Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2003
01/02/2003US20030001832 Semiconductor device and method for manufacturing the same
01/02/2003US20030001798 Multi-exposure drawing method and apparatus therefor
01/02/2003US20030001713 Integrated transformer
01/02/2003US20030001661 Programmable reference voltage generating circuit
01/02/2003US20030001615 Programmable logic circuit device having look up table enabling to reduce implementation area
01/02/2003US20030001582 Apparatus and method for detection and measurement of environmental parameters
01/02/2003US20030001554 Internal power voltage generator
01/02/2003US20030001535 Four-bar linkage wafer clamping mechanism
01/02/2003US20030001528 Ion implanting system
01/02/2003US20030001475 Lamp design
01/02/2003US20030001290 Semiconductor memory device and method for manufacturing the same
01/02/2003US20030001289 Resin-sealed semiconductor device and manufacturing method thereof
01/02/2003US20030001286 Semiconductor package and flip chip bonding method therein
01/02/2003US20030001285 Semiconductor package and method for manufacturing the same
01/02/2003US20030001284 On-die de-coupling capacitor using bumps or bars and method of making same
01/02/2003US20030001283 Multi-purpose planarizing/back-grind/pre-underfill arrangements for bumped wafers and dies
01/02/2003US20030001282 Metal barrier behavior by sic:h deposition on porous materials
01/02/2003US20030001280 Semiconductor integrated circuit device and manufacturing method of semiconductor integrated circuit device
01/02/2003US20030001278 Method for manufacturing a semiconductor device and a semiconductor device
01/02/2003US20030001277 Semiconductor integrated circuit device and manufacturing method of semiconductor integrated circuit device
01/02/2003US20030001276 Semiconductor device and method of manufacture thereof
01/02/2003US20030001273 Structure and method for isolating porous low-k dielectric films
01/02/2003US20030001272 Method of fabricating interlevel connectors using only one photomask step
01/02/2003US20030001271 Method of forming copper oxide film, method of etching copper film, method of fabricating semiconductor device, semiconductor manufacturing apparatus, and semiconductor device
01/02/2003US20030001270 Semiconductor device having an improved multi-layer interconnection structure and manufacturing method thereof
01/02/2003US20030001269 Semiconductor integrated circuit device, design method for semiconductor integrated circuit device, design aiding device for semiconductor integrated circuit device, program, and program recording medium
01/02/2003US20030001268 Semiconductor device including cylinder-type capacitor and a manufacturing method thereof
01/02/2003US20030001267 Semiconductor wafer device having separated conductive patterns in peripheral area and its manufacture method
01/02/2003US20030001266 Agglomeration control using early transition metal alloys
01/02/2003US20030001265 Thin titanium nitride layers used in conjunction with tungsten
01/02/2003US20030001264 Apparatus for integrating low dielectric constant materials into a multilevel metallization and interconnect structure
01/02/2003US20030001263 In situ plasma pre-deposition wafer treatment in chemical vapor deposition technology for semiconductor integrated circuit applications and structures fabricated using the treatment
01/02/2003US20030001262 Semiconductor device having solder bumps and method for manufacturing same
01/02/2003US20030001260 Semiconductor devices having different package sizes made by using common parts
01/02/2003US20030001257 Semiconductor device and semiconductor assembly apparatus for semiconductor device
01/02/2003US20030001256 Wiring substrate having position information
01/02/2003US20030001255 Hybrid integrated circuit device and manufacturing method thereof
01/02/2003US20030001253 Semiconductor device
01/02/2003US20030001249 Semiconductor device and a method of manufacturing the same and a mounting structure of a semiconductor device
01/02/2003US20030001244 Lead frame, resin-sealed semiconductor device, and method for fabricating the same
01/02/2003US20030001243 Method of monitoring ultra-thin nitride quality by wet re-oxidation
01/02/2003US20030001241 Semiconductor device and method of fabrication
01/02/2003US20030001240 Semiconductor devices containing a discontinuous cap layer and methods for forming same
01/02/2003US20030001239 Porous materials
01/02/2003US20030001235 Semiconductor device having the effect that the drop in the current gain is kept to the minimum, when the substrate density is amplified and that the variation in the collector current is improved
01/02/2003US20030001234 Semiconductor device and manufacturing method thereof
01/02/2003US20030001233 semiconductor memory device
01/02/2003US20030001232 Composite integrated circuit and its fabrication method
