Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
03/2010
03/18/2010US20100068878 Thin film fuse phase change cell with thermal isolation pad and manufacturing method
03/18/2010US20100068877 Method for tuning a work function of high-k metal gate devices
03/18/2010US20100068876 Methods of fabricating high-k metal gate devices
03/18/2010US20100068875 Double treatment on hard mask for gate n/p patterning
03/18/2010US20100068874 Method for forming a sacrificial sandwich structure
03/18/2010US20100068873 Depletion-Free MOS using Atomic-Layer Doping
03/18/2010US20100068872 Method for Fabricating Single-Crystalline Substrate Containing Gallium Nitride
03/18/2010US20100068871 Microwave Heating for Semiconductor Nanostructure Fabrication
03/18/2010US20100068870 High Speed Thin Film Deposition via Pre-Selected Intermediate
03/18/2010US20100068869 Method for fabricating a micro-electronic device equipped with semi-conductor zones on an insulator with a horizontal ge concentration gradient
03/18/2010US20100068868 Wafer temporary bonding method using silicon direct bonding
03/18/2010US20100068867 Method for producing bonded silicon wafer
03/18/2010US20100068866 III-V Compound Semiconductor Epitaxy From a Non-III-V Substrate
03/18/2010US20100068865 Method for manufacturing shallow trench isolation layer of semiconductor device
03/18/2010US20100068864 Apparatus and method for wafer level fabrication of high value inductors on semiconductor integrated circuits
03/18/2010US20100068863 Method of Manufacturing a Bipolar Transistor and Bipolar Transistor Obtained Therewith
03/18/2010US20100068862 Semiconductor device having a round-shaped nano-wire transistor channel and method of manufacturing same
03/18/2010US20100068861 Method of defining gate structure height for semiconductor devices
03/18/2010US20100068860 Semiconductor device and method of manufacture thereof
03/18/2010US20100068859 Method of manufacturing a fet gate
03/18/2010US20100068858 Double gate fet and fabrication process
03/18/2010US20100068857 Semiconductor device and manufacturing method of same
03/18/2010US20100068856 Charge mapping memory array formed of materials with mutable electrical characteristics
03/18/2010US20100068855 Group III nitride semiconductor devices with silicon nitride layers and methods of manufacturing such devices
03/18/2010US20100068854 MEMS Switch Capping and Passivation Method
03/18/2010US20100068853 Method of manufacturing semiconductor device
03/18/2010US20100068852 Method of Manufacturing A Semiconductor Device
03/18/2010US20100068851 Castellation wafer level packaging of integrated circuit chips
03/18/2010US20100068850 Semiconductor device and a method of manufacturing the same
03/18/2010US20100068849 Manufacturing method of translucent solar cell
03/18/2010US20100068848 One-step diffusion method for fabricating a differential doped solar cell
03/18/2010US20100068847 Method for manufacturing an image sensor
03/18/2010US20100068844 Microcap Wafer Bonding Method and Apparatus
03/18/2010US20100068843 Distributed bragg's reflector of digital-alloy multinary compound semiconductor
03/18/2010US20100068842 Long-wavelength resonant-cavity light-emitting diode
03/18/2010US20100068841 Thin Film Transistor Array Panel and Method of Manufacturing the Same
03/18/2010US20100068838 Method of Manufacturing a Light Emitting, Photovoltaic or Other Electronic Apparatus and System
03/18/2010US20100068837 Structures and Methods for Wafer Packages, and Probes
03/18/2010US20100068836 Method of measuring resistivity of sidewall of contact hole
03/18/2010US20100068835 Thin film scribe process
03/18/2010US20100068834 Damage evaluation method of compound semiconductor member, production method of compound semiconductor member, gallium nitride compound semiconductor member, and gallium nitride compound semiconductor membrane
03/18/2010US20100068833 System of testing semiconductor devices, a method for testing semiconductor devices, and a method for manufacturing semiconductor devices
03/18/2010US20100068832 Method for the protection of information in multi-project wafers
03/18/2010US20100068831 Method for wafer trimming for increased device yield
03/18/2010US20100068830 Marker structure and method for controlling alignment of layers of a multi-layered substrate
03/18/2010US20100068829 Manufacture method for semiconductor device capable of preventing reduction of ferroelectric film
03/18/2010US20100068828 Method of forming a structure having a giant resistance anisotropy or low-k dielectric
03/18/2010US20100068662 Method of forming fine patterns
03/18/2010US20100068654 Method for creating gray-scale features for dual tone development processes
03/18/2010US20100068025 Conveying device
