Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2004
04/01/2004US20040061843 Process and mask projection system for laser crystallization processing of semiconductor film regions on a substrate
04/01/2004US20040061674 Apparatus for applying OFF-state stress to P-MOS device
04/01/2004US20040061671 Display apparatus driven by DC current
04/01/2004US20040061613 Electronic device and method of manufacture the same
04/01/2004US20040061549 Potential detector and semiconductor integrated circuit
04/01/2004US20040061534 Drive circuit
04/01/2004US20040061518 Time limit function utilization
04/01/2004US20040061517 Empirical data based test optimization method
04/01/2004US20040061514 Wafer probe station for low-current measurements
04/01/2004US20040061449 Plasma processing apparatus
04/01/2004US20040061438 Electro-optical device and electronic device
04/01/2004US20040061433 Light emitting apparatus and method of manufacturing the same
04/01/2004US20040061385 Linear motor apparatus
04/01/2004US20040061383 Position-control stage with onboard linear motor
04/01/2004US20040061346 System and method for performing simultaneous precision die bond of photonic components onto a single substrate
04/01/2004US20040061242 Semiconductor device power interconnect striping
04/01/2004US20040061240 Semiconductor device and fabrication process thereof
04/01/2004US20040061238 Semiconductor device and method of manufacturing the same
04/01/2004US20040061237 Method of reducing voiding in copper interconnects with copper alloys in the seed layer
04/01/2004US20040061236 Semiconductor device provided with a dielectric film including porous structure and manufacturing method thereof
04/01/2004US20040061235 Dual damascene interconnect structure using low stress fluorosilicate insulator with copper conductors
04/01/2004US20040061234 High reliability multlayer circuit substrates and methods for their formation
04/01/2004US20040061233 Semiconductor device including interconnects formed by damascene process and manufacturing method thereof
04/01/2004US20040061232 Multilayer substrate
04/01/2004US20040061230 Method of forming an air gap using etch back of inter layer dielectric (ILD) with self-alignment to metal pattern
04/01/2004US20040061228 Circuit element having a metal silicide region thermally stabilized by a barrier diffusion material
04/01/2004US20040061227 Hardmask employing multiple layers of silicon oxynitride
04/01/2004US20040061226 Semiconductor device and contact-forming method therefor
04/01/2004US20040061219 Semiconductor device
04/01/2004US20040061217 Thin and heat radiant semiconductor package and method for manufacturing
04/01/2004US20040061210 Semiconductor workpiece apparatus
04/01/2004US20040061201 Low-dielectric constant structure with a multilayer stack of thin films with pores
04/01/2004US20040061200 Semiconductor wafer and manufacturing method thereof
04/01/2004US20040061199 Etching metal using sonication
04/01/2004US20040061197 Method and apparatus to fabricate an on-chip decoupling capacitor
04/01/2004US20040061196 Methods for making nearly planar dielectric films in integrated circuits
04/01/2004US20040061194 Gallium nitride compound semiconductor device having schottky contact
04/01/2004US20040061193 Photo sensing integrated circuit device and related circuit adjustment
04/01/2004US20040061191 Mosfets incorporating nickel germanosilicided gate and methods for their formation
04/01/2004US20040061190 Method and structure for tungsten gate metal surface treatment while preventing oxidation
04/01/2004US20040061189 Semiconductor device and method of forming the same
04/01/2004US20040061187 Indium-boron dual halo MOSFET
04/01/2004US20040061185 MOS devices with reduced fringing capacitance
04/01/2004US20040061184 Nickel silicide - silicon nitride adhesion through surface passivation
04/01/2004US20040061183 Multiple chip guard rings for integrated circuit and chip guard ring interconnect
04/01/2004US20040061182 High power mosfet semiconductor device
04/01/2004US20040061181 Semiconductor device and mehtod of manufacturing the same
04/01/2004US20040061180 1T1R resistive memory
04/01/2004US20040061179 Suppresses boron diffusion in doped semiconductors; dielectric stacks prevent shorting
04/01/2004US20040061178 Finfet having improved carrier mobility and method of its formation
04/01/2004US20040061177 Capacitor structure and fabrication method therefor in a dual damascene process
04/01/2004US20040061176 Single-crystal silicon substrate, SOI substrate, semiconductor device, display device, and manufacturing method of semiconductor device
04/01/2004US20040061175 Full depletion SOI-MOS transistor
04/01/2004US20040061174 Structure of thin film transistor
04/01/2004US20040061173 Single-electron transistor and fabrication method thereof
