Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
12/2003
12/10/2003CN1461179A Electrooptical device and electronic instrument
12/10/2003CN1461107A 晶体管电路 Transistor circuit
12/10/2003CN1461058A Semiconductor device and its mfg. method
12/10/2003CN1461056A Nonvolatile semiconductor storage device and its manufacturing method
12/10/2003CN1461054A Electrooptical device and semiconductor device
12/10/2003CN1461048A Method for mfg. thin film transistor
12/10/2003CN1461045A Method and device for semiconductor crystallization by laser beam
12/10/2003CN1461042A Method for producing semiconductor substrate
12/10/2003CN1461041A Simple technology for manufacturing semiconductor device
12/10/2003CN1460980A 图像显示装置 The image display apparatus
12/10/2003CN1460979A 显示装置 Display device
12/10/2003CN1460893A Method for mfg. liquid crystal display device
12/10/2003CN1460885A Electrooptical device and electronic equipment
12/10/2003CN1460884A Reflection active matrix liquid crystal display and its making method
12/10/2003CN1460846A Film type semiconductor pressure sensor
12/10/2003CN1130777C Method for making film semiconductor device
12/10/2003CN1130776C Semiconductor component with linear current-to-voltage characteristics
12/10/2003CN1130774C Non-volatile semiconductor storage apparatus and production method of same
12/10/2003CN1130772C Semiconductor device comprising high density integrated circuit having large number of insulated gate field effect transistors
12/10/2003CN1130770C 静电放电保护电路 Electrostatic discharge protection circuit
12/10/2003CN1130766C Process for mfg. thin-film transistor
12/10/2003CN1130765C Integrated circuit with self-aligning hydrogen barrier layer and its preparing process
12/10/2003CN1130762C Reduced parasitic resistance and capacitance field effect transisitor and its mfg. method
12/10/2003CN1130761C Method of forming integrated circuit capacitors and capacitors formed thereby
12/10/2003CN1130758C Method for fabricating semiconductor device
12/10/2003CN1130657C Semiconductor device simulation method and simulator
12/10/2003CN1130550C Sensor with diaphragm
12/09/2003US6662344 Semiconductor device and method for fabricating the same
12/09/2003US6662031 Method and device for the noninvasive determination of hemoglobin and hematocrit
12/09/2003US6661688 Method and article for concentrating fields at sense layers
12/09/2003US6661476 Liquid crystal display device and its manufacturing method
12/09/2003US6661290 High-frequency power amplifier
12/09/2003US6661277 Enhanced conductivity body biased PMOS driver
12/09/2003US6661180 Light emitting device, driving method for the same and electronic apparatus
12/09/2003US6661096 Wiring material semiconductor device provided with a wiring using the wiring material and method of manufacturing thereof
12/09/2003US6661076 Semiconductor device
12/09/2003US6661074 Receiver comprising a variable capacitance diode
12/09/2003US6661068 Semiconductor device and method of providing regions of low substrate capacitance
12/09/2003US6661066 Semiconductor device including inversely tapered gate electrode and manufacturing method thereof
12/09/2003US6661065 Semiconductor device and SOI substrate
12/09/2003US6661059 Lateral drift region of n-type conductivity and a p-type drain region; high voltage; semiconductors
12/09/2003US6661058 Highly reliable gate oxide and method of fabrication
12/09/2003US6661057 Tri-level segmented control transistor and fabrication method
12/09/2003US6661056 DMOS transistor protected against polarity reversal
12/09/2003US6661055 Prevents generation of a coupling noise; gate electrode electrically isolated by oxide film and connected to power supply source
12/09/2003US6661054 Semiconductor device and method of fabricating the same
12/09/2003US6661053 Memory cell with trench transistor
12/09/2003US6661052 Semiconductor device and method of manufacturing the same
12/09/2003US6661050 Memory cell structure with trench capacitor and method for fabrication thereof
12/09/2003US6661049 Microelectronic capacitor structure embedded within microelectronic isolation region
12/09/2003US6661046 Image sensor and method for fabricating the same
12/09/2003US6661044 Method of manufacturing MOSEFT and structure thereof
12/09/2003US6661042 One-transistor floating-body DRAM cell in bulk CMOS process with electrically isolated charge storage region
