Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2003
03/27/2003US20030060016 Method for fabricating semiconductor device
03/27/2003US20030060015 Multiple operating voltage vertical replacement-gate (VRG) transistor
03/27/2003US20030060014 Field effect transistor configuration with high latch-up resistance, and method for its production
03/27/2003US20030060013 Method of manufacturing trench field effect transistors with trenched heavy body
03/27/2003US20030060012 Electronic power device monolithically integrated on a semiconductor and comprising a first power region and at least a second region as well as an isolation structure of limited planar dimension
03/27/2003US20030060011 Semiconductor device and method of manufacturing the same
03/27/2003US20030060010 Fabrication method for a flash memory device with a split floating gate and a structure thereof
03/27/2003US20030060009 Integrated capacitor and fuse
03/27/2003US20030060008 Method for fabricating capacitors in semiconductor devices
03/27/2003US20030060007 Semiconductor device and method of fabricating the same
03/27/2003US20030060006 Spacer formation in a deep trench memory cell
03/27/2003US20030060005 Increased capacitance trench capacitor
03/27/2003US20030060004 Memory device with surface-channel peripheral transistors
03/27/2003US20030060003 Capacitor device for a semiconductor circuit configuration, and fabrication method
03/27/2003US20030060002 Method for fabricating a semiconductor memory device
03/27/2003US20030060001 Method of fabricating a high-voltage transistor with a multi-layered extended drain structure
03/27/2003US20030060000 Wiring board and fabricating method thereof, semiconductor device and fabricating method thereof, circuit board and electronic instrument
03/27/2003US20030059999 Methods of forming semiconductor constructions
03/27/2003US20030059996 Method for forming gate structure
03/27/2003US20030059995 Deep sub-micron raised source/drain CMOS structure and method of making the same
03/27/2003US20030059994 Method of forming minimally spaced word lines
03/27/2003US20030059993 Method of manufacturing semiconductor device
03/27/2003US20030059992 Method for BEOL resistor tolerance improvement using anodic oxidation
03/27/2003US20030059991 Laser processing method
03/27/2003US20030059990 Method for manufacturing semiconductor device
03/27/2003US20030059989 Method of manufacturing a thin-film transistor comprising a recombination center
03/27/2003US20030059988 Method for SOI device isolation
03/27/2003US20030059987 Inkjet-fabricated integrated circuits
03/27/2003US20030059986 Semiconductor device, manufacturing method thereof, and displaly device
03/27/2003US20030059984 Solution processing
03/27/2003US20030059983 Method of manufacturing semiconductor device with offset sidewall structure
03/27/2003US20030059982 Methods of and apparatus for manufacturing ball grid array semiconductor device packages
03/27/2003US20030059981 Semiconductor device, method of producing the same and semiconductor production equipment for carrying out the method
03/27/2003US20030059980 Copper interconnect barrier layer structure and formation method
03/27/2003US20030059979 Semiconductor device-manufacturing method
03/27/2003US20030059978 Flip chip mounting method
03/27/2003US20030059977 Methods of and apparatus for manufacturing ball grid array semiconductor device packages
03/27/2003US20030059976 Integrated package and methods for making same
03/27/2003US20030059975 Solution processed devices
03/27/2003US20030059974 Method for fabricating solid-state imaging device
03/27/2003US20030059971 Forming indium nitride (InN) and indium gallium nitride (InGaN) quantum dots grown by metal-organic-vapor-phase-epitaxy (MOCVD)
03/27/2003US20030059968 Method of producing field emission display
03/27/2003US20030059967 Semiconductor device, test method for semiconductor device, and tester for semiconductor device
03/27/2003US20030059964 Electric-circuit fabricating method and system, and electric-circuit fabricating program
03/27/2003US20030059962 Method for testing semiconductor chips
03/27/2003US20030059961 Electric-circuit fabricating system and method, and electric-circuit fabricating program
03/27/2003US20030059960 Methods of semiconductor processing
03/27/2003US20030059959 Method for fabricating capacitor
03/27/2003US20030059958 Methods of forming magnetoresistive devices
03/27/2003US20030059957 Chip sorting unit used for apparatus for inspecting surface mounted chip
03/27/2003US20030059929 Apparatus for use in the preparation or analysis of biopolymers
03/27/2003US20030059726 Method of recording identifier and set of photomasks
03/27/2003US20030059723 Electronic device manufacture