03/18/2010US20100068014 Substrate processing apparatus and substrate conveying apparatus for use in the same
03/18/2010US20100068013 Conveyer system
03/18/2010US20100068011 Pallet conveyance device and substrate inspection device
03/18/2010US20100068009 Vacuum processing apparatus
03/18/2010US20100067778 Apparatus and method for pattern inspection
03/18/2010US20100067777 Evaluation pattern generating method, computer program product, and pattern verifying method
03/18/2010US20100067310 Mos transistor with a settable threshold
03/18/2010US20100067235 Method of manufacturing display device
03/18/2010US20100067165 Electrostatic chuck and method for manufacturing same
03/18/2010US20100067078 Actuator
03/18/2010US20100067010 Film quality evaluation method, apparatus therefor, and production system for thin-film device
03/18/2010US20100066931 Low-cost large-screen wide-angle fast-response liquid crystal display apparatus
03/18/2010US20100066930 Low-cost large-screen wide-angle fast-response liquid crystal display apparatus
03/18/2010US20100066683 Method for Transferring Thin Film to Substrate
03/18/2010US20100066440 Transistor with a passive gate and methods of fabricating the same
03/18/2010US20100066348 Apparatus and method for molecule detection using nanopores
03/18/2010US20100065971 Laser assisted chemical vapor deposition for backside die marking and structures formed thereby
03/18/2010US20100065967 Copper interconnection, method for forming copper interconnection structure, and semiconductor device
03/18/2010US20100065964 Copper-topped interconnect structure that has thin and thick copper traces and method of forming the copper-topped interconnect structure
03/18/2010US20100065961 Electronic Device and Method of Manufacturing Same
03/18/2010US20100065960 Resin sheet, circuit device and method of manufacturing the same
03/18/2010US20100065959 Semiconductor package and method of manufacturing the same, and semiconductor device
03/18/2010US20100065958 Pad redistribution chip for compactness, method of manufacturing the same, and stacked package using the same
03/18/2010US20100065956 Packaging structure, packaging method and photosensitive device
03/18/2010US20100065951 Method of Manufacturing A Semiconductor Device
03/18/2010US20100065949 Stacked Semiconductor Chips with Through Substrate Vias
03/18/2010US20100065948 Semiconductor Device and Method of Forming a Fan-In Package-on-Package Structure Using Through-Silicon Vias
03/18/2010US20100065947 Method for evaluating impurity distribution under gate electrode without damaging silicon substrate
03/18/2010US20100065946 Bonded Wafer Substrate for Use in MEMS Structures
03/18/2010US20100065945 Semiconductor device and manufacturing method thereof
03/18/2010US20100065942 Semiconductor Device and Method of Forming High-Frequency Circuit Structure and Method Thereof
03/18/2010US20100065940 3-d integrated circuit system and method
03/18/2010US20100065938 Ion implantation method, method of producing solid-state imaging device, solid-state imaging device, and electronic apparatus
03/18/2010US20100065935 Structure and method to fabricate high performance MTJ devices for spin-transfer torque (STT)-RAM
03/18/2010US20100065931 Micro-electromechanical system microphone structure and method of fabricating the same
03/18/2010US20100065930 Method of etching sacrificial layer, method of manufacturing MEMS device, MEMS device and MEMS sensor
03/18/2010US20100065928 Semiconductor device and manufacturing method of semiconductor device
03/18/2010US20100065927 Semiconductor device and fabrication method of the same
03/18/2010US20100065926 Photoresist etch back method for gate last process
03/18/2010US20100065925 Local charge and work function engineering on mosfet
03/18/2010US20100065924 Ultra-Shallow Junctions using Atomic-Layer Doping
03/18/2010US20100065920 Method to reduce collector resistance of a bipolar transistor and integration into a standard cmos flow
03/18/2010US20100065918 Semiconductor device and method for manufacturing the same
03/18/2010US20100065917 Semiconductor device and method of manufacturing the same
03/18/2010US20100065916 Semiconductor device and method for manufacturing the same
03/18/2010US20100065915 Chemical mechanical polishing (cmp) method for gate last process
03/18/2010US20100065914 Method of forming a single metal that performs n and p work functions in high-k/metal gate devices
03/18/2010US20100065910 Semiconductor device and method for manufacturing the same
03/18/2010US20100065909 Semiconductor device and method for making the same
03/18/2010US20100065908 Alignment of trench for mos
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