| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/25/2006 | US7082560 Scan capable dual edge-triggered state element for application of combinational and sequential scan test patterns |
| 07/25/2006 | US7082559 Semiconductor integrated circuit device and test method thereof |
| 07/25/2006 | US7082558 Increasing possible test patterns which can be used with sequential scanning techniques to perform speed analysis |
| 07/25/2006 | US7082557 High speed serial interface test |
| 07/25/2006 | US7082103 Subscriber terminal, network controller and communication system for performing packet data transfer with reduced delay |
| 07/25/2006 | US7082102 Systems and methods for policy-enabled communications networks |
| 07/25/2006 | US7081869 Test fixture for assembled wireless devices |
| 07/25/2006 | US7081770 Multiple testing bars for testing liquid crystal display and method thereof |
| 07/25/2006 | US7081769 Method of identifying and analyzing semiconductor chip defects |
| 07/25/2006 | US7081768 Device for testing printed circuit boards |
| 07/25/2006 | US7081767 Electroconductive contact unit |
| 07/25/2006 | US7081766 Probe card for examining semiconductor devices on semiconductor wafers |
| 07/25/2006 | US7081762 Method and apparatus for measuring high speed glitch energy in an integrated circuit |
| 07/25/2006 | US7081761 Ultracapacitor useful life prediction |
| 07/25/2006 | US7081760 Method of diagnosing a broken bar fault in an induction motor |
| 07/25/2006 | US7081759 Fluid detection cable |
| 07/25/2006 | US7081758 Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure |
| 07/25/2006 | US7081757 Re-locatable partial discharge transducer head |
| 07/25/2006 | US7081756 Substrate inspection apparatus, substrate inspection method, method of manufacturing semiconductor device and recording medium |
| 07/25/2006 | US7081755 Battery tester capable of predicting a discharge voltage/discharge current of a battery |
| 07/25/2006 | US7081737 Battery cell monitoring and balancing circuit |
| 07/25/2006 | US7081729 Variable-structure diagnostics approach achieving optimized low-frequency data sampling for EMA motoring subsystem |
| 07/25/2006 | US7081635 High activity, spatially distributed radiation source for accurately simulating semiconductor device radiation environments |
| 07/25/2006 | US7081625 Charged particle beam apparatus |
| 07/25/2006 | US7081193 Multi-stack isolation detection system |
| 07/25/2006 | US7081005 Electric-connection testing device |
| 07/25/2006 | US7080789 Smart card including a JTAG test controller and related methods |
| 07/21/2006 | CA2533376A1 Apparatus and method for detecting hot spots in an electric power conductor |
| 07/20/2006 | WO2006076583A2 Rate adaptation using semi-open loop technique |
| 07/20/2006 | WO2006075820A1 Apparatus and method for transmitting data blocks based on priority |
| 07/20/2006 | WO2006075740A1 Method and apparatus for judging conformity of lead storage battery |
| 07/20/2006 | WO2006075516A1 Signal transmission system, signal output circuit board, signal receiving circuit board, signal output method and signal receiving method |
| 07/20/2006 | WO2006075391A1 Electronic component testing apparatus |
| 07/20/2006 | WO2006075374A1 Semiconductor device and test method thereof |
| 07/20/2006 | WO2006075046A1 Method for identifying cables in a telecommunications patch panel |
| 07/20/2006 | WO2006074502A1 Apparatus and method for using a counter-propagating signal method for locating events |
| 07/20/2006 | WO2006060467A3 Probe card with segmented substrate |
| 07/20/2006 | WO2006044128A3 Evaluating the performance of an automotive switch network |
| 07/20/2006 | WO2006031646A3 Double sided probing structures |
| 07/20/2006 | US20060161829 Test apparatus and test method |
| 07/20/2006 | US20060161828 Digital logic test method to systematically approach functional coverage completely and related apparatus and system |
| 07/20/2006 | US20060161827 Over-voltage test for automatic test equipment |
| 07/20/2006 | US20060161826 Method and system of modifying data in functional latches of a logic unit during scan chain testing thereof |
| 07/20/2006 | US20060161820 Highly reliable distributed system |
| 07/20/2006 | US20060161372 Pattern generator and test apparatus |
| 07/20/2006 | US20060161271 Two-wire field-mounted process device |
| 07/20/2006 | US20060161212 Method and device for displaying remaining serviceable life of an analytical device |
| 07/20/2006 | US20060160254 System and method for detection of spatial signature yield loss |
| 07/20/2006 | US20060159111 Scaleable controlled interconnect with optical and wireless applications |
| 07/20/2006 | US20060159014 System, method and computer program product for provisioning of resources and service environments |
| 07/20/2006 | US20060159013 Method of controlling transmission rates |
| 07/20/2006 | US20060158222 Testing using independently controllable voltage islands |
| 07/20/2006 | US20060158212 System for testing semiconductor devices |
| 07/20/2006 | US20060158211 Test system of semiconductor device having a handler remote control and method of operating the same |
| 07/20/2006 | US20060158210 Method of predicting high-k semiconductor device lifetime |
