Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2006
07/12/2006EP1112505B1 Locating underground power cable faults
07/12/2006CN2796243Y Intelligent controller for inductive voltage regulator speed changing and voltage regulation
07/12/2006CN2795872Y Road lamp maintenance and detector
07/12/2006CN2795871Y Electric life test device for contactor and startor
07/12/2006CN2795870Y Cable fault distance detection synchronous sampler
07/12/2006CN2795865Y Composite printed circuit board test device
07/12/2006CN2795864Y Spring transfer element of printed circuit board detector
07/12/2006CN1802811A Transmission system, signal receiver, test apparatus and test head
07/12/2006CN1802775A Device probing using a matching device
07/12/2006CN1802708A IC device comprising test circuit for measuring AC characteristic of internal memory macro
07/12/2006CN1802592A 阵列基板检查方法 Array substrate inspection method
07/12/2006CN1802590A Array substrate, method of inspecting the array substrate and method of manufacturing the array substrate
07/12/2006CN1802570A 测试装置 Test device
07/12/2006CN1802569A Pattern generator and test apparatus
07/12/2006CN1802568A Electronic component processing device and method for temperature addition in electronic component processing device
07/12/2006CN1802567A Performing compression of user datagram protocol packets
07/12/2006CN1801574A Transformer substation automatization system information safety protecting method based on neural network under IEC 61850 standard
07/12/2006CN1801336A Test method and relative device for printed circuit board for controlling CD-ROM
07/12/2006CN1801264A Test circuit and display device having the same
07/12/2006CN1801104A Transparent re-mapping of parallel computational units
07/12/2006CN1800870A Single-phase plug type power supply detector
07/12/2006CN1800869A High temperature aging test device for display panel
07/12/2006CN1800868A Heat conduction mechanism of high and low temperature circulating device with wide temperature range
07/12/2006CN1800867A Fault line selection method for single-phase-to-ground fault in middle and low voltage distribution network
07/12/2006CN1800866A Cell detection system and method thereof
07/12/2006CN1800865A Cantalever board conveying equipment
07/12/2006CN1264255C Contactor device
07/12/2006CN1264245C Multiple plateau battery charging method and system to fully charge the first plateau
07/12/2006CN1264219C Synchronous semiconductor memory device
07/12/2006CN1264022C Fault analysis monitoring method and system device used on power supply network
07/12/2006CN1263996C Device and method for substrate displacement detection
07/12/2006CN1263980C Repair apparatus for decorating lamp shunt
07/11/2006US7076747 Analytical simulator and analytical simulation method and program
07/11/2006US7076714 Memory tester uses arbitrary dynamic mappings to serialize vectors into transmitted sub-vectors and de-serialize received sub-vectors into vectors
07/11/2006US7076713 Test generator for converting a model of computer component object behavior and stimulus values to test script
07/11/2006US7076712 Generating a test sequence using a satisfiability technique
07/11/2006US7076710 Non-binary address generation for ABIST
07/11/2006US7076709 Testing of circuit with plural clock domains
07/11/2006US7076708 Method and apparatus for diagnosis and behavior modification of an embedded microcontroller
07/11/2006US7076707 Methodology of locating faults of scan chains in logic integrated circuits
07/11/2006US7076706 Method and apparatus for ABIST diagnostics
07/11/2006US7076705 Semiconductor integrated circuit having bonding optional function
07/11/2006US7076405 Method for estimating power consumption and noise levels of an integrated circuit, and computer-readable recording medium storing a program for estimating power consumption and noise levels of an integrated circuit
07/11/2006US7076404 Method and apparatus for the analysis and monitoring of the partial discharge behavior of an electrical operating device
07/11/2006US7076388 Methods and apparatus for handling test number collisions
07/11/2006US7076385 System and method for calibrating signal paths connecting a device under test to a test system
