Patents for H01J 27 - Ion beam tubes (3,716)
04/2007
04/26/2007WO2005114691A3 Charged droplet sprayers
04/26/2007US20070090286 Ion drive and odor emitter
04/26/2007US20070089980 Ion source control system
04/26/2007DE112005001120T5 Austauschbarer Anodenmantel für eine Ionenquelle Replaceable anode sheath for an ion source
04/25/2007CN1953129A Method of operating ion source and ion implanting apparatus
04/24/2007US7208240 Fuel cell with ionization membrane
04/19/2007WO2007044361A2 Ldi/maldi source for enhanced spatial resolution
04/19/2007US20070085021 Technique for improving performance and extending lifetime of inductively heated cathode ion source
04/19/2007CA2625457A1 Compact ionization source
04/19/2007CA2622982A1 Ldi/maldi source for enhanced spatial resolution
04/17/2007US7204921 Vacuum apparatus and vacuum processing method
04/11/2007EP1183709B1 Linearly extended device for large-surface microwave treatment and for large surface plasma production
04/11/2007CN1945782A 微波离子源 Microwave ion source
04/10/2007US7202487 Apparatus for ion implantation
04/05/2007US20070075267 Monatomic dopant ion source and method
04/05/2007US20070075266 Ion source element, ion implanter having the same and method of modifying the same
03/2007
03/28/2007EP1766652A2 Non-axisymmmetric charged-particle beam system
03/28/2007EP1766651A2 Charged droplet sprayers
03/27/2007US7196325 Glow discharge and photoionizaiton source
03/22/2007US20070063147 Doping device
03/20/2007US7193223 Desorption and ionization of analyte molecules at atmospheric pressure
03/15/2007WO2007029777A1 Ion source and plasma processing device
03/14/2007CN2879416Y Scanning type ion gun
03/08/2007US20070051900 Atomic level ion source and method of manufacture and operation
03/08/2007US20070051899 Maldi sample plate imaging workstation
03/08/2007US20070051898 Ionising particle analyser enabling for example the separation of the fluorescent yield (fy) and the total electron yield (tey) in exafs (extended x-ray absorption fine structure) measurements
03/07/2007EP0992057B1 Charged-particle source, control system, and process
03/07/2007EP0946961B1 Magnetic system, particularly for ecr sources, for producing closed surfaces of equimodule b of any form and dimensions
03/07/2007CN2875742Y Ionic perforating machine for medicinal plaster
03/06/2007US7185602 Ion implantation ion source, system and method
03/01/2007WO2007023489A1 A plasma emitter and methods utilizing the same
03/01/2007WO2006047609A3 Ionizer and method for gas-cluster ion-beam formation
02/2007
02/28/2007EP1303866A4 System and method for improving thin films by gas cluster ion be am processing
02/28/2007CN1922709A Ion sources
02/28/2007CN1302511C Method for predicting the lifetime of a filament in an ion source and ion source device
02/27/2007US7183559 Ion source with substantially planar design
02/21/2007CN1917131A Filament of neutralization cathode in Kaufman ion source, and method
02/20/2007US7180059 Apparatus and method for sensor control and feedback
02/20/2007US7180058 LDI/MALDI source for enhanced spatial resolution
02/13/2007US7176469 Negative ion source with external RF antenna
02/13/2007US7174703 Ion thrusting system
02/08/2007US20070029501 Ion source
02/08/2007US20070029500 Plasma source and applications thereof
02/07/2007CN1909147A Emitter for an ion source and method of producing same
02/06/2007US7173252 Ionizer and method for gas-cluster ion-beam formation
02/01/2007US20070023680 High voltage design structure for high temperature superconducting device
02/01/2007US20070023679 Sensitive glow discharge ion source for aerosol and gas analysis
02/01/2007US20070023678 Method and apparatus for ionization by cluster-ion impact
02/01/2007US20070023676 Nanospray ionization device and method
02/01/2007US20070023675 Multimode ionization source
01/2007
01/31/2007CN1906725A Ion source with modified gas delivery
