Patents
Sitemap › G01 - Measuring; Testing › G01B - Measuring length, thickness or similar linear dimensions; Measuring angles; Measuring areas; Measuring irregularities of surfaces or contours › G01B 11 - Measuring arrangements characterised by the use of optical means
Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862)
06/2003
06/05/2003US20030102426 Arrangement for the detection of relative movements or relative positions of two objects
06/05/2003US20030102422 Arrangement for the detection of relative movements or relative positions of two objects
06/04/2003EP1316222A2 Apparatus and method for determining the range of remote objects
06/04/2003EP1315944A1 Spatial positioning
06/04/2003EP1315943A1 Control wire inspection with controlled scheimpflug condition
06/03/2003US6574361 Image measurement method, image measurement apparatus and image measurement program storage medium
06/03/2003US6573999 Film thickness measurements using light absorption
06/03/2003US6573998 Optoelectronic system using spatiochromatic triangulation
06/03/2003US6573499 Microstructured pattern inspection method
06/03/2003US6571583 Device for drawing an optical fiber including a more accurate diameter measuring sensor
06/03/2003US6571486 Linear measuring device
05/2003
05/30/2003WO2003044727A1 Video surveillance system employing video primitives
05/30/2003WO2003044598A1 Compensating for effects of variations in gas refractivity in interferometers
05/30/2003WO2003044505A1 Device for the detection of surface defects on cylinders
05/30/2003WO2003044464A1 Method and system for detecting the three-dimensional shape of an object
05/30/2003WO2003044462A1 Apparatus and method for optical characterization of an object
05/30/2003WO2003044460A1 Method for determining corresponding points in three-dimensional measurement
05/30/2003WO2003044459A1 Quality factor
05/30/2003WO2003044458A1 Method and system for the calibration of a computer vision system
05/30/2003WO2003044457A2 Method and device for enlarging the measurement volume of an optical measurement system
05/30/2003WO2003044456A1 Scanning interferometer for aspheric surfaces and wavefronts
05/30/2003WO2003044455A1 Rapid in situ mastering of an aspheric fizeau
05/30/2003WO2003044454A1 Dispersive null-optics for aspheric surface and wavefront metrology
05/30/2003WO2003044452A2 Method and system for assisting a user taking measurements using a coordinate measurement machine
05/30/2003WO2003006921A3 Aligning optical components of an optical measuring system
05/30/2003CA2467970A1 Method and device for enlarging the measurement volume of an optical measurement system
05/30/2003CA2465954A1 Video surveillance system employing video primitives
05/29/2003US20030101012 Biometric quality control process
05/29/2003US20030098972 Streamlined method and apparatus for aligning a sensor to an aircraft
05/29/2003US20030098967 Method for carrying out the non-contact measurement of geometries of objects
05/29/2003US20030098966 Stage system and stage driving method for use in exposure apparatus
05/29/2003US20030098707 Method of controlling bond process quality by measuring wire bond features
05/29/2003US20030098704 Method and apparatus for measuring stress in semiconductor wafers
05/29/2003US20030098426 Wire bonding method and apparatus
05/29/2003US20030097761 Device for measuring an object across several axes
05/28/2003EP1314955A2 Procedure to determine the position of measuring points on an object
05/28/2003EP1314954A1 Method and apparatus for locating fluorescent spherical optical components
05/28/2003EP1314953A2 Interferometer and interferometric measuring procedure
05/28/2003EP1314000A1 Method and apparatus for three-dimensional optical scanning of interior surfaces
05/28/2003EP1313400A1 Method and device for determining a load axis of an extremity
05/28/2003EP1266444A4 Safety interlock for mechanically actuated closure device
05/28/2003EP1212583B1 Device for inspecting a three-dimensional surface structure
05/28/2003EP0880675B1 Method and apparatus for three-dimensional scene processing using parallax geometry of pairs of points
05/28/2003EP0765471B1 Arrangement and method for the detection of defects in timber
05/28/2003CN2553337Y Linear bidirectional lighting assembly
05/28/2003CN2552785Y Multifunctional laser detector for contact network
05/28/2003CN1421119A Method and device for monitoring electric component in pick-and-place device for substrates
05/28/2003CN1421045A Methods and apparatuses for trench depth detection and control
05/28/2003CN1421020A 图像处理设备 The image processing apparatus
05/28/2003CN1420635A Single-pass encoding method of absolute encoder, and encoder
05/28/2003CN1420470A Method for automatic selection of effective range of negative and continuous negative by scanner
05/28/2003CN1420340A Automatic in-line length measuring system
