Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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07/03/2003 | US20030123707 Imaging-based distance measurement and three-dimensional profiling system |
07/03/2003 | US20030123703 Method for monitoring a moving object and system regarding same |
07/03/2003 | US20030123061 Automatic optical inter-alignment of two linear arrangements |
07/03/2003 | US20030123060 Thin film optical measurement system and method with calibrating ellipsometer |
07/03/2003 | US20030123053 Apparatus for measuring slant angle of solid immersion lens |
07/03/2003 | US20030123045 Process and apparatus for taking up an object space |
07/03/2003 | US20030123044 Optical distance sensor |
07/03/2003 | US20030122093 Optical measurement apparatus |
07/03/2003 | US20030121889 Thickness measuring apparatus, thickness measuring method, and wet etching apparatus and wet etching method utilizing them |
07/03/2003 | US20030121673 Advanced applications for 3-D autoscanning LIDAR system |
07/03/2003 | DE19651667C2 Vorrichtung zur dreidimensionalen Untersuchung eines Objektes Apparatus for three-dimensional examination of an object |
07/03/2003 | DE10159998C1 Measuring point coordinates determination method, involves indirect calculation of coordinates using measured positions of at least 3 reference points |
07/02/2003 | EP1324268A2 Position detecting device for takeout apparatus |
07/02/2003 | EP1324082A1 Dual-parameter optical waveguide grating sensing device and sensor |
07/02/2003 | EP1324006A1 Simultaneous self-calibrated sub-aperture stitching for surface figure measurement ( interferometer ) |
07/02/2003 | EP1324005A2 Device and process for measuring ovalization, buckling, planes and rolling parameters of railway wheels |
07/02/2003 | EP1323862A1 Method for regulating the cross-machine shrinkage profile in a paper machine |
07/02/2003 | EP1322940A1 In-situ method and apparatus for end point detection in chemical mechanical polishing |
07/02/2003 | EP1322937A1 Device for measuring colour, lustre and undulations on lacquered freeform surfaces |
07/02/2003 | EP1322911A1 Arrangement and method for producing photogrammetric image records |
07/02/2003 | EP1322909A1 Co-ordinate measuring device |
07/02/2003 | EP1322908A1 In-situ thickness and refractive index monitoring and control system for thin film deposition |
07/02/2003 | EP1322907A2 Optical device |
07/02/2003 | EP1322905A1 Device for measuring co-ordinates |
07/02/2003 | EP1173726B1 Optical device for measuring position |
07/02/2003 | EP1119739B1 Measurement of small, periodic undulations in surfaces |
07/02/2003 | EP1058591A4 Calibration and compensation of robot-based gauging system |
07/02/2003 | EP1036300B1 Surface measuring apparatus |
07/02/2003 | CN2558955Y Digital display grating rule read sensor |
07/02/2003 | CN2558954Y Micro diamond needle detecting apparatus and imaging device thereof |
07/02/2003 | CN1427945A 3D machine vision measuring system with vehicle position adjustment mechanism for positioning vehicle |
07/02/2003 | CN1427944A Method and apparatus for measuring wall thickness of plastic container |
07/02/2003 | CN1427328A Intermittent operation indicator |
07/02/2003 | CN1427243A Position detection device and method |
07/02/2003 | CN1427242A Apparatus and method for measuring non-spheric surface with hologram and concave surface |
07/02/2003 | CN1427103A Equipment for noninductive measurement of structure attribute of moving yarn or yarn-like fabrics |
07/02/2003 | CN1113390C Method of checking for presence of connection balls |
07/02/2003 | CN1113241C Method for sorting leucocyte |
07/02/2003 | CN1113234C Process and device for detecting location of components and/or for checking position of component connections and mounting head with said device |
07/01/2003 | US6587809 Position and orientation detection system |
07/01/2003 | US6587794 Method for measuring thin metal films |
07/01/2003 | US6587212 Method and apparatus for studying vibrational modes of an electro-acoustic device |
07/01/2003 | US6587211 Interferometric torque and power sensor |
07/01/2003 | US6587210 Measurement method and apparatus of an external digital camera imager assembly |
07/01/2003 | US6587209 Measurement method and apparatus of an external digital camera imager assembly |
07/01/2003 | US6587208 Optical system for measuring diameter, distribution and so forth of micro bubbles and micro liquid drop |
07/01/2003 | US6587207 Method for producing time marks at any points on moving components |
07/01/2003 | US6587201 Aligning apparatus and method for aligning mask patterns with regions on a substrate |
07/01/2003 | US6587194 Method of and apparatus for article inspection including speckle reduction |