01/25/2007US20070018114 Resonance method for production of intense low-impurity ion beams of atoms and molecules
01/24/2007EP1397818B1 Gating grid for use in particle beam measurement device and method of manufacturing said grid
01/24/2007CN1902728A 离子源控制系统 Ion source control system
01/23/2007US7166965 Waveguide and microwave ion source equipped with the waveguide
01/23/2007US7165458 Vacuum gauge
01/23/2007CA2171649C Discharge device having cathode with micro hollow array
01/17/2007CN1896315A Ion beam etching method and ion beam etching apparatus
01/17/2007CN1896302A System and method for controlling ion density and energy using modulated power signals
01/16/2007US7164124 Mass spectrometric apparatus and ion source
01/11/2007US20070007465 Display apparatus
01/10/2007EP1741120A2 Method and system for desorption electrospray ionization
01/10/2007CN1294614C Ion source, ion injection equipment, manufacturing method of semiconductor device
01/09/2007US7161144 Interfaces for a photoionization mass spectrometer
01/09/2007US7161112 Toroidal low-field reactive gas source
01/04/2007WO2007002455A2 Helicon plasma source with permanent magnets
01/04/2007WO2007002121A2 High voltage design structure for high temperature superconducting device
01/03/2007EP1738388A2 Method and apparatus for improved processing with a gas-cluster ion beam
12/2006
12/28/2006US20060288938 Systems and Methods for the Production of Highly Tetrahedral Amorphous Carbon Coatings
12/27/2006EP1735809A2 Method and apparatus for improved beam stability in high current gas-cluster ion beam processing system
12/21/2006US20060284106 Atmospheric pressure ion source high pass ion filter
12/21/2006US20060284105 Ion source
12/21/2006US20060284104 Ion source
12/21/2006US20060284103 Glow discharge and photoionization source
12/12/2006US7148491 Super alloy ionization chamber for reactive samples
12/06/2006CN1875668A Device for controlling the electronic temperature in an RCE plasma
12/06/2006CN1288696C Ion source and its operating method
12/05/2006US7144794 Ion source, ion implanting device, and manufacturing method of semiconductor devices
11/2006
11/30/2006US20060269614 Multi-cell polarizer systems for hyperpolarizing gases
11/29/2006EP1725697A2 Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
11/28/2006US7141773 Image focusing in fluorescent imaging
11/28/2006CA2380989C Atomic beam generating method and apparatus
11/23/2006WO2005122265A3 Field emission ion source based on nanostructure-containing material
11/21/2006US7138768 Indirectly heated cathode ion source
11/21/2006US7138625 User customizable plate handling for MALDI mass spectrometry
11/16/2006WO2006121602A1 Ion source with multi-piece outer cathode
11/16/2006CA2606590A1 Ion source with multi-piece outer cathode
11/14/2006US7135689 Apparatus and method for ion production enhancement
11/09/2006US20060249697 Method, apparatus and system for specimen fabrication by using an ion beam
11/08/2006EP1719147A2 Fluid-cooled ion source
11/07/2006US7132670 Apparatus and method for ion production enhancement
11/02/2006WO2006115172A1 Solid ion source
11/02/2006US20060243917 Apparatus and method for sensor control and feedback
11/01/2006CN1856858A A source of liquid metal ions and a method for controlling the source
10/2006
10/31/2006US7129513 Field emission ion source based on nanostructure-containing material
10/26/2006WO2004003973A3 Ion implantation device and method
10/26/2006US20060238133 Ion implantation system and control method
10/26/2006US20060237663 High speed combination multi-mode ionization source for mass spectrometers
10/26/2006US20060237641 Method for controlling space charge-driven ion instabilities in electron impact ion sources
10/19/2006WO2005114701A3 Replaceable anode liner for ion source
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