| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/22/2006 | US20060136154 Power management system |
| 06/22/2006 | US20060136153 Technique for determining performance characteristics of electronic devices and systems |
| 06/22/2006 | US20060134378 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 06/22/2006 | US20060133404 Method and apparatus for managing wireless communication network radio resources |
| 06/22/2006 | US20060133292 System and method for measuring performance of internet phone protocol |
| 06/22/2006 | US20060132759 Vision inspection apparatus using a full reflection mirror |
| 06/22/2006 | US20060132167 Contactless wafer level burn-in |
| 06/22/2006 | US20060132166 Method and system for producing signals to test semiconductor devices |
| 06/22/2006 | US20060132165 Method and system for testing semiconductor devices |
| 06/22/2006 | US20060132164 Using a parametric measurement unit to sense a voltage at a device under test |
| 06/22/2006 | US20060132163 Using parametric measurement units as a source of power for a device under test |
| 06/22/2006 | US20060132162 Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment |
| 06/22/2006 | US20060132161 Remote Test Facility With Wireless Interface To Local Test Facilities |
| 06/22/2006 | US20060132160 Lsi test socket for bga |
| 06/22/2006 | US20060132159 Burn-in apparatus |
| 06/22/2006 | US20060132158 Bi-directional buffer for interfacing test system channel |
| 06/22/2006 | US20060132157 Wafer probe station having environment control enclosure |
| 06/22/2006 | US20060132156 Device and method for testing electronic components |
| 06/22/2006 | US20060132155 Probe card, method of manufacturing the probe card and alignment method |
| 06/22/2006 | US20060132154 Wafer Burn-In and Test Employing Detachable Cartridge |
| 06/22/2006 | US20060132153 Assembly with a detachable member |
| 06/22/2006 | US20060132152 Contact-type film probe |
| 06/22/2006 | US20060132151 Contact-type film probe |
| 06/22/2006 | US20060132144 Method and system for monitoring partial discharge in gas-insulated apparatus |
| 06/22/2006 | US20060132143 Power tester for electrical outlets |
| 06/22/2006 | US20060132142 Power supply device and electric circuit |
| 06/22/2006 | US20060132141 Battery monitoring system and method |
| 06/22/2006 | US20060132119 Configurable test interface device |
| 06/22/2006 | US20060132118 Electromagnetic wave analysis apparatus and design support apparatus |
| 06/22/2006 | US20060132117 Systems and methods for evaluating electromagnetic interference |
| 06/22/2006 | US20060132115 Integrated circuit test probe |
| 06/22/2006 | US20060132094 Method of calculating SOC of battery for prevention of memory effect |
| 06/22/2006 | US20060131577 Isolation circuit |
| 06/22/2006 | US20060130499 Dynamic control of a variable displacement compressor |
| 06/22/2006 | US20060130322 Semiconductor inspection device and method for manufacturing contact probe |
| 06/22/2006 | DE60022624T2 Trellisdekoder mit korrektur von paartauschungen, zur andwendung in sendern/empfängern für gigabit-ethernet Ethernet gigabit Trellisdekoder with correction of paartauschungen, in the USAGE transmitters / receivers for |
| 06/22/2006 | DE10297713T5 Prüfgerät für elektronische Bauelemente An electronic component tester |
| 06/22/2006 | DE102005058757A1 Verbindungselement für Halbleiterpackungstest und Herstellungsverfahren Connecting element for semiconductor package test and manufacturing processes |
| 06/22/2006 | DE102004059643A1 Gate control circuit for e.g. MOS-transistor, has isolated gate connected with gate connection, where circuit executes test mode adapted for testing quality of gate oxide of transistor and test mode is activated in baking process |
| 06/22/2006 | DE102004007209B4 Schaltungsanordnung und Verfahren zur Ermittlung des Laststromes durch eine getaktet an eine Versorgungsspannung angelegte induktive Last Circuit arrangement and method for determining the load current through a clocked applied to a supply voltage inductive load |
| 06/21/2006 | EP1672764A2 System and method for providing power control of an energy storage system |
| 06/21/2006 | EP1672508A1 Test program debug device, semiconductor test device, test program debug method, and test method |
| 06/21/2006 | EP1671143A1 Method of online testing for an intermediate link |
| 06/21/2006 | EP1671142A1 Device and method for measuring individual cell voltages in a cell stack of an energy accumulator |
| 06/21/2006 | EP1671141A1 Method and system for selectively masking test responses |
| 06/21/2006 | EP1671140A1 Magnetic-field-measuring device |
| 06/21/2006 | EP1671139A1 System and method for testing control processes in a vehicle |
| 06/21/2006 | EP1671136A2 A method of analyzing the time-varying electrical response of a stimulated target substance |
| 06/21/2006 | EP1636598A4 Apparatus and method for sensing emulator cable orientation while providing signal drive capability |
