Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
10/2003
10/29/2003CN1126148C Method for recovering SOI substrate and regenerated substrate
10/29/2003CN1126127C Magnetoresistance effect device, and device using the same
10/29/2003CN1126109C Memory and semiconductor device
10/29/2003CN1125988C Method for Real time metering junction temp of transistor during steady stateservice life test
10/29/2003CN1125963C Improved chemical drying and cleaning system
10/29/2003CN1125862C Chemicomechenically grinding Composition for semiconductor processing
10/29/2003CN1125705C Method and device for detecting end point of film removing process
10/29/2003CN1125704C CMP pad conditioner arrangement and method therefor
10/29/2003CN1125690C Novolac Polymer planarization films for microelectronic structures
10/28/2003US6640324 Boundary scan chain routing
10/28/2003US6640155 Chemical mechanical polishing apparatus and methods with central control of polishing pressure applied by polishing head
10/28/2003US6640151 Multi-tool control system, method and medium
10/28/2003US6639927 Surface emitting semiconductor laser, and its fabrication method
10/28/2003US6639859 Test array and method for testing memory arrays
10/28/2003US6639848 Semiconductor memory device and method for testing the same
10/28/2003US6639834 Data register and access method thereof
10/28/2003US6639831 Localized MRAM data line and method of operation
10/28/2003US6639829 Configuration and method for the low-loss writing of an MRAM
10/28/2003US6639828 Static memory cell having independent data holding voltage
10/28/2003US6639823 Ferroelectric memory device and method of driving the same
10/28/2003US6639822 Dynamic ram-and semiconductor device
10/28/2003US6639821 Memory circuit with memory elements overlying driver cells
10/28/2003US6639784 Wedge-shaped high density capacitor and method of making the capacitor
10/28/2003US6639782 Protecting circuit of the semiconductor factory automation
10/28/2003US6639765 Magnetoresistive element and magnetoresistive device using the same
10/28/2003US6639677 Position measuring method and position measuring system using the same
10/28/2003US6639676 Method for determining rotational error portion of total misalignment error in a stepper
10/28/2003US6639662 Sample inspection system
10/28/2003US6639652 Illumination system for use in exposure apparatus
10/28/2003US6639651 Fabrication method for correcting member, fabrication method for projection optical system, and exposure apparatus
10/28/2003US6639650 Light exposure method, light exposure apparatus, pellicle and method for relieving warpage of pellicle membrane
10/28/2003US6639575 Liquid crystal display
10/28/2003US6639455 Semiconductor integrated circuit device
10/28/2003US6639454 Multiple circuit blocks with interblock control and power conservation
10/28/2003US6639419 Supply voltage level detector
10/28/2003US6639417 Semiconductor parametric testing apparatus
10/28/2003US6639415 Probe station having multiple enclosures
10/28/2003US6639333 Linear motor stage system for use in exposure apparatus
10/28/2003US6639327 Semiconductor member, semiconductor device and manufacturing methods thereof
10/28/2003US6639326 Full CMOS SRAM cell
10/28/2003US6639323 Semiconductor device and its manufacturing method
10/28/2003US6639322 Flip-chip transition interface structure
10/28/2003US6639321 Balanced coefficient of thermal expansion for flip chip ball grid array
10/28/2003US6639320 Reticle for creating resist-filled vias in a dual damascene process
10/28/2003US6639319 Conductive structure in an integrated circuit
10/28/2003US6639318 Integrated circuit device and its manufacturing method
10/28/2003US6639317 Semiconductor device in trench
10/28/2003US6639316 Electrode having substrate and surface electrode components for a semiconductor device
10/28/2003US6639315 Semiconductor device and mounted semiconductor device structure
10/28/2003US6639312 Comprising a protective layer on the surface of the wafer and a layer of silicon covering it to increase the wafer's resistance to breaking during semiconductor processing; impact strength; durability; vapor disposition
