Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2003
04/23/2003CN1106685C Method and device for introducing foreign substance, and method for mfg. semiconductor device
04/23/2003CN1106669C Driving source for vacuum treatment chamber
04/23/2003CN1106460C Apparatus for preventing heater electrode meltdown in single crystal pulling apparatus
04/23/2003CN1106332C Wafer enclosure with door
04/22/2003USRE38085 Exposure method and projection exposure apparatus
04/22/2003US6553562 Method and apparatus for generating masks utilized in conjunction with dipole illumination techniques
04/22/2003US6553560 Alleviating line end shortening in transistor endcaps by extending phase shifters
04/22/2003US6553557 Inter-functional-block restriction high-speed extraction method and recording medium having stored thereon an inter-functional-block restriction high-speed extraction program
04/22/2003US6553553 Method of designing layout of semiconductor device
04/22/2003US6553530 Integrated circuit devices that include self-test apparatus for testing a plurality of functional blocks and methods of testing same
04/22/2003US6553528 Test circuit for semiconductor integrated circuit
04/22/2003US6553496 Integration of security modules on an integrated circuit
04/22/2003US6553395 Reconfigurable processor devices
04/22/2003US6553339 MOSFET simulation method
04/22/2003US6553335 Method and apparatus for determining end-point in a chamber cleaning process
04/22/2003US6553332 Process control; inexpensive, fast, reliable, accurate
04/22/2003US6553323 Method and its apparatus for inspecting a specimen
04/22/2003US6553280 Valve/sensor assemblies
04/22/2003US6553277 Method and apparatus for vacuum treatment
04/22/2003US6553274 Simultaneously patterning interconnection and dummy layers; uniform thickness and flatting insulating film
04/22/2003US6553137 Method of increasing overlay accuracy in an exposure step and overlay displacement measuring device for determining optimum measurement focus plane by variation in magnitudes of displacement of two overlay inspection marks
04/22/2003US6552958 Semiconductor integrated circuit device
04/22/2003US6552953 High speed signal path and method
04/22/2003US6552931 Low voltage flash EEPROM memory cell with improved data retention
04/22/2003US6552930 Semiconductor memory device and storage method thereof
04/22/2003US6552927 MRAM architecture and system
04/22/2003US6552926 Magnetic random-access memory
04/22/2003US6552892 Method and apparatus for the grounding of process wafers by the use of conductive regions created by ion implantation into the surface of an electrostatic clamp
04/22/2003US6552862 Mounting device for an optical element
04/22/2003US6552846 Catoptric optical element, illumination optical system equipped therewith, projection exposure apparatus and method for manufacturing semiconductor device
04/22/2003US6552811 Cutting blade detection mechanism for a cutting machine
04/22/2003US6552798 Position detecting method and system for use in exposure apparatus
04/22/2003US6552775 Optical projecting system for projecting and synchronously scanning mask pattern; enhancing fineness
04/22/2003US6552774 Exposure apparatus
04/22/2003US6552773 Stage system with driving mechanism, and exposure apparatus having the same
04/22/2003US6552768 Driver circuit of display device with channel width directions of buffer and sampling thin film transistors identical with scanning direction of a radiating laser beam
04/22/2003US6552757 Liquid crystal display element and method for manufacturing the same
04/22/2003US6552718 Contact structure of substrates of touch panel and method of bonding the same
04/22/2003US6552694 Semiconductor device and fabrication method thereof
04/22/2003US6552597 Integrated circuit with closely coupled high voltage output and offline transistor pair
04/22/2003US6552561 Apparatus and method for controlling temperature in a device under test using integrated temperature sensitive diode
04/22/2003US6552556 Prober for electrical measurement of potentials in the interior of ultra-fine semiconductor devices, and method of measuring electrical characteristics with said prober
04/22/2003US6552551 Method of producing load for delay time calculation and recording medium
04/22/2003US6552549 Method of reading electrical fuses/antifuses
04/22/2003US6552527 Wafer map display apparatus and method for semiconductor test system
