| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 05/06/2004 | US20040085809 Magnetic memory device having magnetic circuit and method of manufacture thereof |
| 05/06/2004 | US20040085808 Magnetic memory device and methods for making same |
| 05/06/2004 | US20040085807 Magnetic memory and method for driving the same, and magnetic memory device using the same |
| 05/06/2004 | US20040085805 Device selection circuitry constructed with nanotube technology |
| 05/06/2004 | US20040085803 Magnetic thin film element, memory element using the same, and methd for recording and reproducing using the memory element |
| 05/06/2004 | US20040085802 Metal oxynitride capacitor barrier layer |
| 05/06/2004 | US20040085801 Metal wiring pattern for memory devices |
| 05/06/2004 | US20040085798 Nonvolatile data storage circuit using ferroelectric capacitors |
| 05/06/2004 | US20040085796 System-in-package type semiconductor device |
| 05/06/2004 | US20040085792 Inverter controller |
| 05/06/2004 | US20040085791 Inverter controller |
| 05/06/2004 | US20040085783 Inverter controller |
| 05/06/2004 | US20040085708 One-cylinder stack capacitor and method for fabricating the same |
| 05/06/2004 | US20040085706 Electrostatic chuck, supporting table and plasma processing system |
| 05/06/2004 | US20040085690 Semiconductor integrated circuit |
| 05/06/2004 | US20040085687 Ferromagnetic layer for magnetoresistive element |
| 05/06/2004 | US20040085681 Magnetoresistance element, magnetic memory, and magnetic head |
| 05/06/2004 | US20040085645 Illumination system and exposure apparatus and method |
| 05/06/2004 | US20040085629 Magnetically positioned precision holder for optical components |
| 05/06/2004 | US20040085548 Interference system and semiconductor exposure apparatus having the same |
| 05/06/2004 | US20040085546 Measurement and compensation of errors in interferometers |
| 05/06/2004 | US20040085545 Cyclic error compensation in interferometry systems |
| 05/06/2004 | US20040085532 System and methods for classifying anomalies of sample surfaces |
| 05/06/2004 | US20040085524 Device manufacturing apparatus |
| 05/06/2004 | US20040085505 Display, method of manufacturing display and apparatus for manufacturing display |
| 05/06/2004 | US20040085489 Method of fabricating liquid crystal display device |
| 05/06/2004 | US20040085292 Head-mounted display system |
| 05/06/2004 | US20040085268 Display device having superior characteristics |
| 05/06/2004 | US20040085246 Method and apparatus for producing uniform processing rates |
| 05/06/2004 | US20040085182 Resistive polysilicon element controllable to irreversibly decrease its value |
| 05/06/2004 | US20040085175 Solid state inducting device |
| 05/06/2004 | US20040085119 Method and circuit for controlling fuse blow |
| 05/06/2004 | US20040084824 Wafer support device and a wafer support method |
| 05/06/2004 | US20040084782 High density area array solder microjoining interconnect structure and fabrication method |
| 05/06/2004 | US20040084780 Dual damascene structure for the wiring-line structures of multi-level interconnects in integrated circuit |
| 05/06/2004 | US20040084778 Semiconductor device |
| 05/06/2004 | US20040084777 Semiconductor device and method for fabricating the same |
| 05/06/2004 | US20040084776 Semiconductor equipment |
| 05/06/2004 | US20040084775 Solid state device and its manufacturing method |
| 05/06/2004 | US20040084774 Gas layer formation materials |
| 05/06/2004 | US20040084773 To prevent the diffusion of copper atoms during damascene process |
| 05/06/2004 | US20040084772 Compound structure for reduced contact resistance |
| 05/06/2004 | US20040084769 Semiconductor device and method for manufacturing the same |
| 05/06/2004 | US20040084767 Method for fabricating a semiconductor apparatus including a sealing member with reduced thermal stress |
| 05/06/2004 | US20040084762 Ceramic substrate |
| 05/06/2004 | US20040084761 Method and structure of a reducing intra-level and inter-level capacitance of a semiconductor device |
| 05/06/2004 | US20040084758 Semiconductor package with lead frame as chip carrier and method for fabricating the same |
| 05/06/2004 | US20040084757 Micro leadframe package having oblique etching |
| 05/06/2004 | US20040084756 Electronic circuit device and manufacturing method thereof |
| 05/06/2004 | US20040084755 Dicing process for GaAs/InP and other semiconductor materials |
| 05/06/2004 | US20040084754 Bipolar transistor comprising; a collector; a base; and a polysilicon emitter containing a dopant species and a polysilicon grain size modulating species |
| 05/06/2004 | US20040084752 Semiconductor device and method of forming a semiconductor device |
| 05/06/2004 | US20040084751 Inductive storage capacitor |
