Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/2003
11/19/2003CN1456863A Target device and optical tester
11/19/2003CN1456862A Method and device for zigzag grating projecting and phase shifting grating projecting
11/19/2003CN1128341C Trigonometric laser measuring head
11/19/2003CN1128340C Photoelectric geometric parameter measurer and measuring method for cornea contacting lens
11/18/2003US6650425 Position measuring laser apparatus
11/18/2003US6650423 Measurement of reflected light
11/18/2003US6650422 Scatterometry techniques to ascertain asymmetry profile of features and generate a feedback or feedforward process control data associated therewith
11/18/2003US6650419 Interferometric apparatus for precision measurement of altitude to a surface
11/18/2003US6650415 Broadband spectroscopic rotating compensator ellipsometer
11/18/2003US6650405 Method for detecting stress and strain
11/18/2003US6650401 Optical distance sensor
11/18/2003US6650397 Media width detecting system for an imaging apparatus
11/18/2003US6649923 Positional deviation detecting method and device manufacturing method using the same
11/18/2003US6649904 Subject state detecting apparatus for detecting dynamically moving subject
11/18/2003US6649903 Self-configurable optical proximity detector
11/18/2003US6649208 Thickness of the thin film being deposited on one or more substrates is continuously monitored enabling precise control of the thickness of the film
11/18/2003US6647919 Device for determining the position of a teat of an animal
11/18/2003US6647800 Temperature insensitive fiber-optic torque and strain sensor
11/13/2003WO2003094212A1 Alignment system, alignment method and production method for semiconductor device
11/13/2003WO2003093804A1 Improved fizeau interferometer designs for optical coherence tomography
11/13/2003WO2003093783A1 Method & apparatus for monitoring wear in chain links.
11/13/2003WO2003093761A1 Method and instrument for measuring bead cutting shape of electric welded tube
11/13/2003WO2003093760A1 Systems and methods for deformation measurement
11/13/2003WO2003093759A2 Phase gap analysis for scanning interferometry
11/13/2003WO2003068889A8 Profile refinement for integrated circuit metrology
11/13/2003WO2003064962A9 Multi-axis interferometer
11/13/2003WO2003052800A3 Semiconductor wafer carrier mapping sensor
11/13/2003WO2003034042A3 Method of monitoring extent of cure of a coating
11/13/2003WO2003009063A3 Real time analysis of periodic structures on semiconductors
11/13/2003WO2002065106A8 Web inspection method and device
11/13/2003US20030212506 Compact optical contour digitizer
11/13/2003US20030211892 Target device and light detecting device
11/13/2003US20030211409 Through-the-lens alignment for photolithography
11/13/2003US20030210408 Method of measuring thickness of layer
11/13/2003US20030210407 Image processing method, image processing system and image processing apparatus
11/13/2003US20030210406 Sensor alignment method for 3D measurment systems
11/13/2003US20030210404 Method and apparatus for stage mirror mapping
11/13/2003US20030210394 Combination thin-film stress and thickness measurement device
11/13/2003US20030210391 Method and apparatus for inspecting pattern defects
11/13/2003US20030210262 Video microscopy system and multi-view virtual slide viewer capable of simultaneously acquiring and displaying various digital views of an area of interest located on a microscopic slide
11/13/2003US20030209678 Non-contact measurement device for quickly and accurately obtaining dimensional measurement data
11/13/2003US20030208919 Portable coordinate measurement machine with integrated touch probe and improved handle assembly
11/13/2003CA2428628A1 Method and apparatus for imaging using polarimetry and matrix based image reconstruction
11/12/2003EP1361445A1 Flexure air speed indicator and vane
11/12/2003EP1361414A1 Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe
11/12/2003EP1361413A1 Method for self-calibration of a non-contact probe
11/12/2003EP1361410A1 Target Device and Light Detecting Device
11/12/2003EP1360927A1 Optical imaging device and optical imaging detecting method
11/12/2003EP1360538A1 Scanning near-field optical microscope
11/12/2003EP1092055B1 Method for determining the draft angle of a textile web and device for carrying out this method
11/12/2003EP1082583B1 A procedure for measuring the wheel angle on steerable vehicles
