Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2010
03/24/2010CN101677072A Method for encapsulation of an electronic assembly
03/24/2010CN101677071A Demoulding mechanism used in encapsulation process of light-emitting diode
03/24/2010CN101677070A Method for producing light-emitting diode and packaging adhesive material thereof by utilizing lithography process
03/24/2010CN101677069A Manufacturing and assembling method of semiconductor chip with consumption type metal-based core carrier
03/24/2010CN101677068A Copper core layer multilayer packaging substrate manufacturing method
03/24/2010CN101677067A Copper core layer multilayer packaging substrate manufacturing method
03/24/2010CN101677066A Build-up circuit board manufacturing method
03/24/2010CN101677065A Method of manufacturing a semiconductor device
03/24/2010CN101677064A Method for making a semiconductor device
03/24/2010CN101677063A Semiconductor device and a method of manufacturing the semiconductor device
03/24/2010CN101677062A Dry etching method of silicon compound film
03/24/2010CN101677061A Laser irradiation method and laser irradiation apparatus
03/24/2010CN101677060A Part mounting device
03/24/2010CN101677059A Substrate processing apparatus and substrate processing method
03/24/2010CN101677058A Manufacturing method of film construction body
03/24/2010CN101677057A Low-temperature wafer bonding method
03/24/2010CN101677056A Carrying device and method for monitoring deposition machine
03/24/2010CN101677055A Wafer grinding process
03/24/2010CN101676801A Lithography method
03/24/2010CN101676799A Method for etching base material
03/24/2010CN101676783A Thin film transistor display panel, liquid crystal display having the same, and method of manufacturing liquid crystal display
03/24/2010CN101676781A System for displaying images and fabricating method thereof
03/24/2010CN101676433A Film deposition apparatus and film deposition method
03/24/2010CN101676220A Ozonated water flow and concentration control apparatus and method
03/24/2010CN101676181A Apparatus for conveying substrates, method and apparatus for locating substrates
03/24/2010CN100596266C Electronic component mounting device and method
03/24/2010CN100596265C Image pickup device and substrate mounting apparatus for an electronic part
03/24/2010CN100596258C Method for manufacturing a circuit board structure, and a circuit board structure
03/24/2010CN100595974C Transmission line
03/24/2010CN100595973C Transmission line pair and transmission line group
03/24/2010CN100595944C Hermetic seal for light emitting display device, method, and apparatus
03/24/2010CN100595932C 电光装置和电子装置 An electro-optical device and electronic apparatus
03/24/2010CN100595928C Semiconductor substrate, preparing technique and application in advanced three-dimensional electronic packaging
03/24/2010CN100595925C Nand flash memory device and method of fabricating the same
03/24/2010CN100595924C 半导体器件及其制造方法 Semiconductor device and manufacturing method thereof
03/24/2010CN100595921C High-temperature resisting one-chip integrated micro-sensor structure and system integrating method
03/24/2010CN100595920C Semiconductor device and method of fabricating the same
03/24/2010CN100595916C LED chip packaging structure using ceramics as plaque and making method thereof
03/24/2010CN100595913C Package for semiconductor devices
03/24/2010CN100595911C IC device package and its assembling method
03/24/2010CN100595910C Carburetor, various types of devices using carburetor, and method of vaporization
03/24/2010CN100595908C Production method for solving problem of SiO2/SiN/SiO2 memory laminated residual on non-volatile
03/24/2010CN100595907C Nonvolatile semiconductor memory element having excellent charge retention properties and process for producing the same
03/24/2010CN100595906C Method for protecting silicon oxide layer in low-voltage field by CMOS high-voltage process
03/24/2010CN100595905C Electronic device and method of manufacturing the same
03/24/2010CN100595904C Manufacturing method using copper Dimashg process in production of integrated circuits
03/24/2010CN100595903C Non-contact silicon chip clamping device
03/24/2010CN100595902C DC-type electrode used for semiconductor
03/24/2010CN100595901C Static chuck plate
03/24/2010CN100595900C Buffer system for adjusting first-in first-out
