Patents for H01J 27 - Ion beam tubes (3,716)
03/2002
03/14/2002WO2001027964A3 Electron impact ion source
03/14/2002US20020029746 Operation method of ion source and ion beam irradiation apparatus
03/13/2002EP1185857A2 Method and apparatus for enhancing yield of secondary ions
03/12/2002US6356026 Ion implant source with multiple indirectly-heated electron sources
03/12/2002US6355933 Ion source and method for using same
03/07/2002WO2002019376A2 System and method for removing contaminant particles relative to an ion beam
03/07/2002WO2002019366A2 Cold cathode ion beam deposition apparatus with segregated gas flow
03/06/2002EP1183709A1 Linearly extended device for large-surface microwave treatment and for large surface plasma production
03/05/2002US6352626 Sputter ion source for boron and other targets
02/2002
02/21/2002WO2001067502A3 Method and apparatus for milling copper interconnects in a charged particle beam system
02/20/2002EP1180783A2 Magnet for generating a magnetic field in an ion source
02/19/2002US6348764 Indirect hot cathode (IHC) ion source
02/13/2002EP1179217A1 Secondary electron spectroscopy method and system
02/12/2002US6346770 Discharge device having cathode with micro hollow array
02/12/2002US6346768 Low energy ion gun having multiple multi-aperture electrode grids with specific spacing requirements
02/07/2002US20020014407 For reducing the surface roughness (smoothing) and improving the thickness uniformity of, top silicon film of silicon-on-insulator wafer or similar thin-film electronic or photonic workpiecies
02/06/2002EP1178517A1 An ion beam apparatus
02/06/2002EP1178513A2 Ionization chamber
02/05/2002USRE37537 Method and apparatus for altering material
01/2002
01/31/2002WO2000019481A9 Low contamination high density plasma processing chamber and methods for processing a semiconductor substrate
01/24/2002DE10014034C2 Plasma-Beschleuniger-Anordnung Plasma accelerator configuration
01/22/2002US6340812 Two-dimensional image detector with electrodes on counter substrate
01/17/2002WO2002005315A2 System and method for improving thin films by gas cluster ion be am processing
01/16/2002EP1171901A1 Multi-column fib for nanofabrication applications
01/08/2002US6337540 High brightness point ion sources using liquid ionic compounds
01/03/2002US20020000523 Ion implantation with improved ion source life expectancy
01/02/2002EP0702843B1 Device for high energy ion implantation of the low or medium current kind and method for its use
12/2001
12/27/2001US20010054699 Decaborane ion source
12/27/2001US20010054384 Vaporiser for generating feed gas for an arc chamber
12/20/2001WO2000019481A3 Low contamination high density plasma processing chamber and methods for processing a semiconductor substrate
12/20/2001US20010052574 MOS-based image sensor and method of forming black-level signal therefor
12/20/2001EP1145273A3 Low contamination high density plasma etch chambers and methods for making the same
12/18/2001US6331713 Movable ion source assembly
12/13/2001WO2001004611A3 Method and apparatus for enhancing yield of secondary ions
12/12/2001EP1161309A1 A method for a repetitive ion beam processing with a by carbon containing ion beam
11/2001
11/29/2001WO2001091523A2 Extreme ultraviolet source based on colliding neutral beams
11/28/2001CN1324093A Ion source operation method, and ion beam radiation device
11/27/2001US6322672 Method and apparatus for milling copper interconnects in a charged particle beam system
11/22/2001WO2001088947A1 Control system for indirectly heated cathode ion source
11/22/2001WO2001088946A1 Cathode assembly for indirectly heated cathode ion source
11/22/2001US20010043040 Cathode assembly for indirectly heated cathode ion source
11/22/2001US20010042836 Control system for indirectly heated cathode ion source
11/21/2001EP1062679B1 Plasma etching installation
11/20/2001US6320321 Ion beam processing apparatus for processing work piece with ion beam being neutralized uniformly
11/08/2001US20010037817 Arc chamber for an ion implantation system
10/2001
10/25/2001US20010032939 Multi-column FIB for nanofabrication applications
10/24/2001EP1147544A2 Rf plasma etch reactor with internal inductive coil antenna and electrically conductive chamber walls
10/24/2001CN1319247A Low contaminatino, high density plasma etch chamber and method for making the same