| 06/21/2006 | EP1497804B1 Remote control with low battery indication and corresponding method |
| 06/21/2006 | CN2790005Y Detecting device for electric relay protector pressing-plate state signal |
| 06/21/2006 | CN2789929Y Multi path tester chip testing interface for non-contact applied chip |
| 06/21/2006 | CN2789780Y Equal-pressure method network line testing instrument |
| 06/21/2006 | CN2789779Y Multifunction electric line remote control antitheft alarm |
| 06/21/2006 | CN2789778Y Transmission route fault precision locating device utilizing multiport signal |
| 06/21/2006 | CN2789777Y Long-distance maintanance and fault diagnosing system for family appliances |
| 06/21/2006 | CN2789741Y Automatic device for light-emitting diode testing machine platform |
| 06/21/2006 | CN1791804A Method for judging deterioration of accumulator, method for measuring secondary cell internal impedance, device for measuring secondary cell internal impedance, device for judging deterioration of sec |
| 06/21/2006 | CN1791803A Test apparatus and test module |
| 06/21/2006 | CN1791802A Power source device, test device, and power source voltage stabilizing device |
| 06/21/2006 | CN1790657A Apparatus and method for single die backside probing of semiconductor devices |
| 06/21/2006 | CN1790656A Power MOS device testing method and product for realizing the same |
| 06/21/2006 | CN1790572A Diagnose of dipole layer capacitor, deterioration detecting device thereof and emergency breaking valve |
| 06/21/2006 | CN1790286A PCI test card and test method thereof |
| 06/21/2006 | CN1790043A Fuel cell test system with self-supporting and electric power output function |
| 06/21/2006 | CN1790042A Multiplex test method for semiconductor wafer and multiplex test probe station therefor |
| 06/21/2006 | CN1790041A Method and system for monitoring partial discharge in gas-insulated apparatus |
| 06/21/2006 | CN1790040A Cylindrical high Q resonant cavity and microwave dielectric complex permittivity test device |
| 06/21/2006 | CN1790039A Method for judging generator PT line failure |
| 06/21/2006 | CN1790038A Electric power line failure alarm apparatus |
| 06/21/2006 | CN1790037A Inspection method of array board and inspection equipment thereof |
| 06/21/2006 | CN1790036A Electro-optical detector capable of calibrating voltage |
| 06/21/2006 | CN1790034A Device for measuring resistivity of graphite plate or carbon diffusion layer material for fuel cell |
| 06/21/2006 | CN1790033A Slab display panel detector |
| 06/21/2006 | CN1790032A Detecting apparatus of display panel |
| 06/21/2006 | CN1790031A Workbench for slab display panel detector |
| 06/21/2006 | CN1789944A Vacuum leak detector for fuel cell membrane electrode |
| 06/21/2006 | CN1789943A Vacuum leakage detector for flow guide plate of fuel cell |
| 06/21/2006 | CN1261006C Printed circuit board fabrication-related device |
| 06/21/2006 | CN1260851C Method for judging state of secondary cell and device for judging state thereof, and method for regenerating secondary cell |
| 06/21/2006 | CN1260799C Multiple semiconductor die testing system and method with expandible channels |
| 06/21/2006 | CN1260577C Testing data synchronization at access port |
| 06/21/2006 | CN1260576C Device for detecting solar cells |
| 06/21/2006 | CN1260550C Device for detecting physical volume |
| 06/20/2006 | US7065724 Method and apparatus for generating and verifying libraries for ATPG tool |
| 06/20/2006 | US7065723 Defect tracking by utilizing real-time counters in network computing environments |
| 06/20/2006 | US7065722 System and method for building a binary decision diagram associated with a target circuit |
| 06/20/2006 | US7065693 Implementation of test patterns in automated test equipment |
| 06/20/2006 | US7065692 IC with external register present lead connected to instruction register |
| 06/20/2006 | US7065691 Apparatus and method for saving precise system state following exceptions |
| 06/20/2006 | US7065690 Fault detecting method and layout method for semiconductor integrated circuit |
| 06/20/2006 | US7065686 Dual port RAM |
| 06/20/2006 | US7065544 System and method for detecting repetitions in a multimedia stream |
| 06/20/2006 | US7065481 Method and system for debugging an electronic system using instrumentation circuitry and a logic analyzer |
| 06/20/2006 | US7065464 Measuring device with dialog control occuring via dialog windows and corresponding method |
| 06/20/2006 | US7065460 Apparatus and method for inspecting semiconductor device |
| 06/20/2006 | US7065458 Method and apparatus providing concatenated data from multiple signal acquisition devices |
| 06/20/2006 | US7065051 Management and scheduling of data that is wirelessly transmitted between a base transceiver station and subscriber units |
| 06/20/2006 | US7065046 Scalable weight-based terabit switch scheduling method |
| 06/20/2006 | US7065040 Ring switching method and node apparatus using the same |