Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
11/2003
11/04/2003US6643002 System and method for locating and positioning an ultrasonic signal generator for testing purposes
11/04/2003US6642509 Linear scale measuring device and position detection method using the same
11/04/2003US6642507 Beam rotation angle detecting apparatus, rotation detecting apparatus and beam rotation angle detecting method
11/04/2003US6642506 Speckle-image-based optical position transducer having improved mounting and directional sensitivities
11/04/2003US6642505 Reflection-type optical sensor
11/04/2003US6640647 System for structural strain sensing by optical fiber sensor
10/2003
10/30/2003WO2003089887A1 Method and device for automatically regulating a quantity of product deposited
10/30/2003WO2003089876A1 Vehicle wheel alignment by rotating vision sensor
10/30/2003WO2003089875A1 Method and apparatus for alignment of components
10/30/2003WO2003089874A1 Camera corrector
10/30/2003WO2003089873A2 Methods and computer program products for characterizing a crystalline structure
10/30/2003WO2003089277A1 Safety device for a vehicle
10/30/2003WO2003044452A3 Method and system for assisting a user taking measurements using a coordinate measurement machine
10/30/2003WO2003038373A3 Characterization of optical preforms
10/30/2003US20030204326 Real time analysis of periodic structures on semiconductors
10/30/2003US20030203288 Method and apparatus capable of accurately measuring overlay shift between overlay measuring pattern used for transfer to lower target transfer film and overlay measuring pattern used for transfer to upper target transfer film
10/30/2003US20030202703 Apparatus and computer-readable medium for assisting image classification
10/30/2003US20030202691 Calibration of multiple cameras for a turntable-based 3D scanner
10/30/2003US20030202188 System for monitoring sealing wear
10/30/2003US20030201410 Sensitivity adjusting method for pattern inspection apparatus
10/30/2003US20030201409 Method and device for measuring wear on internal barrel surfaces
10/30/2003US20030201408 Non-contact measurement device for accurately determining angular measurements in relation to plumb and level
10/30/2003US20030201406 Active optical component alignment system and method
10/29/2003EP1357398A2 Combined laser/FLIR optics system
10/29/2003EP1357397A2 Combined laser/FLIR optics system
10/29/2003EP1357375A2 Actuator- and sensorsystem for composite structures
10/29/2003EP1356664A2 Cmos-compatible three-dimensional image sensing using quantum efficiency modulation
10/29/2003CN2583625Y Regulating device of light driving main shaft motor
10/29/2003CN1452730A Panoramic image acquisition device
10/29/2003CN1452018A Rotary etcher with thickness measuring system
10/29/2003CN1451943A Recording material type discriminating device, method and image forming device
10/29/2003CN1125980C Inspection of container mouth using infrared energy emitted by container bottom
10/28/2003US6640003 Surface inspection system for work boards
10/28/2003US6640002 Image processing apparatus
10/28/2003US6639685 Image processing method using phase-shifted fringe patterns and curve fitting
10/28/2003US6639684 Digitizer using intensity gradient to image features of three-dimensional objects
10/28/2003US6639682 System of fabricating plane parallel substrates with uniform optical paths
10/28/2003US6639673 Surface coating measurement instrument and apparatus for determination of coating thickness
10/28/2003US6639659 Measuring method for determining the position and the orientation of a moving assembly, and apparatus for implementing said method
10/28/2003US6639656 Distance measuring apparatus
10/28/2003US6639239 Angle rejection filter
10/28/2003US6639206 Rotary angle sensor for a rotary member
10/25/2003CA2383318A1 Active optical component alignment system and method
10/23/2003WO2003087934A2 Interferometry system error compensation in twin stage lithography tools
10/23/2003WO2003087724A1 Improvements relating to cameras
10/23/2003WO2003087717A1 Appliance for digitising of curved and plane surfaces
10/23/2003WO2003087716A1 Compact optical contour digitizer
10/23/2003WO2003087715A1 Method for optically detecting the spatial form of inside spaces and a device for carrying out said method
10/23/2003WO2003087714A1 An apparatus and method for inspecting a tubular
10/23/2003WO2003087713A1 Arrangement in a measuring system
10/23/2003WO2003087711A1 High-precision measuring method for object to be measured by laser reflection beam and device therefor
10/23/2003WO2003087710A2 Method and apparatus for stage mirror mapping
10/23/2003WO2003086180A2 Measurement of optical properties
10/23/2003WO2003060810A3 Laser scanner with parabolic collector
10/23/2003WO2003034097A3 Method and a device for the combination of a first and second beam of rays
