H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof

Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
12/2002
12/18/2002	CN1385745A Electrode substrater for LCD, its making method and LCD
12/18/2002	CN1385743A Film transistor for LCD and making method
12/18/2002	CN1385737A Glass upper chip adhering device for LCD
12/18/2002	CN1385554A 真空成膜装置 Vacuum deposition apparatus
12/18/2002	CN1385288A Method for cutting slice from workpiece
12/18/2002	CN1096748C Dynamic CMOS circuits with noise immunity
12/18/2002	CN1096747C 保护电路 Protection circuit
12/18/2002	CN1096744C Electronic components and method of manufacturing same
12/18/2002	CN1096711C Semiconductor memory device having memory cells similarly layouted and peripheral circuits symmetrically layouted in memory cell arrays
12/18/2002	CN1096710C 半导体器件 Semiconductor devices
12/18/2002	CN1096709C Method of manufacturing semiconductor devices
12/18/2002	CN1096708C Manufacture of tunneling oxide unit for EPROM
12/18/2002	CN1096707C Metal to metal capacitor and method for producing same
12/18/2002	CN1096706C Method for producing semiconductor device packaged by epoxy resin
12/18/2002	CN1096705C Mfg. method for semiconductor device
12/18/2002	CN1096704C Semiconductor device including insulation film and fabrication method thereof
12/18/2002	CN1096703C Wafer-cleaning solution and process for production thereof
12/18/2002	CN1096702C Photoresist developing process
12/18/2002	CN1096701C Method for manufacturing capacitor
12/18/2002	CN1096684C Transparent conductive composition, transparent conductive layer formed of the same, and manufacturing method thereof
12/18/2002	CN1096682C Highly integrated storage unit and making method
12/18/2002	CN1096628C Process for producing surfactant having low metal ion level and developer produced therefrom
12/18/2002	CN1096626C Method for etching photolithographically produced quartz crystal blanks for singulation
12/18/2002	CN1096625C Pattern structure of photomask
12/18/2002	CN1096313C Method and device for selective removal of material by irradiation
12/18/2002	CN1096311C Wet processing methods for the manufactur of electronic components using sequential chemical processing
12/18/2002	CN1096310C Method and apparatus for sheet products treatment like circuit board
12/17/2002	US6496971 Supporting multiple FPGA configuration modes using dedicated on-chip processor
12/17/2002	US6496968 Hierarchical wiring method for a semiconductor integrated circuit
12/17/2002	US6496966 Place and route scan chain partitioning by clock regions
12/17/2002	US6496964 Method for designing semiconductor device
12/17/2002	US6496963 Delay analysis method and design assist apparatus of semiconductor circuit
12/17/2002	US6496959 Method and system for estimating plasma damage to semiconductor device for layout design
12/17/2002	US6496958 Yield prediction and statistical process control using predicted defect related yield loss
12/17/2002	US6496788 Data processing method and apparatus to determine killer ratio based on a variety of defect types
12/17/2002	US6496749 Semiconductor producing apparatus and temperature control method therefor
12/17/2002	US6496748 Wafer flattening process and storage medium
12/17/2002	US6496747 Semiconductor device manufacturing apparatus and information processing system therefor
12/17/2002	US6496746 Method and apparatus for automatically generating schedules for wafer processing within a multichamber semiconductor wafer processing tool
12/17/2002	US6496648 Apparatus and method for rapid thermal processing
12/17/2002	US6496596 Method for detecting and categorizing defects
12/17/2002	US6496441 Semiconductor memory device with improved data propagation characteristics of a data bus
12/17/2002	US6496435 Sense amplifier control circuit of semiconductor memory device
12/17/2002	US6496433 Semiconductor device and semiconductor device testing method
12/17/2002	US6496430 Semiconductor memory circuit having selective redundant memory cells
12/17/2002	US6496416 Low voltage non-volatile memory cell
12/17/2002	US6496413 Semiconductor memory device for effecting erasing operation in block unit
12/17/2002	US6496412 Nonvolatile semiconductor memory device for storing multivalued data
