| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 07/17/2003 | WO2003058162A1 A scanner system and a method for determining the surface coordinates of a three-dimensional object |
| 07/17/2003 | WO2003058158A2 Stereoscopic three-dimensional metrology system and method |
| 07/17/2003 | WO2003050470A3 Phase-shifting interferometry method and system |
| 07/17/2003 | US20030133133 Measuring apparatus |
| 07/17/2003 | US20030133132 Method and system for verifying correct mounting of a printing plate on an external drum imaging machine |
| 07/17/2003 | US20030133131 Accuracy analyzing apparatus for machine tool |
| 07/17/2003 | US20030133130 Three-dimensional information acquiring system for acquiring three-dimensional shape and surface attributes of object |
| 07/17/2003 | US20030133129 Three-dimensional data input apparatus |
| 07/17/2003 | US20030133128 Laser scanner with parabolic collector |
| 07/17/2003 | US20030133127 Method for monitoring the rate of etching of a semiconductor |
| 07/17/2003 | US20030133126 Spectral reflectance for in-situ film characteristic measurements |
| 07/17/2003 | US20030133125 Alignment stage, exposure apparatus, and semiconductor device manufacturing method |
| 07/17/2003 | US20030133124 Process for forming a thin film and apparatus therefor |
| 07/17/2003 | US20030133116 Apparatus and method for die placement using transparent plate with fiducials |
| 07/17/2003 | US20030133115 Method of measuring photoresist and bump misalignment |
| 07/17/2003 | US20030133112 Light scattering measuring probe |
| 07/17/2003 | US20030133100 Semiconductor wafer tilt monitoring on semiconductor fabrication equipment plate |
| 07/17/2003 | US20030131485 Method and device for automatically adjusting the axle geometry of suspended vehicle in a production line |
| 07/17/2003 | DE10143489C2 Anordnung zum Erfassen von Relativbewegungen zweier Objekte Arrangement for detecting relative motion of two objects |
| 07/17/2003 | CA2471374A1 A coiled tubing inspection system using image pattern recognition |
| 07/16/2003 | EP1327854A1 Device for angular positioning, wedge and use of the device |
| 07/16/2003 | EP1327852A1 Apparatus for the measuring of the surface flatness, in particular for metallic strips |
| 07/16/2003 | EP1327851A1 Imaging a three-dimensional structure by confocal focussing an array of light beams |
| 07/16/2003 | EP1327126A1 Differential numerical aperture methods and device |
| 07/16/2003 | EP1326931A1 Luminescent paint |
| 07/16/2003 | EP1181525B1 Method for the automatic analysis of microscope images |
| 07/16/2003 | CN1430073A Process and equipment for forming film |
| 07/16/2003 | CN1430043A Method of measuring two dimensional displacement quantity using conjugated optical channels |
| 07/15/2003 | US6594600 Method for calibrating the initial position and the orientation of one or several mobile cameras |
| 07/15/2003 | US6594539 Dental imaging system that includes intra-oral probe with conduit for illuminating dental surface, camera for obtaining imaging data as light rays are reflected from dental surface, and concave reflector to increase field of view |
| 07/15/2003 | US6594290 Dynamic change detecting method, dynamic change detecting apparatus and ultrasonic diagnostic apparatus |
| 07/15/2003 | US6594023 Coordinate inputting/detecting apparatus, method and computer program product designed to precisely recognize a designating state of a designating device designating a position |
| 07/15/2003 | US6594015 Method and a device for calibrating equipment for determining the surface uniformity of film or sheet material |
| 07/15/2003 | US6594013 Reflectance method for evaluating the surface characteristics of opaque materials |
| 07/15/2003 | US6594007 Method and apparatus for mapping system calibration |
| 07/15/2003 | US6594006 Method and array for detecting the position of a plane scanned with a laser scanner |
| 07/15/2003 | US6594002 Wafer shape accuracy using symmetric and asymmetric instrument error signatures |
| 07/15/2003 | US6593738 Method and apparatus for measuring thickness of conductive films with the use of inductive and capacitive sensors |
| 07/15/2003 | US6593705 Rapid-firing flashlamp discharge circuit |
| 07/15/2003 | US6593587 Non-contact measurement device for quickly and accurately obtaining dimensional measurement data |
| 07/15/2003 | US6592574 Hydration and topography tissue measurements for laser sculpting |
| 07/15/2003 | US6591512 Device for use as a navigation link when measuring objects |
| 07/10/2003 | WO2003056305A1 A material independent optical profilometer |
| 07/10/2003 | WO2003056275A1 Method and device for measuring lengths of a workpiece deformed by bending |
| 07/10/2003 | WO2003055338A2 Device and system for measuring the properties of multi-segmented filters and corresponding method |
| 07/10/2003 | WO2003016818A3 Three dimensional mapping system for automotive vehicles |
