Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2004
03/31/2004CN1485887A Method for forming contact hole
03/31/2004CN1485886A Forming method of flute grid electrode profile
03/31/2004CN1485885A Pattern formation material, water-soluble material and pattern formation method
03/31/2004CN1485884A Method for fabricating semiconductor device
03/31/2004CN1485883A Machine worktable of semiconductor process flow
03/31/2004CN1485865A Condenser and circuit board, method for producing the same
03/31/2004CN1485852A 半导体存储器 Semiconductor memory
03/31/2004CN1485769A Motor system for positioning a load
03/31/2004CN1485694A Step-by-step projection photo-etching machine double set shifting exposure ultra-sophisticated positioning silicon chip bench system
03/31/2004CN1485692A Image display device and projector
03/31/2004CN1485623A Highly effective testing method for dynamic storage module
03/31/2004CN1485622A Fresnel lens and the transmission style screen
03/31/2004CN1485558A Door open-shut device of processing device
03/31/2004CN1485393A Abrasive used for planarization of semiconductor device and method of manufacturing semiconductor device using the abrasive
03/31/2004CN1485257A Transfer method
03/31/2004CN1485218A Apparatus for permitting transfer of organic material from a donor web to form a layer in an oled device
03/31/2004CN1485180A Chemical mechanical polishing and pad dressing method
03/31/2004CN1485150A Substrate processing device and rinsing apparatus
03/31/2004CN1144359C Surface acoustic wave device
03/31/2004CN1144296C Fabrication process of solar cell
03/31/2004CN1144294C Semiconductor memory device
03/31/2004CN1144293C Semiconductor storage device and its mfg. method, and method for preparing its mask data
03/31/2004CN1144292C Semiconductor device
03/31/2004CN1144291C Semiconductor integrated circuit device and process for fabricating thereof
03/31/2004CN1144290C Semiconductor device and method of manufacturing the same
03/31/2004CN1144288C Semiconductor device having protective circuit
03/31/2004CN1144287C Integrated circuit assembly band and its producing method
03/31/2004CN1144286C Semiconductor device and method for manufacturing same
03/31/2004CN1144285C Semiconductor device
03/31/2004CN1144284C Semiconductor device and manufacture thereof
03/31/2004CN1144283C Circuit-board flattening method and method for producing semiconductor device
03/31/2004CN1144282C Fabrication method of semiconductor device with HSG configuration
03/31/2004CN1144281C Double-swing charge-restoring low-power consumption circuit structure
03/31/2004CN1144280C Semiconductor device manufacturing method
03/31/2004CN1144279C Method for forming interconnection structure
03/31/2004CN1144278C Bump joining judging device and method, and semiconductor component production device and method
03/31/2004CN1144277C 载体和半导体器件 Carrier and semiconductor device
03/31/2004CN1144276C Method for making resin packaging semiconductor device
03/31/2004CN1144275C Method for manufacturing thin film transistor and thin film transistor
03/31/2004CN1144274C Semiconductor device manufacturing apparatus and semiconductor device manufacturing method
03/31/2004CN1144273C Semiconductor device and method for making the same
03/31/2004CN1144272C Method for growing silicon oxide thick film by adopting TEOS source PECVD
03/31/2004CN1144271C Method for manufacturing integrated circuit
03/31/2004CN1144270C Method for manufacturing semiconductor device having multiple wiring layer
03/31/2004CN1144269C Method for realizing technological section structure of 70-nm device
03/31/2004CN1144268C Polishing method for different conducting layer in semiconductor device
03/31/2004CN1144267C Electron-beam exposing method
03/31/2004CN1144266C Titanium silicide method using amorphous pre-injection of Ge or Sb and washing
03/31/2004CN1144265C Electron beam exposure mask and method for making semiconductor device with the same
03/31/2004CN1144264C Mask blank and method of producing mask
03/31/2004CN1144263C Exposure device and method for exposure
03/31/2004CN1144262C Liquid crystal display on silicon-on-sapphire and method for manufacturing the same
03/31/2004CN1144237C Integral lens for high energy particle flow, method for producing such lenses and use thereof
03/31/2004CN1144231C Programmable metallization cell and method of making