01/02/2003US20030001231 Multi-layer inductor formed in a semiconductor substrate
01/02/2003US20030001229 Chalcogenide comprising device
01/02/2003US20030001228 Antistatic contact for a polycrystalline silicon line
01/02/2003US20030001227 Semiconductor device and method of manufacturing a semiconductor device
01/02/2003US20030001226 Semiconductor device and the manufacturing method thereof
01/02/2003US20030001225 Semiconductor device and method of fabricating the same
01/02/2003US20030001224 Semiconductor device having isolating region for suppressing electrical noise
01/02/2003US20030001220 Semiconductor chip having both polycide and salicide gates and methods for making same
01/02/2003US20030001219 Novel transistor structure and method of fabrication
01/02/2003US20030001218 Semiconductor device with high driving force and less impurity punch-through and method of manufacturing the same
01/02/2003US20030001215 Power MOS element and method for producing the same
01/02/2003US20030001214 Semiconductor integrated circuit device and manufacturing method thereof
01/02/2003US20030001213 High density read only memory and fabrication method thereof
01/02/2003US20030001212 Conductor layer nitridation
01/02/2003US20030001210 Semiconductor device having element isolation region and method for manufacture thereof
01/02/2003US20030001209 HV-SOI LDMOS device with integrated diode to improve reliability and avalanche ruggedness
01/02/2003US20030001207 Structure and method for fabricating semiconductor structures and devices utilizing the formation of a compliant subtrate for materials used to form the same
01/02/2003US20030001206 Semiconductor device and method for fabricating such device
01/02/2003US20030001205 Transistor of semiconductor device and method of manufacturing the same
01/02/2003US20030001204 Semiconductor device and method for fabricating the same
01/02/2003US20030001201 Semiconductor device and manufacturing method thereof
01/02/2003US20030001200 Modified vertical MOSFET and methods of formation thereof
01/02/2003US20030001199 Electrostatic discharge protection in double diffused MOS transistors
01/02/2003US20030001198 Process for manufacturing a DMOS transistor
01/02/2003US20030001197 Method for forming a flash memory cell having contoured floating gate surface
01/02/2003US20030001196 Non-volatile memory device and method of fabricating the same
01/02/2003US20030001195 Non-volatile semiconductor memory having a decreased gate length and manufacturing method thereof
01/02/2003US20030001194 Capacitor having tantalum oxynitride film and method for making same
01/02/2003US20030001193 Method for forming a tantalum oxide capacitor
01/02/2003US20030001192 Wiring layer structure for ferroelectric capacitor
01/02/2003US20030001191 Dynamic electrically alterable programmable read only memory device
01/02/2003US20030001190 Methods for forming conductive structures and structures regarding same
01/02/2003US20030001189 Ferroelectric capacitor and semiconductor device
01/02/2003US20030001188 High-dielectric constant metal-insulator metal capacitor in VLSI multi-level metallization systems
01/02/2003US20030001187 Structures and methods for enhancing capacitors in integrated circuits
01/02/2003US20030001186 Semiconductor memory device capable of preventing oxidation of plug and method for fabricating the same
01/02/2003US20030001183 Semiconductor integrated circuit device and manufacturing method of semiconductor integrated circuit device
01/02/2003US20030001181 Method of fabricating a DRAM cell having a thin dielectric access transistor and a thick dielectric storage capacitor
01/02/2003US20030001180 Semiconductor device and manufacturing method thereof
01/02/2003US20030001179 Semiconductor device and method of manufacturing therefor
01/02/2003US20030001178 Low cross-talk electrically programmable resistance cross point memory
01/02/2003US20030001177 Diffusion prevention film, fabricating method therefor, semiconductor storage device and fabricating method therefor
01/02/2003US20030001176 Low-voltage and interface damage-free polymer memory device
01/02/2003US20030001175 Semiconductor device and method for fabricating the same
01/02/2003US20030001163 Semiconductor light emitting device and method for manufacturing the same
01/02/2003US20030001162 Boron phosphide-based semiconductor device and production method thereof
01/02/2003US20030001160 Semiconductor wafer and production method therefor
01/02/2003US20030001159 Semiconductor thin film and semiconductor device
01/02/2003US20030001158 Semiconductor device and method of fabricating same
01/02/2003US20030001157 Semiconductor device having thin film transistor for supplying current to driven element
01/02/2003US20030001156 Silicon carbide schottky barrier diode and method of making
01/02/2003US20030001155 Pattern forming method and semiconductor device manufactured by ussing said pattern forming method