| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/19/2006 | CN1806180A Timing closure monitoring circuit and method |
| 07/19/2006 | CN1806179A Scan test design method, scan test circuit, scan test circuit insertion cad program, large-scale integrated circuit, and mobile digital device |
| 07/19/2006 | CN1805528A External device connection status detection device and method for audio/video devices |
| 07/19/2006 | CN1805239A Electronic equipment system and control method thereof |
| 07/19/2006 | CN1804808A Method for optimizing test order |
| 07/19/2006 | CN1804652A Integrated test bench for creepage breaker |
| 07/19/2006 | CN1804651A Circuit board fault self-positioning device and method based on programmable logic device |
| 07/19/2006 | CN1804650A Distance measuring method based on Bergeron model for power transmission line |
| 07/19/2006 | CN1804649A Fault line selection method for single-phase-to-ground fault in small ground current distribution network |
| 07/19/2006 | CN1804648A Incremental generation of calibration factors for automated test equipment |
| 07/19/2006 | CN1804647A Apparatus and method for testing organic electroluminescence display panel |
| 07/19/2006 | CN1804646A Behavioral model generation |
| 07/19/2006 | CN1804645A 电源开关控制器 Power Switch Controller |
| 07/19/2006 | CN1804643A Antenna failure recognition system and antenna failure recognition method |
| 07/19/2006 | CN1804605A Method for analyzing temperature and flow field in transformer |
| 07/19/2006 | CN1804555A Outer casing of online monitoring apparatus for power transmission line |
| 07/19/2006 | CN1803508A LED signal lamp with digital automatic detection function |
| 07/19/2006 | CN1265685C High-frequency circuit board with signal pickup pad and measuring tool thereof |
| 07/19/2006 | CN1265511C Lockable pressure controlled frame of electron element testing socket |
| 07/19/2006 | CN1265505C Contact structure with silicone grease contact point and general laminated structure using same |
| 07/19/2006 | CN1265495C Secondary cell sorting method |
| 07/19/2006 | CN1265396C Mixed packing semiconductor integrate circuit device of controller mass storage and measuring method |
| 07/19/2006 | CN1265232C Circuit pattern detecting device and circuit pattern detecting method |
| 07/19/2006 | CN1265207C Alternator testing method and system using ripple detection |
| 07/19/2006 | CN1265206C Processor and experimental equipment using same |
| 07/19/2006 | CN1265205C System and method for detecting open-phase of compressor system |
| 07/19/2006 | CA2533385A1 Self-powered power bus sensor employing wireless communication |
| 07/18/2006 | US7080338 Method and apparatus for designing layout, and computer product |
| 07/18/2006 | US7080331 Method and system for automatic recognition of simulation configurations of an integrated circuit |
| 07/18/2006 | US7080304 Technique for programming clocks in automatic test system |
| 07/18/2006 | US7080303 Method and system for computer based testing using plugins to expand functionality of a test driver |
| 07/18/2006 | US7080302 Semiconductor device and test system therefor |
| 07/18/2006 | US7080301 On-chip service processor |
| 07/18/2006 | US7080300 Testing a programmable logic device with embedded fixed logic using a scan chain |
| 07/18/2006 | US7080299 Resetting latch circuits within a functional circuit and a test wrapper circuit |
| 07/18/2006 | US7080298 Circuit apparatus and method for testing integrated circuits using weighted pseudo-random test patterns |
| 07/18/2006 | US7080292 Method for testing jitter tolerance of high speed receivers |
| 07/18/2006 | US7080282 Method for determining an operating voltage of floating point error detection |
| 07/18/2006 | US7080258 IC, IC-mounted electronic device, debugging method and IC debugger |
| 07/18/2006 | US7079983 Method, apparatus and computer program product for implementing physical interconnect fault source identification |
| 07/18/2006 | US7079973 Apparatus and method for compensating clock period elongation during scan testing in an integrated circuit (IC) |
| 07/18/2006 | US7079964 Method for determining the frequency of the current ripple in the armature current of a commutated DC motor |
| 07/18/2006 | US7079961 Method and apparatus for measuring impedance of electrical component under high interference conditions |
| 07/18/2006 | US7079612 Fast bit-error-rate (BER) test |
| 07/18/2006 | US7079551 Private network link verification procedure in free space optical communication network |
| 07/18/2006 | US7079512 Quality indicator and method for frame selection in wireless network |
| 07/18/2006 | US7079493 Device and method for collecting traffic information |
| 07/18/2006 | US7079490 Integrated circuit with trace analyzer |
| 07/18/2006 | US7079483 Ring network and method for path interchange therein |
