| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/13/2006 | US20060156140 Network equipment and a method for monitoring the start up of such an equipment |
| 07/13/2006 | US20060156139 Systems and methods for facilitating testing of integrated circuits |
| 07/13/2006 | US20060156138 Test pattern generating apparatus, circuit designing apparatus, test pattern generating method, circuit designing method, test pattern generating program and circuit designing program |
| 07/13/2006 | US20060156137 Test program set generation tool |
| 07/13/2006 | US20060156136 System for storing device test information on a semiconductor device using on-device logic for determination of test results |
| 07/13/2006 | US20060156135 Tabbed form with error indicators |
| 07/13/2006 | US20060156134 Programmable memory built-in-self-test (MBIST) method and apparatus |
| 07/13/2006 | US20060156133 Flexible memory built-in-self-test (MBIST) method and apparatus |
| 07/13/2006 | US20060156132 Semiconductor device with built-in scan test circuit |
| 07/13/2006 | US20060156131 Method of reducing hardware overhead upon generation of test pattern in built-in sef test |
| 07/13/2006 | US20060156130 Self test method and apparatus for identifying partially defective memory |
| 07/13/2006 | US20060156129 System for maintaining data |
| 07/13/2006 | US20060156128 System and method for implementing postponed quasi-masking test output compression in integrated circuit |
| 07/13/2006 | US20060156127 Method for transmitting data |
| 07/13/2006 | US20060156126 Semiconductor test instrument |
| 07/13/2006 | US20060156125 Shift register system, method and driving circuit |
| 07/13/2006 | US20060156124 Boundary scan apparatus and interconnect test method |
| 07/13/2006 | US20060156123 Fault free store data path for software implementation of redundant multithreading environments |
| 07/13/2006 | US20060156122 Mask network design for scan-based integrated circuits |
| 07/13/2006 | US20060156121 Emission control driver and organic light emitting display using the same |
| 07/13/2006 | US20060156120 Light emitting device and method of driving the same |
| 07/13/2006 | US20060156119 Semiconductor apparatus and clock generation unit |
| 07/13/2006 | US20060156118 Scan driver and organic light emitting display for selectively performing progressive scanning and interlaced scanning |
| 07/13/2006 | US20060156117 Processor, its error analytical method and program |
| 07/13/2006 | US20060156116 Method and apparatus for controlling AC power during scan operations in scannable latches |
| 07/13/2006 | US20060156115 Device, system, and method for providing error information in XHT network |
| 07/13/2006 | US20060156114 Semiconductor device for accurate measurement of time parameters in operation |
| 07/13/2006 | US20060156113 Reduced signaling interface method & apparatus |
| 07/13/2006 | US20060156112 Reduced signaling interface method & apparatus |
| 07/13/2006 | US20060156111 Test circuit and display device having the same |
| 07/13/2006 | US20060156110 Method for testing semiconductor chips using register sets |
| 07/13/2006 | US20060156109 Test mode circuit and reset control method therefor |
| 07/13/2006 | US20060156108 Method for testing semiconductor chips using check bits |
| 07/13/2006 | US20060156107 Method for testing semiconductor chips by means of bit masks |
| 07/13/2006 | US20060156106 Test system |
| 07/13/2006 | US20060156105 Data receiving apparatus capable of compensating for reduced timing margin caused by inter-symbol interference and method thereof |
| 07/13/2006 | US20060156104 Wrapper testing circuits and method thereof for system-on-a-chip |
| 07/13/2006 | US20060156103 Apparatus and method for bit pattern learning and computer product |
| 07/13/2006 | US20060156102 System and method to control data capture |
| 07/13/2006 | US20060156101 Method and system for testing distributed logic circuitry |
| 07/13/2006 | US20060156100 Test wrapper including integrated scan chain for testing embedded hard macro in an integrated circuit chip |
| 07/13/2006 | US20060156099 Method and system of using a single EJTAG interface for multiple tap controllers |
| 07/13/2006 | US20060156098 Method and apparatus for testing an electronic device |
| 07/13/2006 | US20060156097 Analog counter using memory cell |
| 07/13/2006 | US20060156096 Voltage converting device, computer readable recording medium with program recorded thereon for causing computer to execute failure processing, and failure processing method |
| 07/13/2006 | US20060156095 Fault detecting method and layout method for semiconductor integrated circuit |
| 07/13/2006 | US20060156087 Bit distributor for multicarrier communication systems employing adaptive bit loading for multiple spatial streams and methods |
| 07/13/2006 | US20060156086 System and method for integrating multiple data sources into service-centric computer networking services diagnostic conclusions |
| 07/13/2006 | US20060155500 Ic with on-board characterization unit |
| 07/13/2006 | US20060155396 Position-correction device for correcting the position of a component holder for electronic components |
| 07/13/2006 | US20060154386 Apparatus and method for aligning devices on carriers |
