| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/29/2006 | DE10208757B4 Verfahren und Magazinvorrichtung zur Prüfung von Halbleitereinrichtungen A method and storage device for the testing of semiconductor devices |
| 06/29/2006 | DE102005058469A1 Battery`s state of charge calculating method for hybrid vehicle, involves determining whether conditions for switching to next state of charge mode is met, and switching specific mode to next mode |
| 06/29/2006 | DE10134753B4 Anordnung zur Aufnahme eines Halbleiterplättchens mit auf einer Hauptseite angeordneten elektrischen Anschlußelementen zu Testzwecken For testing arrangement for receiving a semiconductor wafer having, arranged on a main electrical connecting elements |
| 06/29/2006 | DE10101173B4 Vorrichtung und Verfahren zur Diagnose eines Antennensystems Device and method for the diagnosis of an antenna system |
| 06/28/2006 | EP1674877A1 Secondary battery residual capacity calculating apparatus and calculating method |
| 06/28/2006 | EP1674876A1 Self test of a semiconductor circuit |
| 06/28/2006 | EP1674875A1 Invalidation of an integrated circuit |
| 06/28/2006 | EP1674874A1 Circuit board inspection device |
| 06/28/2006 | EP1673638A1 Digital cable toning apparatus and method |
| 06/28/2006 | EP1673637A1 Switch device |
| 06/28/2006 | EP1673636A2 Test head positioning system |
| 06/28/2006 | CN2791658Y Feed-back type aging system with monitoring controlling function |
| 06/28/2006 | CN2791657Y Electric load general simulation device |
| 06/28/2006 | CN2791656Y Hydrogen-storage device capacity monitoring displaying device for fuel cell |
| 06/28/2006 | CN1795395A Automatic test pattern generation |
| 06/28/2006 | CN1795394A Automatic test pattern generation |
| 06/28/2006 | CN1795393A Signal integrity self-test architecture |
| 06/28/2006 | CN1794546A Rotation detecting structure of electric motor and its detecting method |
| 06/28/2006 | CN1794438A Reliability screening method of infrared focus planardetector |
| 06/28/2006 | CN1794137A Alerting method for recharging mobile devices |
| 06/28/2006 | CN1794002A Method of calculating soc of battery for prevention of memory effect |
| 06/28/2006 | CN1794001A Method for verifying smart battery failures by measuring input charging voltage and associated systems |
| 06/28/2006 | CN1794000A Monitoring device of power generator real time power angle |
| 06/28/2006 | CN1793999A 半导体集成电路 The semiconductor integrated circuit |
| 06/28/2006 | CN1793998A 半导体装置 Semiconductor device |
| 06/28/2006 | CN1793997A Automatic tuning and small current grounding failure wire selection system of 8421 parallel reactor composite extinction coil |
| 06/28/2006 | CN1793996A Automatic tuning and small current grounding failure wire selection system of master slave extinction coil |
| 06/28/2006 | CN1793995A Measuring method of power transmission line failure distance |
| 06/28/2006 | CN1793994A Monitoring method of electric current secondary loop short circuit and monitoring instrument |
| 06/28/2006 | CN1793993A Fast detection device for polymer PTC component element long period electric aging test |
| 06/28/2006 | CN1793992A Remote detection system and method |
| 06/28/2006 | CN1793991A Testing system of IC card interface electric characteristics |
| 06/28/2006 | CN1793990A On-line monitoring system for capacitor type equipment dielectricless |
| 06/28/2006 | CN1793989A Insulation aging test device used for converter high voltage pulse equipment |
| 06/28/2006 | CN1262155C Testing structure and printed circuit board with the same testing structure |
| 06/28/2006 | CN1261993C Detection card for testing semiconductor |
| 06/28/2006 | CN1261992C Device for testing semiconductor |
| 06/28/2006 | CN1261898C Crosstalk detecting method |
| 06/28/2006 | CN1261742C Method and apparatus for monitoring high or intermediate voltage electrified equipment |
| 06/27/2006 | US7069526 Hardware debugging in a hardware description language |
| 06/27/2006 | US7069495 Bit error resilience for an internet protocol stack |
| 06/27/2006 | US7069488 Signal sampling with sampling and reference paths |
| 06/27/2006 | US7069486 Test circuit for logical integrated circuit and method for testing same |
| 06/27/2006 | US7069485 Reading data from a memory with a memory access controller |
| 06/27/2006 | US7069484 System for optimizing anti-fuse repair time using fuse id |
| 06/27/2006 | US7069483 System and method for identifying nodes in a wireless mesh network |
| 06/27/2006 | US7069475 Software-hardware welding system |
| 06/27/2006 | US7069163 Digital spread spectrum methods and apparatus for testing aircraft wiring |
| 06/27/2006 | US7069162 Magnetic field analysis method and programs for rotating machines |