10/28/2003US6639310 Pin arrangement for high frequency integrated circuit
10/28/2003US6639307 Cover tape for packaging electronic elements
10/28/2003US6639306 Semiconductor package having a die pad with downward-extended tabs
10/28/2003US6639303 Integrated circuits and methods for their fabrication
10/28/2003US6639301 Semiconductor device and manufacturing method thereof
10/28/2003US6639300 Semiconductor integrated circuit having an integrated resistance region
10/28/2003US6639299 Semiconductor device having a chip size package including a passive element
10/28/2003US6639298 Multi-layer inductor formed in a semiconductor substrate
10/28/2003US6639296 Semiconductor device and method of manufacturing the same
10/28/2003US6639295 Semiconductor device
10/28/2003US6639294 Semiconductor device having a device formation region protected from a counterelectromotive force
10/28/2003US6639288 Semiconductor device with a particular conductor arrangement
10/28/2003US6639287 Semiconductor integrated circuit device
10/28/2003US6639285 Method for fabricating a semiconductor device
10/28/2003US6639284 Compensated-well electrostatic discharge protection structure
10/28/2003US6639282 Semiconductor device on silicon-on-insulator and method for manufacturing the semiconductor device
10/28/2003US6639280 Semiconductor device and semiconductor chip using SOI substrate
10/28/2003US6639279 Semiconductor transistor having interface layer between semiconductor and insulating layers
10/28/2003US6639277 High-voltage transistor with multi-layer conduction region
10/28/2003US6639276 Power MOSFET with ultra-deep base and reduced on resistance
10/28/2003US6639275 Semiconductor device with vertical MOSFET
10/28/2003US6639274 Semiconductor device
10/28/2003US6639273 Silicon carbide n channel MOS semiconductor device and method for manufacturing the same
10/28/2003US6639272 Charge compensation semiconductor configuration
10/28/2003US6639271 Fully isolated dielectric memory cell structure for a dual bit nitride storage device and process for making same
10/28/2003US6639269 Electrically programmable memory cell configuration and method for fabricating it
10/28/2003US6639268 Flash memory with ultra thin vertical body transistors
10/28/2003US6639267 Capacitor dielectric having perovskite-type crystalline structure
10/28/2003US6639266 Modifying material removal selectivity in semiconductor structure development
10/28/2003US6639265 Semiconductor device and method of manufacturing the semiconductor device
10/28/2003US6639264 With collar of fluorine doped silicon oxide
10/28/2003US6639263 Semiconductor device with copper wiring connected to storage capacitor
10/28/2003US6639262 Metal oxide integrated circuit on silicon germanium substrate
10/28/2003US6639259 Charge-coupled device
10/28/2003US6639258 Group III nitride compound semiconductor device
10/28/2003US6639257 Hetero-junction bipolar transistor having a dummy electrode
10/28/2003US6639256 Structure for eliminating collector-base band gap discontinuity in an HBT
10/28/2003US6639254 Epitaxial layer capable of exceeding critical thickness
10/28/2003US6639252 Integrated circuit and method for fabricating an integrated circuit
10/28/2003US6639247 Semi-insulating silicon carbide without vanadium domination
10/28/2003US6639246 Semiconductor device
10/28/2003US6639245 Active matrix display device having high intensity and high precision and manufacturing method thereof
10/28/2003US6639244 Semiconductor device and method of fabricating the same
10/28/2003US6639243 DRAM cell constructions
10/28/2003US6639240 Photosemiconductor device and method for fabricating the same
10/28/2003US6639233 Apparatus for implanting an ion on a target and method for the same
10/28/2003US6639232 Pattern writing method employing electron beam writing device of variable-shaped vector scan system
10/28/2003US6639230 High-energy ion implanter for fabricating a semiconductor device
10/28/2003US6639229 Using nitrogen trifluoride to ionize solid alumina
10/28/2003US6639228 Method for molecular nitrogen implantation dosage monitoring