appearance testing method and equipment |
07/23/2003 | CN1115545C Angular coordinate measuring method for point and novel wheel positioning device |
07/23/2003 | CN1115544C Coin counter by measuring coin diameter |
07/22/2003 | US6597822 Multiplexable fiber-optic strain sensor system with temperature compensation capability |
07/22/2003 | US6597806 Image processing method and apparatus |
07/22/2003 | US6597805 Visual inspection method for electronic device, visual inspecting apparatus for electronic device, and record medium for recording program which causes computer to perform visual inspecting method for electronic device |
07/22/2003 | US6597505 Apparatus for producing and guiding a light beam |
07/22/2003 | US6597464 Method and device for testing a cutting-edge geometry of a rotatably drivable tool |
07/22/2003 | US6597463 System to determine suitability of sion arc surface for DUV resist patterning |
07/22/2003 | US6597460 Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum |
07/22/2003 | US6597459 Data age adjustments |
07/22/2003 | US6597447 Method and apparatus for periodic correction of metrology data |
07/22/2003 | US6597443 Spatial tracking system |
07/22/2003 | US6597006 Dual beam symmetric height systems and methods |
07/17/2003 | WO2003058689A1 Optical measurement apparatus |
07/17/2003 | WO2003058568A2 Obscuration detector |
07/17/2003 | WO2003058545A1 A coiled tubing inspection system using image pattern recognition |
07/17/2003 | WO2003058164A1 Machine and method of inspecting input shaft of power steering system |
07/17/2003 | WO2003058163A1 System and method for inspection using white light intererometry |