04/01/2004US20040061172 Damascene gate multi-mesa MOSFET
04/01/2004US20040061171 Ultra dense trench-gated power device with the reduced drain-source feedback capacitance and Miller charge
04/01/2004US20040061169 Non-volatile memory device and method of manufacturing the same
04/01/2004US20040061168 Electrically erasable and programmable non-volatile memory cell
04/01/2004US20040061167 Method of improving erase efficiency and a non-volatile memory cell made thereby
04/01/2004US20040061166 Magnetoresistive memory device and method for fabricating the same
04/01/2004US20040061165 Floating gate memory fabrication methods comprising a field dielectric etch with a horizontal etch component
04/01/2004US20040061164 Integrated DRAM process/structure using contact pillars
04/01/2004US20040061163 Semiconductor equipment
04/01/2004US20040061162 Titanium nitride; bit line stack and a storage node contact hole which are aligned at bit line spacers
04/01/2004US20040061161 Memory cell with vertical transistor and trench capacitor with reduced burried strap
04/01/2004US20040061160 Semiconductor device including storage capacitor
04/01/2004US20040061159 Semiconductor device, manufacture and evaluation methods for semiconductor device, and process condition evaluation method
04/01/2004US20040061158 Semiconductor device having different thickness gate oxides
04/01/2004US20040061157 Semiconductor device
04/01/2004US20040061156 Magnetic random access memory having transistor of vertical structure with writing line formed on an upper portion of the magnetic tunnel junction cell
04/01/2004US20040061155 Ferroelectric memory with read-only memory cells, and fabrication method thereof
04/01/2004US20040061153 Non-volatile memory using ferroelectric gate field-effect transistors
04/01/2004US20040061151 Nanometer-scale semiconductor devices and method of making
04/01/2004US20040061150 CMOS of semiconductor device and method for manufacturing the same
04/01/2004US20040061149 Semiconductor device, annealing method, annealing apparatus and display apparatus
04/01/2004US20040061148 One-transistor floating-body DRAM cell in bulk CMOS process with electrically isolated charge storage region
04/01/2004US20040061146 Multi-chip semiconductor package and fabrication method thereof
04/01/2004US20040061145 Method for forming a bit line for a semiconductor device
04/01/2004US20040061144 Semiconductor memory device
04/01/2004US20040061140 Semiconductor integrated circuit having reduced cross-talk noise
04/01/2004US20040061134 Semiconductor substrate with defects reduced or removed and method of manufacturing the same, and semiconductor device capable of bidirectionally retaining breakdown voltage and method of manufacturing the same
04/01/2004US20040061133 Semiconductor device including bipolar junction transistor, and production method therefor
04/01/2004US20040061132 Microcircuits having metal oxide semiconductor (MOS) transistor; bismuth doped
04/01/2004US20040061130 High electron mobility transistor and method of manufacturing the same
04/01/2004US20040061129 Forming nitride-based semiconductor cap layer on channel layer; mask corresponds to recesses for contactors
04/01/2004US20040061128 Heterojunction bipolar transistor with dielectric assisted planarized contacts and method for fabricating
04/01/2004US20040061126 Electronic circuit device
04/01/2004US20040061125 Semiconductor element structure, electron emitter and method for fabricating a semiconductor element structure
04/01/2004US20040061114 High carrier concentration p-type transparent conducting oxide films
04/01/2004US20040061111 Capacitors of memory cell array being arranged in matrix form each having trench with interior capacitor electrode isolated by dielectric layer; trench capacitors connected and lengthened to overlap in transverse direction
04/01/2004US20040061110 Test structure for determining a doping region of an electrode connection between a trench capacitor and a selection transistor in a memory cell array
04/01/2004US20040061103 Quantum ridges and tips
04/01/2004US20040061080 Electron beam exposure apparatus, deflection apparatus, and electron beam exposure method
04/01/2004US20040061067 Particle-optical apparatus and method for operating the same
04/01/2004US20040061065 Electron beam exposure apparatus, electron beam exposure apparatus calibration method, and semiconductor element manufacturing method
04/01/2004US20040061053 Method and apparatus for measuring physical properties of micro region
04/01/2004US20040061052 Method of determining degree of charge-up induced by plasma used for manufacturing semiconductor device and apparatus therefor
04/01/2004US20040061042 Spot grid array imaging system
04/01/2004US20040060971 Method for the production of a soldered connection