| 07/13/2006 | US20060153174 Quality determination for packetized information |
| 07/13/2006 | US20060152395 Integrated circuit with embedded identification code |
| 07/13/2006 | US20060152245 TFT substrate and testing method of thereof |
| 07/13/2006 | US20060152244 System and method for testing devices utilizing capacitively coupled signaling |
| 07/13/2006 | US20060152243 System and method for testing devices utilizing capacitively coupled signaling |
| 07/13/2006 | US20060152242 Method of performing parallel test on semiconductor devices by dividing voltage supply unit |
| 07/13/2006 | US20060152241 Shared bond pad for testing a memory within a packaged semiconductor device |
| 07/13/2006 | US20060152240 Probe device with micro-pin inserted in interface board |
| 07/13/2006 | US20060152239 Wafer burn-in system with probe cooling |
| 07/13/2006 | US20060152238 System, apparatus and method for controlling temperature of an integrated circuit under test |
| 07/13/2006 | US20060152237 Functional and stress testing of LGA devices |
| 07/13/2006 | US20060152236 On-chip self test circuit and self test method for signal distortion |
| 07/13/2006 | US20060152235 Probing apparatus |
| 07/13/2006 | US20060152234 Method and apparatus for increasing operating frequency of a system for testing electronic devices |
| 07/13/2006 | US20060152233 Contact-type film probe |
| 07/13/2006 | US20060152232 Method and apparatus for inspection of high frequency and microwave hybrid circuits and printed circuit boards |
| 07/13/2006 | US20060152229 Noncontact conductivity measuring instrument |
| 07/13/2006 | US20060152226 Diagnostic method for a sensor |
| 07/13/2006 | US20060152224 Diagnosis for expected life of emergency power apparatus |
| 07/13/2006 | US20060152211 Transfer system and transfer method of object to be processed |
| 07/13/2006 | US20060152209 Electric field sensor and adjustment method thereof |
| 07/13/2006 | US20060152195 Battery pack capacity control system |
| 07/13/2006 | US20060152190 Wireless battery management system |
| 07/13/2006 | US20060151784 Photonic devices and PICs including sacrificial testing structures and method of making the same |
| 07/13/2006 | US20060151444 Method for producing a captive wired test fixture and fixture therefor |
| 07/13/2006 | US20060151430 Method and system for processing multi-layer films |
| 07/13/2006 | US20060150697 Anionic polymers composed of dicarboxylic acids and uses thereof |
| 07/13/2006 | DE4210797B4 Verfahren und Schaltungsanordnung zur Überwachung einer Leitung für ein impulsförmiges Signal Method and circuit arrangement for monitoring a line for a pulse-shaped signal |
| 07/13/2006 | DE19947441B4 Prüfsystem für elektrische Teile Testing system for electrical parts |
| 07/13/2006 | DE19928981B4 Vorrichtung und Verfahren zum Testen von Halbleiterspeichern Apparatus and method for testing semiconductor memories |
| 07/13/2006 | DE19912417B4 IC-Testgerät IC tester |
| 07/13/2006 | DE10228764B4 Anordnung zum Testen von Halbleitereinrichtungen Arrangement for the testing of semiconductor devices |
| 07/13/2006 | DE102005048261A1 Anomaliedetektor für Schwingungsdrehratesensor Anomaly detector for vibrational-rotational rate sensor |
| 07/13/2006 | DE102005034208A1 Imitier-Wafer, System, das unter Verwendung des Imitier-Wafers kalibriert wird, und Verfahren zum Kalibrieren einer automatisierten Testausrüstung Imitier wafer system which is calibrated using the Imitier wafer, and method of calibrating an automatic test equipment |
| 07/13/2006 | DE102005017241B3 Test device for electrical connecting elements, such as cable-connected plug, uses plug-receptacle to form plug-in module with support body |
| 07/13/2006 | DE102004063155A1 Vehicle battery charge status determination procedure uses engine rotation rate and oil temperature information |
| 07/13/2006 | DE102004047511B4 Testvorrichtung und Verfahren zum Testen von Analog-Digital-Wandlern A test device and method for testing analog-to-digital converters |
| 07/13/2006 | DE102004020187B4 Umverdrahtungssubstratstreifen mit mehreren Halbleiterbauteilpositionen Rewiring substrate having a plurality of semiconductor component positions |
| 07/13/2006 | CA2580815A1 Dielectric strenght test method of superconducting cable |
| 07/12/2006 | EP1679523A1 Secondary battery voltage correcting method and unit and battery residual capacity estimating method and unit |
| 07/12/2006 | EP1679522A1 Method and device for measuring electric field distribution of semiconductor device |
| 07/12/2006 | EP1679521A2 Time domain reflectometer display method |
| 07/12/2006 | EP1679520A1 Printed circuit board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus |
| 07/12/2006 | EP1678646A1 Method and system for test creation |
| 07/12/2006 | EP1678576A2 System verification using one or more automata |
| 07/12/2006 | EP1678514A1 Battery sensor and method for operation of a battery sensor |
| 07/12/2006 | EP1678513A1 Electronic circuit comprising a secret sub-module |
| 07/12/2006 | EP1678512A1 Method and device for measuring radio interference levels with frequency tracking |
| 07/12/2006 | EP1625406A4 Device probing using a matching device |