| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 02/11/2004 | CN1474963A Digital imaging system having distribution controlled over distributed network |
| 02/11/2004 | CN1474932A Digitizing device using strength gradient for unit depth detection of three-dimensional objects property in three-dimensional imaging |
| 02/11/2004 | CN1474162A Optical imaging method and device for invisible image |
| 02/11/2004 | CN1474161A Method and device for determining three-dimensional object surface coordinate and color |
| 02/11/2004 | CN1474160A Multiple-section synthesizing three-dimensional profile measuring method |
| 02/11/2004 | CN1474159A Chromatographic scanning three-dimension measuring method and device linear array photoelectric sensor |
| 02/11/2004 | CN1474158A Servo caparative polarized light displacement sensor system |
| 02/11/2004 | CN1473668A Device for measuring pipe wall thickness in pipe press |
| 02/11/2004 | CN1138128C Error correcting method in circular grating angle measurement |
| 02/10/2004 | US6691062 Method and apparatus for assessing the play in bearings or joints of components coupled to one another |
| 02/10/2004 | US6690986 Method of detecting the position of a wafer |
| 02/10/2004 | US6690965 Method and system for physiological gating of radiation therapy |
| 02/10/2004 | US6690817 Spectral bio-imaging data for cell classification using internal reference |
| 02/10/2004 | US6690474 Apparatus and methods for surface contour measurement |
| 02/10/2004 | US6690473 Integrated surface metrology |
| 02/10/2004 | US6690459 Method and apparatus for fiber alignment using light leaked from cladding |
| 02/10/2004 | US6690456 Wheel alignment apparatus |
| 02/10/2004 | US6690024 Laser inspection apparatus |
| 02/10/2004 | US6688758 Line generator optical apparatus |
| 02/10/2004 | US6688743 Method and apparatus to determine fly height of a recording head |
| 02/10/2004 | CA2233887C Optical encoder for indicating the position of an adjustable member |
| 02/05/2004 | WO2004011879A1 System and method for controlling the shape and alignment of wheels |
| 02/05/2004 | WO2004011878A1 Method and system for optical distance and angle measurement |
| 02/05/2004 | WO2004011877A1 Laser-type angle detection device, crankshaft deflection measuring-device, crankshaft deflection-measuring method, and crankshaft |
| 02/05/2004 | WO2004011876A1 Apparatus and method for automatically arranging three dimensional scan data using optical marker |
| 02/05/2004 | WO2003078920A3 Method and device for determining the absolute coordinates of an object |
| 02/05/2004 | WO2003064116A3 Method and apparatus for single camera 3d vision guided robotics |
| 02/05/2004 | US20040024563 Method for generating a control output for a position control loop |
| 02/05/2004 | US20040022498 Alignment of optical fiber elements |
| 02/05/2004 | US20040021951 Object lens producing device and producing method |
| 02/05/2004 | US20040021877 Method and system for determining dimensions of optically recognizable features |
| 02/05/2004 | US20040021876 Method for the automatic calibration-only, or calibration and qualification simultaneously of a non-contact probe |
| 02/05/2004 | US20040021872 Stable Fabry-Perot interferometer |
| 02/05/2004 | US20040021865 Aligning a lens with respect to an axis of beam propagation |
| 02/05/2004 | US20040021858 Apparatus and method for detecting pipelwe defects |
| 02/05/2004 | US20040021851 Focal length measuring device |
| 02/05/2004 | US20040021803 Method of determining local structures in optical crystals |
| 02/05/2004 | US20040021305 Safety apparatus against automobile clash |
| 02/05/2004 | US20040021098 Electromagnetic radiation structure control system |
| 02/05/2004 | US20040021053 Adjustable focusing composite for use in an optical profilometer system and method |
| 02/05/2004 | US20040021035 Concept of increasing efficiency conversion kinetic energy working substance in linear and rotary force |
| 02/05/2004 | DE10233087A1 Reflexionsphotometrisches Analysesystem Reflection Photometric Analysis System |
| 02/05/2004 | DE10232746A1 Verfahren zur Automatischen Ermittlung optischer Parameter eines Schichtstapels A method for automatic determination of optical parameters of a layer stack |
| 02/05/2004 | DE10130423B4 Optisches 3D-Positionsmesssystem für die simultane Erfassung von sechs Freiheitsgraden Optical 3D position measurement system for the simultaneous detection of six degrees of freedom |
| 02/05/2004 | DE10118668B4 Koordinatenmeßvorrichtung A coordinate |
| 02/05/2004 | DE10105994B4 Verfahren zum Optimieren der Richtigkeit der theoretisch ermittelten Verformungen eines Werkstückes unter Belastung A method for optimizing the accuracy of the calculated theoretical deformation of a workpiece under load |
| 02/05/2004 | DE10103870B4 Verfahren zur Bilderkennung bei Kraftfahrzeugen A method for image recognition in motor vehicles |
| 02/04/2004 | EP1386142A1 An electronic imaging and quality control method for a fast moving web |
| 02/04/2004 | EP1386141A1 Method and device for examining an object in a contactless manner, especially for examining the surface form of the same |
| 02/04/2004 | CN1472552A Singe lnog period optical fiber gratings based simultaneous temperature and load measuring method and sensor |