12/09/2003US6661040 Semiconductor device with insulating gate surrounded by impurity layers
12/09/2003US6661038 Semiconductor device and method of producing the same
12/09/2003US6661037 Low emitter resistance contacts to GaAs high speed HBT
12/09/2003US6661036 Semiconductor switches with evenly distributed fine control structures
12/09/2003US6661026 Thin film transistor substrate
12/09/2003US6661024 Forming organic semiconductor channel; dielectric patch functions as gate electrode; lamination, thinning layers
12/09/2003US6661022 Information processing structures
12/09/2003US6661021 Quantum size effect type micro electron gun and flat display unit using it and method for manufacturing the same
12/09/2003US6660666 Integrated processing system for forming an insulating layer of thin film transistor liquid crystal display
12/09/2003US6660664 Structure and method for formation of a blocked silicide resistor
12/09/2003US6660660 Methods for making a dielectric stack in an integrated circuit
12/09/2003US6660658 Transistor structures, methods of incorporating nitrogen into silicon-oxide-containing layers; and methods of forming transistors
12/09/2003US6660657 Methods of incorporating nitrogen into silicon-oxide-containing layers
12/09/2003US6660623 Semiconductor device and method of manufacturing the same
12/09/2003US6660616 P-i-n transit time silicon-on-insulator device
12/09/2003US6660609 Method of manufacturing a semiconductor device using laser irradiation
12/09/2003US6660607 Method for fabricating heterojunction bipolar transistors
12/09/2003US6660605 Method to fabricate optimal HDD with dual diffusion process to optimize transistor drive current junction capacitance, tunneling current and channel dopant loss
12/09/2003US6660604 Method of forming double junction region and method of forming transfer transistor using the same
12/09/2003US6660603 Higher voltage drain extended MOS transistors with self-aligned channel and drain extensions
12/09/2003US6660602 Stand-alone triggering structure for ESD protection of high voltage CMOS
12/09/2003US6660601 Semiconductor device and method for fabricating the same
12/09/2003US6660600 Methods of forming integrated circuitry, methods of forming elevated source/drain regions of a field effect transistor, and methods of forming field effect transistors
12/09/2003US6660598 Method of forming a fully-depleted SOI ( silicon-on-insulator) MOSFET having a thinned channel region
12/09/2003US6660597 Method for manufacturing semiconductor integrated circuit device
12/09/2003US6660596 Double planar gated SOI MOSFET structure
12/09/2003US6660592 Fabricating a DMOS transistor
12/09/2003US6660591 Trench-gate semiconductor devices having a channel-accommodating region and their methods of manufacture
12/09/2003US6660590 Vertical transistor and method of manufacturing thereof
12/09/2003US6660589 Semiconductor devices and methods for fabricating the same
12/09/2003US6660588 High density floating gate flash memory and fabrication processes therefor
12/09/2003US6660586 Semiconductor device and process for manufacturing same
12/09/2003US6660580 Capacitor of an integrated circuit device and method of manufacturing the same
12/09/2003US6660577 Method for fabricating metal gates in deep sub-micron devices
12/09/2003US6660576 Substrate and method for producing variable quality substrate material
12/09/2003US6660574 Method of forming a semiconductor device including recombination center neutralizer
12/09/2003US6660572 Thin film semiconductor device and method for producing the same
12/09/2003US6660571 High voltage power MOSFET having low on-resistance
12/09/2003US6660570 Method of fabricating a high voltage semiconductor device using SIPOS
12/09/2003US6660569 Method for producing a power semiconductor device with a stop zone
12/09/2003US6660555 X-ray image sensor and method for fabricating the same
12/09/2003US6660549 Method of manufacturing an active matrix type display circuit
12/09/2003US6660545 Semiconductor device and manufacturing method therefor, circuit substrate, and electronic apparatus
12/09/2003US6660393 Reduced resistance
12/09/2003US6660085 Polycrystal thin film forming method and forming system
12/09/2003US6658948 Semiconductor dynamic quantity sensor
12/04/2003WO2003100878A2 A low-forward-voltage molecular rectifier
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