Patents for C09G 1 - Polishing compositions (7,846)
10/2001
10/10/2001CN1316477A Polishing composition for producing memory hard disk and polishing method
10/10/2001CN1072699C 抛光剂 Polishes
10/09/2001US6300249 Polishing compound and a method for polishing
10/09/2001US6299795 Polishing slurry
10/09/2001US6299659 Polishing material composition for polishing lsi devices comprising water and cerium oxide which has been surface treated with coupling agent to improve affinity for pads
10/04/2001WO2001032793A8 Use of cesium hydroxide in a dielectric cmp slurry
10/04/2001EP1139406A2 Chemical mechanical polishing process for low dishing of metal lines in semiconductor wafer fabrication
10/04/2001EP1138734A2 Aqueous dispersion for chemical mechanical polishing of metal films
10/04/2001EP1138733A2 Aqueous dispersion for chemical mechanical polishing of insulating films
10/04/2001EP0985007A4 Oxygen-containing phosphor powders, methods for making phosphor powders and devices incorporating same
10/03/2001CN1315991A Composition for polishing substrate for magnetic disk and method for producing substrate for magnetic disk
10/03/2001CN1315989A Chemical mechanical polishing slurry and method for using same
10/02/2001CA2033639C Metal-free emulsion polymers for high performance aqueous coatings
09/2001
09/27/2001US20010024933 Composition and method for polishing in metal CMP
09/26/2001EP1137056A1 Abrasive liquid for metal and method for polishing
09/26/2001EP1136534A1 Hybrid polishing slurry
09/26/2001CN1314444A Mixed polishing paste
09/25/2001US6294472 Dual slurry particle sizes for reducing microscratching of wafers
09/25/2001US6294106 Slurries of abrasive inorganic oxide particles and method for adjusting the abrasiveness of the particles
09/25/2001US6294105 Chemical mechanical polishing slurry and method for polishing metal/oxide layers
09/25/2001US6293848 Composition and method for planarizing surfaces
09/19/2001EP1133792A1 Chemical mechanical polishing of feram capacitors
09/18/2001US6290736 In chemical mechanical polishing (cmp) in planarization of noble metals, and the formation of noble metal damascene electrode structures
09/18/2001US6290735 Abrasive particles for surface polishing
09/18/2001US6290580 Polishing method for silicon wafers which uses a polishing compound which reduces stains
09/13/2001WO2001030886A3 Zwitterionic siloxane polymers and ionically cross-linked polymers formed therefrom
09/13/2001US20010020348 Particle with a functional group capable of trapping a metal ion, an oxidizing agent and water for chemical mechanical polishing of a copper-based metal
09/12/2001CN1312845A Chemical mechanical polishing slurry useful for copper/tantalum substrate
09/12/2001CN1312843A Chemical mechanical polishing slurry useful for copper/tantalum substrates
09/12/2001CN1312824A Contiuous bulk polymerization and esterification process and compositions including the polymeric product
09/12/2001CN1312345A Polishing composition for producing storage hard disc and polishing method thereof
09/11/2001US6287633 Finishing agents and method of using the same
09/07/2001WO2001064354A2 Method for repairing and lustering defects on hydrophilic coat surface
09/07/2001CA2401657A1 Method for repairing and lustering defects on hydrophilic coat surface
09/05/2001EP1130630A1 Abrasive composition for polishing lsi device
09/05/2001EP1129035A1 Aluminum oxide particles
09/05/2001CN1311279A Method for producing wax polish of slabstone
09/04/2001US6284151 Ferric nitrate-alumina based slurry containing ferric nonahydrate, water and nitric acid; corrosion resistance
09/04/2001US6284091 Unique chemical mechanical planarization approach which utilizes magnetic slurry for polish and magnetic fields for process control
08/2001
08/30/2001WO2001062440A1 Polishing pad with a transparent portion
08/30/2001US20010018270 Comprising silica abrasive and polycarboxylic acid to polish substrate of tantulum-containing metal film formed on dielectric film; accuracy
08/30/2001US20010017007 Polishing composition
08/28/2001US6280924 Planarization method using fluid composition including chelating agents
08/28/2001US6280652 Polishing edge surface of silicon wafers or oxide film-coated semiconductor wafers with formulation comprising water, silicon dioxide selected form colloidal silica, fumed silica, and precipitated silica
08/28/2001US6280490 Polishing composition and method for producing a memory hard disk
08/28/2001US6280489 Polishing compositions
08/23/2001WO2001060940A1 Biocides for polishing slurries
08/22/2001EP1125999A1 Polishing composition
08/22/2001EP1124912A1 A chemical mechanical polishing slurry system having an activator solution
08/21/2001US6277169 Method for making silver-containing particles
08/16/2001US20010014539 Planarization method using fluid composition including chelating agents
