| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 01/27/2004 | US6683684 Device for measuring relative position error |
| 01/27/2004 | US6683682 Electronic component inspection equipment |
| 01/27/2004 | US6683676 Three-dimensional image capturing device |
| 01/27/2004 | US6683675 Distance measuring apparatus and distance measuring method |
| 01/27/2004 | US6682810 Fluorescent materials |
| 01/22/2004 | WO2004008077A1 Optical encoder |
| 01/22/2004 | WO2004008069A1 Method and apparatus for optically measuring the topography of nearly planar periodic structures |
| 01/22/2004 | WO2004008068A1 Overlay error detection |
| 01/22/2004 | WO2004008067A1 Inspection of railway vehicles |
| 01/22/2004 | WO2003064962A3 Multi-axis interferometer |
| 01/22/2004 | US20040014395 Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
| 01/22/2004 | US20040014250 Method and apparatus for determining layer thickness and composition using ellipsometric evaluation |
| 01/22/2004 | US20040013414 Determining the position of an axis of rotation (patient positioning table, radiation therapy) on the basis of an angle of rotation and a chord through a movable mark |
| 01/22/2004 | US20040013295 Obstacle recognition apparatus and method, obstacle recognition program, and mobile robot apparatus |
| 01/22/2004 | US20040012794 Two-dimensional scale structures and method usable in an absolute position transducer |
| 01/22/2004 | US20040012791 Interferometer having a coupled cavity geometry for use with an extended source |
| 01/22/2004 | US20040012790 Reflection-photometric analytical system |
| 01/22/2004 | US20040011946 Apparatus for measuring position of fine particle |
| 01/22/2004 | US20040011120 Device for detecting a running surface and vehicle using same |
| 01/22/2004 | DE4206281B4 Erfassung von Partikeln mit Durchmessern im Submikron-Bereich unter Verwendung eines Feldes mit hoher Dichte Detection of particles having diameters in the submicron range using an array of high density |
| 01/22/2004 | DE10254542A1 Vorrichtung und Verfahren zur Detektion der Kontur beliebiger Teile, insbesondere von Gussteilen Apparatus and method for detection of the contour of any parts, in particular of castings |
| 01/22/2004 | DE10230972A1 Gerät mit Mitteln zur Positionsbestimung von Geräteteilen Device with means for Positionsbestimung of equipment parts |
| 01/22/2004 | DE10228515A1 Höhenmess- und Anreißgerät Height gauge |
| 01/22/2004 | DE10006083B4 Verfahren zur quantitativen und/oder qualitativen Bestimmung von Schichtdicken sowie ein Mikroreaktionsgefäß und eine Titerplatte A method for quantitative and / or qualitative determination of layer thickness and a micro reactor and a titer plate |
| 01/21/2004 | EP1382959A1 Analysis device for reflectance photometry |
| 01/21/2004 | EP1382940A2 Absolute position transducer |
| 01/21/2004 | EP1381825A1 Method and apparatus for decreasing thermal loading and roughness sensitivity in a photoacoustic film thickness measurement system |
| 01/21/2004 | EP1381824A1 Measurement of components that have been micro-galvanically produced, using a sample component by means of photoresist webs |
| 01/21/2004 | CN1469990A Position detection method, position detection device, exposure method, exposure system, control program, and device production method |
| 01/21/2004 | CN1469113A Defect detecting apparatus, method and its program |
| 01/21/2004 | CN1469101A Method for extracting round area from fringe pattern |
| 01/21/2004 | CN1135072C Method and apparatus for testing cigarette tip |
| 01/20/2004 | US6680781 Critical dimension measurement method and apparatus capable of measurement below the resolution of an optical microscope |
| 01/20/2004 | US6679756 Method and apparatus for monitoring polishing state, polishing device, process wafer, semiconductor device, and method of manufacturing semiconductor device |
| 01/20/2004 | US6679106 Road surface roughness measuring device |
| 01/15/2004 | WO2004006022A1 System and method for optical metrology of semiconductor wafers |
| 01/15/2004 | WO2004005955A1 Method and system of triangulating an object |
| 01/15/2004 | WO2004005902A1 Optical measuring method and device therefor |
| 01/15/2004 | WO2004005848A1 Laser calibration apparatus |
| 01/15/2004 | WO2004005052A2 Tyre wear indicator |
| 01/15/2004 | WO2004004926A1 Apparatus and method for simultaneously coating and measuring parts |
| 01/15/2004 | US20040008878 Apparatus and method for measuring amount of projection of abrasive grain on grinding tool |
| 01/15/2004 | US20040008869 Discriminating method for recording medium and recording apparatus |
| 01/15/2004 | US20040008435 Optical film thickness controlling method, optical film thickness controlling apparatus, dielectric multilayer film manufacturing apparatus, and dielectric multilayer film manufactured using the same controlling apparatus or manufacturing apparatus |
| 01/15/2004 | US20040008352 Precision size measuring apparatus |
| 01/15/2004 | US20040008339 Method and apparatus for core alignment between optical components |
| 01/15/2004 | US20040008337 Spatial tracking system |
| 01/15/2004 | US20040008297 Liquid crystal display device and inspection method for a transparent substrate |
| 01/15/2004 | US20040008259 Optical methods for remotely measuring objects |
| 01/15/2004 | US20040007020 Method and system for positioning a glass plate, and method and system for bending a glass plate |
