Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
09/2002
09/18/2002CN1370209A Polishing system with stopping compound and method of its use
09/18/2002CN1370208A Chemical mechanical polishing systems and methods for their use
09/18/2002CN1370207A Polishing system and method of its use
09/18/2002CN1369919A Solar cell and mfg. method thereof
09/18/2002CN1369915A Semiconductor device and its mfg. method
09/18/2002CN1369912A Semiconductor integrated circuit and its preparing method
09/18/2002CN1369911A Wire frame, semiconductor device using such frame and its mfg. method
09/18/2002CN1369908A Mfg. method of semiconductor integrated circuit device contg. non-volatility semiconductor memory
09/18/2002CN1369907A Mfg. method of buryed non-volatility semiconductor memory unit
09/18/2002CN1369906A Tester of chip without package
09/18/2002CN1369905A Package method for high-correctness high-sensitivity Hall sensor and IC
09/18/2002CN1369904A Heteroepitavy technology for growing silicon carbide film on sapphire substrate
09/18/2002CN1369903A Method for mfg. silicon Mos field effect transistor on insulating layer
09/18/2002CN1369902A Self-adption plasma attribute system
09/18/2002CN1369901A Mfg. method of semiconductor device
09/18/2002CN1369859A Layot encode method for photoetching system of array-type integrated circit
09/18/2002CN1369854A Semiconductor device and its mfg. method and electronic camera installation
09/18/2002CN1369747A Exposure method and exposure device
09/18/2002CN1369745A Correction method of photomask and mfg. method of semiconductor element
09/18/2002CN1369534A Abrasive compsns. and abrasive process using such compsns.
09/18/2002CN1369530A Polishing compsns. and polishing method using same
09/18/2002CN1369365A Mould open/close mechanism of resin sealing device
09/18/2002CN1091303C Epitaxial wafer for gap light-emitting element and gap light-emitting element
09/18/2002CN1091301C 半导体器件 Semiconductor devices
09/18/2002CN1091298C Method of mfg. semiconductor device
09/18/2002CN1091270C Parts testing method
09/18/2002CN1091264C Light-absorbing antireflective layers with improved performance due to refractive index optimization
09/18/2002CN1091262C 相移掩模 Phase shift mask
09/18/2002CN1091261C Phase shift mask and method for fabricating same
09/18/2002CN1091259C Method for detecting operational errors of tester for semiconductor devices
09/17/2002US6453446 Timing closure methodology
09/17/2002US6453274 Method of forming a pattern using proximity-effect-correction
09/17/2002US6453264 Surface flaw detection using spatial raman-based imaging
09/17/2002US6453214 Method of using a specimen sensing end effector to align a robot arm with a specimen stored on or in a container
09/17/2002US6453001 X-ray exposure apparatus
09/17/2002US6453000 Exposure method, exposure device and semiconductor device manufacturing method
09/17/2002US6452862 Semiconductor memory device having hierarchical word line structure
09/17/2002US6452860 Semiconductor memory device having segment type word line structure
09/17/2002US6452859 Dynamic semiconductor memory device superior in refresh characteristics
09/17/2002US6452856 DRAM technology compatible processor/memory chips
09/17/2002US6452853 Nonvolatile semiconductor memory
09/17/2002US6452830 Memory configuration including a plurality of resistive ferroelectric memory cells
09/17/2002US6452828 Dynamic random access memory (DRAM) having a structure for emplying a word line low voltage
09/17/2002US6452825 256 meg dynamic random access memory having a programmable multiplexor
09/17/2002US6452824 Semiconductor memory device
09/17/2002US6452779 One-mask metal-insulator-metal capacitor and method for forming same
09/17/2002US6452776 Capacitor with defect isolation and bypass
09/17/2002US6452775 Electrostatic chuck and method for manufacturing the same
09/17/2002US6452764 Limiting magnetoresistive electrical interaction to a preferred portion of a magnetic region in magnetic devices
09/17/2002US6452712 Method of manufacturing spatial light modulator and electronic device employing it
09/17/2002US6452671 Illuminator for macro inspection, macro inspecting apparatus and macro inspecting method