| 02/04/2004 | CN1472504A Phase and time based focusing shiftable pickup and measuring instrument thereof |
| 02/04/2004 | CN1472502A Recording media identification and recorder |
| 02/04/2004 | CN1137387C Method for testing abnormality of electronic element and device on printed circuit board |
| 02/04/2004 | CN1137370C Image-type automatic calibrating instrument for micrometer gauge or dial gauge |
| 02/03/2004 | US6687398 Method and an apparatus for the identification of incorrectly oriented parts and/or parts departing from a predetermined master |
| 02/03/2004 | US6687396 Optical member inspection apparatus, image-processing apparatus, image-processing method, and computer readable medium |
| 02/03/2004 | US6687391 Adjustable, rotatable finger guide in a tenprint scanner with movable prism platen |
| 02/03/2004 | US6687015 Method and device for measuring the thickness of a layer |
| 02/03/2004 | US6687014 Method for monitoring the rate of etching of a semiconductor |
| 02/03/2004 | US6687008 Waveguide based parallel multi-phaseshift interferometry for high speed metrology, optical inspection, and non-contact sensing |
| 02/03/2004 | US6687002 Method and apparatus for ellipsometric metrology for a sample contained in a chamber or the like |
| 02/03/2004 | US6686996 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 02/03/2004 | CA2342413C A method of isolating an electrical fault |
| 01/29/2004 | WO2004010380A2 Measuring 3d deformations of an object by comparing focusing conditions for sharp capturing of said object before and after deformation |
| 01/29/2004 | WO2004010077A1 Measuring device |
| 01/29/2004 | WO2004010076A1 Method and device for three-dimensionally detecting objects and the use of this device and method |
| 01/29/2004 | WO2003052342A3 Confocal line sensor |
| 01/29/2004 | US20040019405 Object taking out apparatus |
| 01/29/2004 | US20040019255 Measuring endoscope system |
| 01/29/2004 | US20040018653 Method of measuring meso-scale structures on wafers |
| 01/29/2004 | US20040017886 Method and apparatus for three-dimensional surface morphometry |
| 01/29/2004 | US20040017607 Stereo-examination systems and stereo-image generation apparatus as well as a method for operating the same |
| 01/29/2004 | US20040017575 Optimized model and parameter selection for optical metrology |
| 01/29/2004 | US20040017574 Model and parameter selection for optical metrology |
| 01/29/2004 | US20040017563 Method and apparatus for volume and density measurements |
| 01/29/2004 | US20040017561 Method of detecting and classifying scratches and particles on thin film disks or wafers |
| 01/29/2004 | US20040016139 Riser and tubular inspection systems |
| 01/29/2004 | DE19947557B4 Bildverarbeitungsvorrichtung und Bildverarbeitungsverfahren Image processing apparatus and image processing method |
| 01/29/2004 | DE10232912A1 Verfahren und Vorrichtung zur optischen Vermessung von Objekten Method and apparatus for optical measurement of objects |
| 01/29/2004 | DE10229246A1 Optoelektronische Winkelmessgerät sowie Verfahren zu dessen Herstellung Photoelectric angle measuring device and process for its preparation |
| 01/29/2004 | DE10160221B4 Verfahren zur hochgenauen Bestimmung des Radius einer Krümmung einer Oberfläche A method for precise determination of the radius of curvature of a surface |
| 01/29/2004 | DE10030479B4 Linearmaßstabs-Messgerät und Positionserfassungsverfahren unter Anwendung desselben The same linear scale measuring device and position detection method using |
| 01/28/2004 | EP1385122A1 Object taking-out apparatus |
| 01/28/2004 | EP1384973A2 Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure |
| 01/28/2004 | EP1255965B1 Coded disc for an optoelectronic displacement or angle measuring device |
| 01/28/2004 | EP0902874B1 Interferometer for measuring thickness variations of semiconductor wafers |
| 01/28/2004 | CN1471725A Polishing progress monitoring method and device thereof, polishing device, semiconductor device production method, and semiconductor device |
| 01/28/2004 | CN1471624A Detecting and correcting plural laser misalignment |
| 01/28/2004 | CN1470922A Baseboard assembling device and baseboard assembling method |
| 01/28/2004 | CN1470848A Sampler inclination measuring method |
| 01/28/2004 | CN1470846A Polyhedron checking conveyor and polyhedron checking device |
| 01/28/2004 | CN1470466A Method and system for positionnig glass plate, and method and system for bending glass plate |
| 01/28/2004 | CN1136474C Method and device for measuring thickness of liquid crystal layer and derived angle and derived wave length device |
| 01/28/2004 | CN1136433C Method and apparatus for measuring cell gas of VA liquid crystal panel |
| 01/28/2004 | CN1136432C Measurement method by automatic laser length measuring instrument |
| 01/28/2004 | CN1136431C On-line width measurement method |
| 01/27/2004 | US6683977 Method of taking three-dimensional measurements of object surfaces |
| 01/27/2004 | US6683694 Telemetry equipment for the two-dimensional or three-dimensional mapping of a volume |
| 01/27/2004 | US6683693 Target device |
| 01/27/2004 | US6683688 Method and device for gauging a device for producing electrical components |