| 01/15/2004 | US20040006882 Portable coordinate measurement machine with integrated magnetic mount |
| 01/15/2004 | DE10322907A1 Device for measuring dimensions, distances has common light source/separate source per slot with light of one or different frequencies or frequency modulated light amplitudes for slots in slotted stop |
| 01/15/2004 | DE10229818A1 Verfahren zur Fokusdetektion und Abbildungssystem mit Fokusdetektionssystem Method of focus detection and imaging system with focus detection system |
| 01/15/2004 | DE10229816A1 Vorrichtung zur Erzeugung einer konvergenten Lichtwellenfront und System zur interferometrischen Linsenflächenvermessung An apparatus for generating a convergent optical system for interferometric and front lens surface surveying |
| 01/15/2004 | DE10229336A1 Verfahren und Vorrichtung zur Kalibrierung von Bildsensorsystemen Method and apparatus for calibration of image sensor systems |
| 01/15/2004 | DE10227376A1 Verfahren zur Bestimmung von Schichtdickenbereichen A method for determining layer thickness ranges |
| 01/15/2004 | DE10227345A1 Verfahren zur Bestimmung lokaler Strukturen in optischen Kristallen Method for the determination of local structures in optical crystals |
| 01/15/2004 | DE10225487A1 Vorrichtung und Verfahren zur Bestimmung der dreidimensionalen Lageabweichung eines Gegenstandes von einer Standardlage Apparatus and method for determining the three-dimensional positional deviation of an object from a standard position |
| 01/15/2004 | DE10101057B4 Verfahren und Vorrichtung zur Erfassung der Verformung von Objekten Method and apparatus for detecting the deformation of objects |
| 01/14/2004 | EP1380811A1 Optical distance measuring device |
| 01/14/2004 | EP1379835A1 Method for automatic adjustment of focus and lighting and for objectivated scanning of edge site in optical precision measuring technique |
| 01/14/2004 | EP1379834A1 Optical apparatus for measuring objects having a rectilinear profile |
| 01/14/2004 | EP1379833A1 Method for indicating a point in a measurement space |
| 01/14/2004 | EP1379832A1 Length sensor |
| 01/14/2004 | CN2599526Y Two-dimensional grating length-measuring unit |
| 01/14/2004 | CN2599524Y Dot diffraction interferometer for detecting surface shape |
| 01/14/2004 | CN1468371A Reduction of error alarm in PCB detection |
| 01/14/2004 | CN1468367A Differential numerical aperture methods and device |
| 01/14/2004 | CN1468290A Luminescent paint |
| 01/14/2004 | CN1467569A Projection exposure equipment |
| 01/14/2004 | CN1467479A Two dimension coding type zero aligning marker and coding method |
| 01/14/2004 | CN1467478A Automatic measuring method of optical regulator |
| 01/14/2004 | CN1467476A Method of assisting sample inclination error adjustment |
| 01/14/2004 | CN1134663C Apparatus and methods for measurement and classification of generalized cotton like entities in fiber samples |
| 01/14/2004 | CN1134571C Measuring and control system of pavement straightness for paving machine |
| 01/13/2004 | US6678433 Apparatus and method for measuring residual stress and photoelastic effect of optical fiber |
| 01/13/2004 | US6678240 Method for optimizing the image properties of at least two optical elements as well as methods for optimizing the image properties of at least three optical elements |
| 01/13/2004 | US6678063 Measuring device for reinforcing steel rods for concrete |
| 01/13/2004 | US6678062 Automated system with improved height sensing |
| 01/13/2004 | US6678061 Method of calibrating the optical system of a laser machine for processing electrical circuit substrates |
| 01/13/2004 | US6678060 Monitoring distance variations |
| 01/13/2004 | US6678059 Apparatus for measuring 6-degree-of-freedom motions of rigid body by using three-facet mirror |
| 01/13/2004 | US6678058 Integrated alignment and calibration of optical system |
| 01/13/2004 | US6678057 Method and device for reduction in noise in images from shiny parts |
| 01/13/2004 | US6678055 Method and apparatus for measuring stress in semiconductor wafers |
| 01/13/2004 | US6678047 Method and apparatus for aligning optical axes of optical components |
| 01/13/2004 | US6677863 Absolute encoder |
| 01/13/2004 | US6677603 Paper sheet discriminating device |
| 01/13/2004 | US6677573 Laser sensor having a pinhole for particle measurement |
| 01/13/2004 | US6677170 Method for determining process layer thickness using scatterometry measurements |
| 01/13/2004 | US6676717 Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operations |
| 01/13/2004 | CA2284025C Measuring system using laser technique for three-dimensional objects |
| 01/08/2004 | WO2004003845A1 Device and method for detecting the contour of any part, particularly of cast parts |
| 01/08/2004 | WO2004003470A1 Thin films measurement method and system |
| 01/08/2004 | WO2004003463A2 Interferometer system of compact configuration |
| 01/08/2004 | WO2004002626A1 Delivery of metered amounts of liquid materials |
| 01/08/2004 | WO2004002593A1 Information processor having input system using stroboscope |
| 01/08/2004 | WO2003089873A3 Methods and computer program products for characterizing a crystalline structure |
| 01/08/2004 | WO2003069392A3 Optical rotating transmitter having a free inside diameter |
| 01/08/2004 | WO2003067246A3 Use of electronic speckle interferometry for defect detection in fabricated devices |