09/17/2002US6452662 Lithography apparatus
09/17/2002US6452661 Illumination system and exposure apparatus and method
09/17/2002US6452503 Semiconductor wafer imaging system
09/17/2002US6452439 Inductive voltage spike generator with diode shunt
09/17/2002US6452437 Voltage generator for compensating for temperature dependency of memory cell current
09/17/2002US6452427 Dual output capacitance interface circuit
09/17/2002US6452407 Probe contactor and production method thereof
09/17/2002US6452400 Method of measuring negative ion density of plasma and plasma processing method and apparatus for carrying out the same
09/17/2002US6452378 Probe for electro-optic sampling oscilloscope
09/17/2002US6452341 EL display device, driving method thereof, and electronic equipment provided with the EL display device
09/17/2002US6452338 Electron beam ion source with integral low-temperature vaporizer
09/17/2002US6452283 Semiconductor chip with surface cover
09/17/2002US6452281 Semiconductor integrated circuit and fabrication process therefor
09/17/2002US6452280 Flip chip semiconductor apparatus with projecting electrodes and method for producing same
09/17/2002US6452278 Low profile package for plural semiconductor dies
09/17/2002US6452277 Semiconductor device and manufacturing method thereof
09/17/2002US6452276 Ultra thin, single phase, diffusion barrier for metal conductors
09/17/2002US6452275 Fabrication of integrated circuits with borderless vias
09/17/2002US6452274 Semiconductor device having a low dielectric layer as an interlayer insulating layer
09/17/2002US6452273 Semiconductor integrated circuit device and method of manufacturing the same
09/17/2002US6452272 Semiconductor device
09/17/2002US6452271 Conductive barrier layer for use on bond pads of integrated circuit dies that will not oxidize to form a nonconductive material; good electrical and thermal conductivity; low thermal expansion
09/17/2002US6452270 Semiconductor device having bump electrode
09/17/2002US6452269 Semiconductor integrated circuit having power supply pin
09/17/2002US6452268 Integrated circuit package configuration having an encapsulating body with a flanged portion and an encapsulating mold for molding the encapsulating body
09/17/2002US6452267 Selective flip chip underfill processing for high speed signal isolation
09/17/2002US6452266 Semiconductor device
09/17/2002US6452265 Multi-chip module utilizing a nonconductive material surrounding the chips that has a similar coefficient of thermal expansion
09/17/2002US6452260 Electrical interface to integrated circuit device having high density I/O count
09/17/2002US6452259 Stacked substrate and semiconductor device
09/17/2002US6452257 Film carrier tape
09/17/2002US6452256 Semiconductor device
09/17/2002US6452252 Semiconductor device
09/17/2002US6452251 Damascene metal capacitor
09/17/2002US6452249 Inductor with patterned ground shield
09/17/2002US6452247 Inductor for integrated circuit
09/17/2002US6452246 Semiconductor device having an improved isolation structure, and method of manufacturing the semiconductor device
09/17/2002US6452244 Film-like composite structure and method of manufacture thereof
09/17/2002US6452243 Solid state image sensor and method for fabricating the same
09/17/2002US6452242 Heterostructure having lattice matched layers with differing bandgaps composed of indium and antimony with aluminum or gallium for contact layer and arsenic, thallium and/or bismuth for active layer; infrared photodetector
09/17/2002US6452241 Thin film transistor for use in liquid crystal display device and method for manufacturing the same
09/17/2002US6452239 High-efficiency miniature magnetic integrated circuit structures
09/17/2002US6452238 MEMS wafer level package
09/17/2002US6452237 Artificial neuron on the base of β-driven threshold element
09/17/2002US6452236 Channel implant for improving NMOS ESD robustness
09/17/2002US6452233 SOI device having a leakage stopping layer
09/17/2002US6452232 Semiconductor device having SOI structure and manufacturing method thereof
09/17/2002US6452229 Ultra-thin fully depleted SOI device with T-shaped gate and method of fabrication
09/17/2002US6452228 Silicon carbide semiconductor device