| 07/20/2006 | US20060158209 System and method for testing one or more dies on a semiconductor wafer |
| 07/20/2006 | US20060158208 Prober tester |
| 07/20/2006 | US20060158207 Method and apparatus for testing semiconductor wafers by means of a temperature-regulated chuck device |
| 07/20/2006 | US20060158206 Probe card for high speed testing |
| 07/20/2006 | US20060158205 Method for testing standby current of semiconductor package |
| 07/20/2006 | US20060158204 Test apparatus |
| 07/20/2006 | US20060158203 Allocating device testing resources |
| 07/20/2006 | US20060158179 Apparatus for testing un-moulded IC devices using air flow system and the method of using the same |
| 07/20/2006 | US20060158178 Parametric measuring circuit for minimizing oscillation effect |
| 07/20/2006 | US20060157697 System and method for adjusting a manufacturing condition of an electronic device and method for manufacturing an electronic device |
| 07/20/2006 | US20060157445 Gas setting method, gas setting apparatus, etching apparatus and substrate processing system |
| 07/20/2006 | US20060156850 Test head positioning apparatus |
| 07/20/2006 | US20060156836 Apparatus and method for balancing and for providing a compliant range to a test head |
| 07/20/2006 | DE69832015T2 Halbleiterspeicher mit einer verbesserten Prüfschaltung A semiconductor memory with an improved test circuit |
| 07/20/2006 | DE69831918T2 Speicherschaltung mit DMA Prüfung und sein Prüfverfahren Memory circuit with DMA testing and test methods to be |
| 07/20/2006 | DE60207307T2 Testen von schaltungen mit mehreren taktsignal-domänen Testing of circuits with multiple clock signal-domains |
| 07/20/2006 | DE4305707B4 Steuerbarer Zeitlagesteuerungsschaltkreis für einen integrierten Schaltkreis-Chip Controllable timing control circuit for an integrated circuit chip |
| 07/20/2006 | DE10241045B4 Verfahren zum Durchführen von Testmessungen an lichtemittierenden Bauelementen A method for performing test measurements on light emitting devices |
| 07/20/2006 | DE102006002552A1 Manuelles Sondenträgersystem und Verfahren zur Verwendung desselben Manual probe carrier system and method for use thereof |
| 07/20/2006 | DE102005052448A1 Method for determining functional capability of storage battery involves determination of number of remainder operating cycles of security relevant consumer load as a measure for service life |
| 07/20/2006 | DE102005034209A1 Schnittstellenschaltung für elektronisches Testsystem Interface circuit for electronic test system |
| 07/20/2006 | DE102005025108B3 Device for testing protection, measuring or counting devices as component of medium or high voltage equipment has pole strip which can be attached on this device, whereby pole strip exhibits several pole openings arranged one behind other |
| 07/20/2006 | DE102004063163A1 Verfahren zur Bestimmung des Innenwiderstandes einer Batterie Method for determining the internal resistance of a battery |
| 07/20/2006 | DE102004058906A1 Electrochemical traction battery life status and availability prediction unit records actual current and voltage so as to construct polynomial approximation of charging process versus time |
| 07/20/2006 | DE10164771B4 Kapazitätsabschätzungsverfahren und -vorrichtung für Lithium-Ionenzellen und Lithium-Ionenbatterien Capacity estimation method and apparatus for lithium-ion cells and lithium-ion batteries |
| 07/20/2006 | DE10164770B4 Lithium-ion cell capacity estimation for electronic devices, involves estimating capacity of cell based on elapsed time from time when charge voltage reaches specified value to time when charge condition is changed |
| 07/20/2006 | CA2593628A1 Apparatus and method for using a counter-propagating signal method for locating events |
| 07/20/2006 | CA2493410A1 Assembly, production and quality assurance processes respecting electronic compliance monitor (ecm) tags |
| 07/19/2006 | EP1681777A1 Method and apparatus to measure far end crosstalk for the determination of equal level far end crosstalk |
| 07/19/2006 | EP1681575A1 Insulation resistance deterioration detection method and insulation resistance deterioration detection device for motor, and motor driver |
| 07/19/2006 | EP1680813A2 Probe testing structure |
| 07/19/2006 | EP1563380B1 Virtual to physical memory address mapping within a system having a secure domain and a non-secure domain |
| 07/19/2006 | EP1547270A4 Aircraft multi-function wire and insulation tester |
| 07/19/2006 | EP1423715B1 Diagnostics for piezoelectric sensor |
| 07/19/2006 | EP1256006B1 Non-invasive electrical measurement of semiconductor wafers |
| 07/19/2006 | EP1250608B1 Load angle determination for electrical motors |
| 07/19/2006 | EP1153431B1 Method and apparatus for cooling backside optically probed integrated circuits |
| 07/19/2006 | CN2798109Y Automatic DC power tester |
| 07/19/2006 | CN2798108Y BIT controller for liquid crystal display |
| 07/19/2006 | CN2798107Y Screened electrode oil cup |
| 07/19/2006 | CN2798106Y Power line anti-theft alarm |
| 07/19/2006 | CN2798105Y Structure for fast determining medium voltage cable network fault range |
| 07/19/2006 | CN2798104Y Tester for reactor turn-to-turn high-frequency oscillation |
| 07/19/2006 | CN2798095Y Probe structure for testing tool |
| 07/19/2006 | CN2798062Y Automatic apparatus for LED tester table |