Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
05/2004
05/12/2004CN1149303C Ion plating apparatus
05/12/2004CN1149237C Copolymer resin, Preparation thereof, and photoresist using the same
05/11/2004US6735753 Method of fabricating a semiconductor device having a multilevel interconnections
05/11/2004US6735730 Integrated circuit with design for testability and method for designing the same
05/11/2004US6735558 Characteristic extraction device, characteristic evaluation device, characteristic extraction method, characteristic evaluation method, recording medium and semiconductor device
05/11/2004US6735488 Production process standardization system of semiconductor device and method of same and storage medium storing that method
05/11/2004US6735378 Plurality of thermal shields spaced by gaps for gas flow
05/11/2004US6735333 Pattern inspection apparatus
05/11/2004US6735276 Sample preprocessing system for a fluorescent X-ray analysis and X-ray fluorescence spectrometric system using the same
05/11/2004US6735275 X-ray exposure method, x-ray exposure apparatus, fine structure and semiconductor device
05/11/2004US6735183 Radio frequency data communications device
05/11/2004US6735146 System and method for pulling electrically isolated memory cells in a memory array to a non-floating state
05/11/2004US6735132 6F2 DRAM array with apparatus for stress testing an isolation gate and method
05/11/2004US6735127 Method for driving a semiconductor memory
05/11/2004US6735123 Tunnel dielectric layer for data storage with greater thickness in central region; charge trapping layer; drain-to-source bias in presence of control gate field to induce hot electron injection
05/11/2004US6735118 CG-WL voltage boosting scheme for twin MONOS
05/11/2004US6735102 256 Meg dynamic random access memory
05/11/2004US6734983 Sensor body for detecting monitor light; plurality of detachable collector barrels to guide
05/11/2004US6734982 Method and device for measuring the thickness of thin films near a sample's edge and in a damascene-type structure
05/11/2004US6734969 Vacuum measurement device
05/11/2004US6734960 Wafer defect measuring method and apparatus
05/11/2004US6734949 Lithographic apparatus and device manufacturing method
05/11/2004US6734945 Liquid crystal display device
05/11/2004US6734940 Semiconductor device, electro-optical device substrate, liquid crystal device substrate and manufacturing method therefor, liquid crystal device, and projection liquid crystal display device and electronic apparatus using the liquid crystal device
05/11/2004US6734925 Multiple testing bars for testing liquid crystal display and method thereof
05/11/2004US6734714 Integrated circuit with closely coupled high voltage output and offline transistor pair
05/11/2004US6734693 Semiconductor integrated circuit having a semiconductor storage circuit and a test circuit for testing the semiconductor storage circuit
05/11/2004US6734692 Inspection apparatus and sensor
05/11/2004US6734691 Substrate for a probe card having conductive layers for supplying power to IC devices
05/11/2004US6734635 Process of crystallizing semiconductor thin film and laser irradiation system
05/11/2004US6734601 Surface acoustic wave device, method for making the same, and communication apparatus including the same
05/11/2004US6734573 Semiconductor memory having access transistors formed in a single well and driver transistors formed in wells different from the single well
05/11/2004US6734571 Semiconductor assembly encapsulation mold
05/11/2004US6734569 Die attachment with reduced adhesive bleed-out
05/11/2004US6734568 Semiconductor device and method of manufacturing the same
05/11/2004US6734567 Flip-chip device strengthened by substrate metal ring
05/11/2004US6734566 Recyclable flip-chip semiconductor device
05/11/2004US6734565 Contact structure for an integrated semiconductor device
05/11/2004US6734564 Specially shaped contact via and integrated circuit therewith
05/11/2004US6734563 Post passivation interconnection schemes on top of the IC chips
05/11/2004US6734562 Integrated circuit device structure including foamed polymeric material
05/11/2004US6734561 Comprises silicon oxynitride antireflective coating interposed between dielectric layers for etching prevention
05/11/2004US6734560 Diamond barrier layer
05/11/2004US6734559 Channel in dielectric lined with metallic barrier and filled with conductor where recess is etched
05/11/2004US6734558 Electronic devices with barium barrier film and process for making same
05/11/2004US6734557 Semiconductor device
05/11/2004US6734556 Semiconductor device with chip-on-chip construction joined via a low-melting point metal layer
