Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
07/2000
07/06/2000WO2000038935A1 Local vectorial particle cleaning
07/06/2000WO2000021715A3 Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head
07/06/2000WO2000016378A3 Method of fabricating group-iii nitride-based semiconductor device
07/06/2000WO2000008674A9 Mosfet having self-aligned gate and buried shield and method of making same
07/06/2000WO2000002675A9 Automated semiconductor processing system
07/06/2000WO2000002253A3 Silicon thin-film, integrated solar cell, module, and methods of manufacturing the same
07/06/2000WO2000001615A8 Method and apparatus for the preparation of high purity phosphine or other gas
07/06/2000WO1999067812A9 Chuck table for semiconductor wafer
07/06/2000WO1999065065A9 Etching process for producing substantially undercut free silicon on insulator structures
07/06/2000WO1999047722A3 Method for applying a dielectric cap film to a dielectric stack
07/06/2000DE19963883A1 Power semiconductor casing for surface securing enclosing substrate top and bottom faces, with top face carrying power semiconductor chip
07/06/2000DE19962703A1 Control of discharge of semiconductor component, arriving from production for testing, with time saving
07/06/2000DE19962053A1 Semiconductor device with silicon-on-insulator structure has semiconductor regions in latter separated via separation regions with insulating upper part and semiconductor lower part
07/06/2000DE19959565A1 Halbleiterbauelement und Entwurfsverfahren hierfür The semiconductor device design method therefor, and
07/06/2000DE19958144A1 Programmierbare Zwischenverbindungszelle zum wahlweisen Verbinden von Schaltkreisknoten in einem integrierten Schaltkreis Programmable interconnect cell for selectively connecting circuit nodes in an integrated circuit
07/06/2000DE19958143A1 Programmable connection for logic IC circuit nodes using switching FET with floating gate coupled to floating gate of read FET
07/06/2000DE19957609A1 Making electrically conducting adhesive connection between module and electronic component e.g. for chip card, involves first introducing conducting body arranged in compressible fixing structure between them
07/06/2000DE19956472A1 Flüssigkeits-Abgabesystem Liquid dispensing system
07/06/2000DE19951930A1 Two-transistor type electrically erasable programmable read only memory has a selection transistor gate electrode with two selection gate electrodes separated by an interlevel insulation layer
07/06/2000DE19947887A1 Static semiconductor memory (SRAM) for LV operation with CMOS memory cells, each with six transistors of specified conductivities
07/06/2000DE19940320A1 Nicht reflektierende Beschichtungspolymere und Verfahren zu deren Herstellung Non-reflective coating polymers and methods for their preparation
07/06/2000DE19934758A1 Semiconductor device, e.g. double diffused metal oxide semiconductor transistor has a control electrode extending above and between different depth interfaces between a first conductivity type region and two second conductivity type regions
07/06/2000DE19929490A1 Etching device used e.g. in the production of piezoelectric components comprises a bell-shaped hood, a wafer deposition table, a gas concentrating element, and a gas feed connection
07/06/2000DE19928781C1 DRAM cell array has deep word line trenches for increasing transistor channel length and has no fixed potential word lines separating adjacent memory cells
07/06/2000DE19927747C1 Multi-chip module for leads-on-chip mounting, includes rectangular chips on single wafer
07/06/2000DE19915651A1 Semiconductor component for semiconductor chip
07/06/2000DE19915146C1 Production of highly pure copper wiring trace on semiconductor wafer for integrated circuit by applying metal base coat, plating and structurization uses dimensionally-stable insoluble counter-electrode in electroplating
07/06/2000DE19914490C1 DRAM or FRAM cell array, with single transistor memory cells, has trench conductive structures and upper source-drain regions overlapping over a large area for low contact resistance between capacitors and transistors
07/06/2000DE19860779A1 Method for monitoring Faraday cups in ion implantation includes loopback device and interlock signals
07/06/2000DE19860701A1 Integrated circuit structure comprises a common substrate having different technology components, e.g. hetero bipolar transistors, with active regions consisting of the same vertical sequence of semiconductor layers
07/06/2000DE19860587A1 Verfahren zur Verbindung zweier Oberflächen und Vorrichtung A method for joining two surfaces and apparatus
07/06/2000DE19860581A1 Halbleiterelement und Verfahren zur Herstellung Semiconductor element and process for producing
07/06/2000DE19860501A1 Capacitor for a dynamic random access memory is produced by applying a conductive support to a structured alternating conductive and sacrificial layer sequence prior to selective sacrificial layer removal
07/06/2000DE19860084A1 Verfahren zum Strukturieren eines Substrats A method for patterning a substrate
07/06/2000DE19860080A1 Microelectronic structure, especially the bottom electrode of a ferroelectric memory storage capacitor, has a sputtered oxygen-containing iridium layer between a silicon-containing layer and an oxygen barrier layer
07/06/2000DE19860010A1 Surface cleaning method for low temperature microscopy and spectroscopy uses glow discharge of argon gas
07/06/2000DE19859469A1 Vorrichtung und Verfahren zum Behandeln von Substraten Apparatus and method for processing substrates
07/06/2000DE19859468A1 Vorrichtung zum Behandeln von Substraten Apparatus for processing substrates
