| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/20/2006 | US7065037 Method and apparatus to provide facility and module redundancy in telecommunication switching equipment |
| 06/20/2006 | US7064991 Semiconductor storage device |
| 06/20/2006 | US7064988 Synchronous semiconductor memory device of fast random cycle system and test method thereof |
| 06/20/2006 | US7064953 Electronic package with direct cooling of active electronic components |
| 06/20/2006 | US7064822 Evaluating a multi-layered structure for voids |
| 06/20/2006 | US7064616 Multi-stage numeric counter oscillator |
| 06/20/2006 | US7064573 Driving circuit, method of testing driving circuit, electro-optical apparatus, and electro-optical device |
| 06/20/2006 | US7064572 System and method of monitoring, predicting and optimizing production yields in a liquid crystal display (LCD) manufacturing process |
| 06/20/2006 | US7064571 Multiple-select multiplexer circuit, semiconductor memory device including a multiplexer circuit and method of testing the semiconductor memory device |
| 06/20/2006 | US7064570 Method for locating IDDQ defects using multiple controlled collapse chip connections current measurement on an automatic tester |
| 06/20/2006 | US7064569 Detecting a current with a sensor having a wheatsone bridge |
| 06/20/2006 | US7064568 Optical testing of integrated circuits with temperature control |
| 06/20/2006 | US7064567 Interposer probe and method for testing |
| 06/20/2006 | US7064566 Probe card assembly and kit |
| 06/20/2006 | US7064565 Methods and systems for determining an electrical property of an insulating film |
| 06/20/2006 | US7064564 Bundled probe apparatus for multiple terminal contacting |
| 06/20/2006 | US7064563 Method and structure for measuring a bonding resistance |
| 06/20/2006 | US7064556 Frequency rectification tool for shorter waveforms |
| 06/20/2006 | US7064554 Fluorescent light bulb test apparatus and method of use |
| 06/20/2006 | US7064553 Open-circuit detecting circuit |
| 06/20/2006 | US7064535 Measurement circuit with improved accuracy |
| 06/20/2006 | US7064516 Motor driver |
| 06/20/2006 | US7064459 Method of inhibiting corrosion of a component of a marine vessel |
| 06/20/2006 | US7064267 Gas insulating apparatus and method for locating fault point thereof |
| 06/20/2006 | US7063991 Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same |
| 06/20/2006 | US7063990 Inspecting swath boundaries produced by thermal transfer of organic materials in forming OLED devices |
| 06/20/2006 | US7063987 Backside failure analysis of integrated circuits |
| 06/20/2006 | US7063544 System for burn-in testing of electronic devices |
| 06/20/2006 | US7063541 Composite microelectronic spring structure and method for making same |
| 06/15/2006 | WO2006063043A2 Reduced signaling interface method & apparatus |
| 06/15/2006 | WO2006062941A2 Amplifier system with current-mode servo feedback |
| 06/15/2006 | WO2006062812A2 Line short localization in lcd pixel arrays |
| 06/15/2006 | WO2006062252A1 Method and system for performing installation and configuration management of tester instrument modules |
| 06/15/2006 | WO2006062152A1 Relay connection member, inspection device, and relay connection member manufacturing method |
| 06/15/2006 | WO2006062067A1 Testing apparatus |
| 06/15/2006 | WO2006061668A1 Test time reduction for multi-chip modules (mcm) and for system-in-packages (sip) |
| 06/15/2006 | WO2006061011A1 Testing embedded circuits with the aid of test islands |
| 06/15/2006 | WO2006061010A1 Testing embedded circuits with the aid of a separate supply voltage |
| 06/15/2006 | US20060129955 Printed circuit board development cycle using probe location automation and bead probe technology |
| 06/15/2006 | US20060129900 Scan chain partition for reducing power in shift mode |
| 06/15/2006 | US20060129868 Clock transferring apparatus and test device |
| 06/15/2006 | US20060129345 Biometric quality control process |
| 06/15/2006 | US20060129335 Test apparatus |
| 06/15/2006 | US20060129319 Method for analyzing measurement data of device under test, program, measurement data analyzing system |
| 06/15/2006 | US20060128040 Bond positioning method for wire-bonding process and substrate for the bond positioning method |
| 06/15/2006 | US20060126595 Method and system for bypassing a core network in establishing a call between endpoints on different media gateways |
| 06/15/2006 | US20060126511 Ethernet packet transmission apparatus and method |