| 07/10/2003 | WO2002010829A8 Multiple-source arrays with optical transmission enhanced by resonant cavities |
| 07/10/2003 | US20030128894 Digital image analysis of reflecting markers |
| 07/10/2003 | US20030128371 Method and apparatus for measuring surface configuration |
| 07/10/2003 | US20030128369 Compensating for effects of non-isotropic gas mixtures in interferometers |
| 07/10/2003 | US20030128368 Dispersive null-optics for aspheric surface and wavefront metrology |
| 07/10/2003 | US20030128366 Imaging systems |
| 07/10/2003 | US20030128361 Light modulation apparatus and optical switch, movement detecting device and distance measuring device, alignment device and semiconductor aligner, and processes thereof |
| 07/10/2003 | US20030128356 Three-dimensional laser beam detection device |
| 07/10/2003 | US20030127610 Methods and systems for alignment of detection optics |
| 07/10/2003 | US20030127588 Method and system for optical distance and angle measurement |
| 07/10/2003 | US20030127585 Obscuration detector |
| 07/10/2003 | US20030126930 Null |
| 07/09/2003 | EP1326097A2 Process for forming a thin film and apparatus therefor |
| 07/09/2003 | EP1326059A1 Method and measuring device for controlling properties of a multi-layer structure |
| 07/09/2003 | EP1325283A1 Level and/or verticality indicator using laser beams |
| 07/09/2003 | EP1161655B1 System for measuring the position of an edge of a transparent article |
| 07/09/2003 | EP1051595B1 Method and device for determining the thickness of a moving linear textile formation |
| 07/09/2003 | EP1023616B1 General asphere-conic conformal optical windows |
| 07/09/2003 | EP1023595A4 Method and system for processing measurement signals to obtain a value for a physical parameter |
| 07/09/2003 | EP1023574B1 High speed profiling with CCD capturing profile lines per frame period |
| 07/09/2003 | EP0886829B1 A system and a method of three-dimensional imaging |
| 07/09/2003 | EP0775364B1 Fiber optic sensor method and device |
| 07/09/2003 | CN2559963Y Special punching bit testing apparatus for PC board punching |
| 07/09/2003 | CN1429334A Adjusting device with optical regulating device having reflector |
| 07/09/2003 | CN1429333A Apparatus for monitoring rails of railway or tramway line |
| 07/09/2003 | CN1429332A Method for determining thickness of multi-thin-layer structure |
| 07/09/2003 | CN1428595A Plane parameter measuring method and wheel positioning system |
| 07/09/2003 | CN1114090C Schileren instrument for measuring body surface appearance |
| 07/09/2003 | CN1114089C 3D space optical integrated circuit pins testing method and testing instrument |
| 07/08/2003 | US6591218 Process for determining the alignment of a cylindrical body with respect to a reference direction |
| 07/08/2003 | US6591197 Sensor; indicator projects visible lines; data processing |
| 07/08/2003 | US6590712 Arrangement and method for generating a plurality of optical axes which are oriented in a defined manner relative to one another |
| 07/08/2003 | US6590670 Method and apparatus for measuring heights of test parts of object to be measured |
| 07/08/2003 | US6590669 Method for optically detecting the shape of objects |
| 07/08/2003 | US6590667 Method and an apparatus for measuring the flying height with sub-nanometer resolution |
| 07/08/2003 | US6590665 Optical sensing devices |
| 07/08/2003 | US6590664 Interferometer with optical fiber interconnected dual arm sampler |
| 07/08/2003 | US6590656 Spectroscopic scatterometer system |
| 07/08/2003 | US6590654 Polarized illumination and detection for metrological applications |
| 07/08/2003 | US6590222 Light detection apparatus |
| 07/08/2003 | US6590221 On-line measuring system for measuring substrate thickness and the method thereof |
| 07/08/2003 | US6589804 Oxide/nitride or oxide/nitride/oxide thickness measurement using scatterometry |
| 07/08/2003 | CA2406281C System and method for determining strain |
| 07/03/2003 | WO2003055201A1 Imaging device |
| 07/03/2003 | WO2003054831A1 Centreline identification in a docking guidance system |
| 07/03/2003 | WO2003054775A2 Centreline identification in a docking guidance system |
| 07/03/2003 | WO2003054529A2 Method for mobile on- and off-line monitoring of coloured and high-gloss automobile component surfaces |
| 07/03/2003 | WO2003012510A8 System and method for optical multiplexing and/or demultiplexing |
| 07/03/2003 | WO2003003148A3 Spatial tracking system |
| 07/03/2003 | US20030126566 Method for inspecting accuracy in stitching pattern elements using CAD or pattern reference data |
| 07/03/2003 | US20030125901 Method and system for assisting a user taking measurements using a coordinate measurement machine |
| 07/03/2003 | US20030125622 Apparatus and method for compensating for respiratory and patient motion during treatment |
| 07/03/2003 | US20030124957 Substrate polishing apparatus |
| 07/03/2003 | US20030123802 System and method for optical multiplexing and/or demultiplexing |