10/18/2001DE10115937A1 Verdampfer zum Erzeugen von Speisegas für eine Lichtbogenkammer Evaporator for generating feed gas for an arc chamber
10/17/2001EP1145273A2 Low contamination high density plasma etch chambers and methods for making the same
10/11/2001US20010027917 Ion milling chromium on a quartz substrate without causing defects in the quartz by moving the ion beam initially in a pattern that produces an uneven surface, followed by milling step where beam moves in a pattern of overlapping pixels
10/11/2001DE10112817A1 Ion extraction apparatus for ion implantation system has electrode manipulator with actuators for adjusting slit width and moving electrode
10/11/2001DE10015415A1 Generation of high intensity ion beam and or short wave electromagnetic emissions using laser
10/09/2001US6300720 Plasma gun and methods for the use thereof
10/09/2001US6300636 Ion source head
10/09/2001US6298806 Device for exciting a gas by a surface wave plasma
10/04/2001WO2001022465A8 Plasma source of linear ion beam
10/04/2001DE10014034A1 Plasma-Beschleuniger-Anordnung Plasma accelerator configuration
09/2001
09/27/2001WO2001072093A2 Plasma accelerator arrangement
09/25/2001US6294862 Multi-cusp ion source
09/25/2001US6294780 Pulsed ion source for ion trap mass spectrometer
09/20/2001WO2001069645A1 Spatter ion pump
09/20/2001WO2001068938A1 Method and apparatus for repairing lithography masks using a charged particle beam system
09/19/2001EP0799491B1 Radio frequency ion source
09/18/2001US6291939 Ion source device
09/13/2001WO2001067502A2 Method and apparatus for milling copper interconnects in a charged particle beam system
09/13/2001WO2001067482A1 Hollow cathode sputter ion source for generating high-intensity ion beams
09/13/2001DE10010706A1 Hollow cathode sputter ion source for generating high intensity ion beams has electromagnet, externally heated cathode, cooled anti-cathode, cooled anode for Penning plasma
09/12/2001EP1132946A1 Ion beam processing apparatus
09/12/2001CN1312578A Ion source and operation method thereof
09/11/2001US6288403 Decaborane ionizer
09/04/2001US6285025 Source of fast neutral molecules
08/2001
08/30/2001US20010017353 Ion source and operation method thereof
08/29/2001EP1128414A1 Modulated power for ionized metal plasma deposition
08/16/2001WO2001059805A1 Multi-column fib for nanofabrication applications
08/16/2001EP1123641A1 Gas-filled particle accelerator with a pulsed plasma source
07/2001
07/10/2001US6259210 Power control apparatus for an ION source having an indirectly heated cathode
07/10/2001US6259091 Apparatus for reduction of selected ion intensities in confined ion beams
06/2001
06/28/2001US20010005119 Ion beam processing apparatus for processing work piece with ion beam being neutralized uniformly
06/14/2001WO2001043160A1 Ionizer for gas cluster ion beam formation
06/14/2001WO2001043157A1 Ion implantation ion source, system and method
06/13/2001EP1105908A1 Ion beam generation apparatus
06/12/2001US6246162 Ion optics
06/12/2001US6246059 Ion-beam source with virtual anode
06/07/2001WO2001041181A1 Gas cluster ion beam smoother apparatus
06/05/2001US6242749 Ion-beam source with uniform distribution of ion-current density on the surface of an object being treated
05/2001
05/29/2001US6239440 Arc chamber for an ion implantation system
05/29/2001US6238526 Ion-beam source with channeling sputterable targets and a method for channeled sputtering
05/22/2001US6236163 Multiple-beam ion-beam assembly
05/22/2001US6236054 Ion source for generating ions of a gas or vapor
05/17/2001US20010001185 Plasma processing apparatus and method of cleaning the apparatus
05/16/2001EP1099235A1 Ion source
05/10/2001DE19949978A1 Elektronenstoßionenquelle Electron impact ion source
05/01/2001US6225747 Charged-particle source, control system and process using gating to extract the charged particle beam
04/2001
04/19/2001WO2001027964A2 Electron impact ion source
04/18/2001EP1093149A2 Decaborane ion source
04/17/2001CA2162748C Ion generating source for use in an ion implanter
04/12/2001DE10049536A1 Ion source arrangement has ion source movable relative to chamber along fixed curve essentially in horizontal plane to enable access to inner wall of chamber
04/10/2001US6215125 Method to operate GEF4 gas in hot cathode discharge ion sources
04/10/2001CA2124344C Corona discharge ionisation source
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