04/22/2003US6552449 Precise position small angle controller; increased response; slim, small; robotics, inspection equipments, machine tools, semiconductor manufacturing
04/22/2003US6552437 Semiconductor device and method of manufacture thereof
04/22/2003US6552435 Integrated circuit with conductive lines disposed within isolation regions
04/22/2003US6552434 Semiconductor device and manufacturing method thereof
04/22/2003US6552432 Mask on a polymer having an opening width less than that of the opening in the polymer
04/22/2003US6552431 Semiconductor structure with a titanium aluminum nitride layer and method for fabricating same
04/22/2003US6552428 Semiconductor package having an exposed heat spreader
04/22/2003US6552427 BGA package and method of fabrication
04/22/2003US6552426 Semiconductor device and method of manufacturing same
04/22/2003US6552425 Integrated circuit package
04/22/2003US6552421 Semiconductor device and a method of manufacturing the same
04/22/2003US6552419 Semiconductor device and liquid crystal module using the same
04/22/2003US6552414 Semiconductor device with selectively diffused regions
04/22/2003US6552411 DC or AC electric field assisted anneal
04/22/2003US6552408 Methods, apparatuses, and substrate assembly structures for fabricating microelectronic components using mechanical and chemical-mechanical planarization processes
04/22/2003US6552403 Binary non-crystalline oxide analogs of silicon dioxide for use in gate dielectrics
04/22/2003US6552402 Composite MOS transistor device
04/22/2003US6552401 Use of gate electrode workfunction to improve DRAM refresh
04/22/2003US6552400 Semiconductor device and method of manufacturing the same
04/22/2003US6552399 Dummy layer diode structures for ESD protection
04/22/2003US6552398 T-Ram array having a planar cell structure and method for fabricating the same
04/22/2003US6552396 Matched transistors and methods for forming the same
04/22/2003US6552395 Silicon on insulator; beryllium oxide layer
04/22/2003US6552394 Reduced cost
04/22/2003US6552393 Power MOS transistor having increased drain current path
04/22/2003US6552391 Low voltage dual-well trench MOS device
04/22/2003US6552390 Semiconductor device
04/22/2003US6552389 Offset-gate-type semiconductor device
04/22/2003US6552388 Hafnium nitride gate dielectric
04/22/2003US6552387 Non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping
04/22/2003US6552386 Scalable split-gate flash memory cell structure and its contactless flash memory arrays
04/22/2003US6552385 DRAM memory capacitor having three-layer dielectric, and method for its production
04/22/2003US6552384 Thin-film capacitor element and electronic circuit board on which thin-film capacitor element is formed
04/22/2003US6552383 Integrated decoupling capacitors
04/22/2003US6552382 Scalable vertical DRAM cell structure and its manufacturing methods
04/22/2003US6552381 Trench capacitors in SOI substrates
04/22/2003US6552380 Semiconductor device and manufacturing method thereof
04/22/2003US6552379 Semiconductor device and manufacturing method thereof
04/22/2003US6552378 Ultra compact DRAM cell and method of making
04/22/2003US6552377 Mos transistor with dual metal gate structure
04/22/2003US6552376 Group III nitride compound semiconductor device
04/22/2003US6552375 Blocking of boron diffusion through the emitter-emitter poly interface in PNP HBTs through use of a SiC layer at the top of the emitter epi layer
04/22/2003US6552374 Method of manufacturing bipolar device and structure thereof
04/22/2003US6552373 Hetero-junction field effect transistor having an intermediate layer
04/22/2003US6552363 Polysilicon FET built on silicon carbide diode substrate
04/22/2003US6552362 Semiconductor device and process for producing the same
04/22/2003US6552360 Plurality of strips for uniform polishing pressure
04/22/2003US6552352 Aligner
04/22/2003US6552350 System and method for providing a lithographic light source for a semiconductor manufacturing process
04/22/2003US6552337 Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements
04/22/2003US6552332 Image-sensing apparatus
04/22/2003US6552308 Accuracy; increased throughput
04/22/2003US6552297 RF matching network with distributed outputs
04/22/2003US6552266 High performance chip packaging and method
04/22/2003US6552264 High performance chip packaging and method