10/23/2003US20030200063 Generating a library of simulated-diffraction signals and hypothetical profiles of periodic gratings
10/23/2003US20030200047 Methods and computer program products for characterizing a crystalline structure
10/23/2003US20030198425 Apparatus and method for monitoring a structure using a counter-propagating signal method for locating events
10/23/2003US20030198377 Method and system for 3D reconstruction of multiple views with altering search path and occlusion modeling
10/23/2003US20030198274 Laser-based jaw setting device
10/23/2003US20030197874 Method of detecting the thickness of thin film disks or wafers
10/23/2003US20030197872 Scatterometric measurement of undercut multi-layer diffracting signatures
10/23/2003US20030197871 Interferometry method and apparatus for producing lateral metrology images
10/23/2003US20030197864 Monitoring temperature and sample characteristics using a rotating compensator ellipsometer
10/23/2003US20030197858 Method and apparatus for article inspection including speckle reduction
10/23/2003US20030197857 Defect inspection apparatus
10/23/2003US20030197655 Parallel displacement/inclination measuring apparatus and antenna system
10/23/2003US20030197138 Modular non-contact measurement device for quickly and accurately obtaining dimensional measurement data
10/23/2003US20030197120 Nanotube, near-field light detecting apparatus and near-field light detecting method
10/23/2003DE29624436U1 Measuring position and geometry of bore esp. of fuel injection valve for internal combustion engine - aligning and clamping article to be measured in geometrically defined position measuring inlet and outlet edges of bore using opto-electronic method using light guides to access valve interior
10/23/2003CA2477955A1 Arrangement in a measuring system
10/22/2003EP1355350A2 Chip scale marker and marking method
10/22/2003EP1355277A2 Three-dimensional computer modelling
10/22/2003EP1355274A2 3D reconstruction of multiple views with altering search path and occlusion modeling
10/22/2003EP1355148A1 Method to assess the presence of defects, such as cracks or bevelled edges, on the surface of wooden boards
10/22/2003EP1355128A1 Automatic alignment of a sensor
10/22/2003EP1355127A2 Scanning apparatus and method
10/22/2003EP1355126A1 Procedure to measure the mismatch between two parts of an object
10/22/2003EP1355124A1 LED, fiber lighting unit and uniform line of light
10/22/2003EP1354505A1 A method and an apparatus for measuring positions of contact elements of an electronic component
10/22/2003EP1354295A2 Camera calibration for three-dimensional reconstruction of objects
10/22/2003EP1354176A1 Three-dimensional surface profile imaging method and apparatus using single spectral light condition
10/22/2003EP1354175A1 Optical ball height measurement of ball grid arrays
10/22/2003EP1000346B1 System for detecting anomalies and/or features of a surface
10/22/2003CN1451141A Method and apparatus for discriminating latent fingerprin in optical fingerprint input apparatus
10/22/2003CN1450412A Lighographic apparatus, alignment method and device mfg method
10/22/2003CN1450380A Liquid crystal back lighting optical target
10/21/2003US6636755 Method and apparatus for obtaining an optical tomographic image of a sentinel lymph node
10/21/2003US6636704 Imaging system having media stack component measuring system
10/21/2003US6636351 Process for controlling a laser scanning microscope with a tiltable fine focusing stage
10/21/2003US6636322 Method and device for measuring cell gap of liquid crystal display using near-IR radiation
10/21/2003US6636313 Making a bump on a substrate using a unique method of measuring photoresist semiconductor device having a plurality of misalignment ruler markers formed therein for measuring removable layer opening misalignment in the X and Y directions
10/21/2003US6636312 Pitch comprises slits which cannot produce image on the wafer, such that a simultaneous pattern with the conventional pattern on the wafer is formed. Accordingly, the alignment accuracy can be accurately checked
10/21/2003US6636310 Wavelength-dependent surface contour measurement system and method
10/21/2003US6636303 Foreign substance inspecting method and apparatus, which detect a height of a foreign substance, and an exposure apparatus using this inspecting apparatus
10/21/2003US6636255 Three-dimensional image scanner and heat-insulating device for optical apparatus
10/21/2003US6635894 Optical measuring apparatus for measuring objects on machines
10/21/2003US6634552 Three dimensional vision device and method, and structured light bar-code patterns for use in the same
10/21/2003US6634486 Distributing apparatus having tapered rollers
10/21/2003US6634112 Method and apparatus for track geometry measurement
1 ... 500 501 502 503 504 505 506 507 508 509 510 511 512 513 514 515 516 517 518 519 520 ... 739