07/01/2003 | US6587193 Inspection systems performing two-dimensional imaging with line light spot |
07/01/2003 | US6587192 Surface inspecting apparatus and method |
07/01/2003 | US6587188 Method and sensor arrangement for measuring temperature and strain using an optical fiber embedded in a cover layer on a substrate |
07/01/2003 | US6587185 Distance measuring apparatus |
07/01/2003 | US6587184 Positioning aid for a hand tool device |
07/01/2003 | US6587183 Range finder and camera |
07/01/2003 | US6586719 Device for detecting the positional change between two bodies moving in relation to one another |
07/01/2003 | US6584805 Hot bottle inspection apparatus |
07/01/2003 | CA2314251C Article classifying system and article dimension measuring apparatus |
06/26/2003 | WO2003052800A2 Semiconductor wafer carrier mapping sensor |
06/26/2003 | WO2003052468A1 Film forming device, and production method for optical member |
06/26/2003 | WO2003052348A1 A method and an apparatus for inspection of an optical fiber |
06/26/2003 | WO2003052347A2 Method for the three-dimensional measurement of a surface |
06/26/2003 | WO2003052346A1 Sensor for the visual position detection (component, substrate) comprising a modular lighting device |
06/26/2003 | WO2003052345A1 System and method for measuring optical distance |
06/26/2003 | WO2003052342A2 Confocal line sensor |
06/26/2003 | US20030120447 Method and apparatus for calibrating a measurement system |
06/26/2003 | US20030118297 Corrosion detector; aluminum grid, generation radical force; adjusting bandwidth wavelength of reflective profile; calibration; measuring aircraft stresses |
06/26/2003 | US20030118273 System and method for optical multiplexing and/or demultiplexing |
06/26/2003 | US20030118230 Coiled tubing inspection system using image pattern recognition |
06/26/2003 | US20030117633 Probe with a diffraction grating for +1,0 and -1 orders |
06/26/2003 | US20030117632 Method for self-calibrated sub-aperture stitching for surface figure measurement |
06/26/2003 | US20030117412 Method for high dynamic range image construction based on multiple images with multiple illumination intensities |
06/26/2003 | US20030116724 Paper thickness detecting device |
06/26/2003 | US20030116698 Subject state detecting apparatus for detecting dynamically moving subject |
06/26/2003 | DE20121855U1 Optical position-measuring system for simultaneous recording of all three degrees of freedom in three-dimensional area has measuring sensor, identification tag, lighting device and control unit |
06/26/2003 | DE20121829U1 Optical sensor, especially light detector or light barrier, has at least supply voltage for receiver provided by electrically isolated power supply unit with battery, accumulator or solar cells |
06/26/2003 | CA2470959A1 Film forming device, and production method for optical member |
06/25/2003 | EP1321916A1 Centreline identification in a docking guidance system |
06/25/2003 | EP1321777A2 Method for the recording of an object space |
06/25/2003 | EP1321758A1 Light scattering measuring probe |
06/25/2003 | EP1321753A1 Optical tactile sensor |
06/25/2003 | EP1320720A2 Assembly and method for the optical-tactile measurement of a structure |
06/25/2003 | EP1133700B1 Displacement sensor in a system suitable for detecting movements |
06/25/2003 | EP1112484B1 Device for measuring work pieces using an image processing system |
06/25/2003 | EP1075642B1 Position coordinate measuring device for measuring structures on a transparent substrate |
06/25/2003 | EP0963541B1 Variable pitch grating for diffraction range finding system |
06/25/2003 | EP0894239B1 Object fixturing in interferometer |
06/25/2003 | CN1426527A Combined stereovision, color 3D digitizing and motion capture system |
06/25/2003 | CN1112568C Method and instrument for measuring 2-D angle with single-chip one-D image detector |
06/25/2003 | CN1112567C Method for generating sinusoidal light field with binary coding templet |
06/24/2003 | USRE38153 Two-dimensional beam deflector |
06/24/2003 | US6584420 Defect examination apparatus |
06/24/2003 | US6584378 Device and a method for determining coordinates and orientation |
06/24/2003 | US6584283 LED illumination device for a scannerless range imaging system |
06/24/2003 | US6584236 Image processing apparatus and method for image processing |
06/24/2003 | US6584218 Automated photomask inspection apparatus |
06/24/2003 | US6584215 Method and apparatus for the real time determination of deformation of test pieces |
06/24/2003 | US6583884 Tomographic reconstruction of electronic components from shadow image sensor data |
06/24/2003 | US6583883 Method and measuring device for measuring a rotary tool |
06/24/2003 | US6583875 Monitoring temperature and sample characteristics using a rotating compensator ellipsometer |