Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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07/06/2006 | US20060150041 Failure analysis and testing of semi-conductor devices using intelligent software on automated test equipment (ATE) |
07/06/2006 | US20060150040 Systems and methods for reconfiguring scan chains |
07/06/2006 | US20060150039 Input circuit for an integrated circuit |
07/06/2006 | US20060150038 Analog base-band test apparatus and method by enhanced combination of JTAG and memory in mobile communication system |
07/06/2006 | US20060149500 Semiconductor device having a mode of functional test |
07/06/2006 | US20060149492 System and method for testing differential signal crossover using undersampling |
07/06/2006 | US20060149490 Calibration circuit of a semiconductor memory device and method of operating the same |
07/06/2006 | US20060148285 Anisotropic conductive connector and probe member and wafer inspecting device and wafer inspecting method |
07/06/2006 | US20060148113 Chain resistance pattern and method of forming the same |
07/06/2006 | US20060148112 Electrode design |
07/06/2006 | US20060148111 Method for automatic measurement of failure in subthreshold region of metal-oxide-semiconductor transistor |
07/06/2006 | US20060147624 Anionic polymers composed of dicarboxylic acids and uses thereof |
07/06/2006 | US20060147623 Anionic polymers composed of dicarboxylic acids and uses thereof |
07/06/2006 | US20060146722 Altering latency for network testing |
07/06/2006 | US20060145721 Testing printed circuit boards of disk drives and servo track writers |
07/06/2006 | US20060145720 Testing device for printed circuit board |
07/06/2006 | US20060145719 POGO pin and test socket including the same |
07/06/2006 | US20060145718 Burn-in testing apparatus and method |
07/06/2006 | US20060145717 Apparatus and method for testing electrical characteristics of semiconductor workpiece |
07/06/2006 | US20060145716 Inspection method and inspection apparatus for inspecting electrical characteristics of inspection object |
07/06/2006 | US20060145715 Wafer level test head |
07/06/2006 | US20060145714 Energizable electrical test device for measuring current and resistance of an electrical circuit |
07/06/2006 | US20060145713 Probe head arrays |
07/06/2006 | US20060145712 Contact-type film probe |
07/06/2006 | US20060145711 Probe device and probe method |
07/06/2006 | US20060145710 Method and system for testing RFID devices |
07/06/2006 | US20060145705 Antenna for detection of partial discharges in a chamber of an electrical instrument |
07/06/2006 | US20060145704 Systems and methods for testing conductive members employing electromagnetic back scattering |
07/06/2006 | US20060145703 Automatic component testing |
07/06/2006 | US20060145702 Method and device for determining the charge that can be drawn from an energy accumulator |
07/06/2006 | US20060144817 Low-pressure removal of photoresist and etch residue |
07/06/2006 | US20060144564 Heat pipe evaporator with porous valve |
07/06/2006 | US20060143909 Method for producing a captive wired test fixture and fixture therefor |
07/06/2006 | US20060143907 Practical process for integrating circuits and components into nonrigid materials |
07/06/2006 | DE602004000226T2 Parallele Prüfung von Intergrierten Schaltungen Parallel testing of circuits Intergrierten |
07/06/2006 | DE19941110B4 Testsystem und Testverfahren Test System and method |
07/06/2006 | DE19815391B4 Diagnosevorrichtung für Fahrgastschutzsysteme Diagnostic device for passenger protection systems |
07/06/2006 | DE19629481B4 Schaltungsanordnung für eine Hochspannungskabelanlage Circuit arrangement for a high voltage cable system |
07/06/2006 | DE10250777B4 Verfahren und Vorrichtung zur Charakterisierung von kantenemittierenden optischen Sendeelementen Method and device for characterization of edge emitting optical transmission elements |
07/06/2006 | DE10223867B4 Leiterplatten-Prüfeinheit PCB test unit |
07/06/2006 | DE102005062405A1 Verfahren zum Messen der Charakteristiken von FETs Method for measuring the characteristics of FETs |
07/06/2006 | DE102005060926A1 System zum Messen der Fahrzeugbatteriespannung A system for measuring the vehicle battery voltage |
07/06/2006 | DE102004063350A1 Elektrokleingerät mit einem aufladbaren Energiespeicher und einer Anzeige für den Ladezustand des Energiespeichers Small electrical appliance with a rechargeable energy storage and a display for the charge state of the energy storage |
07/06/2006 | DE102004062655A1 Verfahren zum Korrigieren einer durch eine elektrische Spannungsmessung indirekt durchgeführten elektrischen Strommessung A method for correcting an indirectly performed by an electrical voltage measurement electricity measurement |
07/06/2006 | DE102004061549A1 System zum Testen von Halbleiter-Bauelementen A system for testing semiconductor devices |