12/17/2002	US6496408 Selective device coupling
12/17/2002	US6496403 Semiconductor memory device
12/17/2002	US6496401 Memory cell configuration
12/17/2002	US6496352 Post-in-crown capacitor and method of manufacture
12/17/2002	US6496350 Electrostatic wafer chucks and charged-particle-beam exposure apparatus comprising same
12/17/2002	US6496341 SOI electrostatic discharge protection circuit
12/17/2002	US6496306 Catadioptric optical system and exposure apparatus having the same
12/17/2002	US6496261 Double-pulsed optical interferometer for waveform probing of integrated circuits
12/17/2002	US6496255 Measurement of crystal face orientation
12/17/2002	US6496254 Method and device for inspecting objects
12/17/2002	US6496249 Exposure apparatus
12/17/2002	US6496248 Stage device and exposure apparatus and method
12/17/2002	US6496247 Exposure apparatus and exposure method
12/17/2002	US6496246 Optical assembly for an exposure apparatus
12/17/2002	US6496245 Developing method and developing apparatus
12/17/2002	US6496171 Semiconductor display device
12/17/2002	US6496119 Protection circuit for an integrated circuit
12/17/2002	US6496093 Displacement device
12/17/2002	US6496056 Process-tolerant integrated circuit design
12/17/2002	US6496053 Corrosion insensitive fusible link using capacitance sensing for semiconductor devices
12/17/2002	US6496049 Semiconductor integrated circuit having a current control function
12/17/2002	US6496035 Integrated circuit approach, with a serpentine conductor track for circuit configuration selection
12/17/2002	US6496034 Programmable logic arrays with ultra thin body transistors
12/17/2002	US6496030 Scan flip-flop providing both scan and propagation delay testing
12/17/2002	US6496024 Probe holder for testing of a test device
12/17/2002	US6496023 Semiconductor-device inspecting apparatus and a method for manufacturing the same
12/17/2002	US6496016 Semiconductor device for use in evaluating integrated circuit device
12/17/2002	US6495928 Transfer mark structure for multi-layer interconnecting and method for the manufacture thereof
12/17/2002	US6495927 Resin-molded unit including an electronic circuit component
12/17/2002	US6495922 Semiconductor device with pointed bumps
12/17/2002	US6495921 High aspect ratio metallization structures
12/17/2002	US6495920 Wiring for semiconductor device
12/17/2002	US6495919 Conductive implant structure in a dielectric
12/17/2002	US6495917 Method and structure of column interconnect
12/17/2002	US6495916 Resin-encapsulated semiconductor device
12/17/2002	US6495915 Flip chip package of monolithic microwave integrated circuit
12/17/2002	US6495914 Multi-chip module structure having conductive blocks to provide electrical connection between conductors on first and second sides of a conductive base substrate
12/17/2002	US6495912 Structure of ceramic package with integrated passive devices
12/17/2002	US6495909 Low-pin-count chip package and manufacturing method thereof
12/17/2002	US6495908 Multi-chip semiconductor package
12/17/2002	US6495907 Conductor reticulation for improved device planarity
12/17/2002	US6495906 Simplified process for producing nanoporous silica
12/17/2002	US6495904 Compact bipolar transistor structure
12/17/2002	US6495903 Integrated circuit inductor
12/17/2002	US6495900 Insulator for electrical structure
12/17/2002	US6495899 Semiconductor device capable of surely fixing voltage at well
12/17/2002	US6495898 Semiconductor device and method of manufacturing the same
12/17/2002	US6495897 Integrated circuit having etch-resistant layer substantially covering shallow trench regions
12/17/2002	US6495896 Semiconductor integrated circuit device with high and low voltage wells
12/17/2002	US6495894 Photonic device, a substrate for fabricating a photonic device, a method for fabricating the photonic device and a method for manufacturing the photonic device-fabricating substrate
12/17/2002	US6495891 Transistor having impurity concentration distribution capable of improving short channel effect
12/17/2002	US6495890 Field-effect transistor with multidielectric constant gate insulation layer

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