| 05/06/2004 | US20040084750 Low loss high Q inductor |
| 05/06/2004 | US20040084749 Hollow structure in an integrated circuit and method for producing such a hollow structure in an integrated circuit |
| 05/06/2004 | US20040084748 Semiconductor devices and methods for fabricating the same |
| 05/06/2004 | US20040084746 Self-aligned semiconductor contact structures and methods for fabricating the same |
| 05/06/2004 | US20040084745 Systems and methods for integration of heterogeneous circuit devices |
| 05/06/2004 | US20040084742 Bonding pads over input circuits |
| 05/06/2004 | US20040084736 Thermally stable gate insulating film having a high relative dielectric constant |
| 05/06/2004 | US20040084735 Semiconductor transistor having a stressed channel |
| 05/06/2004 | US20040084734 Semiconductor device including metal insulator semiconductor field effect transistor and method of manufacturing the same |
| 05/06/2004 | US20040084733 Mask ROM and fabrication thereof |
| 05/06/2004 | US20040084731 Semiconductor device comprising buried channel region and method for manufacturing the same |
| 05/06/2004 | US20040084730 ESD protection circuit |
| 05/06/2004 | US20040084728 Thin film transistor and method for fabricating same |
| 05/06/2004 | US20040084727 Semiconductor device and learning method thereof |
| 05/06/2004 | US20040084726 Semiconductor device having heat release structure using soi substrate and fabrication method thereof |
| 05/06/2004 | US20040084724 Metal semiconductor contact, semiconductor component, integrated circuit arrangement and method |
| 05/06/2004 | US20040084723 Semiconductor device having complementary mos transistor |
| 05/06/2004 | US20040084722 Power semiconductor device |
| 05/06/2004 | US20040084720 Low temperature hydrophobic direct wafer bonding |
| 05/06/2004 | US20040084719 Flash with finger-like floating gate |
| 05/06/2004 | US20040084718 Structure, fabrication method and operation method of flash memory |
| 05/06/2004 | US20040084717 Semiconductor memory array of floating gate memory cells with low resistance source regions and high source coupling |
| 05/06/2004 | US20040084716 Structure of flash memory device and fabrication method thereof |
| 05/06/2004 | US20040084715 Semiconductor device and method of manufacturing the same |
| 05/06/2004 | US20040084714 Semiconductor memory device |
| 05/06/2004 | US20040084713 Structure with composite floating gate by poly spacer in flash |
| 05/06/2004 | US20040084712 Scaled EEPROM cell by metal-insulator-metal (MIM) coupling |
| 05/06/2004 | US20040084711 Pre-implant film may be grown in thinner layers as silicon nitride as opposed to silica |
| 05/06/2004 | US20040084710 Split-gate thin-film storage NVM cell |
| 05/06/2004 | US20040084709 Capacitor having a cylindrical (or concave) structure to overcome a difficulty in etching a lower electrode as the height of a 3-dimensionally stacked capacitor increases |
| 05/06/2004 | US20040084708 Method for fabricating a trench capacitor |
| 05/06/2004 | US20040084707 Finger metal-insulator-metal capacitor device with local interconnect |
| 05/06/2004 | US20040084706 Non-volatile semiconductor memory |
| 05/06/2004 | US20040084705 Zero-cost non-volatile memory cell with write and erase features |
| 05/06/2004 | US20040084704 Using fewer masks and simpler process steps (simpler because no SAC etch or mask reduction are necessary) as compared to conventional fabrication methods |
| 05/06/2004 | US20040084703 Using isolated p-well transistor arrangements to avoid leakage caused by word line/bit line shorts |
| 05/06/2004 | US20040084702 Magnetic memories with bit lines and digit lines that intersect at oblique angles and fabrication methods thereof |
| 05/06/2004 | US20040084701 Semiconductor device having ferroelectric capacitor and hydrogen barrier film and manufacturing method thereof |
| 05/06/2004 | US20040084700 Image sensor and method for fabricating the same |
| 05/06/2004 | US20040084699 Semiconductor device and fabrication method thereof |
| 05/06/2004 | US20040084698 Semiconductor memory devices having offset transistors and methods of fabricating the same |
| 05/06/2004 | US20040084692 Graded- base- bandgap bipolar transistor having a constant - bandgap in the base |
| 05/06/2004 | US20040084691 Method for making nanoscale wires and gaps for switches and transistors |
| 05/06/2004 | US20040084690 N-type boron-carbide semiconductor polytype and method of fabricating the same |
| 05/06/2004 | US20040084688 Flip chip molded/exposed die process and package structure |
| 05/06/2004 | US20040084680 Barrier layer for a copper metallization layer including a low k dielectric |
| 05/06/2004 | US20040084679 Semiconductor devices and methods of manufacture thereof |