Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2004
05/13/2004US20040089859 Integrated circuit device installed structure and installation method
05/13/2004US20040089854 Dielectric material compositions
05/13/2004US20040089853 Dielectric material compositions with high dielectric constant and low dielectric loss
05/13/2004US20040089840 Fluorinated surfactants for buffered acid etch solutions
05/13/2004US20040089836 Gate valve assembly
05/13/2004US20040089824 Hardware configuration for parallel data processing without cross communication
05/13/2004US20040089823 Method and apparatus for securing microelectronic workpiece containers
05/13/2004US20040089822 Charged-particle beam writer
05/13/2004US20040089819 Radiation source, lithographic apparatus, device manufacturing method, and device manufactured thereby
05/13/2004US20040089818 Multi-foil optic
05/13/2004US20040089697 Bump ball crimping apparatus
05/13/2004US20040089651 Heating device, method for evaluating heating device and pattern forming method
05/13/2004US20040089649 Device for thermally treating substrates
05/13/2004US20040089644 Laser machining method and laser machining apparatus
05/13/2004US20040089634 Compositions for oxide CMP
05/13/2004US20040089632 Method for etching an object using a plasma and an object etched by a plasma
05/13/2004US20040089630 Surface modification method
05/13/2004US20040089557 Process for electrolytic copper plating
05/13/2004US20040089555 Continuous metal plating and supplemental processing in one housing; substrate stage between cassette stage and pre-treatment unit; cleaning with pure water; drying
05/13/2004US20040089552 Electrochemical treating substrate by irradiating with light; lamp, stage, cathode, frame and seal
05/13/2004US20040089542 Design of hardware features to facilitate arc-spray coating applications and functions
05/13/2004US20040089515 Method and apparatus for picking up a semiconductor chip, method and apparatus for removing a semiconductor chip from a dicing tape, and a method of forming a perforated dicing tape
05/13/2004US20040089464 Semiconductor device having packaging structure
05/13/2004US20040089421 Distributed control system for semiconductor manufacturing equipment
05/13/2004US20040089419 Method for using additives in the caustic etching of silicon for obtaining improved surface characteristics
05/13/2004US20040089408 Method for connecting microchips to an antenna arranged on a support strip for producing a transponder
05/13/2004US20040089406 Method for producing an etching mask
05/13/2004US20040089331 Rinsing lid for wet bench
05/13/2004US20040089328 Substrate cleaning apparatus
05/13/2004US20040089326 Method for post chemical-mechanical planarization cleaning of semiconductor wafers
05/13/2004US20040089325 Method of and apparatus for cleaning semiconductor wafers
05/13/2004US20040089282 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions and dicing apparatus
05/13/2004US20040089239 Method for dechucking a substrate
05/13/2004US20040089238 Vacuum/gas phase reactor for dehydroxylation and alkylation of porous silica
05/13/2004US20040089236 Semiconductor wafer treatment member
05/13/2004US20040089235 Mixer, and device and method for manufacturing thin-film
05/13/2004US20040089233 Deposition methods utilizing microwave excitation
05/13/2004US20040089229 Deposition method, deposition apparatus, and pressure-reduction drying apparatus
05/13/2004US20040089228 Dispensing system and method
05/13/2004US20040089227 Dual chamber vacuum processing system
05/13/2004US20040089224 Process for producing low defect density silicon
05/13/2004US20040089223 Preparation of crystals
05/13/2004US20040089222 GaN single crystal substrate and method of making the same
05/13/2004US20040089065 Wind tunnel and collector configuration therefor
05/13/2004US20040089059 Scanning probe microscope and specimen observation method and semiconductor device manufacturing method using said scanning probe microscope
05/13/2004US20040088880 Substrate drying system
05/13/2004US20040088855 Substrate having a coefficient of thermal expansion the same as that of the semiconductor of the chip-scale package and including apertures formed at locations corresponding to bond pads of the semiconductor device
05/13/2004DE69907930T2 Integrierte Schaltung mit Kalibriermitteln zur Kalibrierung eines elektronischen Moduls und Verfahren zum Kalibrieren eines elektronischen Moduls in einer Integrierten Schaltung An integrated circuit comprising calibration means for calibrating an electronic module and method for calibrating an electronic module in an integrated circuit
05/13/2004DE19808246B4 Verfahren zur Herstellung eines mikroelektronischen Halbleiterbauelements mittels Ionenimplatation A process for producing a microelectronic semiconductor component by means of ion implantation
05/13/2004DE10349747A1 Verfahren zum Herstellen von dünnen Schichten wie etwa zum Einsatz bei integrierten Schaltungen A method of manufacturing of thin layers such as used in integrated circuits
05/13/2004DE10349694A1 Semiconductor wafer aligment device has reception plane of alignment table lying within periphery of semiconductor wafer for preventing damage by contact with table edge
05/13/2004DE10349188A1 Verfahren zur Herstellung einer vergrabenen Verdrahtungsstruktur A process for producing a buried wiring structure
05/13/2004DE10345368A1 Production of a column-like structure in a substrate surface used as a photonic crystal or semiconductor component, e.g. in optical communication systems, involves determining the final properties of the columns after a first etching step
05/13/2004DE10344827A1 Power semiconductor device e.g. insulated gate bipolar transistor substrate, has P-type isolation region partially formed by diffusing P-type impurity on substrate, where region surrounds N region which is part of substrate