05/11/2004US6734554 Semiconductor wafer with bumps of uniform height
05/11/2004US6734550 In-situ cap and method of fabricating same for an integrated circuit device
05/11/2004US6734547 Semiconductor wiring structure having divided power lines and ground lines on the same layer
05/11/2004US6734544 Integrated circuit package
05/11/2004US6734542 Component built-in module and method for producing the same
05/11/2004US6734536 Surface-mounting semiconductor device and method of making the same
05/11/2004US6734534 Microelectronic substrate with integrated devices
05/11/2004US6734533 Electron-beam treated CDO films
05/11/2004US6734531 Use of selective oxidation conditions for dielectric conditioning
05/11/2004US6734528 Transistor with pi-gate structure and method for producing the same
05/11/2004US6734527 CMOS devices with balanced drive currents based on SiGe
05/11/2004US6734526 Oxidation resistant microelectronics capacitor structure with L shaped isolation spacer
05/11/2004US6734524 Epitaxial semiconductor layer with doping concentration lower than substrate; dielectric trench
05/11/2004US6734523 Semiconductor device including a well divided into a plurality of parts by a trench
05/11/2004US6734522 Transistor
05/11/2004US6734521 Integrated circuit cells
05/11/2004US6734518 Surface treatment of DARC films to reduce defects in subsequent cap layers
05/11/2004US6734516 Monolithic lead-salt infrared radiation detectors and methods of formation
05/11/2004US6734511 Configuring a semiconductor chip as a single circuit that provides varying functions according to extrinsic conditions; permitting single circuit to be switched between a particular function and a different particular function
05/11/2004US6734510 Technique to mitigate short channel effects with vertical gate transistor with different gate materials
05/11/2004US6734509 Semiconductor integrated circuit
05/11/2004US6734508 Mask ROM, and fabrication method thereof
05/11/2004US6734507 Semiconductor device including memory cells and manufacturing method thereof
05/11/2004US6734506 Semiconductor device including a plurality of kinds of MOS transistors having different gate widths and method of manufacturing the same
05/11/2004US6734505 Thin film transistor and use of same
05/11/2004US6734503 Nitride-based semiconductor element
05/11/2004US6734501 Fully inverted type SOI-MOSFET capable of increasing the effective mutual conductance
05/11/2004US6734500 Semiconductor devices including a bi-polar transistor and a field effect transistor
05/11/2004US6734499 Operation method of semiconductor devices
05/11/2004US6734497 Insulated gate bipolar transistor, semiconductor device, method of manufacturing insulated-gate bipolar transistor, and method of manufacturing semiconductor device
05/11/2004US6734494 Vertical field effect transistor
05/11/2004US6734492 Nonvolatile vertical channel semiconductor device
05/11/2004US6734491 EEPROM with reduced manufacturing complexity
05/11/2004US6734490 Nonvolatile memory cell with high programming efficiency
05/11/2004US6734489 Semiconductor element and MIM-type capacitor formed in different layers of a semiconductor device
05/11/2004US6734488 Semiconductor device and manufacturing method thereof
05/11/2004US6734486 Recessed plug semiconductor device and manufacturing method thereof
05/11/2004US6734485 Vertical DRAM cell structure and its contactless DRAM arrays
05/11/2004US6734484 Vertical transistor DRAM structure and its manufacturing methods
05/11/2004US6734483 Process for fabricating a capacitor within an integrated circuit, and corresponding integrated circuit
05/11/2004US6734482 Trench buried bit line memory devices
05/11/2004US6734481 Semiconductor device having a monitor pattern
05/11/2004US6734480 Semiconductor capacitors having tantalum oxide layers
05/11/2004US6734479 Semiconductor integrated circuit device and the method of producing the same
05/11/2004US6734478 Ferroelectric memory circuit and method for its fabrication
05/11/2004US6734477 Fabricating an embedded ferroelectric memory cell
05/11/2004US6734476 Semiconductor devices having group III-V compound layers
05/11/2004US6734472 Power and ground shield mesh to remove both capacitive and inductive signal coupling effects of routing in integrated circuit device
05/11/2004US6734468 Devices related to electrode pads for p-type group III nitride compound semiconductors
05/11/2004US6734463 Semiconductor device comprising a window
05/11/2004US6734461 SiC wafer, SiC semiconductor device, and production method of SiC wafer
05/11/2004US6734460 Active matrix substrate and method of fabricating the same
05/11/2004US6734459 Semiconductor memory cell