03/27/2003US20030059722 Method of forming mask, method of forming patterned thin film, and method of fabricating micro device
03/27/2003US20030059721 Forming copper wire on heat resistant tape; overcoating with photoresist; imaging with light source; packaging using epoxy resin
03/27/2003US20030059720 Masking methods and etching sequences for patterning electrodes of high density RAM capacitors
03/27/2003US20030059719 Post exposure modification of critical dimensions in mask fabrication
03/27/2003US20030059718 Removal of passivation layer over metal pad; developing photoresist with ultraviolet radiation
03/27/2003US20030059716 Methods for reducing blur and variation in blur in projected images produced by charged-particle-beam microlithography
03/27/2003US20030059715 Positive resist composition
03/27/2003US20030059706 Positive photoresist composition for the formation of thick films, photoresist film and method of forming bumps using the same
03/27/2003US20030059691 Automatic measurement; calibration; adjustment accuracy; controlling exposure of optical pattern
03/27/2003US20030059689 Method of producing a perforated mask for particle radiation
03/27/2003US20030059688 Post exposure modification of critical dimensions in mask fabrication
03/27/2003US20030059653 Film of yttria-alumina complex oxide, a method of producing the same, a sprayed film, a corrosion resistant member, and a member effective for reducing particle generation
03/27/2003US20030059644 Multilayer; tin diffusion barrier
03/27/2003US20030059630 Rasiation transparent conductive bias electrode
03/27/2003US20030059628 Stacked film, method for the formation of stacked film, insulating film, and substrate for semiconductor
03/27/2003US20030059627 Electrostatic adsorption device
03/27/2003US20030059568 Opaque low resistivity silicon carbide
03/27/2003US20030059552 Chemical resistance; uniform film thickness; mixture of phenolic resin and acid generator
03/27/2003US20030059550 Method of film formation, insulating film, and substrate for semiconductor
03/27/2003US20030059544 Photodegradation of complex
03/27/2003US20030059543 Insulating paste composition for rib formation and method of rib pattern formation
03/27/2003US20030059538 Integration of barrier layer and seed layer
03/27/2003US20030059536 Lanthanum complex and process for the preparation of a BLT layer using same
03/27/2003US20030059534 Substrate processing method
03/27/2003US20030059533 Uniformity multilayer film; rotating interior, exterior cup
03/27/2003US20030059289 Wafer cassette transport cart with self correcting fault alignment block and method
03/27/2003US20030059285 Load storage equipment
03/27/2003US20030059284 Load storage equipment
03/27/2003US20030059105 Method and apparatus for managing surface image of thin film device, and method and apparatus for manufacturing thin film device using the same
03/27/2003US20030058986 Apparatus and methods for surficial milling of selected regions on surfaces multilayer-film reflective mirrors as used in X-ray optical systems
03/27/2003US20030058916 Method of laser irradiation, laser irradiation apparatus, and method of manufacturing a semiconductor device
03/27/2003US20030058729 Semiconductor integrated circuit device
03/27/2003US20030058715 Nonvolatile semiconductor memory device and method for testing the same
03/27/2003US20030058709 Ferroelectric memory and method for fabricating the same
03/27/2003US20030058708 Method of insulating interconnects, and memory cell array with insulated interconnects
03/27/2003US20030058705 Semiconductor device and method of manufacturing the same
03/27/2003US20030058700 Method for fabricating a semiconductor memory device
03/27/2003US20030058686 Thin film magnetic memory device sharing an access element by a plurality of memory cells
03/27/2003US20030058685 Read methods for magneto-resistive device having soft reference layer
03/27/2003US20030058684 Magneto-resistive device having soft reference layer
03/27/2003US20030058683 Ferroelectric-type nonvolatile semiconductor memory
03/27/2003US20030058678 Ferroelectric memory device and method of fabricating the same
03/27/2003US20030058538 Diffraction grating, diffractive optical element, and optical system using the same
03/27/2003US20030058453 Apparatus and method for measuring two opposite surfaces of a body
03/27/2003US20030058449 Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure
03/27/2003US20030058443 Spectroscopic scatterometer system
03/27/2003US20030058436 Inspection data analysis program, defect inspection apparatus, defect inspection system and method for semiconductor device
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