| 07/18/2006 | US7079365 Electrical fault detection system |
| 07/18/2006 | US7079060 Test circuit for evaluating characteristic of analog signal of device |
| 07/18/2006 | US7079040 Thermostatic controller and circuit tester |
| 07/18/2006 | US7079039 Process and device for testing electric motors, in particular fan motors, for functionality |
| 07/18/2006 | US7078940 Current comb generator |
| 07/18/2006 | US7078929 Interface controller using JTAG scan chain |
| 07/18/2006 | US7078928 Semiconductor integrated circuit device |
| 07/18/2006 | US7078927 Semiconductor device characteristics measurement apparatus and connection apparatus |
| 07/18/2006 | US7078926 Wafer-level burn-in and test |
| 07/18/2006 | US7078925 Method and apparatus for detecting and correcting wiring errors in power monitoring applications |
| 07/18/2006 | US7078924 Methodology to accurately test clock to signal valid and slew rates of PCI signals |
| 07/18/2006 | US7078923 Environmental test method and system |
| 07/18/2006 | US7078922 Semiconductor interconnect having semiconductor spring contacts |
| 07/18/2006 | US7078921 Contact probe |
| 07/18/2006 | US7078920 Semiconductor substrate and test pattern for the same |
| 07/18/2006 | US7078919 In situ determination of resistivity, mobility and dopant concentration profiles |
| 07/18/2006 | US7078912 Techniques to test signal propagation media |
| 07/18/2006 | US7078908 Voltage detecting apparatus applicable to a combination battery |
| 07/18/2006 | US7078907 Battery capacity calculating method, battery capacity calculating apparatus and battery capacity calculating program |
| 07/18/2006 | US7078890 Methods and apparatus for creating a high speed connection between a device under test and automatic test equipment |
| 07/18/2006 | US7078889 Semiconductor test apparatus for testing semiconductor device that produces output data by its internal clock timing |
| 07/18/2006 | US7078879 Method and apparatus for testing and charging a power source |
| 07/18/2006 | US7078878 Method for determining a steady state battery terminal voltage |
| 07/18/2006 | US7078248 Method and structure for defect monitoring of semiconductor devices using power bus wiring grids |
| 07/18/2006 | US7078247 Early detection of contact liner integrity by chemical reaction |
| 07/18/2006 | US7077231 Automotive passenger restraint and protection apparatus |
| 07/18/2006 | US7076858 Method for controlling resonant tag frequency |
| 07/18/2006 | CA2532899A1 Manual probe carriage system and method of using the same |
| 07/18/2006 | CA2324135C Apparatus for testing bare-chip lsi mounting board |
| 07/13/2006 | WO2006074092A1 High precision voltage source for electrical impedance tomography |
| 07/13/2006 | WO2006073737A2 A method and apparatus for increasing the operating frequency of a system for testing electronic devices |
| 07/13/2006 | WO2006073736A2 Probe head arrays |
| 07/13/2006 | WO2006073028A1 Semiconductor device, test apparatus and measuring method |
| 07/13/2006 | WO2006073016A1 Superconductive cable withstand voltage test method |
| 07/13/2006 | WO2006072981A1 Rotary electric machine constant measuring device and method |
| 07/13/2006 | WO2006072846A1 Circuit arrangement and method of testing and/or diagnosing the same |
| 07/13/2006 | WO2006072598A1 Method and device for testing semiconductor wafers using a chuck device whose temperature can be regulated |
| 07/13/2006 | WO2006072501A1 Method for determining a battery internal resistance |
| 07/13/2006 | WO2006032028A3 Metric-based monitoring and control of a limited resource |
| 07/13/2006 | WO2006029386A3 Architecture enhancement for a broadband wireless router |
| 07/13/2006 | WO2006007415A3 Nonlinear adaptive control of resource-distribution dynamics |
| 07/13/2006 | US20060156150 Apparatus and method for test, characterization, and calibration of microprocessor-based and digital signal processor-based integrated circuit digital delay lines |
| 07/13/2006 | US20060156149 Semiconductor component, arrangement and method for characterizing a tester for semiconductor components |
| 07/13/2006 | US20060156148 Application specific integrated circuit with internal testing |
| 07/13/2006 | US20060156147 Method and apparatus for measuring group delay of a device under test |
| 07/13/2006 | US20060156146 Simplified high speed test system |
| 07/13/2006 | US20060156145 Using patterns for high-level modeling and specification of properties for hardware systems |
| 07/13/2006 | US20060156144 Removing the effects of unknown test values from compacted test responses |
| 07/13/2006 | US20060156143 Method for testing drive circuit, testing device and display device |
| 07/13/2006 | US20060156142 Automatic test pin assignment |
| 07/13/2006 | US20060156141 Defect symptom repair system and methods |