07/06/2006 | DE10058464B4 Mustererzeugungsverfahren, dieses verwendender Mustergenerator, und diesen Mustergenerator verwendendes Speichertestgerät Pattern forming method using this Direction pattern generator, and this pattern generator-use memory tester |
07/06/2006 | DE10037495B4 Verfahren und Vorrichtung zum Erkennen einer Fehlfunktion eines Sensors oder eines Leitungsbruchs Method and apparatus for detecting a malfunction of a sensor or a line break |
07/05/2006 | EP1677195A2 Enhanced embedded logic analyzer |
07/05/2006 | EP1677122A1 Integrated semiconductor device |
07/05/2006 | EP1677121A1 Integrated semiconductor device |
07/05/2006 | EP1677120A1 Method and apparatus for verifying connectivity of an instrumentation system |
07/05/2006 | EP1676427A2 Methods of discharge control for a battery pack of a cordless power tool system, a cordless power tool system and battery pack adapted to provide over-discharge protection and discharge control |
07/05/2006 | EP1676141A1 Evaluation circuit for detecting and/or locating faulty data words in a data stream tn |
07/05/2006 | EP1535386B1 Output choke arrangement for inverter, and method in conjunction therewith |
07/05/2006 | EP1389315B1 Hierarchical built-in self-test |
07/05/2006 | EP1222474B1 Fault location device and method |
07/05/2006 | EP1082830A4 Method and system for monitoring broadband quality of services |
07/05/2006 | EP0787306B1 Process for determining the state of charge of an accumulator |
07/05/2006 | CN2793893Y Ageing tester for capacitor |
07/05/2006 | CN2793744Y Module testrer of fuel battery |
07/05/2006 | CN2793743Y Testing platform |
07/05/2006 | CN2793742Y Discharging bar for paper pasting device of unwind levelling shearing line |
07/05/2006 | CN2793741Y Electric leakagte testing circuit |
07/05/2006 | CN2793740Y Circuit tester |
07/05/2006 | CN2793739Y Heating tube disconnection monitor |
07/05/2006 | CN2793738Y Transistor measuring equipment |
07/05/2006 | CN2793737Y Insulating monitor of microcomputer DC sysrtem |
07/05/2006 | CN2793736Y Insulating resistance inspector of high-voltage apparatus on top of electric locomotive |
07/05/2006 | CN2793724Y Air humidity alarming device |
07/05/2006 | CN2793696Y Response characteristic tester on detector surface |
07/05/2006 | CN1799033A A network analyzing method and a network analyzing apparatus |
07/05/2006 | CN1798980A Delay-fault testing method,Related system and circuit |
07/05/2006 | CN1798979A Insert for electronic component-handling device, tray, and electronic component handling device |
07/05/2006 | CN1798978A Harness checker and harness checking method |
07/05/2006 | CN1798977A Planarizing and testing of bga packages |
07/05/2006 | CN1797837A Battery management system and apparatus |
07/05/2006 | CN1797732A Semiconductor inspection apparatus and manufacturing method of semiconductor device |
07/05/2006 | CN1797657A Ground fault circuit interrupter with mechanism for testing ground fault |
07/05/2006 | CN1797656A Mechanism for testing ground fault |
07/05/2006 | CN1797604A Calibration circuit of a semiconductor memory device and method of operation the same |
07/05/2006 | CN1797547A Testing method and device for printed circuit boards of disk drives and servo track writers |
07/05/2006 | CN1797488A System and method for testing LCD unit |
07/05/2006 | CN1797359A Automatic test system for external connected ports of electronic products |
07/05/2006 | CN1797022A Method for setting and holding high current |
07/05/2006 | CN1797021A System for discharging electronic circuitry |
07/05/2006 | CN1797020A Parallel source/catching structure |
07/05/2006 | CN1797019A Method for measuring characteristics of fets |
07/05/2006 | CN1797018A Sample holder in use for measuring spectrum of photoluminescence of electrical modulation |
07/05/2006 | CN1797017A Breakdown testing structure for capacitor of preventing damage caused by middle and large current of semiconductor device |
07/05/2006 | CN1797016A Detection device and method for array base plate |
07/05/2006 | CN1797015A Interface circuit for electronic test system |
07/05/2006 | CN1797014A Detection method for testing current in resistance property of lightning arrester |
07/05/2006 | CN1797012A Impedance measurement system and method |
07/05/2006 | CN1797006A Probe component of detecting device for plane display board detection |
07/05/2006 | CN1797004A Detecting device for panel display board detector |
07/05/2006 | CN1797003A Apparatus/testing processor for testing un-moulded IC devices using air flow system and the method of testing the same |
07/05/2006 | CN1797002A Device for debugging circuit board, and method for debugging circuit board |
07/05/2006 | CN1797001A Apparatus and method for generating a high-frequency signal |
07/05/2006 | CN1263110C Wafer image display device for semiconductor testing system and its method |
07/05/2006 | CN1263025C Floppy disk driving unit, method and apparatus for its IC detection mode switching |