Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
06/2003
06/24/2003US6583869 Non-contact positioning apparatus
06/24/2003US6583868 Method of aligning an ACC-sensor on a vehicle
06/24/2003US6583752 Method and apparatus for recognizing object
06/24/2003US6582619 Methods and apparatuses for trench depth detection and control
06/19/2003WO2003050565A1 Device for measuring position, orientation and trajectory of a solid object
06/19/2003WO2003050475A1 Contactless device for controlling and identifying the surfaces of three-dimensional objects
06/19/2003WO2003050474A1 Device for optically measuring boreholes
06/19/2003WO2003050473A1 Measurement of metal electroplating and seed layer thickness and profile
06/19/2003WO2003050472A1 Systems and methods for wavefront measurement
06/19/2003WO2003050470A2 Phase-shifting interferometry method and system
06/19/2003WO2002068902A3 Method and apparatus for three dimensional mapping
06/19/2003US20030115004 Laser measurement system with digital delay compensation
06/19/2003US20030113020 Method for the extraction of image features caused by structure light using template information
06/19/2003US20030113008 Process and device for generating test patterns when applying solder paste by a screen process on printed circuit boards
06/19/2003US20030113000 Image collating apparatus for comparing/collating images before/after predetermined processing, image forming apparatus, image collating method, and image collating program product
06/19/2003US20030112450 Three dimensional sensor laser noise reduction method
06/19/2003US20030112449 Method for the extraction of image features caused by structure light using image reconstruction
06/19/2003US20030112448 Method and device for determining the 3d profile of an object
06/19/2003US20030112447 Method and device for reduction in noise in images from shiny parts
06/19/2003US20030112445 Apparatus and methods for high accuracy metrology and positioning of a body
06/19/2003US20030112444 System and method for measuring optical distance
06/19/2003US20030112428 Method and apparatus for surface inspection
06/19/2003US20030112426 Method and apparatus for transmission measurement of the geometrical structure of an optical component
06/19/2003US20030112222 Intermittent operating type pointing device
06/19/2003US20030110963 Ink and dampening solution determination in offset printing
06/19/2003US20030110809 Characterization of optical preforms
06/18/2003EP1319926A2 A device for contactless measurement of the properties of a moving yarn or a yarn-like textile formation
06/18/2003EP1319191A2 Generation of a library of periodic grating diffraction signals
06/18/2003EP1319164A1 Method for measuring the geometry of an object by means of a co-ordination measuring device
06/18/2003EP1319163A1 Method for measuring the surface height of a material bed conducted on a conveyor belt to thermal treatment
06/18/2003EP1032812A4 Automatic lens inspection system
06/18/2003EP0932816B1 Method and device for measuring the course of reflective surfaces
06/18/2003DE10154404C1 Verfahren und Vorrichtung zur Messung physikalischer Kenngrößen von dünnen, optisch transparenten Schichten und Vorrichtung zur Durchführung des Verfahrens Method and apparatus for measuring physical characteristics of thin, optically transparent layers and apparatus for performing the method
06/18/2003CN1425190A Monitor, method of monitoring, polishing device, and method of manufacturing semiconductor wafer
06/18/2003CN1425127A Measurement of wheel and axle alignment of motor vehicles
06/18/2003CN1425126A Differential bending and/or subsidence detector and method for monitoring structure
06/18/2003CN1424558A Two-dimensional microvibration optical fibre test system and method
06/18/2003CN1111936C Optical position-measurement device
06/17/2003US6581193 Apparatus and methods for modeling process effects and imaging effects in scanning electron microscopy
06/17/2003US6580519 Method and apparatus for determining the alignment of rotational bodies
06/17/2003US6580515 Surface profiling using a differential interferometer
06/17/2003US6580511 System for monitoring sealing wear
06/17/2003US6580505 Overlay alignment mark design
06/17/2003US6580501 Apparatus and method for the visual inspection in particular of concealed soldered joints
06/17/2003US6580087 Inspection apparatus
06/17/2003US6579190 Ball motion measuring apparatus
06/12/2003WO2003049166A1 Method and device for measuring film layer state, polishing device, and method of manufacturing semiconductor device