03/31/2004CN1144088C Semiconducter device with conductive layer and liquid crystal display device
03/31/2004CN1144044C Method and apparatus for testing filtration efficiency of cloth material intended for use in clean room environment
03/31/2004CN1144038C Method and apparatus for detecting micro-scrape
03/31/2004CN1143907C Truncated susceptor for vapor-phase deposition
03/31/2004CN1143906C Process for depositing layer of material on substrate
03/31/2004CN1143762C Ultrasonic vibrative cutting method and the device thereof
03/30/2004US6715133 Method for adding redundant vias on VLSI chips
03/30/2004US6715115 Semiconductor integrated circuit device capable of outputting leading data of a series of multiple burst-readout data without delay
03/30/2004US6715114 Test method and apparatus for semiconductor device
03/30/2004US6714885 Method for measuring number of yield loss chips and number of poor chips by type due to defect of semiconductor chips
03/30/2004US6714884 Once the source is identified, the operator adjusts the operating parameters of the various chambers within the tool to mitigate future defects
03/30/2004US6714878 System and method for a digital mass flow controller
03/30/2004US6714842 Synchronous position control apparatus and method
03/30/2004US6714833 Performance evaluation method for plasma processing apparatus
03/30/2004US6714832 Including two or more processing units for processing wafers and a transferring unit for carrying the wafers
03/30/2004US6714830 Push-type scheduling for semiconductor fabrication
03/30/2004US6714828 Method and system for designing a probe card
03/30/2004US6714768 Structure and method for fabricating semiconductor structures and polarization modulator devices utilizing the formation of a compliant substrate
03/30/2004US6714691 Exposure method and apparatus, and device manufacturing method using the same
03/30/2004US6714671 Method of detecting pattern defects
03/30/2004US6714625 Lithography device for semiconductor circuit pattern generation
03/30/2004US6714474 Method of checking the state of a capacitor fuse in which the voltage applied to the capacitor fuse is the same level as voltage applied to memory cells
03/30/2004US6714456 Process for making and programming and operating a dual-bit multi-level ballistic flash memory
03/30/2004US6714451 Semiconductor memory device including bit select circuit
03/30/2004US6714447 Semiconductor device and a integrated circuit card
03/30/2004US6714444 Magnetic element utilizing spin transfer and an MRAM device using the magnetic element
03/30/2004US6714443 Thin film magnetic memory device for writing data of a plurality of bits in parallel
03/30/2004US6714439 Semiconductor memory device
03/30/2004US6714436 Write operation for capacitorless RAM
03/30/2004US6714431 Semiconductor package with a controlled impedance bus and method of forming same
03/30/2004US6714418 Method for producing an electronic component having a plurality of chips that are stacked one above the other and contact-connected to one another
03/30/2004US6714415 Split fin heat sink
03/30/2004US6714397 Protection configuration for schottky diode
03/30/2004US6714392 Electronic component and utilization of a guard structure contained therein
03/30/2004US6714390 Giant magneto-resistive effect element, magneto-resistive effect type head, thin-film magnetic memory and thin-film magnetic sensor
03/30/2004US6714302 Aligning method, aligner, and device manufacturing method
03/30/2004US6714300 Optical inspection equipment for semiconductor wafers with precleaning
03/30/2004US6714282 Position detecting method optical characteristic measuring method and unit, exposure apparatus, and device manufacturing method
03/30/2004US6714281 Exposure apparatus and device manufacturing method
03/30/2004US6714280 Projection optical system, projection exposure apparatus, and projection exposure method
03/30/2004US6714279 Lithographic projection apparatus, device manufacturing method and device manufactured thereby
03/30/2004US6714277 Exposure apparatus, gas replacement method, semiconductor device manufacturing method, semiconductor manufacturing factory and exposure apparatus maintenance method
03/30/2004US6714274 Liquid crystal display apparatus and TFT panel
03/30/2004US6714050 I/O cell configuration for multiple I/O standards
03/30/2004US6714047 Semiconductor integrated circuit
03/30/2004US6714031 Semiconductor device for wafer examination