| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/05/2006 | CN1262960C Extraction method of defect density and size distribution |
| 07/05/2006 | CN1262870C Image display device equipment with checking terminal |
| 07/05/2006 | CN1262842C Microcontactor probe and electric probe unit |
| 07/04/2006 | US7073153 Route searching method and storage medium thereof |
| 07/04/2006 | US7073112 Compilable address magnitude comparator for memory array self-testing |
| 07/04/2006 | US7073111 High speed interconnect circuit test method and apparatus |
| 07/04/2006 | US7073110 Method and system for programmable boundary-scan instruction register |
| 07/04/2006 | US7073109 Method and system for graphical pin assignment and/or verification |
| 07/04/2006 | US7073108 Communications jacks including test circuits and related circuits and methods |
| 07/04/2006 | US7073107 Adaptive defect based testing |
| 07/04/2006 | US7073095 Computer-implemented system and method for evaluating the diagnostic state of a component |
| 07/04/2006 | US7072819 Method for locating functional mistakes in digital circuit designs |
| 07/04/2006 | US7072787 Method for analyzing data storage system test data |
| 07/04/2006 | US7072781 Architecture for generating adaptive arbitrary waveforms |
| 07/04/2006 | US7072647 System and method for pre-programming a cellular phone |
| 07/04/2006 | US7072306 Reverse outer loop optimization for communication channels with discontinuous transmission (DTX) |
| 07/04/2006 | US7072300 Action tag generation within a network based on priority or differential services information |
| 07/04/2006 | US7072297 Method for dynamical identification of network congestion characteristics |
| 07/04/2006 | US7072292 Methods and apparatus for supporting multiple Utopia masters on the same Utopia bus |
| 07/04/2006 | US7072291 Devices, softwares and methods for redundantly encoding a data stream for network transmission with adjustable redundant-coding delay |
| 07/04/2006 | US7072180 Gas collecting device, test head and IC device testing apparatus |
| 07/04/2006 | US7072164 Electric parts drive circuit |
| 07/04/2006 | US7072129 Identifying defective data sectors in a disk drive |
| 07/04/2006 | US7072023 Position detection apparatus having a plurality of detection sections, and exposure apparatus |
| 07/04/2006 | US7071833 Failure analyzing system and method for displaying the failure |
| 07/04/2006 | US7071746 Variable delay circuit |
| 07/04/2006 | US7071724 Wafer probecard interface |
| 07/04/2006 | US7071723 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit |
| 07/04/2006 | US7071722 Anisotropic, conductive sheet and impedance measuring probe |
| 07/04/2006 | US7071721 Device and method for electronic device test |
| 07/04/2006 | US7071720 Method and apparatus for managing aligning and coupling of a land grid array interposer for a field replacement unit |
| 07/04/2006 | US7071719 Semiconductor device |
| 07/04/2006 | US7071718 Low-current probe card |
| 07/04/2006 | US7071717 Universal test fixture |
| 07/04/2006 | US7071716 Apparatus for scan testing printed circuit boards |
| 07/04/2006 | US7071715 Probe card configuration for low mechanical flexural strength electrical routing substrates |
| 07/04/2006 | US7071714 Method and system for compensating for thermally induced motion of probe cards |
| 07/04/2006 | US7071713 Probe navigation method and device and defect inspection device |
| 07/04/2006 | US7071711 Method and device for determining the ratio between an RC time constant in an integrated circuit and a set value |
| 07/04/2006 | US7071710 Extraction of interconnect parasitics |
| 07/04/2006 | US7071705 Apparatus and method for communications testing |
| 07/04/2006 | US7071704 Circuit for improved diagnosability of defects in a fuse scan structure |
| 07/04/2006 | US7071702 Multi-jack detector |
| 07/04/2006 | US7071701 Online fiber optic sensor for detecting partial discharge and similar events in large utility station transformers and the like |
| 07/04/2006 | US7071700 Characterizing analog and digital telephone circuits and other types of wiring systems using frequency domain reflectometry (FDR) |
| 07/04/2006 | US7071699 Non-load driven fault monitor for electrical circuits |
| 07/04/2006 | US7071698 Power supply apparatus for detecting battery voltage and the portions of faults |
| 07/04/2006 | US7071679 Testing of a system-on-a-chip having a programmable section and a plurality of high-speed interfaces |
| 07/04/2006 | US7071676 Circuit configuration and method for measuring at least one operating parameter for an integrated circuit |
| 07/04/2006 | US7071675 Band distribution inspecting device and band distribution inspecting method |
| 07/04/2006 | US7071654 Battery charging/discharging apparatus and battery charging/discharging method |
| 07/04/2006 | US7071012 Methods relating to the reconstruction of semiconductor wafers for wafer-level processing |
| 07/04/2006 | US7071011 Method of defect review |