05/28/2003CN1420339A Non-spheric eccentricity measuring method and device
05/28/2003CN1109877C System for non-contact measurement of solid speed and length
05/27/2003US6571196 Size inspection/measurement method and size inspection/measurement apparatus
05/27/2003US6570998 Vehicle area detecting apparatus and vehicle area determining method
05/27/2003US6570663 Calibration method and device for visual measuring systems
05/27/2003US6570662 Optical techniques for measuring layer thicknesses and other surface characteristics of objects such as semiconductor wafers
05/27/2003US6570661 Optical system for oblique incidence interferometer and apparatus using the same
05/27/2003US6570660 Measuring instrument
05/27/2003US6570658 Optical part driving device incorporated into a detachable block and optical interferometer including same
05/27/2003US6570650 Apparatus and methods for reducing thin film color variation in optical inspection of semiconductor devices and other surfaces
05/27/2003US6570645 Stage system and stage driving method for use in exposure apparatus
05/27/2003US6568809 System and method for automatically adjusting a lens power through gaze tracking
05/27/2003US6568289 Planar shape characteristic measuring apparatus and planar shape characteristic measuring method
05/27/2003CA2113569C Contact-free method for tridimensional measurement of the envelope of an object, particularly a foot, and measuring apparatus for implementing such method
05/22/2003WO2003042924A1 Connection of point clouds measured by a computer vision system
05/22/2003WO2003042631A1 Method and arrangement in a measuring system
05/22/2003WO2003042630A1 Method of measuring change in glass thickness
05/22/2003WO2003041902A1 Method and device for evaluation of jointing regions on workpieces
05/22/2003WO2003041573A1 Illumination unit for the generation of optical sectional images in transparent media in particular in the eye
05/22/2003US20030097237 Monitor system of vehicle outside and the method thereof
05/22/2003US20030097235 Method of surveying a track
05/22/2003US20030095710 Systems and methods for boundary detection in images
05/22/2003US20030095700 Method and apparatus for three dimensional edge tracing with Z height adjustment
05/22/2003US20030095301 Scanning method and scanning apparatus for optical density measurement
05/22/2003US20030095265 Interferometric cyclic error compensation
05/22/2003US20030095251 Defect inspection method and apparatus therefor
05/22/2003US20030095249 Inclinometer with bragg grating
05/22/2003US20030095241 Interferometric alignment system for use in vacuum-based lithographic apparatus
05/22/2003US20030094579 Method and apparatus for evaluating the quality of a semiconductor substrate
05/21/2003EP1312937A2 System and method for monitoring vehicle outside
05/21/2003EP1312890A1 Method of detecting and identifying thickness of sheet-like food, method of manufacturing sheet-like food, and devices therefor
05/21/2003EP1311911A2 Device for registration of optical holograms on the amorphous molecular semiconductor films
05/21/2003EP1311874A2 System and method for locating and positioning an ultrasonic signal generator for testing purposes
05/21/2003EP1311801A1 Interferometric, low coherence shape measurement device for a plurality of surfaces (valve seat) via several reference planes
05/21/2003EP0970392B1 Measuring system using laser technique for three-dimensional objects
05/21/2003EP0890078B1 Method and apparatus for optical alignment of a measuring head in an x-y plane
05/21/2003CN1419647A System for simultaneous projections of multiple phase-shifted patterns for the multiple phase-shifted patterns for the three-dimensional inspection of an object
05/21/2003CN1419275A Marked location detector
05/21/2003CN1419267A Focusing, position measuring, exposure and element making method and exposure device
05/21/2003CN1419217A System and method for reducing image relative system location error in inner reference image displacement
05/21/2003CN1419103A Apparatus and method for raising location accuracy of laser heterodyne difference interferometer
05/20/2003US6567213 Apparatus for analyzing multi-layer thin film stacks on semiconductors
05/20/2003US6567172 System and multipass probe for optical interference measurements
05/20/2003US6567169 Method of and device for determining the warpage of a wafer
05/20/2003US6567165 Concentration measuring method and apparatus for absorption component in scattering medium
05/20/2003US6566648 Edge triggered apparatus and method for measuring strain in bragg gratings
05/20/2003US6564527 Process and apparatus for checking cigarette packs for the correct positioning of material strips
05/20/2003US6564468 Process for producing an arrangement for determining the relative position of two bodies that are movable in relation to each other
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