08/16/2001US20010013507 Method for CMP of low dielectric constant polymer layers
08/16/2001US20010013506 Chemical mechanical polishing; microelectronics; semiconductors; eliminating short circuiting
08/16/2001EP1123956A1 Aqueous dispersion for chemical mechanical polishing
08/15/2001CN1308107A Leather dry cleaning finishing cream
08/15/2001CN1069678C Vehicle washing and polishing agent
08/14/2001US6274063 Metal polishing composition
08/09/2001WO2001057919A1 Polishing composite for use in lsi manufacture and method of manufacturing lsi
08/09/2001WO2001057150A1 Polishing composition
08/09/2001US20010011515 Mixture of an urea and phenolic compound
08/08/2001CN1307079A 抛光组合物 The polishing composition
08/07/2001US6271139 Smoothness of emission display grid using fine silica colloids
08/07/2001US6270395 Oxidizing polishing slurries for low dielectric constant materials
08/07/2001US6270393 Abrading a semiconductor integrated circuit using a slurry comprising an aluminum grain, an inorganic salt, a water-soluble chelating agent, and an abrasive oil; no microscratches; thin film magnetic head
08/07/2001CA2203726C Silanized silica
08/02/2001WO2001055028A1 Oxide powder and method for preparing the same, and product using the same
08/02/2001WO2001032793A3 Use of cesium hydroxide in a dielectric cmp slurry
08/01/2001CN1306560A CMP slurry contg. solid catalyst
07/2001
07/31/2001US6267909 Useful for thinning, polishing and planarizing integrated circuitry deposited on semiconductor wafers which have metal conducting film deposits on surfaces
07/26/2001WO2001052618A2 Stabilized silica and methods of making and using the same
07/26/2001CA2396953A1 Stabilized silica and methods of making and using the same
07/25/2001EP1118647A1 Polishing slurry
07/25/2001EP1117744A1 Composition for abradable and/or scratchable surfaces
07/25/2001CN1305411A Silicon oxide particles
07/25/2001CN1304968A Nm-class polishing liquid and its preparing process
07/24/2001CA2198813C Waxless composition for cleaning and polishing acrylic and glass surfaces
07/19/2001US20010008828 Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing process
07/18/2001EP1116762A1 Aqueous dispersion for chemical mechanical polishing and chemical mechanical polishing process
07/18/2001EP1115804A1 Polishing liquid for polishing components, preferably wafers, especially for chemically-mechanically polishing components of this type
07/18/2001EP1115803A1 Oxidizing polishing slurries for low dielectric constant materials
07/17/2001US6261476 Hybrid polishing slurry
07/12/2001WO2001049450A1 Chemical mechanical polishing process for manufacturing dopant-striation-free silicon wafers
07/10/2001US6258882 Wax-resin surface polishes
07/10/2001US6258721 Diamond slurry for chemical-mechanical planarization of semiconductor wafers
07/10/2001US6258140 Polishing composition
07/10/2001US6258137 CMP products
07/10/2001US6258136 Fixed abrasives for optical polishing
07/05/2001WO2001048807A1 Abrasives for chemical mechanical polishing
07/05/2001WO2001048114A1 Composition for polishing magnetic disk substrate and polishing method, and magnetic disk substrate polished thereby
07/05/2001WO2001048109A1 Hard surface treating agent, stain-proofing agent and method for surface treatment
07/05/2001US20010006225 A slurry used for chemical mechanical polishing of a substrate having a copper-containing film at the surface, which contains and abrasive, an oxidizer, and adhesive-inhibitor preventing adhesion of polishing product to
07/05/2001US20010006224 A slurry for chemical mechanical polishing of a substrate containing tantalum or tantalum nitride comprising a silica polishing grain and an inorganic salt to prevent dishing and erosion
07/05/2001US20010006031 Chemical meachanical polishing slurry for polishing copper metal or alloy film formed on tantalum or tantalum nitride film comprising an oxidizer, an organic acid and an alkanolamine
07/05/2001DE10002450A1 Polish for post-treatment of lacquered surfaces in the automobile industry comprises preferably 5-10 wt.% polish and a 1-1:3, preferably 1:2 mixture of thinner and spray dissolver
07/05/2001CA2363819A1 Hard surface treating agent, stain-proofing agent and method for surface treatment
07/04/2001CN1301992A Leveling method
07/04/2001CN1068031C Preparation of stain-eliminating polishing powder
06/2001
06/28/2001US20010005009 A slurry for chemical mechanical polishing a copper-containing metal film, comprising theta -alumina mainly comprising secondary particles made of aggregated primary particles as polishing grains, an oxidizer and an organic acid
06/28/2001DE19942962A1 Wachsmischung für wäßrige Anwendungen Wax composition for aqueous applications
06/27/2001EP1111023A2 Neutral slurry of colloidal silica
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