11/12/2003CN1455443A Apparatus and method for automatically detecting chip surface quality through measuring bonding speed
11/12/2003CN1455222A Camera calibrating method and its implementing apparatus
11/12/2003CN1127660C End detection method in wet etching course
11/11/2003US6647442 Data processing device
11/11/2003US6647161 Structural monitoring sensor system
11/11/2003US6647137 Characterizing kernel function in photolithography based on photoresist pattern
11/11/2003US6646753 In-situ thickness and refractive index monitoring and control system for thin film deposition
11/11/2003US6646752 Method and apparatus for measuring thickness of a thin oxide layer
11/11/2003US6646751 Apparatus and method for measuring trench depth
11/11/2003US6646750 Method and arrangement for measuring the structures of an object
11/11/2003US6646749 Device for the measurement of dental objects
11/11/2003US6646748 Surface profile measurement apparatus
11/11/2003US6646732 Position determination and adjustment system and light sensing device used for the same
11/11/2003US6646264 Methods and devices for analyzing agricultural products
11/11/2003US6646251 Separate type photoelectric switch
11/11/2003US6645045 Method of measuring thickness of a semiconductor layer and method of manufacturing a semiconductor substrate
11/06/2003WO2003091661A1 Adjustable focusing composite for use in an optical profilometer system and method
11/06/2003WO2003091660A1 Method and device for determining the spatial co-ordinates of an object
11/06/2003WO2003091659A1 Thickness measuring device
11/06/2003WO2003090867A1 Methods and systems for laser calibration and eye tracker camera alignment
11/06/2003WO2003071229A3 Rapid high resolution position sensor for auto steering
11/06/2003WO2003065007A3 Sample level detection system
11/06/2003US20030206650 Systems and methods for continuously varying wavelength illumination
11/06/2003US20030206306 Coordinate inputting/detecting apparatus, method and computer program product designed to precisely recognize a designating state of a designating device designating a position
11/06/2003US20030206305 Apparatus for determining measurements of an object utilizing negative imaging
11/06/2003US20030206304 Topographical measurement machine for bowling lanes and the like
11/06/2003US20030206303 Overlay alignment mark design
11/06/2003US20030205869 Height control system and sensor therefor
11/06/2003US20030205664 Process end point detection apparatus and method, polishing apparatus, semiconductor device manufacturing method, and recording medium recorded with signal processing program
11/06/2003US20030205120 Method and device for separating disc-shaped bodies from an original body
11/06/2003US20030205076 Pneumatic tire and measuring method of tread wear amount of the same
11/05/2003EP1359460A2 Double-layered type nematic liquid crystal display device and method of inspecting transparent substrates
11/05/2003EP1359451A1 Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method
11/05/2003EP1359438A2 Combined laser/FLIR optics system
11/05/2003EP1359390A1 Device and method for the automatic control of the state of a surface of a plate by measuring the bonding speed
11/05/2003EP1359387A2 Device for measuring universal joint operating angles in a drive train system
11/05/2003EP1358467A1 Method for characterising or controlling the production of a thin-layered component using optical methods
11/05/2003EP1358444A1 Method for image recognition in motor vehicles
11/05/2003EP1090268B1 High accuracy interferometer with light conductors
11/05/2003EP1009969B1 Method and system for acquiring a three-dimensional shape description
11/05/2003CN2585180Y Device for measuring length of mechanical tube of microscopic
11/05/2003CN1454333A Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography
11/05/2003CN1453558A Aperture size mesurer and measuring method
11/05/2003CN1453101A Three-dimensional reverse evaluating measurer with digitally controlled miller as machine tool
11/04/2003US6643562 Position determining apparatus for coordinate machine
11/04/2003US6643394 Visual inspection apparatus and method
11/04/2003US6643027 Optical measurement system and method for determining height differential between two surfaces
11/04/2003US6643025 Microinterferometer for distance measurements
11/04/2003US6643003 Process for reading fractioin of an interval between contiguous photo-sensitive
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