Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2006
07/06/2006US20060150041 Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE)
07/06/2006US20060150040 Systems and methods for reconfiguring scan chains
07/06/2006US20060150039 Input circuit for an integrated circuit
07/06/2006US20060150038 Analog base-band test apparatus and method by enhanced combination of JTAG and memory in mobile communication system
07/06/2006US20060149500 Semiconductor device having a mode of functional test
07/06/2006US20060149492 System and method for testing differential signal crossover using undersampling
07/06/2006US20060149490 Calibration circuit of a semiconductor memory device and method of operating the same
07/06/2006US20060148285 Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method
07/06/2006US20060148113 Chain resistance pattern and method of forming the same
07/06/2006US20060148112 Electrode design
07/06/2006US20060148111 Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor
07/06/2006US20060147624 Anionic polymers composed of dicarboxylic acids and uses thereof
07/06/2006US20060147623 Anionic polymers composed of dicarboxylic acids and uses thereof
07/06/2006US20060146722 Altering latency for network testing
07/06/2006US20060145721 Testing printed circuit boards of disk drives and servo track writers
07/06/2006US20060145720 Testing device for printed circuit board
07/06/2006US20060145719 POGO pin and test socket including the same
07/06/2006US20060145718 Burn-in testing apparatus and method
07/06/2006US20060145717 Apparatus and method for testing electrical characteristics of semiconductor workpiece
07/06/2006US20060145716 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object
07/06/2006US20060145715 Wafer level test head
07/06/2006US20060145714 Energizable electrical test device for measuring current and resistance of an electrical circuit
07/06/2006US20060145713 Probe head arrays
07/06/2006US20060145712 Contact-type film probe
07/06/2006US20060145711 Probe device and probe method
07/06/2006US20060145710 Method and system for testing RFID devices
07/06/2006US20060145705 Antenna for detection of partial discharges in a chamber of an electrical instrument
07/06/2006US20060145704 Systems and methods for testing conductive members employing electromagnetic back scattering
07/06/2006US20060145703 Automatic component testing
07/06/2006US20060145702 Method and device for determining the charge that can be drawn from an energy accumulator
07/06/2006US20060144817 Low-pressure removal of photoresist and etch residue
07/06/2006US20060144564 Heat pipe evaporator with porous valve
07/06/2006US20060143909 Method for producing a captive wired test fixture and fixture therefor
07/06/2006US20060143907 Practical process for integrating circuits and components into nonrigid materials
07/06/2006DE602004000226T2 Parallele Prüfung von Intergrierten Schaltungen Parallel testing of circuits Intergrierten
07/06/2006DE19941110B4 Testsystem und Testverfahren Test System and method
07/06/2006DE19815391B4 Diagnosevorrichtung für Fahrgastschutzsysteme Diagnostic device for passenger protection systems
07/06/2006DE19629481B4 Schaltungsanordnung für eine Hochspannungskabelanlage Circuit arrangement for a high voltage cable system
07/06/2006DE10250777B4 Verfahren und Vorrichtung zur Charakterisierung von kantenemittierenden optischen Sendeelementen Method and device for characterization of edge emitting optical transmission elements
07/06/2006DE10223867B4 Leiterplatten-Prüfeinheit PCB test unit
07/06/2006DE102005062405A1 Verfahren zum Messen der Charakteristiken von FETs Method for measuring the characteristics of FETs
07/06/2006DE102005060926A1 System zum Messen der Fahrzeugbatteriespannung A system for measuring the vehicle battery voltage
07/06/2006DE102004063350A1 Elektrokleingerät mit einem aufladbaren Energiespeicher und einer Anzeige für den Ladezustand des Energiespeichers Small electrical appliance with a rechargeable energy storage and a display for the charge state of the energy storage
07/06/2006DE102004062655A1 Verfahren zum Korrigieren einer durch eine elektrische Spannungsmessung indirekt durchgeführten elektrischen Strommessung A method for correcting an indirectly performed by an electrical voltage measurement electricity measurement
07/06/2006DE102004061549A1 System zum Testen von Halbleiter-Bauelementen A system for testing semiconductor devices
07/06/2006DE10058464B4 Mustererzeugungsverfahren, dieses verwendender Mustergenerator, und diesen Mustergenerator verwendendes Speichertestgerät Pattern forming method using this Direction pattern generator, and this pattern generator-use memory tester