03/24/2010CN100595899C Process endpoint detection method using broadband reflectometry
03/24/2010CN100595898C Component mounting apparatus and component mounting method
03/24/2010CN100595897C Crystal round stage encapsulation object and method for forming the same
03/24/2010CN100595896C Semiconductor device
03/24/2010CN100595895C Silicon groove forming method and device
03/24/2010CN100595894C Palladium-selective etching solution and method for controlling etching selectivity
03/24/2010CN100595893C Etching solution, etched article and mehtod for etched article
03/24/2010CN100595892C 研磨组合物 Polishing composition
03/24/2010CN100595891C Damage-free ashing process and system for post low-k etch
03/24/2010CN100595890C Method for manufacturing semiconductor device
03/24/2010CN100595889C Method of forming conducting nanowires
03/24/2010CN100595888C Method for forming pattern in semiconductor device
03/24/2010CN100595887C Coating apparatus and coating method
03/24/2010CN100595886C Method and system for eliminating reactive ion etching self bias
03/24/2010CN100595885C Plasma processing apparatus
03/24/2010CN100595884C Method of forming pattern of semiconductor device
03/24/2010CN100595883C Plasma processing device and medium window thereof
03/24/2010CN100595882C SOI preparation method of bonding and wafer thinning
03/24/2010CN100595881C crystal circle marking method, bad grade chip marking method, crystal circle positioning method and crystal circle testing mahcine
03/24/2010CN100595880C Apparatus and method for controlling wafer bias voltage
03/24/2010CN100595879C Scheduling method of silicon slice transmission course
03/24/2010CN100595878C Semiconductor stacked die/wafer configuration and packaging and method thereof
03/24/2010CN100595872C Method for detecting plasma distribution density in responses chamber
03/24/2010CN100595844C Semiconductor memory device
03/24/2010CN100595770C Method for displaying diagnostic message of automobile
03/24/2010CN100595681C Full phase shifting mask in damascene process
03/24/2010CN100595680C Diluent composition for removing photosensitive resin
03/24/2010CN100595677C Lithographic method
03/24/2010CN100595676C Adjusting method for long mask exposure focusing plane correction
03/24/2010CN100595675C Positive quadrupole illuminating exposure method and device therefor
03/24/2010CN100595674C Lithographic apparatus and device manufacturing method
03/24/2010CN100595671C Mask blank manufacturing method
03/24/2010CN100595670C Mask pattern and its forming method, method for manufacturing coating composition, and method for manufacturing semiconductor device
03/24/2010CN100595660C Thin film transistor liquid crystal display array basal plate structure and manufacturing method thereof
03/24/2010CN100595658C Liquid crystal displays, manufacturing methods and a driving method thereof
03/24/2010CN100595657C Liquid crystal display and a method for manufacturing the same
03/24/2010CN100595644C Transmissible reflective type diode substrate and a method for fabricating the same
03/24/2010CN100595638C Image display device
03/24/2010CN100595599C Multi-core cable detecting device and method thereof
03/24/2010CN100595576C Surface-sensitive condenser type gas transducer and manufacturing method thereof
03/24/2010CN100595351C Interstitial atoms based silicon with low defect density
03/24/2010CN100595187C Alkoxide compound, thin film-forming material and method for forming thin film
03/24/2010CN100595035C Method of surface treatment, crystal substrate, and semiconductor device
03/24/2010CN100594993C Method for cleaning reaction cavity
03/23/2010US7685560 Method and apparatus for monitoring exposure process
03/23/2010US7685556 Mask data correction method, photomask manufacturing method, computer program, optical image prediction method, resist pattern shape prediction method, and semiconductor device manufacturing method
03/23/2010US7685551 Semiconductor integrated circuit, standard cell, standard cell library, semiconductor integrated circuit designing method, and semiconductor integrated circuit designing equipment
03/23/2010US7684965 Method and apparatus for processing data, and computer product
03/23/2010US7684937 Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
03/23/2010US7684895 Wafer loading station that automatically retracts from a moving conveyor in response to an unscheduled event