| 06/27/2006 | US7069160 Intrusion detection system and method thereof |
| 06/27/2006 | US7069116 High impedance fault detection |
| 06/27/2006 | US7068982 Determination of transmitter distortion |
| 06/27/2006 | US7068942 Selection of IC Vdd for improved voltage regulation of transciever/transponder modules |
| 06/27/2006 | US7068608 Automated method for connection discovery within consolidated network elements |
| 06/27/2006 | US7068607 Bandwidth broker for cellular radio access networks |
| 06/27/2006 | US7068602 Feedback priority modulation rate controller |
| 06/27/2006 | US7068601 Codec with network congestion detection and automatic fallback: methods, systems & program products |
| 06/27/2006 | US7068599 Wireless network having link-condition based proxies for QoS management |
| 06/27/2006 | US7068100 Gain control methods and systems in an amplifier assembly |
| 06/27/2006 | US7068062 Fault detection apparatus of direct-current motor drive bridge circuit |
| 06/27/2006 | US7068061 Semiconductor device characteristics measurement apparatus and connection apparatus |
| 06/27/2006 | US7068060 Connection apparatus and cable assembly for semiconductor-device characteristic measurement apparatus |
| 06/27/2006 | US7068059 Arrangement for producing an electrical connection between a BGA package and a signal source, and method for producing such a connection |
| 06/27/2006 | US7068058 Semiconductor integrated circuit device with test element group circuit |
| 06/27/2006 | US7068057 Low-current pogo probe card |
| 06/27/2006 | US7068056 System and method for the probing of a wafer |
| 06/27/2006 | US7068055 Device for inspecting element substrates and method of inspecting element substrates using electromagnetic waves |
| 06/27/2006 | US7068052 Methods and systems for automated pipeline testing |
| 06/27/2006 | US7068045 Apparatus and method for real time determination of arc fault energy, location and type |
| 06/27/2006 | US7068044 Cable tester |
| 06/27/2006 | US7068043 Cable tester |
| 06/27/2006 | US7068042 Method and apparatus for monitoring integrity of wires or electrical cables |
| 06/27/2006 | US7068041 Method and system for multi-frequency inductive ratio measurement |
| 06/27/2006 | US7068040 Ground circuit impedance measurement apparatus and method |
| 06/27/2006 | US7068039 Test structure embedded in a shipping and handling cover for integrated circuit sockets and method for testing integrated circuit sockets and circuit assemblies utilizing same |
| 06/27/2006 | US7068038 240 volt outlet tester |
| 06/27/2006 | US7068037 Method of diagnosing inverter trouble |
| 06/27/2006 | US7068026 Sensor signal circuit and measuring instrument |
| 06/27/2006 | US7067335 Apparatus and methods for semiconductor IC failure detection |
| 06/27/2006 | US7065870 Segmented contactor |
| 06/27/2006 | US7065857 Method of manufacturing electronic device |
| 06/27/2006 | CA2330580C Method and device for monitoring an electrode line of a bipolar high-voltage dc transmission system |
| 06/22/2006 | WO2006066112A2 Using parametric measurement units as a source of power for a device under test |
| 06/22/2006 | WO2006065701A2 Interleaved mems-based probes for testing integrated circuits |
| 06/22/2006 | WO2006065669A1 Signal module with reduced reflections |
| 06/22/2006 | WO2006065621A1 A system for testing and burning in of integrated circuits |
| 06/22/2006 | WO2006064786A1 Power supply device |
| 06/22/2006 | WO2006064551A1 Test apparatus |
| 06/22/2006 | WO2006064300A1 Circuitry and method for an at-speed scan test |
| 06/22/2006 | WO2006064209A1 Device for detecting an electrical power supply failure |
| 06/22/2006 | WO2006063809A2 Method and device for the independent extraction of carrier concentration level and electrical junction depth in a semiconductor substrate from a single measurement |
| 06/22/2006 | WO2005121825A3 Test arrangement including anisotropic conductive film for testing power module |
| 06/22/2006 | WO2005086786A3 Wafer-level opto-electronic testing apparatus and method |
| 06/22/2006 | WO2005079211A3 Television data management system |
| 06/22/2006 | US20060136796 LSI device having scan separators provided in number reduced from signal lines of combinatorial circuits |
| 06/22/2006 | US20060136795 Method of testing scan chain integrity and tester setup for scan block testing |
| 06/22/2006 | US20060136794 Computer peripheral connecting interface system configuration debugging method and system |
| 06/22/2006 | US20060136165 Boundary scan circuit with integrated sensor for sensing physical operating parameters |
| 06/22/2006 | US20060136164 Multi-domain execution of tests on electronic devices |
| 06/22/2006 | US20060136155 Diagnostic method for an electronic systems unit |