Patents for C09G 1 - Polishing compositions (7,846)
06/2002
06/20/2002WO2002048279A1 Abrasive, abrasive slurry, and method for manufacturing abrasive
06/20/2002US20020076932 Method of polishing or planarizing a substrate
06/20/2002CA2365593A1 Polishing slurry for the chemical-mechanical polishing of silica films
06/19/2002CN1354214A 金属擦亮剂 Metal polishes
06/19/2002CN1354213A Furniture nursing agent and its preparation method
06/18/2002US6407000 Microelectronics
06/13/2002US20020069593 For use in semiconductor device fabrication
06/12/2002EP1212789A1 Polishing mixture and process for reducing incorporation of copper into silicon wafers
06/11/2002US6403546 Glycol solvent; plasticizer is tributoxyethyl phosphate; nonionic surfactant; an amine
06/11/2002US6402978 Magnetic polishing fluids for polishing metal substrates
06/06/2002WO2002044300A2 Cerium-based abrasive and production process thereof
06/06/2002WO2002044293A2 Method and composition for the removal of residual materials during substrate planarization
06/06/2002WO2002044292A1 A nanometer polishing composition and the method for preparing it
06/06/2002US20020068454 Transition metal ions; chelating agents; surfactants; oxidizers; corrosion inhibitors; and water.
06/06/2002US20020068452 Polishing agent and polishing method
06/06/2002US20020066234 Acidic slurry of an oxidizer, deionized water, a corrosion inhibitor and a surfactant
06/06/2002DE10060343A1 Polierslurry für das chemisch-mechanische Polieren von Metall- und Dielektrikastrukturen Polishing slurry for chemical mechanical polishing of metal and dielectric structures
06/05/2002EP1211719A1 Polishing slurry for the chemical mechanical polishing of metal and dielectric structures
06/05/2002EP1211717A1 Polishing compound for chemimechanical polishing and method for polishing substrate
06/05/2002EP1210395A1 Compositions for insulator and metal cmp and methods relating thereto
06/05/2002CN1352673A Compositions for and methods for reducing/eliminating scratches and defects in silicon dioxide CMP process
06/04/2002US6399081 Organic silicone resin powder
06/04/2002US6398827 Stable aqueous spherical moniliform colloidal silica bonded with metal oxide; monoplanar; iron oxide or inorganic salt accelerator; alumina disks; silica surfaces; semiconductorwafers
06/04/2002CA2364053A1 Polishing slurry for the chemical-mechanical polishing of metal and dielectric structures
05/2002
05/30/2002WO2002020682A3 Method of initiating copper cmp process
05/30/2002WO2002020214A3 Method for polishing a memory or rigid disk with a polishing composition containing an oxidized halide and an acid
05/30/2002US20020065355 For providing protection, antifouling property, gloss and the like on a floor surfaces
05/30/2002US20020065025 Chemical mechanical polishing method for copper
05/30/2002US20020064955 Wafer polishing slurry and chemical mechanical polishing (CMP) method using the same
05/30/2002US20020062600 Polishing composition
05/29/2002EP1209731A1 Polishing composition and polishing method employing it
05/29/2002EP0935512B1 Cryogenic polishing method for soft acrylic articles
05/28/2002US6395194 Slurry of abrasive, bromide, bromate, organic acid, and bromine-chloride complex
05/23/2002US20020061635 For use in polishing semiconductor device
05/23/2002US20020059755 Abrasive composition for polishing semiconductor device and method for producing semiconductor device using the same
05/21/2002US6391948 Triazine compounds and use thereof
05/21/2002US6391189 Wax blend for aqueous applications
05/16/2002US20020058601 Low-foaming; good biodegradability; can be used in polymer, antifoaming, biocidal, coating, fertilizer, pharmaceutical, and drilling fluid compositions.