06/12/2003WO2003048682A1 Apparatus and method for detecting twist in articles
06/12/2003WO2003048681A1 Compensating for effects of non-isotropics gas mixtures in interferometers
06/12/2003WO2003048415A1 Arrangement for monitoring a thickness of a layer depositing on a sidewall of a processing chamber
06/12/2003US20030109991 Apparatus and method for detecting twist in articles
06/12/2003US20030107748 Method and apparatus for remote pointing
06/12/2003US20030107747 Three-dimensional shape and color detecting apparatus
06/12/2003US20030107744 Interferometer arrangement and interferometric measuring method
06/12/2003US20030107741 Surface plasmon resonance sensor system
06/12/2003US20030107737 Six degree of freedom position ranging
06/12/2003US20030107728 Non-contact hole depth gage
06/12/2003US20030107708 Shape measurement apparatus
06/12/2003US20030107705 Method for producing eyeglasses
06/12/2003US20030106378 Determining large deformations and stresses of layered and graded structures to include effects of body forces
06/12/2003US20030106228 Accuracy measuring apparatus for machine tool
06/11/2003EP1318211A1 Arrangement for monitoring a thickness of a layer depositing on a sidewall of a processing chamber
06/11/2003EP1317899A2 Shape measurement apparatus
06/11/2003EP1317695A2 Digital imaging system having distribution controlled over a distributed network
06/11/2003EP1317653A1 Method for establishing the position of a temporary target on an object relative to known features of the object
06/11/2003EP1317651A2 Method and device for measuring three-dimensional shapes
06/11/2003EP1175592B1 Position detector with auxiliary means for detecting the direction of the gravity vector
06/11/2003EP0873496B1 Test equipment for colour printing with CCD camera and framegrabber
06/11/2003CN2555494Y Grid type digital displaying detector for welded edge angle fissure of displacement
06/11/2003CN1423237A Picture borderline detection system and method
06/10/2003US6577936 Image processing system for estimating the energy transfer of an occupant into an airbag
06/10/2003US6577756 Method and apparatus for quantitatively evaluating scintillation, antiglare film and method of producing the same
06/10/2003US6577405 Phase profilometry system with telecentric projector
06/10/2003US6577404 Arrangement and method for measuring surface irregularities
06/10/2003US6577403 Achromatic optical interferometer with continuously adjustable sensitivity
06/10/2003US6577400 Interferometer
06/10/2003US6577397 Scatterometer
06/10/2003US6577387 Inspection of ophthalmic lenses using absorption
06/10/2003US6577384 Spatial averaging technique for ellipsometry and reflectometry
06/10/2003US6577383 Method of determining structural features of test pieces having a randomly scattering surface
06/10/2003US6576483 Backside cannelure to provide for wafer shift detection
06/10/2003US6575812 Setting up process for a tool or workpiece on a gear making machine
06/10/2003US6575035 Apparatus and method for measuring internal stress of reticle membrane
06/10/2003US6574877 Two piece alignment head
06/10/2003US6574876 Apparatus for detecting rotational angle
06/05/2003WO2003046662A1 Imaging apparatus
06/05/2003WO2003046551A2 Measuring method for measuring the surfaces of biological and/or chemical samples
06/05/2003WO2003046483A1 Arrangement for detecting relative movements or relative positions of two objects
06/05/2003WO2003046478A1 Robot self-position identification system and self-position identification method
06/05/2003WO2003046476A2 Method and system for determining symmetry of the steering system of a vehicle
06/05/2003WO2003046474A1 Method and apparatus for measuring stress in semiconductor wafers
06/05/2003WO2003046472A2 Method and device for detecting the shape of a three-dimensional object
06/05/2003WO2003046430A1 Adjustable device with universal joints
06/05/2003WO2003045600A1 Method and apparatus for detecting roll eccentricity utilizing pulse generator in rolling mill
06/05/2003US20030104761 Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
06/05/2003US20030103684 Method and apparatus to determine golf ball trajectory and flight
06/05/2003US20030103649 Road white line recognition apparatus and method
06/05/2003US20030103217 Arrangement for the detection for relative movements or relative position of two objects
06/05/2003US20030103216 Device and process for measuring ovalization, buckling, planes and rolling parameters of railway wheels
06/05/2003US20030103215 Scanning interferometer for aspheric surfaces and wavefronts
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