| 06/15/2006 | US20060126400 Semiconductor integrated circuit |
| 06/15/2006 | US20060125640 Merchandise marking with programmable transponders |
| 06/15/2006 | US20060125622 Self testing ground fault circuit interrupter (GFCI) |
| 06/15/2006 | US20060125528 Sensor signal detection device |
| 06/15/2006 | US20060125513 Current sensing in a two-phase motor |
| 06/15/2006 | US20060125512 Method and apparatus for inspecting array substrate |
| 06/15/2006 | US20060125511 Image test method, program thereof and recording medium storing the program |
| 06/15/2006 | US20060125510 Line short localization in LCD pixel arrays |
| 06/15/2006 | US20060125509 Dynamically adaptable semiconductor parametric testing |
| 06/15/2006 | US20060125508 On wafer testing of RFID tag circuit with pseudo antenna signal |
| 06/15/2006 | US20060125507 Wafer level testing for RFID tags |
| 06/15/2006 | US20060125506 RFID tag with bist circuits |
| 06/15/2006 | US20060125505 RFID tag design with circuitry for wafer level testing |
| 06/15/2006 | US20060125504 Printed circuit board for burn-in testing |
| 06/15/2006 | US20060125503 Interleaved MEMS-based probes for testing integrated circuits |
| 06/15/2006 | US20060125502 System for testing and burning in of integrated circuits |
| 06/15/2006 | US20060125501 Modularized probe head |
| 06/15/2006 | US20060125500 Compliant contact structure |
| 06/15/2006 | US20060125499 Test apparatus |
| 06/15/2006 | US20060125498 Modularized probe card for high frequency probing |
| 06/15/2006 | US20060125497 Sanitary probe seal |
| 06/15/2006 | US20060125496 Method and system for implicitly encoding preferred probing locations in a printed circuit board design for use in tester fixture build |
| 06/15/2006 | US20060125495 Charge amount measurement method, shift value measurement method of charged beam, charge amount measuring device and shift value measuring device of charged beam |
| 06/15/2006 | US20060125494 Electromigration test device and electromigration test method |
| 06/15/2006 | US20060125488 Two wire resistive sensor |
| 06/15/2006 | US20060125487 Oil condition sensor |
| 06/15/2006 | US20060125486 System and method of locating ground fault in electrical power distribution system |
| 06/15/2006 | US20060125471 Planarity diagnostic system, E.G., for microelectronic component test systems |
| 06/15/2006 | US20060125470 System and method for IDDQ measurement in system on a chip (SOC) design |
| 06/15/2006 | US20060125469 Monitoring system and device for an electric power line network |
| 06/15/2006 | US20060125465 Evanescent microwave probe with enhanced resolution and sensitivity |
| 06/15/2006 | US20060123882 Method for calibrating semiconductor test instruments |
| 06/15/2006 | US20060123881 Method for calibrating semiconductor test instruments |
| 06/15/2006 | US20060123880 Method for calibrating semiconductor test instruments |
| 06/15/2006 | US20060123879 Method for calibrating semiconductor test instruments |
| 06/15/2006 | US20060123878 Method for calibrating semiconductor test instruments |
| 06/15/2006 | CA2589911A1 Amplifier system with current-mode servo feedback |
| 06/14/2006 | EP1670113A2 Voltage equalization control system of accumulator |
| 06/14/2006 | EP1670108A1 Arc monitoring system |
| 06/14/2006 | EP1670067A2 Reverse biasing method and apparatus for solar battery module |
| 06/14/2006 | EP1670059A1 Semiconductor device protection circuit and semiconductor device having the same |
| 06/14/2006 | EP1669940A1 Method and apparatus for detecting fault conditions in a vehicle data recording device |
| 06/14/2006 | EP1669768A1 Calibration comparator circuit |
| 06/14/2006 | EP1669767A1 System and method of locating ground fault in electrical power distribution system |
| 06/14/2006 | EP1669766A1 Test probe for an integrated circuit |
| 06/14/2006 | EP1668601A1 System and method for diagnosing an automotive vehicle |
| 06/14/2006 | EP1668377A1 Method and device for monitoring deterioration of battery |
| 06/14/2006 | EP1668376A1 Efficient switching architecture with reduced stub lengths |
| 06/14/2006 | EP1668375A1 Integrated circuit with jtag port, tap linking module, and off-chip tap interface port |
| 06/14/2006 | EP1629289A4 Tester architecture for testing semiconductor integrated circuits |
| 06/14/2006 | EP1625411A4 Test circuit for input-to output speed measurement |
| 06/14/2006 | EP1625409A4 Planarizing and testing of bga packages |
| 06/14/2006 | EP1554656B1 Digital message transmission protocol |