Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143) |
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04/07/1998 | US5736446 Method of fabricating a MOS device having a gate-side air-gap structure |
04/07/1998 | US5736445 Method for producing at least two transsistors in a semiconductor body |
04/07/1998 | US5736443 Flash EEPROM cell and method of manufacturing the same |
04/07/1998 | US5736442 Forming protective insulating film made of same material as isolating film on conductive layer, forming oxide film at electrode facings of gate electrodes, etching, |
04/07/1998 | US5736439 Heating at the second temperature higher than the first temperature |
04/07/1998 | US5736438 Field effect thin-film transistor and method of manufacturing the same as well as semiconductor device provided with the same |
04/07/1998 | US5736437 Method of fabricating a bottom and top gated thin film transistor having an electrical sidewall connection |
04/07/1998 | US5736436 Method of making a thin film transistor panel |
04/07/1998 | US5736435 Process for fabricating a fully self-aligned soi mosfet |
04/07/1998 | US5736434 Forming gate electrode, applying voltage between electrode and cathode, maintaining voltage, forming anodic oxide film, forming channel |
04/07/1998 | US5736430 Transducer having a silicon diaphragm and method for forming same |
04/07/1998 | US5736418 Anisotropic etching the polysilicon and silicon dioxide barrier layer, forming a v-shaped groove |
04/07/1998 | US5736417 Method of fabricating double photoresist layer self-aligned heterojunction bipolar transistor |
04/07/1998 | US5736416 Fabrication process for MOSFET using oblique rotation ion implantation |
04/07/1998 | US5736414 Forming a silicon semiconductor layer on the substrate, a dielctric layer, a gate electrode of aluminum, surface layer of aluminum oxide, doping silcon layer twice by masking first by anodized layer, removing it, doping again |
04/07/1998 | US5736061 Semiconductor element mount and producing method therefor |
04/02/1998 | WO1998013881A1 Semiconductor device and production method thereof |
04/02/1998 | WO1998013880A1 POLY-Si/POLY-SiGe GATE FOR CMOS DEVICES |
04/02/1998 | WO1998013878A1 Self-aligned non-volatile storage cell |
04/02/1998 | WO1998013865A1 Method of producing a mos transistor |
04/02/1998 | WO1998013861A1 Screening oxide for source and drain regions formed from solid dopant source |
04/02/1998 | WO1998013829A1 Two-transistor flash eprom cell |
04/02/1998 | WO1998013811A1 Display device |
04/02/1998 | WO1998013775A1 System and method for predicting the behavior of a component |
04/02/1998 | WO1998013300A1 Ferroelectric material, method of manufacturing the same, semiconductor memory, and method of manufacturing the same |
04/02/1998 | DE19742181A1 Semiconductor component manufacturing method for IGBT, DMOSFET |
04/02/1998 | DE19724221A1 Non volatile memory device |
04/02/1998 | DE19705791C1 Power MOSFET device structure |
04/02/1998 | DE19646148A1 Planar semiconductor component for monolithic integrated circuit |
04/02/1998 | DE19640413A1 Verfahren zur Herstellung barrierenfreier Halbleiterspeicheranordnungen A process for preparing barrier-free semiconductor memory devices |
04/02/1998 | DE19640308A1 Leistungs-MOS-Bauelement Power MOS device |
04/02/1998 | DE19640246A1 Halbleiteranordnung mit geschützter Barriere für eine Stapelzelle A semiconductor device with a protected barrier to cell stack |
04/02/1998 | DE19640211A1 Verfahren zur Herstellung barrierenfreier Halbleiterspeicheranordnungen A process for preparing barrier-free semiconductor memory devices |
04/02/1998 | DE19639875C1 Verfahren zur Herstellung eines MOS-Transistors A process for producing a MOS transistor |
04/02/1998 | DE19638969A1 EEPROM cell with poly:silicon-distance-floating gate |
04/01/1998 | EP0833394A1 Bidirectional breakover protection diode |
04/01/1998 | EP0833393A1 Floating gate non-volatile memory cell with low erasing voltage and manufacturing method |
04/01/1998 | EP0833392A2 Field effect controllable vertical semiconductor device |
04/01/1998 | EP0833391A1 Semiconductor device on III-V semiconductor substrate and method for fabricating it |
04/01/1998 | EP0833390A2 Cathode assembly for GTO thyristor |
04/01/1998 | EP0833389A2 GTO thyristor |
04/01/1998 | EP0833388A2 Amplifying gate thyristor with lateral resistance |
04/01/1998 | EP0833387A1 Field effect controllable semiconductor device |
04/01/1998 | EP0833386A1 Vertical semiconductor device controllable by field effect |
04/01/1998 | EP0833380A2 Improvements in or relating to mosfet transistors |
04/01/1998 | EP0833379A2 Semiconductor device and manufacturing method thereof |
04/01/1998 | EP0833377A2 Enhancement of hydrogenation of materials encapsulated by an oxide |