07/11/2006US7076375 Apparatus and method for incorporating the use of a processing device into a battery charger and tester
07/11/2006US7076374 Methods and systems for detecting and locating damage in a wire
07/11/2006US7075886 Method and apparatus for routing information in satellite communication networks
07/11/2006US7075839 Semiconductor memory device
07/11/2006US7075834 Semiconductor integrated circuit device
07/11/2006US7075565 Optical inspection system
07/11/2006US7075515 Method and apparatus for testing a joystick control circuit
07/11/2006US7075464 Circuit for current measurement and current monitoring
07/11/2006US7075448 Method and circuit arrangement for offset correction of a measurement bridge
07/11/2006US7075327 System and method for proactive motor wellness diagnosis
07/11/2006US7075326 LSI testing apparatus
07/11/2006US7075325 Method and apparatus for testing semiconductor devices using an actual board-type product
07/11/2006US7075324 Method and device for testing semiconductor laser
07/11/2006US7075323 Large substrate test system
07/11/2006US7075322 Testing apparatus with electronic camera
07/11/2006US7075320 Probe for combined signals
07/11/2006US7075319 Probe card having a coil spring interposed between a support member and a contactor unit
07/11/2006US7075318 Methods for imperfect insulating film electrical thickness/capacitance measurement
07/11/2006US7075311 Insulation detecting device for non-grounded power source
07/11/2006US7075310 Device and method for testing for a wiring fault condition
07/11/2006US7075309 System and method to locate an anomaly of a conductor
07/11/2006US7075308 Blocking impedance
07/11/2006US7075307 Method and apparatus for detecting shorts on inaccessible pins using capacitive measurements
07/11/2006US7075305 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries
07/11/2006US7075285 Delay locked loop circuit and method for testing the operability of the circuit
07/11/2006US7075283 Cable tester
07/11/2006US7075175 Systems and methods for testing packaged dies
07/11/2006US7074629 Test patterns for measurement of effective vacancy diffusion area
07/11/2006US7074628 Test structure and method for yield improvement of double poly bipolar device
07/11/2006US7074278 Removable lid and floating pivot
07/11/2006US7074072 Method of making contact with circuit units to be tested in a tester and contact-making apparatus for implementing the method
07/11/2006US7074049 Kelvin contact module for a microcircuit test system
07/11/2006CA2224927C Ground fault circuit interrupter miswiring prevention device
07/06/2006WO2006072003A1 Multipoint protected switching ring
07/06/2006WO2006071668A2 Pin electronics with high voltage functionality
07/06/2006WO2006071416A1 Systems and methods for a contactless electrical probe
07/06/2006WO2006070697A1 Current measuring apparatus and current measuring method
07/06/2006WO2006069970A1 Method and device for the safe operation of a switching device
07/06/2006WO2006069963A1 Method and device for the secure operation of a switching device
07/06/2006WO2006069962A1 Method and device for the secure operation of a switching device
07/06/2006WO2006069960A1 Method and device for the secure operation of a switching device
07/06/2006WO2006069959A1 Method and device for the secure operation of a switching device
07/06/2006WO2006069956A1 Method and device for the secure operation of a switching device
07/06/2006WO2006069955A2 Method and device for the secure operation of a switching device
07/06/2006WO2006069810A1 Method of assembling an electric connector, electric connector so formed, and device for determining correct assembly of the connector
07/06/2006WO2005010723A3 System and method for threat detection and response
07/06/2006WO2004081985A3 Methods and systems for estimating reticle bias states
07/06/2006US20060150136 Systems and methods for designing integrated circuits
07/06/2006US20060150047 Apparatus and method for generating a high-frequency signal
07/06/2006US20060150046 Integrated circuit testing module
07/06/2006US20060150045 Versatile control pin electronics
07/06/2006US20060150044 On-chip data transmission control apparatus and method
07/06/2006US20060150043 Method for clock synchronization validation in integrated circuit design
07/06/2006US20060150042 Testing of electronic circuits