| 07/04/2006 | US7070323 Environmental test chamber and a carrier for use therein |
| 07/04/2006 | CA2341941C Method and apparatus for measuring harmonic load-pull for frequency multiplication |
| 06/29/2006 | WO2006069365A2 Battery pack leakage cut-off |
| 06/29/2006 | WO2006069309A2 Contactless wafer level burn-in |
| 06/29/2006 | WO2006069219A2 System and method for prioritizing individual streams within a multimedia flow |
| 06/29/2006 | WO2006069197A2 Scaleable controlled interconnect with optical and wireless applications |
| 06/29/2006 | WO2006068966A1 Using a parametric measurement unit to sense a voltage at a device under test |
| 06/29/2006 | WO2006068939A2 Remote test facility with wireless interface to local test facilities |
| 06/29/2006 | WO2006068938A2 Bi-directional buffer for interfacing test system channel |
| 06/29/2006 | WO2006068937A2 A method and system for producing signals to test semiconductor devices |
| 06/29/2006 | WO2006068936A2 A method and system for testing semiconductor devices |
| 06/29/2006 | WO2006068675A1 System and method for message consolidation in a mesh network |
| 06/29/2006 | WO2006068615A1 A method and a device for determining the load state of power system components |
| 06/29/2006 | WO2006068390A1 A test and burn-in socket for integrated circuits (ics) |
| 06/29/2006 | WO2006067733A1 On silicon interconnect capacitance extraction |
| 06/29/2006 | WO2006066938A1 Method and apparatus for contactless testing of rfid straps |
| 06/29/2006 | WO2006055662A3 Maximum and minimum power limit calculator for parallel battery subpacks |
| 06/29/2006 | WO2006053567A9 Compensation of simple fiberoptic faraday effect sensors |
| 06/29/2006 | WO2006044009A3 Interface apparatus for semiconductor device tester and test method therefor |
| 06/29/2006 | WO2005103740A3 Intelligent probe card architecture |
| 06/29/2006 | US20060143552 Circuit test pattern edition apparatus, circuit test pattern editing method, and signal-bearing medium embodying a program of circuit test pattern edition |
| 06/29/2006 | US20060143551 Localizing error detection and recovery |
| 06/29/2006 | US20060143550 Methods and systems for semiconductor defect detection |
| 06/29/2006 | US20060142964 Fault location using measurements from two ends of a line |
| 06/29/2006 | US20060140349 Apparatus and method for processing acquired signals for arbitrary impedance loads |
| 06/29/2006 | US20060140174 VoIP (voice over internet protocol) call processing |
| 06/29/2006 | US20060139628 Probe mark reading device and probe mark reading method |
| 06/29/2006 | US20060139049 Planar view TEM sample preparation from circuit layer structures |
| 06/29/2006 | US20060139048 Pin electronics with high voltage functionality |
| 06/29/2006 | US20060139047 Testing system and testing method for duts |
| 06/29/2006 | US20060139046 Apparatus for reducing deflection of a mobile member in a chamber |
| 06/29/2006 | US20060139045 Device and method for testing unpackaged semiconductor die |
| 06/29/2006 | US20060139044 Test unit usable with a board having an electronic component |
| 06/29/2006 | US20060139043 Test unit to test a board having an area array package mounted thereon |
| 06/29/2006 | US20060139042 Semiconductor inspection apparatus and manufacturing method of semiconductor device |
| 06/29/2006 | US20060139041 System and method of testing and utilizing a fluid stream |
| 06/29/2006 | US20060139040 Non-contact electrical probe utilizing charged fluid droplets |
| 06/29/2006 | US20060139039 Systems and methods for a contactless electrical probe |
| 06/29/2006 | US20060139038 Hollow microprobe using a mems technique and a method of manufacturing the same |
| 06/29/2006 | US20060139033 Apparatus and method for performing eye scan |
| 06/29/2006 | US20060137171 Method of testing using compliant contact structures, contactor cards and test system |
| 06/29/2006 | DE69635227T2 Kontakträger zum bestücken von substraten mit federkontakten Contact carrier of fitting substrates with spring contacts |
| 06/29/2006 | DE19908882B4 Vergleicherschaltung für ein Halbleiter-Prüfsystem Comparator circuit for a semiconductor test system |
| 06/29/2006 | DE19806874B4 Verfahren zum Auffinden, mittels Zwischenschaltung eines Computers, eines Stroms, der durch Elemente eines elektronischen Gerätes fließt A method for finding, by means of the interposition of a computer, a current flowing through the elements of an electronic device |
| 06/29/2006 | DE19715264B4 Einrichtung zum Plombieren und Verriegeln des Deckels eines Sicherungsschaltgerätes Means for sealing and locking the lid of a safety switching device |
| 06/29/2006 | DE19525081B4 Verfahren und Vorrichtung zum Testen der Funktion von Mikrostrukturelementen Method and device for testing the function of microstructure elements |
| 06/29/2006 | DE112004001415T5 Taktübertragungsvorrichtung und Prüfvorrichtung Clock transmission device and testing unit |