04/01/1998 | EP0833345A2 Non-volatile semiconductor memory device |
04/01/1998 | EP0833163A1 Accelerometer |
04/01/1998 | EP0833137A2 Circuit and method of compensating for membrane stress in a sensor |
04/01/1998 | EP0832498A1 Method of manufacturing a pic (power integrated circuit) device, and a pic device manufactured by such a method |
04/01/1998 | EP0786786A4 Capacitor with a double electrical layer |
03/31/1998 | US5734670 Semiconductor device, semiconductor laser, and high electron mobility transistor |
03/31/1998 | US5734612 Semiconductor memory device with a plurality of memory cells connected to bit lines and method of adjusting the same |
03/31/1998 | US5734609 Integrated circuit memory devices having reduced susceptibility to inadvertent programming and erasure and methods of operating same |
03/31/1998 | US5734449 Liquid crystal display apparatus having an opaque conductive capacitor electrode and manufacturing method thereof |
03/31/1998 | US5734440 White clip circuit |
03/31/1998 | US5734195 Semiconductor wafer for epitaxially grown devices having a sub-surface getter region |
03/31/1998 | US5734194 Semiconductor device and method of making |
03/31/1998 | US5734193 Termal shunt stabilization of multiple part heterojunction bipolar transistors |
03/31/1998 | US5734189 Low parasitic source inductance field-effect transistor device having via connections disposed along an outer periphery thereof |
03/31/1998 | US5734187 Memory cell design with vertically stacked crossovers |
03/31/1998 | US5734185 MOS transistor and fabrication process therefor |
03/31/1998 | US5734183 Semiconductor device |
03/31/1998 | US5734181 Semiconductor device and manufacturing method therefor |
03/31/1998 | US5734177 Semiconductor device, active-matrix substrate and method for fabricating the same |
03/31/1998 | US5734175 Insulated-gate semiconductor device having a position recognizing pattern directly on the gate contact area |
03/31/1998 | US5734174 Photo hole burning memory |
03/31/1998 | US5733818 Method for fabricating semiconductor device with planarization step using CMP |
03/31/1998 | US5733812 Semiconductor device with a field-effect transistor having a lower resistance impurity diffusion layer, and method of manufacturing the same |
03/31/1998 | US5733811 Method for fabricating vertical type mosfet |
03/31/1998 | US5733810 Method of manufacturing MOS type semiconductor device of vertical structure |
03/31/1998 | US5733806 Spacer formation |
03/31/1998 | US5733805 Method of fabricating semiconductor device utilizing a GaAs single crystal |
03/31/1998 | US5733804 Fabricating fully self-aligned amorphous silicon device |
03/31/1998 | US5733803 Method for producing a multiplicity of microelectronic circuits on SOI |
03/31/1998 | US5733797 Method of making a semiconductor device with moisture impervious film |
03/31/1998 | US5733794 Breakdown voltage can be optimized |
03/31/1998 | US5733793 Process formation of a thin film transistor |
03/31/1998 | US5733792 MOS field effect transistor with improved pocket regions for suppressing any short channel effects and method for fabricating the same |
03/31/1998 | US5733791 Methods for fabrication of bipolar device having high ratio of emitter to base area |
03/31/1998 | US5733661 Metal oxide containing ions of an organic carboxylic acid salt and/or ions of an inorganic oxoacid salt |
03/31/1998 | US5733641 Buffered substrate for semiconductor devices |
03/31/1998 | US5733369 Method for forming crystal |
03/26/1998 | WO1998012756A1 Semiconductor device and process for manufacturing the same |
03/26/1998 | WO1998012755A1 Semiconductor device |
03/26/1998 | WO1998012754A2 Electronic devices including electrodes comprising chromium nitride and a method of manufacturing such devices |
03/26/1998 | WO1998012753A1 Short channel self aligned vmos field effect transistor |
03/26/1998 | WO1998012749A2 Emitter-switched thyristor |
03/26/1998 | WO1998012741A1 Short channel non-self aligned vmos field effect transistor |
03/26/1998 | DE19709731A1 Electrostatic capacitive acceleration sensor |
03/26/1998 | DE19709007A1 MOS capacitor semiconductor component for A=D or D=A converter |
03/25/1998 | EP0831534A2 Semiconductor device with a passivation layer |
03/25/1998 | EP0831524A1 Process for manufacturing a dual floating gate oxide flash memory cell |
03/25/1998 | EP0831521A2 Method for forming a silicide region |
03/25/1998 | EP0831520A2 Method of manufacturing a MIS structure on silicon carbide (SiC) |
03/25/1998 | EP0831357A2 Liquid crystal display device |
03/25/1998 | EP0830728A2 Monolithic class d amplifier |
03/25/1998 | CN1177213A Solid photoing device |
03/25/1998 | CN1177212A Method of fabricating flash memory device |