05/16/2002US20020058426 Controlling a ratio of platen speed to carrier speed (PS to CS) within a specific range
05/16/2002US20020056829 Ruthenium and ruthenium dioxide removal method and material
05/16/2002US20020056701 Etching, shaping, or patterning layer or films with ceric ammonium nitrate in fabrication of semiconductor systems
05/16/2002US20020056697 Ruthenium and ruthenium dioxide removal method and material
05/15/2002EP1205965A1 Abrasive compound for cmp, method for polishing substrate and method for manufacturing semiconductor device using the same, and additive for cmp abrasive compound
05/15/2002EP1204712A1 Abrasive grain with improved projectability
05/14/2002US6387166 Reverse aggregation; heat sensitive
05/14/2002US6387139 Cerium oxide slurry for polishing, process for preparing the slurry, and process for polishing with the slurry
05/14/2002US6386950 Process for mechanical chemical polishing of layer of aluminium or aluminium alloy conducting material
05/09/2002US20020055324 Process for polishing silicon wafers
05/09/2002US20020053656 Cerium as oxidizer, ammonium cerium nitrate, and abrasive for slurry which is environmentally green, and contains slight cyanide not requiring waste treatment
05/08/2002EP1203801A2 Aqueous dispersion, process for its production and use
05/08/2002EP1202930A1 Cerium phosphate and/or lanthanum sol, preparation method and use for polishing
05/08/2002DE10054345A1 Wäßrige Dispersion, Verfahren zu deren Herstellung und Verwendung An aqueous dispersion, a process for their preparation and use
05/08/2002CN1084368C Chemical polishing agent and its application method
05/08/2002CN1084367C Leather shoe beautifying cream
05/07/2002US6383240 Containing amphipathic compound; polishing semiconductors
05/07/2002US6383239 Composite material of various hardness
05/07/2002US6383060 Method of polishing silicon wafer
05/07/2002CA2241079C Wax-free furniture polish with silicone components
05/02/2002WO2002014014A3 Chemical mechanical planarization of metal substrates
05/02/2002WO2001099170A3 Ceria slurry and process for the chemical-mechanical polishing of silicon dioxide
05/02/2002EP1201725A1 Abrasive compound for glass hard disk platter
05/02/2002EP1200532A1 Cmp composition containing silane modified abrasive particles
04/2002
04/30/2002US6379406 Water polish mixture, abrasive particles of metal oxide for ions
04/30/2002US6379225 Planarization process with abrasive polishing slurry that is selective to a planarized surface
04/25/2002WO2002033736A1 Chemical-mechanical polishing slurry and method
04/25/2002WO2002033023A1 Slurry for chemical-mechanical polishing copper damascene structures
04/25/2002WO2002033015A1 Polish compositions
04/25/2002WO2002033014A1 Method of polishing a memory or rigid disk with an ammonia and/or halide-containing composition
04/25/2002DE10048477A1 Verfahren zum chemisch-mechanischen Polieren von Schichten aus Metallen der Platingruppe A method for chemical mechanical polishing of layers of metals of the platinum group
04/24/2002EP1198534A1 Polishing liquid composition
04/24/2002CN1083618C New Chemical mechanical polishing process for layers of isolating material based on silicon derivatives or silicon
04/24/2002CN1083397C Silanized silicic acid, its preparation process and use
04/23/2002US6375693 Chemical-mechanical planarization of barriers or liners for copper metallurgy
04/23/2002US6375552 Slurries for chemical mechanical polishing
04/23/2002US6375545 Chemical mechanical method of polishing wafer surfaces
04/23/2002US6375541 Polishing fluid polishing method semiconductor device and semiconductor device fabrication method
04/18/2002WO2002031072A1 Cmp slurry composition and a method for planarizing semiconductor device using the same
04/18/2002US20020043027 Preventing formation of pits in copper wiring in chemical mechanical polishing of substrates for semiconductors, photomasks and memory hard disks
04/18/2002US20020043026 Chemical mechanical polishing; composition includes oxidizing agent, an inhibitor of a polyalkyleneimine, and a pH buffer
04/18/2002DE10046933A1 Process for the chemical-mechanical polishing of silicon wafers comprises rotating a silicon surface to be cleaned on a polishing plate covered with a polishing cloth with continuous
04/17/2002CN1083154C Grinding method, and method for manufacturing semiconductor device and device for making semiconductor
04/16/2002US6372648 Providing oxide particles in a basic slurry, particles including surface regions bonded to functional groups, slurry free of any binding polymer; using slurry of step to chemo-mechanically polish a substrate
04/11/2002US20020042208 Aqueous mixture containing phase transfer agents
04/11/2002US20020042199 Removal metal layer overcoating semiconductor; mixture containing oxidation inhibitor; reduce removal of metal in rcesses
04/10/2002EP0703847B1 Magnetorheological polishing devices and methods
04/10/2002CN1343752A Brightener compsn.
04/10/2002CN1343751A Brightener compsn.
04/10/2002CN1343750A Brightener compsn.
04/04/2002WO2002026906A1 Method for chemical-mechanical polishing of layers made from metals from the platinum group
04/04/2002US20020039875 Polishing agent for processing semiconductor, dispersant used therefor and process for preparing semiconductor device using above polishing agent for processing semiconductor
04/04/2002US20020039839 Polishing compositions for noble metals
04/03/2002EP1193745A1 Polishing composite for use in lsi manufacture and method of manufacturing lsi
04/03/2002EP1025175B1 Composition and process for treating hard surfaces
04/02/2002US6365522 Slurries of abrasive inorganic oxide particles and method for adjusting the abrasiveness of the particles
04/02/2002US6364920 CMP formulations
04/02/2002US6364919 Constant pressure in dispersion chambers prevents macro particles would lead to scratching
04/02/2002US6364744 CMP system and slurry for polishing semiconductor wafers and related method
03/2002
03/28/2002WO2002024413A2 Polishing by cmp for optimized planarization
03/28/2002WO2001081490A3 Slurries of abrasive inorganic oxide particles and method for polishing copper containing surfaces
03/28/2002US20020037642 Process for forming a metal interconnect
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