07/06/2000DE19859467A1 Substrathalter Substrate holder
07/06/2000DE19859466A1 Vorrichtung und Verfahren zum Behandeln von Substraten Apparatus and method for processing substrates
07/06/2000DE19858428A1 Verfahrbarer x/y-Koordinaten-Meßtisch Movable x / y coordinate measurement table
07/06/2000CA2294553A1 Ultrasonic vibration bonding machine
07/05/2000EP1017155A1 Positioning device, driving unit, and aligner equipped with the device
07/05/2000EP1017127A2 Method for connecting two surfaces and device
07/05/2000EP1017113A1 Nitride semiconductor device
07/05/2000EP1017108A2 Semiconductor devices and methods of manufacturing the same
07/05/2000EP1017104A2 Ferroelectric intergrated circuit with protective layer incorporating oxygen and method for fabricating same
07/05/2000EP1017103A1 Power switch with DI/DT control
07/05/2000EP1017102A1 Integrated circuit comprising inductive elements
07/05/2000EP1017101A1 Integrated circuit comprising a capacitive network with low dispersion
07/05/2000EP1017100A1 Three-dimensional device
07/05/2000EP1017099A2 Improvements in or relating to semiconductor devices
07/05/2000EP1017098A2 Integrated circuit having a bonding pad and manufacturing method thereof
07/05/2000EP1017097A1 Manufacturing method of salicide contacts for non-volatile memory
07/05/2000EP1017096A2 Method of fabricating semiconductor memory device
07/05/2000EP1017095A2 DRAM trench capacitor cell
07/05/2000EP1017094A2 Wafer-level package and a method of manufacturing thereof
07/05/2000EP1017093A1 Power semiconductor device and process for manufacturing it
07/05/2000EP1017092A1 Process for manufacturing a resistive structure used in semiconductor integrated circuit
07/05/2000EP1017091A2 A processing method of silicon wafer and a processing apparatus
07/05/2000EP1017090A1 Semiconductor wafer polishing device
07/05/2000EP1017089A2 Method of manufacturing a gate electrode
07/05/2000EP1017088A1 Selective salicization process for semiconductor devices
07/05/2000EP1017087A1 Process for manufacturing a semiconductor substrate integrated MOS transistor
07/05/2000EP1017086A1 Projection aligner, method of manufacturing the aligner, method of exposure using the aligner, and method of manufacturing circuit devices by using the aligner
07/05/2000EP1017085A2 Semiconductor device manufacturing apparatus employing vacuum system
07/05/2000EP1017010A2 Electrostatic discharge protection for sensors
07/05/2000EP1017009A2 Apparatus and method for contacting a sensor conductive layer
07/05/2000EP1016992A1 Performance driven multi-valued variable supply voltage scheme for low-power design of VLSI circuits and system
07/05/2000EP1016930A1 Bottom antireflective layer operating in destructive interference and absorption modes
07/05/2000EP1016738A2 Electroplaner
07/05/2000EP1016621A2 Method for producing narrow pores and structure having the narrow pores, and narrow pores and structure produced by the method
07/05/2000EP1016620A2 Method for producing co-planar surface structures
07/05/2000EP1016465A1 Spin coating method and coating apparatus
07/05/2000EP1016143A2 Electrode means, comprising polymer materials, with or without functional elements and an electrode device formed of said means
07/05/2000EP1016140A1 Method for wiring semi-conductor components in order to prevent product piracy and manipulation, semi-conductor component made according to this method and use of said semi-conductor component in a chip card
07/05/2000EP1016138A1 Plastic integrated circuit package and method and leadframe for making the package
07/05/2000EP1016136A1 Microelectronics structure comprising a low voltage part provided with protection against a high voltage part and method for obtaining said protection
07/05/2000EP1016135A1 Fusion-bond electrical feed-through
07/05/2000EP1016134A1 Plasma reactor for passivating a substrate
07/05/2000EP1016133A1 Method of planarizing the upper surface of a semiconductor wafer
07/05/2000EP1016132A1 Capacitors in integrated circuits
07/05/2000EP1016131A1 Process for the removal of copper and other metallic impurities from silicon
07/05/2000EP1016130A1 Metal and metal silicide nitridization in a high density, low pressure plasma reactor
07/05/2000EP1016129A1 CONTROLLING THREADING DISLOCATION DENSITIES IN Ge ON Si USING GRADED GeSi LAYERS AND PLANARIZATION
07/05/2000EP1016128A1 Storage assembly for wafers
07/05/2000EP1016127A1 A fluorometric method for increasing the efficiency of the rinsing and water recovery process in the manufacture of semiconductor chips
07/05/2000EP1016126A2 Optical inspection module and method for detecting particles and defects on substrates in integrated process tools
07/05/2000EP1016122A1 Continuous deposition of insulating material using multiple anodes alternated between positive and negative voltages
07/05/2000EP1016120A1 Resistive heating of power coil to reduce transient heating/start up effects
07/05/2000EP1016118A1 Apparatus and method for improved scanning efficiency in an ion implanter
07/05/2000EP1016117A1 Device and method for ion beam etching
07/05/2000EP1016116A2 Apparatus for improving etch uniformity and methods therefor
07/05/2000EP1016092A1 Method and apparatus for producing extreme ultra-violet light for use in photolithography
07/05/2000EP1016088A1 Ferroelectric memory cell with shunted ferroelectric capacitor and method of making same
07/05/2000EP1016087A1 Memory location arrangement and its use as a magnetic ram and as an associative memory
07/05/2000EP1016085A1 Flash memory array
07/05/2000EP1015931A2 Optical system, especially a projection light facility for microlithography
07/05/2000EP1015856A1 Temperature probe
07/05/2000EP1015843A1 Lever arm for a scanning microscope