07/06/2006DE10037495B4 Verfahren und Vorrichtung zum Erkennen einer Fehlfunktion eines Sensors oder eines Leitungsbruchs Method and apparatus for detecting a malfunction of a sensor or a line break
07/05/2006EP1677195A2 Enhanced embedded logic analyzer
07/05/2006EP1677122A1 Integrated semiconductor device
07/05/2006EP1677121A1 Integrated semiconductor device
07/05/2006EP1677120A1 Method and apparatus for verifying connectivity of an instrumentation system
07/05/2006EP1676427A2 Methods of discharge control for a battery pack of a cordless power tool system, a cordless power tool system and battery pack adapted to provide over-discharge protection and discharge control
07/05/2006EP1676141A1 Evaluation circuit for detecting and/or locating faulty data words in a data stream tn
07/05/2006EP1535386B1 Output choke arrangement for inverter, and method in conjunction therewith
07/05/2006EP1389315B1 Hierarchical built-in self-test
07/05/2006EP1222474B1 Fault location device and method
07/05/2006EP1082830A4 Method and system for monitoring broadband quality of services
07/05/2006EP0787306B1 Process for determining the state of charge of an accumulator
07/05/2006CN2793893Y Ageing tester for capacitor
07/05/2006CN2793744Y Module testrer of fuel battery
07/05/2006CN2793743Y Testing platform
07/05/2006CN2793742Y Discharging bar for paper pasting device of unwind levelling shearing line
07/05/2006CN2793741Y Electric leakagte testing circuit
07/05/2006CN2793740Y Circuit tester
07/05/2006CN2793739Y Heating tube disconnection monitor
07/05/2006CN2793738Y Transistor measuring equipment
07/05/2006CN2793737Y Insulating monitor of microcomputer DC sysrtem
07/05/2006CN2793736Y Insulating resistance inspector of high-voltage apparatus on top of electric locomotive
07/05/2006CN2793724Y Air humidity alarming device
07/05/2006CN2793696Y Response characteristic tester on detector surface
07/05/2006CN1799033A A network analyzing method and a network analyzing apparatus
07/05/2006CN1798980A Delay-fault testing method,Related system and circuit
07/05/2006CN1798979A Insert for electronic component-handling device, tray, and electronic component handling device
07/05/2006CN1798978A Harness checker and harness checking method
07/05/2006CN1798977A Planarizing and testing of bga packages
07/05/2006CN1797837A Battery management system and apparatus
07/05/2006CN1797732A Semiconductor inspection apparatus and manufacturing method of semiconductor device
07/05/2006CN1797657A Ground fault circuit interrupter with mechanism for testing ground fault
07/05/2006CN1797656A Mechanism for testing ground fault
07/05/2006CN1797604A Calibration circuit of a semiconductor memory device and method of operation the same
07/05/2006CN1797547A Testing method and device for printed circuit boards of disk drives and servo track writers
07/05/2006CN1797488A System and method for testing LCD unit
07/05/2006CN1797359A Automatic test system for external connected ports of electronic products
07/05/2006CN1797022A Method for setting and holding high current
07/05/2006CN1797021A System for discharging electronic circuitry
07/05/2006CN1797020A Parallel source/catching structure
07/05/2006CN1797019A Method for measuring characteristics of fets
07/05/2006CN1797018A Sample holder in use for measuring spectrum of photoluminescence of electrical modulation
07/05/2006CN1797017A Breakdown testing structure for capacitor of preventing damage caused by middle and large current of semiconductor device
07/05/2006CN1797016A Detection device and method for array base plate
07/05/2006CN1797015A Interface circuit for electronic test system
07/05/2006CN1797014A Detection method for testing current in resistance property of lightning arrester
07/05/2006CN1797012A Impedance measurement system and method
07/05/2006CN1797006A Probe component of detecting device for plane display board detection
07/05/2006CN1797004A Detecting device for panel display board detector
07/05/2006CN1797003A Apparatus/testing processor for testing un-moulded IC devices using air flow system and the method of testing the same
07/05/2006CN1797002A Device for debugging circuit board, and method for debugging circuit board
07/05/2006CN1797001A Apparatus and method for generating a high-frequency signal
07/05/2006CN1263110C Wafer image display device for semiconductor testing system and its method
07/05/2006CN1263025C Floppy disk driving unit, method and apparatus for its IC detection mode switching