05/13/2004DE10344570A1 Schaltkreis-Simulator mit diffusionslängenabhängigen Transistoren und Verfahren zum Erzeugen eines Transistor-Modells Circuit simulator with length-dependent diffusion transistors and method for generating a transistor model
05/13/2004DE10340750A1 Trockenätzvorrichtung und Trockenätzverfahren sowie in Trockenätzvorrichtung verwendetes Reinigungsverfahren Dry etching and dry etching and cleaning method used in dry etching
05/13/2004DE10340004A1 Semiconductor element coating method using electrophoresis process for selective material deposition e.g. for light-emitting diode manufacture
05/13/2004DE10334539A1 Elektronisches Bauelement und Verfahren zum Herstellen desselben The same electronic device and methods for making
05/13/2004DE10334422A1 Verfahren zur Herstellung eines Materials mit geringer Ausdehnung sowie das Material mit geringer Ausdehnung verwendende Halbleitervorrichtung A method for producing a material with low expansion and the low expansion material semiconductor device using
05/13/2004DE10333129A1 Verfahren zur Bildung einer Siliziumnitridschicht A method of forming a silicon nitride layer
05/13/2004DE10330599A1 Verfahren zur Herstellung von Mikroelektronik-Strukturelementen durch Ausbilden von Durchmischungsschichten aus wasserlöslichen Harzen und Resistmaterialien A process for the production of microelectronic structure elements by forming mixing layers of water-soluble resins and resist materials
05/13/2004DE10251379A1 Magnetisch positionierte Präzisionshalterung für Optikbauteile Magnetically positioned precision mount for optics components
05/13/2004DE10250204A1 Verfahren zur Herstellung einer Transistorstruktur A process for producing a transistor structure
05/13/2004DE10249897A1 Selbstjustierender Transistor und Verfahren zur Herstellung The self aligned transistor and methods for making
05/13/2004DE10249650A1 Manufacturing semiconducting structure with gate stacks for corresponding FETs involves compensating FET starting voltage variation caused by width variation about desired width with dose variation
05/13/2004DE10249649A1 Production of a shallow trench isolation comprises partially filling a recess in a substrate with a filler using a flow-fill process followed by plasma treatment
05/13/2004DE10239775B3 Production of a silicon wafer used in the production of a semiconductor component comprises treating the cleaned wafer with an aqueous ozone solution, coating with polycrystalline silicon, finely grinding, and epitaxially growing the wafer
05/13/2004DE10228998B4 Vorrichtung und Verfahren zum elektrochemischen Behandeln eines Substrats bei reduzierter Metallkorrosion An apparatus and method for electrochemically treating a substrate with reduced metal corrosion
05/13/2004DE10217362B4 Gezielte Abscheidung von Nanoröhren Selective deposition of nanotubes
05/13/2004DE10064456B4 Verfahren zur maskenlosen Formation von Metall-Nanostrukturen in dünnen dielektrischen Schichten mittels Bestrahlung mit ultrakurzen Laserimpulsen Method for maskless formation of metal oxide nanostructures in thin dielectric films by irradiation with ultra-short laser pulses
05/13/2004DE10026030B4 Ätzverfahren, seine Anwendung und Ätzmittel Etching method, its application and abrasives
05/12/2004EP1418796A2 Erosion reduction for EUV laser produced plasma target sources
05/12/2004EP1418631A2 Semiconductor optical device having current-confined structure
05/12/2004EP1418625A1 Method to store a binary data in a memory cell in a memory integrated circuit, corresponding integrated circuit and fabrication process
05/12/2004EP1418623A2 Nonvolatile variable resistor, memory device, and scaling method of nonvolatile variable resistor
05/12/2004EP1418622A1 Encapsulation of multiple integrated circuits
05/12/2004EP1418620A2 MRAM and methods for manufacturing and driving the same
05/12/2004EP1418619A1 Semiconductor device and production method therefor, and plating solution
05/12/2004EP1418618A2 Method of forming cavites between multilayered wirings
05/12/2004EP1418617A2 Semiconductor device and method of manufacturing the same
05/12/2004EP1418616A1 Electronic parts packaging structure and method of manufacturing the same
05/12/2004EP1418615A1 Fabrication of self-aligned bipolar transistor
05/12/2004EP1418614A1 Wafer holding ring for chemical and mechanical polisher
05/12/2004EP1418613A1 Etching method for manufacturing a semiconductor device
05/12/2004EP1418468A2 Projection optical system and exposure apparatus
05/12/2004EP1418467A2 Projection optical system, exposure apparatus, and device manufacturing method
05/12/2004EP1418436A2 Electrical contactor, especially wafer level contactor, using fluid pressure
05/12/2004EP1418251A1 Plating method
05/12/2004EP1418161A2 Method for the production of an aluminium nitride substrate
05/12/2004EP1418160A1 CERAMIC CONNECTION BODY, METHOD OF CONNECTING THE CERAMIC BODIES, AND CERAMIC STRUCTURAL BODY
05/12/2004EP1418154A2 Method and apparatus for vacuum-mounting a micro electro mechanical system on a substrate
05/12/2004EP1418022A1 Vertically adjustable chemical mechanical polishing head having a pivot mechanism and method for use thereof
05/12/2004EP1418021A1 Polishing pad
05/12/2004EP1418017A2 Positioning apparatus, charged particle beam exposure apparatus, and semiconductor device manufacturing method
05/12/2004EP1417758A2 Esd protection devices for a differential pair of transistors
05/12/2004EP1417722A2 Flip chip bonding of light emitting devices and light emitting devices suitable for flip-chip bonding
05/12/2004EP1417721A2 Power mosfet with deep implanted junctions
05/12/2004EP1417718A1 Transistor having high dielectric constant gate insulating layer and source and drain forming schottky contact with substrate
05/12/2004EP1417717A2 Mis device having a trench gate electrode and method of making the same
05/12/2004EP1417716A1 Trench bipolar transistor